07.120 - Nanotechnologies
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Nanotechnologies
Nanotechnologies
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IEC TS 62607-9-2:2024, which is a Technical Specification, establishes a standardized method to determine the key control characteristic
• magnetic field distribution
of nanomagnetic materials, structures and devices by the
• magneto-optical indicator film technique.
The magnetic field distribution is derived by utilizing a magneto optical indicator film, which is a thin film of magneto-optic material that is placed on the surface of an object exhibiting a spatially varying magnetic field distribution. The Faraday effect is then employed to measure the magnetic field strength by analysing the rotation of the polarization plane of light passing through the magneto-optic film.
The method is applicable for measuring the stray field distribution of flat nanomagnetic materials, structures and devices.
- The method can especially be used to perform fast quantitative measurements of stray field distributions at the surface of an object.
- The magneto-optic indicator film technique (MOIF) is a fast, non-destructive method, making it an attractive option for materials analysis and testing in the industry.
- MOIF measurements can be done without any sample preparation and do not rely on specific surface properties of the object. It can be applied to the characterization of rough samples as well as of samples with non-magnetic cover layers.
- MOIF can quantitatively measure magnetic field distributions:
• with a one-shot measurement which typically takes a few seconds
• over areas of several square centimetres (over diameters of up to 15 cm with special techniques)
• in a field range from 1 mT to more than 100 mT
• with down to 1 µm spatial resolution
- Although techniques with nano-scale resolution are suitable for analysing the details of magnetic field structure, their ability to characterize larger areas is limited by their scanning area. Therefore, the MOIF technique is an indispensable complementary method that can offer a more comprehensive understanding of material properties.
This document focuses on the calibration procedures, calibrated measurement process, and evaluation of measurement uncertainty to ensure the traceability of quantitative magnetic field measurements obtained through the magneto-optic indicator film technique.
- Technical specification771 pagesEnglish languagesale 15% off
IEC TS 62607-6-12:2024 establishes a standardized method to determine the key control characteristic
- number of layers
for films consisting of graphene by
- Raman spectroscopy and
- optical reflection.
Criteria for the determination of the number of layers are the G-peak integrated intensity and the optical contrast. Both methods enable to distinguish between graphene and multilayer graphene. However, neither method on its own nor the combination of the two enable a determination of the number of layers in all possible cases (especially regarding all possible stacking angles). But the comparison of the values deduced by each method allows to discriminate whether the determined number of layers is correct and can be specified or not.
- The method is applicable to exfoliated graphene and graphene grown on or transferred to a substrate with a small defect density, low surface contamination (e.g. transfer residue) and number of layers up to 5.
- The method is suitable for the following substrates:
a) glass (soda lime glass or similar with a refractive index between 1,45 and 1,55 at 532 nm);
b) oxidized silicon (SiO2 on silicon, with a SiO2 thickness of 90 nm ± 5 nm).
- The spatial resolution is in the order of 1 µm given by the spot size of the exciting laser.
- Technical specification32 pagesEnglish languagesale 15% off
This document provides: a) a review of radioisotope labelling methods that can be used for nanomaterials; b) the advantages and disadvantages of each radioisotope labelling method; c) information on the selection of a matched pair of nanomaterial and radioisotope labelling method to ensure the in vivo integrity of radioisotope-labelled nanomaterials or the stability of their performance.
- Technical report22 pagesEnglish languagesale 15% off
This document specifies the characteristics of samples of silica with ordered nanopore array (SONA) to be measured in powder form and the industrially available measurement methods used to determine said characteristics. This document provides a sound base for the research, development and commercialization of SONA for various applications. This document excludes silica-gel, fumed silica and chemically modified SONA. NOTE The pore size of SONA ranges usually from one nanometre to several tens of nanometres.
- Technical specification10 pagesEnglish languagesale 15% off
This document defines terms related to liposomes in nanotechnologies, within the context of biological systems and biomedical applications. In this context, liposomes are one form of lipid-based nanomaterials. This document does not address terms that can be relevant to other types of lipid-based particles (e.g. solid lipid nanoparticles).
- Technical specification8 pagesEnglish languagesale 15% off
IEC TS 62607-6-4:2024 has been prepared by IEC technical committee 113: Nanotechnology for electrotechnical products and systems. It is a Technical Specification.
This second edition cancels and replaces the first edition published in 2016. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) changed the document title to better reflect its purpose and application:
old title: Graphene – Surface conductance measurement using resonant cavity
new title: Graphene based materials – Surface conductance: non-contact microwave resonant cavity method.
b) replaced former Figure 1 with new Figure 1 and Figure 2, to better illustrate the method’s fundamentals and its implementation for a non-technical reader.
This part of IEC 62607 establishes a standardized method to determine the key control characteristic
a) surface conductance
for films of graphene and graphene-based materials by the
b) non-contact microwave resonant cavity method
The non-contact microwave resonant cavity method monitors the microwave resonant frequency shifts and changes in the cavity’s quality factor during the insertion of the specimen into the microwave cavity, as a function of the specimen surface area. The empty cavity is an air-filled standard R100 rectangular waveguide operated at one of the resonant frequency modes, typically at 7,5 GHz [4].
1) The method is applicable for graphene materials which are synthesized by chemical vapour deposition (CVD) on metal substrates, epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO), or mechanically exfoliated from graphite [5].
2) This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimensions are uniform over the specimen area.
NOTE In some countries, the R100 standard waveguide is referenced as WR-90.
- Technical specification18 pagesEnglish languagesale 15% off
This document provides an extraction method using the proteinase K (PK) for nanomaterials deposited in the lung. This document specifies the advantages of the PK digestion method and examples of nanomaterials to which it can be applied. This document focuses on extracting nanomaterials from lung tissue and separating nanoparticles from their ionic counterparts. This method is potentially (or theoretically) applicable to any particles that are insoluble during the PK digestion process.
- Technical specification14 pagesEnglish languagesale 15% off
This document provides an overview of the methods used to determine the nanoparticle number concentration in liquid dispersions and aerosols. The methods described are the ensemble measurement techniques of differential centrifugal sedimentation (DCS), multi-angle dynamic light scattering (MDLS), small-angle X-ray scattering (SAXS) and ultraviolet-visible spectroscopy (UV-vis) and the particle counting methods of particle tracking analysis (PTA), resistive pulse sensing (RPS), single particle inductively coupled plasma mass spectrometry (spICP-MS), condensation particle counter (CPC), and differential mobility analysing system (DMAS). This document provides information on the use of each technique, along with considerations on sample preparation, advantages and limitations.
- Technical specification50 pagesEnglish languagesale 15% off
The document provides information on the measurement of nanomaterial mass in tissue after inhalation exposure, which can inform on lung clearance behaviour and translocation.
- Technical specification25 pagesEnglish languagesale 15% off
IEC TS 62607-8-3:2023 This part of IEC 62607, which is a Technical Specification, specifies a measurement protocol to determine the key control characteristics
- analogue resistance change, and
- resistance fluctuation
for nano-enabled metal-oxide interfacial devices by
- electrical resistance measurement.
Analogue resistance change as a function of applied voltage pulse is measured in metal-oxide interfacial devices. The linearity in the relationship of the variation of conductance and the pulse number is evaluated using the parameter fitting. The parameter of the resistance fluctuation is simultaneously computed in the fitting process.
- This method is applicable for evaluating computing devices composed of the metal-oxide interfacial device, for example, product-sum circuits, which record the learning process as the analogue resistance change.
- Technical specification18 pagesEnglish languagesale 15% off
This document defines core terms in the field of nanotechnology. This document is intended to facilitate communication between organizations and individuals in industry and those who interact with them.
- Standard24 pagesEnglish languagesale 10% offe-Library read for1 day
This document specifies requirements and recommendations for performance assessment methods for superhydrophobic surfaces and coatings subjected to mechanical stress, solar radiation and weathering, liquids, and thermal cycling, where applicable, based on the agreement between interested parties. The performance assessment is carried out based on comparative measurements of the advancing and receding angles and the calculation of the contact angle hysteresis before and after the above-mentioned working/environmental conditions. This document does not address safety and environmental related issues of such coatings. This document is applicable to any superhydrophobic surfaces and coatings (i.e. nanostructured) on which the measurement of the advancing and receding angles is possible.
- Technical specification19 pagesEnglish languagesale 15% off
This document specifies the characteristics and performance(s) of the superhydrophobic textiles containing nanomaterials and nanostructures (TCNNs) based on contact angle measurement before and after being subjected to washing/drying (laundry), ironing processes, light sources and abrasion, that are to be determined by agreement between customer and supplier. This document solely covers woven and nonwoven fabrics. This document does not address safety and health related issues.
- Technical specification18 pagesEnglish languagesale 15% off
This document defines core terms in the field of nanotechnology. This document is intended to facilitate communication between organizations and individuals in industry and those who interact with them.
- Standard24 pagesEnglish languagesale 10% offe-Library read for1 day
IEC TS 62607-7-2:2023 specifies the efficiency testing of photovoltaic cells (excluding multi-junction cells) under indoor light. Although it is primarily intended for nano-enabled photovoltaic cells (organic thin-film, dye-sensitized solar cells (DSC), and Perovskite solar cells), it can also be applied to other types of photovoltaic cells, such as Si, CIGS, GaAs cells, and so on.
- Technical specification48 pagesEnglish languagesale 15% off
This document specifies a mild oxidation method to determine the content of carbon impurities (carbon material content not in the form of CNT, including amorphous carbon and trace amountd of other types of structured carbon) less stable than multiwall carbon nanotubes (MWCNTs) by thermogravimetric analysis (TGA) under carbon dioxide atmosphere. This document is applicable to the characterization of carbon impurities content in MWCNT samples prepared by chemical vapour deposition (CVD). Measurement of carbon impurities in MWCNT samples prepared by other methods can refer to this document. This method is not applicable to functionalized MWCNT samples or MWCNT samples with encapsulant species. NOTE This method is applicable for the case of TG curves with a single-stage.
- Technical specification21 pagesEnglish languagesale 15% off
ISO 80004-1:2023 This document defines core terms in the field of nanotechnology. This document is intended to facilitate communication between organizations and individuals in industry and those who interact with them.
- Standard12 pagesEnglish languagesale 15% off
- Standard12 pagesFrench languagesale 15% off
This document defines core terms in the field of nanotechnology. This document is intended to facilitate communication between organizations and individuals in industry and those who interact with them.
- Standard12 pagesEnglish languagesale 15% off
- Standard11 pagesFrench languagesale 15% off
This document specifies the performance evaluation of nanosuspensions containing clay nanoplates for quorum quenching in crop production. This document does not cover safety and environmental aspects.
- Technical specification13 pagesEnglish languagesale 15% off
IEC TS 62607-6-7:2023 establishes a method to determine the key control characteristics sheet resistance RS [measured in ohm per square (Ω/sq)], by the van der Pauw method, vdP.
The sheet resistance RS is derived by measurements of four-terminal electrical resistance performed on four electrical contacts placed on the boundary of the planar sample and calculated with a mathematical expression involving the two resistance measurements.
The measurement range for RS of the graphene samples with the method described in this document goes from 10−2 Ω/sq to 104 Ω/sq.
The method is applicable for CVD graphene provided it is transferred to quartz substrates or other insulating materials (quartz, SiO2 on Si), as well as graphene grown from silicon carbide.
The method is complementary to the in-line four-point-probe method (4PP, IEC 62607-6-8) for what concerns the measurement of the sheet resistance and can be applied when it is possible to reliably place contacts on the sample boundary, avoiding the sample being scratched by the 4PP.
The outcome of the van der Pauw method is independent of the contact position provided the sample is uniform, which is typically not true for graphene at this stage. This document considers the case of samples with non-strictly uniform conductivity distribution and suggests a way to consider the sample inhomogeneity as a component of the uncertainty on RS.
- Technical specification27 pagesEnglish languagesale 15% off
IEC TS 62565-5-1:2023, which is a Technical Specification, establishes a blank detail specification (BDS) for nanoporous activated carbon used for electrochemical capacitors.
Numeric values for the key control characteristics are left blank as they will be specified between customer and supplier in the detail specification (DS). In the DS key control characteristics can be added or removed if agreed between customer and supplier.
- Technical specification37 pagesEnglish languagesale 15% off
IEC TS 62607-6-8:2023 establishes a method to determine the key control characteristic sheet resistance RS [measured in ohm per square (Ω/sq)], by the in-line four-point probe method, 4PP.
The sheet resistance RS is derived by measurements of four-terminal electrical resistance performed on four electrodes placed on the surface of the planar sample.
The measurement range for RS of the graphene samples with the method described in this document goes from 10−2 Ω/sq to 104 Ω/sq.
The method is applicable for CVD graphene provided it is transferred to quartz substrates or other insulating materials (quartz, SiO2 on Si, as well as graphene grown from silicon carbide.
The method is complementary to the van der Pauw method (IEC 62607-6-7) for what concerns the measurement of the sheet resistance and can be useful when it is not possible to reliably place contacts on the sample boundary.
- Technical specification22 pagesEnglish languagesale 15% off
This document describes the characteristics of working suspensions of nano-objects to be considered when conducting in vitro assays to evaluate inherent nano-object toxicity. In addition, the document identifies applicable measurement methods for these characteristics. This document is applicable to nano-objects, and their aggregates and agglomerates greater than 100 nm. This document intends to help clarify whether observed toxic effects come from tested nano-objects themselves or from uncontrolled sources.
- Standard15 pagesEnglish languagesale 15% off
IEC TS 62565-1:2023 which is a Technical Specification, defines the system of blank detail specifications for nanomaterials and nano-assemblies as well as final nano-enabled products addressed in the nanomanufacturing value chain.
It defines the concepts of blank detail specification (BDS), detail specification (DS) and key control characteristic (KCC). Furthermore, it provides guidelines how to develop and use product specifications, particularly the IEC 62565 series, in the field of nanotechnology.
This document also provides guidelines regarding the certification and reliability aspects for products specified by a DS and associated KCCs.
NOTE 1 The IEC 62565 series uses an open generic structure that can be flexibly adapted to technical developments. The double indexing of the individual parts allows grouping into technology areas without restriction due to an overly strict hierarchical structure.
NOTE 2 Key elements of the IEC 62565 series are a consensus-based set of key control characteristics (KCCs) with clear definitions and standardized measurement procedures to measure them.
- Technical specification29 pagesEnglish languagesale 15% off
This document defines terms and definitions for different types of cellulose nanomaterials including secondary components found in cellulose nanomaterials originating from their manufacturing processes. This document also provides information on cellulose micromaterials in Annex B. Where necessary, terms from the ISO/IEC 80004 series are included in this document. Terms in this document are applicable to all types of cellulose nanomaterials, regardless of production methods and their origin (plants, animals, algae or bacteria).
- Technical specification9 pagesEnglish languagesale 15% off
This document describes minimum requirements for performance evaluation of applying fluorescent nanoparticles in quantitative immuno-histochemistry.
- Technical specification18 pagesEnglish languagesale 15% off
IEC TS 62607-6-17:2023 establishes a standardized method to determine the key control characteristic order parameter for graphene-based material and layered carbon material by X-ray diffraction (XRD) and transmission electron microscopy.
The order parameter is analysed from two perspectives: z-axis and x-y-axis. In the z-axis the order parameter is derived from the full width at half maximum (FWHM) of peak (002) in the XRD spectrum. In the x-y-axis, it is derived from the FWHM of peak (100) corresponding to diffraction patterns obtained by SAED (selected area electron diffraction) technique, which is routinely performed on most transmission electron microscopes in the world.
The method is applicable for graphene-based material and layered carbon material including graphite, expanded graphite, amorphous carbon, vitreous carbon or glassy carbon, the structures of which are clarified by other characterization techniques.
The method is applicable for differentiating few-layer graphene or reduced graphene oxide from layered carbon material.
Typical application area is quality control in manufacturing to ensure batch-to-batch reproducibility.
NOTE Graphene oxide, one type of graphene-based material, is not within the scope of this document.
- Technical specification24 pagesEnglish languagesale 15% off
This document specifies characteristics to be measured of magnetic beads in suspension and powder forms for nucleic acid extraction applications. This document deals with magnetic beads that contain a substantial amount of magnetic nanoparticles (which can be superparamagnetic). Potential applicable measurement methods are listed for the individual characteristics. Specifically, this document lists critical characteristics of magnetic beads and suspensions, and additional characteristics to describe the magnetic beads and the suspension for nucleic acid extraction.
Health, safety and environmental aspects of magnetic beads are not within the scope of this document.
- Technical specification23 pagesEnglish languagesale 10% offe-Library read for1 day
This document provides guidance and requirements for the determination of the mean (spherical) equivalent diameter of nano-objects (i.e. particles, droplets or bubbles) dispersed in liquids using the static multiple light scattering (SMLS) technique. The technique is applicable to a wide range of materials and does not require dilution of concentrated samples.
- Technical specification31 pagesEnglish languagesale 10% offe-Library read for1 day
This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope images and by obtaining and reporting accurate results.
This document applies to particles with a lower size limit that depends on the required uncertainty and on the suitable performance of the SEM, which is to be proven first -according to the requirements described in this document.
This document applies also to SEM-based size and shape measurements of larger than nanoscale particles.
- Standard80 pagesEnglish languagesale 10% offe-Library read for1 day
IEC TS 62607-6-2:2023 establishes a standardized method to determine the key control characteristic
- number of layers
for graphene flakes by a combination of
- atomic force microscopy,
- optical transmission, and
- Raman spectroscopy
- Technical specification24 pagesEnglish languagesale 15% off
This document specifies characteristics to be measured of magnetic beads in suspension and powder forms for nucleic acid extraction applications. This document deals with magnetic beads that contain a substantial amount of magnetic nanoparticles (which can be superparamagnetic). Potential applicable measurement methods are listed for the individual characteristics. Specifically, this document lists critical characteristics of magnetic beads and suspensions, and additional characteristics to describe the magnetic beads and the suspension for nucleic acid extraction.
Health, safety and environmental aspects of magnetic beads are not within the scope of this document.
- Technical specification23 pagesEnglish languagesale 10% offe-Library read for1 day
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This document provides guidance and requirements for the determination of the mean (spherical) equivalent diameter of nano-objects (i.e. particles, droplets or bubbles) dispersed in liquids using the static multiple light scattering (SMLS) technique. The technique is applicable to a wide range of materials and does not require dilution of concentrated samples.
- Technical specification31 pagesEnglish languagesale 10% offe-Library read for1 day
This document specifies methods of determining nanoparticle size and shape distributions by acquiring and evaluating scanning electron microscope images and by obtaining and reporting accurate results.
This document applies to particles with a lower size limit that depends on the required uncertainty and on the suitable performance of the SEM, which is to be proven first -according to the requirements described in this document.
This document applies also to SEM-based size and shape measurements of larger than nanoscale particles.
- Standard80 pagesEnglish languagesale 10% offe-Library read for1 day
This document specifies a method for assessing the peroxidase-like activity of metal and metal oxide nanoparticles by spectrophotometry. This document can serve as a reference for the measurements of peroxidase-like activities in other types of nanoparticles.
- Technical specification17 pagesEnglish languagesale 15% off
IEC TS 62607-6-18:2022(E) establishes a standardized method to determine the chemical key control characteristic
functional groups for functionalized graphene-based material and graphene oxide by
thermogravimetry analysis (TGA) coupled with Fourier transform infrared spectroscopy (FTIR), referred to as TGA-FTIR. The content of functional groups is derived by changes in mass of the sample as a function of temperature using TGA. Materials evolved during these mass changes are then analysed using coupled FTIR to identify functional groups.
The functional groups determined according to this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder.
The method is applicable for functionalized graphene powder and graphene oxide that can be pyrolysed and gasified with elevated temperature during TGA.
Typical application areas are quality control for graphene manufacturers, and product selection for downstream users.
- Technical specification19 pagesEnglish languagesale 15% off
IEC TS 62607-6-5:2022(E) establishes a standardized method to determine the key control characteristics
contact resistance, and
sheet resistance for graphene-based materials and other two-dimensional materials by a
transmission line measurement. The method uses test structures applied to the 2D material by photolithographic methods consisting of several metal electrodes with increasing spacing between the electrodes. By a measurement of the voltage drop between different pairs of electrodes, sheet resistance and contact resistance can be calculated.
The method can be applied to any other two-dimensional materials which are subject to electrical metal contact on top of the materials.
The method provides accurate and reproducible results, if the electrical contact formed between the two-dimensional material and the metal electrodes provides ohmic contact property.
- Technical specification23 pagesEnglish languagesale 15% off
This document describes the performance characteristics necessary to evaluate the detection performance of nanosensors for chemical and biomolecule detection. This document does not cover the analytical performance characteristics or the performance evaluation procedure of a specific sensor.
- Technical specification10 pagesEnglish languagesale 15% off
IEC TS 62607-5-4:2022 specifies the measuring method of the band gap energy of a nanomaterial using electron energy loss data of transmission electron microscope.
The method specified in this document is applicable to semiconducting and insulating nanomaterials to estimate the band gap.
The measurement to get reliable data is performed under the consistent conditions of TEM observation and specimen thickness. The applicable measurement range of band gap energy is more than 2 eV.
- Technical specification18 pagesEnglish languagesale 15% off
IEC TS 62607:2022 establishes a standardized method to determine the key control characteristic
carrier concentration for semiconducting two-dimensional materials by the
field effect transistor (FET) method. For semiconducting two-dimensional materials, the carrier concentration is evaluated using a field effect transistor (FET) test by a measurement of the voltage shift obtained from transfer curve upon doping process. The FET test structure consists of three terminals of source, drain, and gate where voltage is applied to induce the transistor action. Transfer curves are obtained by measuring drain current while applying varied gate voltage and constant drain voltage with respect to the source which is grounded.
- Technical specification23 pagesEnglish languagesale 15% off
This document describes and specifies the requirements of a simplified Sustainability Nanomanufacturing Framework (SNF) for sustainability management in Nanomanufacturing Pilot Lines (NPLs), appropriate to their size, management capabilities and sustainability priorities.
The SNF sets up the basic requirements for a screening methodology to quicky assess the sustainability of a NPL. It provides guidance for diagnosis, implementation, and monitoring, to proactively improve nano-sustainability performances in NPLs, considering its sustainability management and results.
The model can be used by NPLs to achieve its intended outcomes in the field of nano-sustainability.
The SNF is intended to be applied to any NPL regardless of its size, type and activities. Similarly, the model could be scaled to manage the sustainability of a manufacturing area/plant that integrates multiple NPLs.
This document can be used in whole or in part to systematically improve the sustainability in NPLs.
- Standardization document94 pagesEnglish languagesale 10% offe-Library read for1 day
- Technical report94 pagesEnglish languagesale 10% offe-Library read for1 day
IEC TS 62607-2-5:2022 specifies the protocols for determining the mass density of vertically-aligned carbon nanotubes (VACNTs) by X-ray absorption method. This document outlines experimental procedures, data formats, and some case studies. These protocols are applicable to VACNT films with thickness larger than several tens of micrometres. There are no limitations in materials for substrate.
- Technical specification20 pagesEnglish languagesale 15% off
IEC TS 62607-6-22:2022 establishes a standardized method to determine the key control characteristic
ash content of powder and dispersion of graphene-based material by
incineration. The ash content is derived by residue obtained after incineration under the operating conditions specified in this document, being divided by the mass of the dried test portion.
The method is applicable for graphene, graphene oxide and reduced graphene oxide in forms of both dry powder and dispersion. This document can be used as reference for graphite oxide and other modified graphene.
Typical application areas of this method are research, manufacturer and downstream user to guide material processing and quality control.
- Technical specification22 pagesEnglish languagesale 15% off
This document describes and specifies the requirements of a simplified Sustainability Nanomanufacturing Framework (SNF) for sustainability management in Nanomanufacturing Pilot Lines (NPLs), appropriate to their size, management capabilities and sustainability priorities.
The SNF sets up the basic requirements for a screening methodology to quicky assess the sustainability of a NPL. It provides guidance for diagnosis, implementation, and monitoring, to proactively improve nano-sustainability performances in NPLs, considering its sustainability management and results.
The model can be used by NPLs to achieve its intended outcomes in the field of nano-sustainability.
The SNF is intended to be applied to any NPL regardless of its size, type and activities. Similarly, the model could be scaled to manage the sustainability of a manufacturing area/plant that integrates multiple NPLs.
This document can be used in whole or in part to systematically improve the sustainability in NPLs.
- Standardization document94 pagesEnglish languagesale 10% offe-Library read for1 day
- Technical report94 pagesEnglish languagesale 10% offe-Library read for1 day
IEC TS 62607-6-20:2022 (EN) IEC TS 62607 establishes a standardized method to determine the chemical key control characteristic
- metallic impurity content
for powders of graphene-based materials by
- inductively coupled plasma mass spectrometry (ICP-MS).
The metallic impurity content is derived by the signal intensity of measured elements through MS spectrum of ICP-MS.
- The method is applicable for powder of graphene and related materials, including bilayer graphene (2LG), trilayer graphene (3LG), few-layer graphene (FLG), reduced graphene oxide (rGO) and graphene oxide (GO).
– The typical application area is in the microelectronics industry, e.g. conductive pastes, displays, etc., for manufacturers to guide material design, and for downstream users to select suitable products.
- Technical specification28 pagesEnglish languagesale 15% off
This document specifies requirements and recommendations for the identification of measurands to characterize nano-objects and their agglomerates and aggregates, and to assess specific properties relevant to the performance of materials that contain them. It provides recommendations for relevant measurement.
- Technical specification79 pagesEnglish languagesale 10% offe-Library read for1 day
IEC TS 62607-6-21:2022 establishes a standardized method to determine the chemical key control characteristics
- elemental composition, and
- C/O ratio
for powders of graphene-based materials by
- X-ray photoelectron spectroscopy (XPS).
The elemental composition (species and relative abundance) is derived by the elemental binding energy and integral peak area at corresponding portion of XPS spectrum.
- The elemental composition refers to main elements in graphene powders, typically including carbon (C), oxygen (O), nitrogen (N), sulfur (S) , chloride (Cl) and silicon (Si).
- This document is applicable to graphene powders consisting of graphene, bilayer graphene (2LG), trilayer graphene (3LG), few-layer graphene (FLG), graphene nanoplate (GNP), reduced graphene oxide (rGO), graphene oxide (GO), and functionalized graphene powders.
- Typical application areas are the microelectronics and thermal management industries, e.g. batteries, integrated circuits, high-frequency electronics. This document can be used by manufacturers in research and development and by downstream users for product selection.
- Technical specification27 pagesEnglish languagesale 15% off
This document specifies requirements and recommendations for the identification of measurands to characterize nano-objects and their agglomerates and aggregates, and to assess specific properties relevant to the performance of materials that contain them. It provides recommendations for relevant measurement.
- Technical specification79 pagesEnglish languagesale 10% offe-Library read for1 day
This document specifies how to capture, measure and analyse transmission electron microscopy images to obtain particle size and shape distributions in the nanoscale.
This document broadly is applicable to nano-objects as well as to particles with sizes larger than 100 nm. The exact working range of the method depends on the required uncertainty and on the performance of the transmission electron microscope. These elements can be evaluated according to the requirements described in this document.
- Standard92 pagesEnglish languagesale 10% offe-Library read for1 day
- Draft93 pagesGerman languagesale 10% offe-Library read for1 day
This document provides a reliable and repeatable method for simultaneous assessment of both exposure and toxicity of manufactured nano-objects (MNOs) using Tetrahymena sp. The ingested, internalized material (MNOs) indicates aquatic exposure. This document is intended to be used by all the centers working with nano(eco)toxicity of MNOs and capable of culturing of Tetrahymena sp. The method uses Tetrahymena sp. to assess exposure and effects of MNOs. In addition, the test can be used by centers (laboratories) interested in investigating the biological interaction of MNOs with living cells. This method is applicable to nano-objects such as nanoparticles, nanofibres of certain size (in a µm size range), nanoplates, as well as their aggregates and agglomerates.
- Technical specification14 pagesEnglish languagesale 15% off