17.040.40 - Geometrical Product Specification (GPS)
ICS 17.040.40 Details
Geometrical Product Specification (GPS)
Spécification géométrique des produits (GPS)
Specifikacija geometrijskih veličin izdelka (GPS)
General Information
This document specifies the calibration and adjustment of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISOÂ 3274. The calibration and adjustment is intended to be carried out with the aid of measurement standards.
Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.
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This document specifies the rules for indication of surface texture by profile methods in technical
product documentation by means of graphical symbols.
This document does not cover population requirements.
NOTE See ISO 18391 for population (batch) specifications.
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This document specifies the calibration and adjustment of the metrological characteristics of contact
(stylus) instruments for the measurement of surface texture by the profile method as defined in
ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement
standards.
Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator
contact (stylus) instruments which do not conform with ISO 3274.
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This document specifies the complete specification operator for surface texture by profile methods.
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This document specifies parameters for the determination of surface texture by areal methods
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This document specifies terms, definitions and parameters for the determination of surface texture by
profile methods.
NOTE 1 The main changes to previous ISO profile documents are described in Annex I.
NOTE 2 An overview of profile and areal standards in the GPS matrix model is given in Annex J.
NOTE 3 The relation of this document to the GPS matrix model is given in Annex K.
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This document specifies terms, definitions and parameters for the determination of surface texture by profile methods. NOTE 1   The main changes to previous ISO profile documents are described in Annex I. NOTE 2   An overview of profile and areal standards in the GPS matrix model is given in Annex J. NOTE 3   The relation of this document to the GPS matrix model is given in Annex K.
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This document specifies the complete specification operator for surface texture by profile methods.
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This document specifies the rules for indication of surface texture by profile methods in technical product documentation by means of graphical symbols. This document does not cover population requirements. NOTEÂ Â Â Â Â Â See ISO 18391 for population (batch) specifications.
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This part of ISO 10360 specifies the acceptance tests for verifying the performance of an optical CMS
(coordinate measuring system) when measuring lengths as stated by the manufacturer. It also
specifies the reverification tests that enable the user to periodically reverify the performance of the
optical 3D CMS. An optical 3D CMS that this standard intends to specify is a contactless area
measuring sensor delivering 3D surface data in several individual single views by an optical measuring
principle and transforming it into a common coordinate system. Typical optical measuring principles are
pattern projection, fringe projection, and project-and-sweep a scanned line, or similar, delivering single
views without assistance of external information related to position and orientation between CMS and
objects to be scanned. Typical registration principle is based on a best fitting of commonly captured
position information across at least two different single views either or both by using reference targets
or surface features of objects to be scanned.
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This document specifies the acceptance tests for verifying the performance of a laser tracker by
measuring calibrated test lengths, according to the specifications of the manufacturer. It also specifies
the reverification tests that enable the user to periodically reverify the performance of the laser tracker.
The acceptance and reverification tests given in this document are applicable to laser trackers utilizing
a retroreflector, or a retroreflector in combination with a stylus or optical distance sensor, as a probing
system. Laser trackers that use interferometric measurement (IFM), absolute distance measurement
(ADM) or both can be verified using this document. This document can also be used to specify and
verify the relevant performance tests of other spherical coordinate measurement systems that use
cooperative targets, such as “laser radar” systems.
NOTE Systems which do not track the target, such as laser radar systems, will not be tested for probing
performance.
This document does not explicitly apply to measuring systems that do not use a spherical coordinate
system. However, interested parties can apply this document to such systems by mutual agreement.
This document specifies:
— performance requirements that can be assigned by the manufacturer or the user of the laser tracker;
— the manner of execution of the acceptance and reverification tests to demonstrate the stated
requirements;
— rules for proving comformity;
— applications for which the acceptance and reverification tests can be used.
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This document specifies the acceptance tests for verifying the performance of an optical 3D coordinate measuring system (CMS) when measuring lengths as stated by the manufacturer. It also specifies the reverification tests that enable the user to periodically reverify the performance of the optical 3D CMS. This document is applicable to verification of the measuring performance of CMSs if the surface characteristics (e.g. glossiness, colour) of the object to be scanned are restricted and within a cooperative range. This document does not apply to other types of CMSs, including those covered by the other parts of the ISO 10360 series.
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This document defines the maximum material requirement (MMR), the least material requirement
(LMR) and the reciprocity requirement (RPR). These requirements can only be applied to linear
features of size of cylindrical type or two parallel opposite planes type.
These requirements are often used to control specific functions of workpieces where size and geometry
are interdependent, for example to fulfil the functions “assembly of parts” (for MMR) or “minimum wall
thickness” (for LMR). However, the MMR and LMR can also be used to fulfil other functional design
requirements.
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This document gives the rules of definition and interpretation of general specifications defined
according to ISO 8015 (general tolerancing) applicable on the whole workpiece.
The general specifications can be applied to integral surfaces only, i.e. integral lines are
excluded.
The general geometrical and dimensional specifications defined in this document applies to the
following:
- for dimensional specifications:
- for features of size:
- linear size (±) (according to ISO 14405-1);
- angular size (±)(according to ISO 14405-3);
- for geometrical specifications:
- for integral features:
- geometrical specifications with the characteristic surface profile (⌓).
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This document gives rules for definition and interpretation of general geometrical specifications and general size specifications defined according to ISO 8015:2011, 5.12. General specifications defined in other standards, and the link to these standards, are not covered by this document. The general geometrical specifications and general size (linear or angular) specifications defined in this document apply only to integral features (including features of size). These specifications do not apply to derived features or integral lines (see ISO 17450-1 for the definitions of integral features and derived features). Dimensions other than linear or angular sizes (see ISO 14405-2) are not covered by this document.
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This document provides an unambiguous calculation of parameters PSm, RSm, WSm and Pc, Rc, Wc, as defined in ISO 4287, by means of a flowchart.
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This document specifies the dimensional and geometrical characteristics, boundary dimensions and tolerances of insert bearings and eccentric locking collars and the radial internal clearances of insert bearings.
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This document specifies the most important design and metrological characteristics of calliper
depth gauges
— with analogue indication: vernier scale or circular scale (dial); and
— with digital indication: digital display.
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This document specifies biorthogonal wavelets for profiles and contains the relevant concepts. It gives
the basic terminology for biorthogonal wavelets of compact support, together with their usage.
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This document specifies acceptance and periodic reverification tests of CMM performance with
contacting probing systems and is only applicable to CMMs using:
— any type of contacting probing system; and
— spherical or hemispherical stylus tip(s).
NOTE CMM probing performance tests are specified by the maximum permissible errors (MPEs), due to the
impracticality of isolating the performance of the probing system from that of the CMM, even on a small artefact
such as a test sphere.
This document applies to CMMs supplied with any of the following:
a) single-stylus probing systems;
b) multi-stylus probing systems with fixed multiple styli attached to a single probe (e.g. “star” stylus);
c) multiple probing systems such as those with a stylus for each of their probes;
d) systems with articulating probing systems;
e) stylus and probe changing systems;
f) manual (non-driven) and automated CMMs;
g) installations including a scanning probe, capable of being used in a scanning mode.
This document is not applicable to non-contacting probing systems, which require different testing
procedures.
The term ‘combined CMM and multi-stylus probing system size error’ has been shortened to ‘multistylus
size error’ for convenience. This applies in similar cases.
If it is desirable to isolate the probing system performance as far as is practical, the influence of the
CMM can be minimized but not eliminated. See Annex C for more information.
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This document specifies acceptance and periodic reverification tests of CMM performance with contacting probing systems and is only applicable to CMMs using:
— any type of contacting probing system; and
— spherical or hemispherical stylus tip(s).
NOTE CMM probing performance tests are specified by the maximum permissible errors (MPEs), due to the impracticality of isolating the performance of the probing system from that of the CMM, even on a small artefact such as a test sphere.
This document applies to CMMs supplied with any of the following:
a) single-stylus probing systems;
b) multi-stylus probing systems with fixed multiple styli attached to a single probe (e.g. "star" stylus);
c) multiple probing systems such as those with a stylus for each of their probes;
d) systems with articulating probing systems;
e) stylus and probe changing systems;
f) manual (non-driven) and automated CMMs;
g) installations including a scanning probe, capable of being used in a scanning mode.
This document is not applicable to non-contacting probing systems, which require different testing procedures.
The term ?combined CMM and multi-stylus probing system size error' has been shortened to ?multi-stylus size error' for convenience. This applies in similar cases.
If it is desirable to isolate the probing system performance as far as is practical, the influence of the CMM can be minimized but not eliminated. See Annex C for more information.
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A transition is an areal feature connecting two adjacent features, for which the intersection is a line. The transition includes portions of the adjacent features. This document defines a number of specification operators for the specification of defined transitions. These specifications all apply to any line in a defined direction in the transition feature. It also defines the specification modifiers and the drawing indications for such transition specifications.
The proportions and dimensions of the graphical symbols to be used are also specified.
This document provides a set of tools to express several defined transition specifications. It does not present any information on the relationship between a function or a use and a defined transition specification.
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This document provides the most important design and metrological characteristics of callipers - with analogue indication: vernier scale or circular scale (dial), and - with digital indication: digital display.
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This part of ISO 25178 deals with geometrical defects that may be present on the surfaces of material measures and calibration specimens conforming to ISO 5436-1 and ISO 25178-70. It defines classes of these geometrical defects, and defines terms for ways of responding to these defects.
This part of ISO 25178 is applicable as follows:
a) to help customers and users of material measures for surface metrology specify their nominal features (ideal geometrical properties) when purchasing them from manufacturers and suppliers;
b) to enable users of material measures to formulate their own rules and policies for responding to the occurrence of defects in such a way as to minimise the uncertainty of their own measurements.
c) to enable calibration laboratories and their customers to agree a common policy on how to treat defects on a material measure that has been sent for calibration;
d) to educate users of material measures about the different significance and importance of different kinds of defect;
e) for other GPS standards which make reference to the issue of selection of measuring locations, or selection of areas to be measured or to be avoided in measurement.
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This document defines classes of geometrical defects that might be present on the surfaces of material measures and calibration specimens conforming to ISO 5436-1 and ISO 25178-70, and defines terms for ways of responding to these defects.
This document is applicable as follows:
a) to help customers and users of material measures for surface metrology specify their nominal features (ideal geometrical properties) when obtaining them from manufacturers and suppliers;
b) to enable users of material measures to formulate their own rules and policies for responding to the occurrence of defects in such a way as to minimize the uncertainty of their own measurements;
NOTE Such policies are required in ISO/IEC 17025:2017, 7.2.1.1, 7.2.1.3, 7.3.1 and 7.8.5 c) and d), for example.
c) to enable calibration laboratories and their customers to agree on a common policy on how to treat defects on a material measure that has been sent for calibration;
d) to educate users of material measures about the different significance and importance of different kinds of defect;
e) for other GPS standards which make reference to the issue of selection of measuring locations, or selection of areas to be measured or avoided in measurement.
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This Standard describes principles and tools to control a manufacturing process in accordance with a GPS specification. It establishes that the result of a GPS specification, consisting of one value, is not sufficient to control a manufacturing process. For this purpose it is necessary to use a set of one or more complementary, independent characteristics that correlate to the manufacturing process parameters.
This Standard describes the concept of decomposition of the macro-geometrical part of the GPS specification. It does not cover the micro-geometry, i.e. surface texture.
The objective of the decomposition presented in this standard is to define correction values for manufacturing control or to perform a statistical analysis of the process.
- Standard28 pagesEnglish languagesale 10% offe-Library read for1 day
This document defines classes of geometrical defects that might be present on the surfaces of material measures and calibration specimens conforming to ISO 5436-1 and ISO 25178-70, and defines terms for ways of responding to these defects. This document is applicable as follows: a) to help customers and users of material measures for surface metrology specify their nominal features (ideal geometrical properties) when obtaining them from manufacturers and suppliers; b) to enable users of material measures to formulate their own rules and policies for responding to the occurrence of defects in such a way as to minimize the uncertainty of their own measurements; NOTE Such policies are required in ISO/IEC 17025:2017, 7.2.1.1, 7.2.1.3, 7.3.1 and 7.8.5 c) and d), for example. c) to enable calibration laboratories and their customers to agree on a common policy on how to treat defects on a material measure that has been sent for calibration; d) to educate users of material measures about the different significance and importance of different kinds of defect; e) for other GPS standards which make reference to the issue of selection of measuring locations, or selection of areas to be measured or avoided in measurement.
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This document describes principles and tools to control a manufacturing process in accordance with a GPS specification. For this purpose a set of one or more complementary, independent characteristics (size, form, orientation, and location characteristics independent to each other) that correlate to the manufacturing process parameters and to the manufacturing process coordinate system established from the manufacturing datum system are used.
This document describes the concept of decomposition of the macro-geometrical part of the GPS specification. It does not cover the micro-geometry, i.e. surface texture.
The objective of the decomposition presented in this document is to define correction values for manufacturing control or to perform a statistical analysis of the process.
- Standard28 pagesEnglish languagesale 10% offe-Library read for1 day
This document describes the influence quantities and instrument characteristics of confocal
microscopy systems for areal measurement of surface topography. Because surface profiles can be
extracted from surface topography images, the methods described in this document can be applied to
profiling measurements as well.
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This document specifies the metrological characteristics of areal instruments for measuring surface
topography. Because surface profiles can be extracted from surface topography images, most of the
terms defined in this document can also be applied to profiling measurements.
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This document describes principles and tools to control a manufacturing process in accordance with a GPS specification. For this purpose a set of one or more complementary, independent characteristics (size, form, orientation, and location characteristics independent to each other) that correlate to the manufacturing process parameters and to the manufacturing process coordinate system established from the manufacturing datum system are used. This document describes the concept of decomposition of the macro-geometrical part of the GPS specification. It does not cover the micro-geometry, i.e. surface texture. The objective of the decomposition presented in this document is to define correction values for manufacturing control or to perform a statistical analysis of the process.
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This document illustrates the ambiguity caused by the use of dimensional specifications to control
properties other than linear or angular size and the benefit of using geometrical specifications instead.
Dimensional tolerancing can be indicated by ± tolerancing or geometrical specifications.
The ambiguity caused by using ± tolerances for dimensions other than linear or angular sizes (for
individual tolerances and general tolerances according to, e.g. ISO 2768-1 and ISO 8062-3) is explained
in Annex A.
NOTE 1 The figures, as shown in this document, merely illustrate the text and are not intended to reflect
actual usage. The figures are consequently simplified to indicate only the relevant principles.
NOTE 2 For indications of dimensional specifications, see the following:
— ISO 14405-1 for linear size;
— ISO 14405-3 for angular size;
— ISO 2538-1 and ISO 2538-2 for wedges;
— ISO 3040 for cones.
NOTE 3 The rules for geometrical specifications are given in ISO 1101.
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This document specifies the general requirements, calibration, terms and definitions of characteristics
of GPS measuring equipment, for example micrometers, callipers, gauge blocks and rotary axis form
measuring instruments. This document forms the basis for standards defining and describing the
design characteristics and metrological characteristics for measuring equipment and gives guidance
for the development and content of standards for GPS measuring equipment.
This document is intended to ease the communication between manufacturer/supplier and customer/
user and to make the specification phase of GPS measuring equipment more accurate. This document
is also intended as a tool to be used in companies in the process of defining and selecting relevant
characteristics for measuring equipment.
This document includes terms which are frequently used in connection with the characterization of
specific measuring equipment.
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This document establishes complementary rules to ISO 1101 to be applied to pattern specifications and
defines rules to combine individual specifications, for geometrical specifications e.g. using the symbols
POSITION, SYMMETRY, LINE PROFILE and SURFACE PROFILE, as well as STRAIGHTNESS (in the case
where the toleranced features are nominally coaxial) and FLATNESS (in the case where the toleranced
features are nominally coplanar) as listed in Annex C.
These rules apply when a set of tolerance zones are grouped together with location or orientation
constraints, through the use of the CZ, CZR or SIM modifiers.
This document does not cover the use of the pattern specifications when the least and maximum
material requirement is applied (see ISO 2692).
This document does not cover the establishment of common datum (see ISO 5459) based on pattern
features.
- Standard52 pagesEnglish languagesale 10% offe-Library read for1 day
This document establishes complementary rules to ISO 1101 to be applied to pattern specifications and defines rules to combine individual specifications, for geometrical specifications e.g. using the symbols POSITION, SYMMETRY, LINE PROFILE and SURFACE PROFILE, as well as STRAIGHTNESS (in the case where the toleranced features are nominally coaxial) and FLATNESS (in the case where the toleranced features are nominally coplanar) as listed in Annex C.
These rules apply when a set of tolerance zones are grouped together with location or orientation constraints, through the use of the CZ, CZR or SIM modifiers.
This document does not cover the use of the pattern specifications when the least and maximum material requirement is applied (see ISO 2692).
This document does not cover the establishment of common datum (see ISO 5459) based on pattern features.
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ISO/TS 21619:2018 specifies the basic types of documents with geometrical product specifications (GPS), their relationship and their related terms and definitions.
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This part of ISO 17450 gives general rules for building the GPS characteristics: size characteristics and geometrical characteristics. It defines a set of GPS characteristics (size characteristic and geometrical characteristic), which can be taken as default GPS characteristic or as special GPS characteristic, depending to the drawing indication, which is not a part of this standard. Moreover, this part of ISO 17450 presents a way to control the manufacturing process parameters by decomposition of a specified characteristic in a set of one or more characteristics.
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ISO 17450-4:2017 specifies general rules for quantifying GPS deviations for individual GPS characteristics.
NOTE GPS deviations can be local or global. A GPS characteristic defined from local GPS deviations is a parameter that transforms the set of local deviations into a global characteristic using a quantifying function (for more details, see Table 1).
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This document establishes the rules for verifying the conformity or nonconformity with a given
tolerance for a characteristic of a workpiece (or a population of workpieces) or with a given maximum
permissible errors for a metrological characteristic of a measuring equipment, including when the
measured value falls close to the specification limits, taking measurement uncertainty into account.
This document applies to specifications defined in general GPS standards (see ISO 14638), i.e. standards
prepared by ISO/TC 213, including:
— workpiece specifications and population specifications (usually given as an upper specification
limit or a lower specification limit or both);
— measuring equipment specifications (usually given as maximum permissible errors).
This document only applies for characteristics and maximum permissible errors expressed as
quantity values.
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ISO 17450-4:2017 specifies general rules for quantifying GPS deviations for individual GPS characteristics. NOTE GPS deviations can be local or global. A GPS characteristic defined from local GPS deviations is a parameter that transforms the set of local deviations into a global characteristic using a quantifying function (for more details, see Table 1).
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ISO 14253-1:2017 establishes the rules for verifying the conformity or nonconformity with a given tolerance for a characteristic of a workpiece (or a population of workpieces) or with a given maximum permissible errors for a metrological characteristic of a measuring equipment, including when the measured value falls close to the specification limits, taking measurement uncertainty into account.
ISO 14253-1:2017 applies to specifications defined in general GPS standards (see ISO 14638), i.e. standards prepared by ISO/TC 213, including:
- workpiece specifications and population specifications (usually given as an upper specification limit or a lower specification limit or both);
- measuring equipment specifications (usually given as maximum permissible errors).
ISO 14253-1:2017 only applies for characteristics and maximum permissible errors expressed as quantity values.
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This document defines Type S1 and Type S2 software measurement standards (etalons) for verifying
the software of measuring instruments. It also defines the file format of Type S1 software measurement
standards for the calibration of instruments for the measurement of surface texture by the areal
method as defined in the areal surface texture chain of standards, chain link G.
NOTE Throughout this document, the term “softgauge” is used as a substitute for “software measurement
standard Type S1”.
- Standard19 pagesEnglish languagesale 10% offe-Library read for1 day
ISO 14253-1:2017 establishes the rules for verifying the conformity or nonconformity with a given tolerance for a characteristic of a workpiece (or a population of workpieces) or with a given maximum permissible errors for a metrological characteristic of a measuring equipment, including when the measured value falls close to the specification limits, taking measurement uncertainty into account. ISO 14253-1:2017 applies to specifications defined in general GPS standards (see ISO 14638), i.e. standards prepared by ISO/TC 213, including: - workpiece specifications and population specifications (usually given as an upper specification limit or a lower specification limit or both); - measuring equipment specifications (usually given as maximum permissible errors). ISO 14253-1:2017 only applies for characteristics and maximum permissible errors expressed as quantity values.
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ISO 25178-71:2017 defines Type S1 and Type S2 software measurement standards (etalons) for verifying the software of measuring instruments. It also defines the file format of Type S1 software measurement standards for the calibration of instruments for the measurement of surface texture by the areal method as defined in the areal surface texture chain of standards, chain link G.
NOTE Throughout ISO 25178-71:2017, the term "softgauge" is used as a substitute for "software measurement standard Type S1".
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This document defines the XML file format x3p for storage and exchange of topography and profile data.
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ISO 25178-72:2017 defines the XML file format x3p for storage and exchange of topography and profile data.
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SIST EN ISO 1101 defines the symbol language for geometrical specification of workpieces and the rules for its interpretation. It provides the foundation for geometrical specification. The illustrations in this document are intended to illustrate how a specification can be fully indicated with visible annotation (including e.g. TEDs).
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