This part of IEC 61788 is applicable to the measurement of the dark count rate (DCR, RD) of
superconductor strip photon detectors (SSPDs). It specifies terms, definitions, symbols and the
measurement method of DCR that depends on the bias current (Ib) and operating temperature
(T).
NOTE The data of measurement results in Annex A are based on measurements of one institute only. The standard
will be updated after the data of a complete round robin test are available.

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IEC 61788-22-3:2022 is applicable to the measurement of the dark count rate (DCR, RD) of superconductor strip photon detectors (SSPDs). It specifies terms, definitions, symbols and the measurement method of DCR that depends on the bias current (Ib) and operating temperature (T). NOTE The data of measurement results in Annex A are based on measurements of one institute only. The standard will be updated after the data of a complete round robin test are available.

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IEC 61788-22-3:2022 is applicable to the measurement of the dark count rate (DCR, RD) of superconductor strip photon detectors (SSPDs). It specifies terms, definitions, symbols and the measurement method of DCR that depends on the bias current (Ib) and operating temperature (T).
NOTE The data of measurement results in Annex A are based on measurements of one institute only. The standard will be updated after the data of a complete round robin test are available.

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This part of IEC 61788 is applicable to high-Tc Josephson junctions. It specifies terms,
definitions, symbols and the measurement and estimation method for normal state resistance
(Rn) and intrinsic critical current (Ici), based on a combination of selecting a data set from
measured U–I curves with a geometric mean criterion and fitting a hyperbolic function to that
data set.

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This part of IEC 61788 is applicable to high-Tc Josephson junctions. It specifies terms, definitions, symbols and the measurement and estimation method for normal state resistance (Rn) and intrinsic critical current (Ici), based on a combination of selecting a data set from measured U-I curves with a geometric mean criterion and fitting a hyperbolic function to that data set.

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This part of IEC 61788 addresses a test method for the determination of the residual resistance
ratio (RRR), rRRR, of cavity-grade niobium. This method is intended for high-purity niobium
grades with 150 < rRRR < 600. The test method is valid for specimens with rectangular or round
cross-section, cross-sectional area greater than 1 mm2 but less than 20 mm2, and a length not
less than 10 nor more than 25 times the width or diameter.

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IEC 61788-22-2:2021 is applicable to high-Tc Josephson junctions. It specifies terms, definitions, symbols and the measurement and estimation method for normal state resistance (Rn) and intrinsic critical current (Ici), based on a combination of selecting a data set from measured U–I curves with a geometric mean criterion and fitting a hyperbolic function to that data set.

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IEC 61788-25:2018 specifies the test method and procedures for testing tensile mechanical properties of REBCO superconductive composite tapes at room temperature. This test is used to measure the modulus of elasticity and 0,2 % proof strength. The values for elastic limit, fracture strength and percentage elongation after fracture serve only as a reference. This document applies to samples having a rectangular cross-section with an area of 0,12 mm2 to 6,0 mm2 (corresponding to the tapes with width of 2,0 mm to 12,0 mm and thickness of 0,06 mm to 0,5 mm)

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This part of IEC 61788 addresses a test method for the determination of the residual resistance ratio (RRR), rRRR, of cavity-grade niobium. This method is intended for high-purity niobium grades with 150 < rRRR < 600. The test method is valid for specimens with rectangular or round cross-section, cross-sectional area greater than 1 mm2 but less than 20 mm2, and a length not less than 10 nor more than 25 times the width or diameter.

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IEC 61788-23:2021 is available as IEC 61788-23:2021 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61788-23:2021 addresses a test method for the determination of the residual resistance ratio (RRR), rRRR, of cavity-grade niobium. This method is intended for high-purity niobium grades with 150 < rRRR < 600. The test method is valid for specimens with rectangular or round cross-section, cross-sectional area greater than 1 mm2 but less than 20 mm2, and a length not less than 10 nor more than 25 times the width or diameter.

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IEC 61788-24:2018 describes a test method for determining the retained critical current after double bending at room temperature of short and straight Ag- and/or Ag alloy-sheathed Bi-2223 superconducting wires that have the shape of a flat or square tape containing mono- or multicores of oxides. The wires can be laminated with copper alloy, stainless steel or Ni alloy tapes. The test method is intended for use with superconductors that have a critical current less than 300 A and an n-value larger than 5.

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This part of IEC 61788 specifies the measurements of the local critical current density (Jc) and
its distribution in large-area high-temperature superconducting (HTS) films by an inductive
method using third-harmonic voltages. The most important consideration for precise
measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion
and obtain current-voltage characteristics from its frequency dependence. Although it is
possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is
limited to the measurement without DC magnetic fields.
This technique intrinsically measures the critical sheet current that is the product of Jc and the
film thickness d. The range and measurement resolution for Jcd of HTS films are as follows.
– Jcd: from 200 A/m to 32 kA/m (based on results, not limitation).
– Measurement resolution: 100 A/m (based on results, not limitation).

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IEC 61788-23:2018 addresses a test method for the determination of the residual resistance ratio (RRR) of cavity-grade niobium. The test method should be valid for specimens with rectangular or round cross-section, cross-sectional area greater than 1 mm2 but less than 20 mm2, and a length not less than 10 nor more than 25 times the width or diameter.

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IEC 61788-17:2021 is available as IEC 61788-17:2021 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61788-17:2021 specifies the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows. - Jcd: from 200 A/m to 32 kA/m (based on results, not limitation). - Measurement resolution: 100 A/m (based on results, not limitation).

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IEC 61788-17:2021 is available as IEC 61788-17:2021 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61788-17:2021 specifies the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows.
- Jcd: from 200 A/m to 32 kA/m (based on results, not limitation).
- Measurement resolution: 100 A/m (based on results, not limitation).

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This document specifies the requirements for the test methods for joint of micro-joining of 2G HTS to
fulfil the requirements of ISO 17279-1 and ISO 17279-2.
This document specifies test methods for determining the capability of joints for the production of the
specified quality. It defines specific test requirements, but does not assign those requirements to any
specific product group.

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This part of IEC 61788 specifies a test method for determining the DC critical current of short
RE (rare earth)-Ba-Cu-O (REBCO) composite superconductor specimens that have a shape of
straight flat tape. This document applies to test specimens shorter than 300 mm and having a
rectangular cross section with an area of 0,03 mm2 to 7,2 mm2, which corresponds to tapes
with width ranging from 1,0 mm to 12,0 mm and thickness from 0,03 mm to 0,6 mm.
This method is intended for use with superconductor specimens that have critical current less
than 300 A and n-values larger than 5 under standard test conditions: the test specimen is
immersed in liquid nitrogen bath at ambient pressure without external magnetic field during the
testing. Deviations from this test method that are allowed for routine tests and other specific
restrictions are given in this document.

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IEC 61788-22-1:2017(E) describes general items concerning the specifications for superconducting sensors and detectors, which are the basis for specifications given in other parts of IEC 61788 for various types of sensors and detectors. The sensors and detectors described are basically made of superconducting materials and depend on superconducting phenomena or related phenomena. The objects to be measured (measurands) include magnetic fields, electromagnetic waves, photons of various energies, electrons, ions, a‑particles, and others.

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IEC 61788-26:2020 specifies a test method for determining the DC critical current of short RE (rare earth)-Ba-Cu-O (REBCO) composite superconductor specimens that have a shape of straight flat tape. This document applies to test specimens shorter than 300 mm and having a rectangular cross section with an area of 0,03 mm2 to 7,2 mm2, which corresponds to tapes with width ranging from 1,0 mm to 12,0 mm and thickness from 0,03 mm to 0,6 mm. This method is intended for use with superconductor specimens that have critical current less than 300 A and n-values larger than 5 under standard test conditions: the test specimen is immersed in liquid nitrogen bath at ambient pressure without external magnetic field during the testing. Deviations from this test method that are allowed for routine tests and other specific restrictions are given in this document.

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IEC 61788-26:2020 specifies a test method for determining the DC critical current of short RE (rare earth)-Ba-Cu-O (REBCO) composite superconductor specimens that have a shape of straight flat tape. This document applies to test specimens shorter than 300 mm and having a rectangular cross section with an area of 0,03 mm2 to 7,2 mm2, which corresponds to tapes with width ranging from 1,0 mm to 12,0 mm and thickness from 0,03 mm to 0,6 mm.
This method is intended for use with superconductor specimens that have critical current less than 300 A and n-values larger than 5 under standard test conditions: the test specimen is immersed in liquid nitrogen bath at ambient pressure without external magnetic field during the testing. Deviations from this test method that are allowed for routine tests and other specific restrictions are given in this document.

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IEC 61788-7 describes measurement of the surface resistance (Rs) ofsuperconductors at microwave frequencies by the standard two-resonator method. The objectof measurement is the temperature dependence of Rs at the resonant frequency.The applicable measurement range of Rs for this method is as follows:- Frequency: 8 GHz < f < 30 GHz- Measurement resolution: 0,01 mΩ at 10 GHzThe Rs data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule forcomparison, is reported.

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IEC 61788-4 specifies a test method for the determination of the residual resistanceratio (RRR) of Nb-Ti and Nb3Sn composite superconductors with Cu, Cu-Ni, Cu/Cu-Ni and Almatrix in a strain-free condition and zero external magnetic field. This method is intended foruse with superconductor specimens that have a monolithic structure with rectangular or roundcross-section, RRR value less than 350, and cross-sectional area less than 3 mm2. In the caseof Nb3Sn, the specimens have received a reaction heat-treatment.

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IEC 61788-7:2020 is available as IEC 61788-7:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61788-7:2020 describes measurement of the surface resistance (Rs) of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of Rs for this method is as follows: - Frequency: 8 GHz < f < 30 GHz - Measurement resolution: 0,01 m Ω at 10 GHz The Rs data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule for comparison, is reported. This third edition cancels and replaces the second edition, published in 2006. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) informative Annex B, relative combined standard uncertainty for surface resistance measurement has been added; b) precision and accuracy statements have been converted to uncertainty; c) reproducibility in surface resistant measurement has been added.

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IEC 61788-4:2020 is available as IEC 61788-4:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61788-4:2020 specifies a test method for the determination of the residual resistance ratio (RRR) of Nb-Ti and Nb3Sn composite superconductors with Cu, Cu-Ni, Cu/Cu-Ni and Al matrix in a strain-free condition and zero external magnetic field. This method is intended for use with superconductor specimens that have a monolithic structure with rectangular or round cross-section, RRR value less than 350, and cross-sectional area less than 3 mm2. In the case of Nb3Sn, the specimens have received a reaction heat-treatment. This fifth edition cancels and replaces the fourth edition published in 2016. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) change in the suitable distance of voltage taps on the specimen for reliable measurement, b) new report on the result of the round robin test of the residual resistance ratio of Nb3Sn superconductors that proves the validity of the measurement method in this standard, c) revision of the confusing definitions of the copper ratio and copper fraction.

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IEC 61788-4:2020 is available as IEC 61788-4:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61788-4:2020 specifies a test method for the determination of the residual resistance ratio (RRR) of Nb-Ti and Nb3Sn composite superconductors with Cu, Cu-Ni, Cu/Cu-Ni and Al matrix in a strain-free condition and zero external magnetic field. This method is intended for use with superconductor specimens that have a monolithic structure with rectangular or round cross-section, RRR value less than 350, and cross-sectional area less than 3 mm2. In the case of Nb3Sn, the specimens have received a reaction heat-treatment. This fifth edition cancels and replaces the fourth edition published in 2016. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) change in the suitable distance of voltage taps on the specimen for reliable measurement,
b) new report on the result of the round robin test of the residual resistance ratio of Nb3Sn superconductors that proves the validity of the measurement method in this standard,
c) revision of the confusing definitions of the copper ratio and copper fraction.

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IEC 61788-7:2020 is available as IEC 61788-7:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61788-7:2020 describes measurement of the surface resistance (Rs) of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of Rs for this method is as follows:
- Frequency: 8 GHz  - Measurement resolution: 0,01 m Ω at 10 GHz
The Rs data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule for comparison, is reported. This third edition cancels and replaces the second edition, published in 2006. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) informative Annex B, relative combined standard uncertainty for surface resistance measurement has been added;
b) precision and accuracy statements have been converted to uncertainty;
c) reproducibility in surface resistant measurement has been added.

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This International Standard specifies terms and definitions, specification and qualification of 2G HTS joining
procedure. A welding procedure specification (WPS) is needed to provide a basis for planning joining
operations and for quality control during joining. Joining is considered as a special process in the terminology
of standards for quality systems. Standards for quality systems usually require that special processes be
carried out in accordance with written procedure specifications. This has resulted in the establishment of a set
of rules for qualification of the joining procedure prior to the release of the WPS to actual production. This part
of ISO 17279 defines these rules.
This standard does not cover soldering, brazing or any fillers, which are currently available in the industry.
This International Standard can be applied for joining of all kinds of 2G HTSs. This standard does not apply to
1st Generation Bismuth Strontium Calcium Copper Oxide (1G BSCCO) type HTS and Low Temperature
Superconductor (LTS) Joining.

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This International Standard specifies the requirements for the qualification for welding and testing personnel of micro-joining of 2G HTS to fulfil the ISO 17279-1 and ISO 17279-3 requirements.

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This part of IEC 61788 specifies the test method and procedures for testing tensile mechanical
properties of REBCO superconductive composite tapes at room temperature. This test is used
to measure the modulus of elasticity and 0,2 % proof strength. The values for elastic limit,
fracture strength and percentage elongation after fracture serve only as a reference. This
document applies to samples having a rectangular cross-section with an area of 0,12 mm2 to
6,0 mm2 (corresponding to the tapes with width of 2,0 mm to 12,0 mm and thickness of 0,06
mm to 0,5 mm).

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This part of IEC 61788 addresses a test method for the determination of the residual resistance
ratio (RRR), rRRR , of cavity-grade niobium. This method is intended for high-purity niobium
grades with 15 < rRRR < 600. The test method should be valid for specimens with rectangular or
round cross-section, cross-sectional area greater than 1 mm2 but less than 20 mm2, and a
length not less than 10 nor more than 25 times the width or diameter.

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This part of IEC 61788 describes a test method for determining the retained critical current
after double bending at room temperature of short and straight Ag- and/or Ag alloy-sheathed
Bi-2223 superconducting wires that have the shape of a flat or square tape containing monoor
multicores of oxides. The wires can be laminated with copper alloy, stainless steel or Ni
alloy tapes.
The test method is intended for use with superconductors that have a critical current less than
300 A and an n-value larger than 5. The test to determine the retained critical current is
carried out without an applied magnetic field, with the test specimen immersed in a liquid
nitrogen open bath.

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IEC 61788-25:2018 specifies the test method and procedures for testing tensile mechanical properties of REBCO superconductive composite tapes at room temperature. This test is used to measure the modulus of elasticity and 0,2 % proof strength. The values for elastic limit, fracture strength and percentage elongation after fracture serve only as a reference. This document applies to samples having a rectangular cross-section with an area of 0,12 mm2 to 6,0 mm2 (corresponding to the tapes with width of 2,0 mm to 12,0 mm and thickness of 0,06 mm to 0,5 mm)

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IEC 61788-21:2015 specifies the test methods used for validating the mechanical, electrical, and superconducting properties of practical SC wires.

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IEC 61788-24:2018 describes a test method for determining the retained critical current after double bending at room temperature of short and straight Ag- and/or Ag alloy-sheathed Bi-2223 superconducting wires that have the shape of a flat or square tape containing mono- or multicores of oxides. The wires can be laminated with copper alloy, stainless steel or Ni alloy tapes.
The test method is intended for use with superconductors that have a critical current less than 300 A and an n-value larger than 5.

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IEC 61788-23:2018 addresses a test method for the determination of the residual resistance ratio (RRR) of cavity-grade niobium. The test method should be valid for specimens with rectangular or round cross-section, cross-sectional area greater than 1 mm2 but less than 20 mm2, and a length not less than 10 nor more than 25 times the width or diameter.

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This part of IEC 61788-22-1 describes general items concerning the specifications for
superconducting sensors and detectors, which are the basis for specifications given in other
parts of IEC 61788 for various types of sensors and detectors. The sensors and detectors
described are basically made of superconducting materials and depend on superconducting
phenomena or related phenomena. The objects to be measured (measurands) include
magnetic fields, electromagnetic waves, photons of various energies, electrons, ions,
α-particles, and others.

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IEC 61788-22-1:2017 describes general items concerning the specifications for superconducting sensors and detectors, which are the basis for specifications given in other parts of IEC 61788 for various types of sensors and detectors. The sensors and detectors described are basically made of superconducting materials and depend on superconducting phenomena or related phenomena. The objects to be measured (measurands) include magnetic fields, electromagnetic waves, photons of various energies, electrons, ions, a‑particles, and others.

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IEC 61788-19:2013 covers a test method detailing the tensile test procedures to be carried out on reacted Cu/Nb3Sn composite superconducting wires at room temperature. The object of this test is to measure the modulus of elasticity and to determine the proof strength of the composite due to yielding of the copper and the copper tin components from the stress versus strain curve. Furthermore, the elastic limit, the tensile strength, and the elongation after fracture can be determined by means of the present method, but they are treated as optional quantities because the measured quantities of the elastic limit and the elongation after fracture have been reported to be subject to significant uncertainties according to the international round robin test. The sample covered by this test procedure should have a bare round or rectangular cross-section with an area between 0,15 mm2 and 2,0 mm2 and a copper to non-copper volume ratio of 0,2 to 1,5 and should have no insulation. Key words: supraconductivity, mechanical properties

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IEC 61788-18:2013 specifies a test method detailing the tensile test procedures to be carried out on Ag/Bi-2223 and Ag/Bi-2212 superconductive composite wires at room temperature. This test is used to measure the modulus of elasticity and to determine the 0,2 % proof strength. When the 0,2 % proof strength could not be determined due to earlier failure, the stress level at apparent strains of 0,05 %, 0,1 %, 0,15 %, 0,2 %, 0,25 % with increment of 0,05 % is measured. The values for elastic limit, fracture strength, percentage elongation after fracture and the fitted type of 0,2 % proof strength serve only as a reference. The sample covered by this test procedure should have a round or rectangular cross-section with an area of 0,3 mm2 to 2,0 mm2 (corresponding to the tape-shaped wires with width of 2,0 mm to 5,0 mm and thickness of 0,16 mm to 0,4 mm). Key words: superconductivity, mechanical properties measurement

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IEC 61788-12:2013 describes a test method for determining the copper to non-copper volume ratio of Cu/Nb3Sn wires. The test method given hereunder is applicable to Nb3Sn composite superconducting wires with a cross-sectional area of 0,1 mm2 to 3,0 mm2 and a copper to non-copper volume ratio of 0,1 or more. It does not make any reference to the filament diameter; however, it is not applicable to those superconducting wires with their filament, Sn, Cu-Sn alloy, barrier material and other non-copper portions dispersed in the copper matrix or those with the stabilizer dispersed. Furthermore, the copper to non-copper volume ratio can be determined on specimens before or after the Nb3Sn formation heat treatment process. The Cu/Nb3Sn wire has a monolithic structure with a round or rectangular cross-section. Though uncertainty increases, this method may be applicable to the measurement of the copper to non-copper volume ratio of the Cu/Nb3Sn wires whose cross-section and copper to non-copper volume ratio fall outside the specified ranges. This test method may be applied to other composite superconducting wires after some appropriate modifications. This second edition cancels and replaces the first edition published in 2002. It constitutes a technical revision. The main revision is the addition of two new annexes, 'Uncertainty considerations' and 'Uncertainty evaluation in the test method of the copper to non-copper volume ratio of Nb3Sn composite superconducting wires'.

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IEC 61788-5:2013 covers a test method for the determination of copper to superconductor volume ratio of Cu/Nb-Ti composite superconducting wires. This test method and the alternate method in Annex are intended for use with Cu/Nb-Ti composite superconducting wires with a cross-sectional area of 0,1 mm2 to 3 mm2, a diameter of the Nb-Ti filament(s) of 2 micrometers to 200 micrometers, and a copper to superconductor volume ratio of 0,5 or more. The Cu/Nb-Ti composite test conductor discussed in this method has a monolithic structure with a round or rectangular cross-section. This test method is carried out by dissolving the copper with nitric acid. Deviations from this test method that are allowed for routine tests and other specific restrictions are given in this standard. Cu/Nb-Ti composite superconducting wires beyond the limits in the cross-sectional area, the filament diameter and the copper to superconductor volume ratio could be measured with this present method with an anticipated reduction of uncertainty. Other, more specialized, specimen test geometries may be more appropriate for conductors beyond the limits and have been omitted from this present standard for simplicity and to retain low uncertainty. The test method given in this standard is expected to apply to other superconducting composite wires after some appropriate modifications. The copper to superconductor volume ratio of composite superconductors is used mainly to calculate the critical current density of superconducting wires. The test with the method given in this International Standard may be used to provide part of the information needed to determine the suitability of a specific superconductor. Moreover, this method is useful for quality control, acceptance or research testing if the precautions given in this standard are observed. This second edition cancels and replaces the first edition published in 2000. It constitutes a technical revision. The main revisions are the addition of two new annexes, 'Uncertainty considerations' (Annex E) and 'Uncertainty evaluation in test method of copper to superconductor volume ratio of Cu/Nb-Ti composite superconductors' (Annex F).

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IEC 61788-17:2013 describes the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields, the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are from 200 A/m to 32 kA/m, with a measurement resolution of 100 A/m.

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IEC 61788-16:2013 involves describing the standard measurement method of power-dependent surface resistance of superconductors at microwave frequencies by the sapphire resonator method. The measuring item is the power dependence of Rs at the resonant frequency. This method is the applicable for a frequency in the range of 10 GHz, for an input microwave power lower than 37 dBm (5 W). The aim is to report the surface resistance data at the measured frequency and that scaled to 10 GHz. Keyword: superconductivity

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IEC 61788-13:2012 describes considerations for the measurement of hysteretic loss in Cu/Nb-Ti multifilamentary composites using DC- or low-ramp-rate magnetometry. This international standard specifies a method of the measurement of hysteretic loss in multifilamentary Cu/Nb-Ti composite conductors. Measurements are assumed to be on round wires with temperatures at or near 4,2 K. DC or low-ramp-rate magnetometry will be performed using either a superconducting quantum interference device or a vibrating-sample magnetometer. Extension to the measurement of superconductors in general is given in Annex. This second edition cancels and replaces the first edition published in 2003. It constitutes a technical revision. Modifications made to the second edition extend to the measurement of superconductors in general, in various sample sizes and shapes, and at temperatures other than 4,2 K, and use the word 'uncertainty' for all quantitative statistical expressions to eliminate the quantitative use of 'precision' and 'accuracy'.

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This part of IEC 61788 specifies the test methods used for validating the mechanical, electrical,
and superconducting properties of practical SC wires. A wire is considered as being practical if
it can be procured in sufficiently continuous lengths under ordinary commercial transactions to
build devices. Conductors made of multiple wires, such as cables, are not included in the scope
of this part of IEC 61788. Extension of the discussions in this part of IEC 61788 beyond practical
SC wires is not intended, even though referenced documents include aspects outside of this
scope.

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IEC TS 60079-39:2015(E) specifies the construction, testing, installation and maintenance of Power-i apparatus and systems which utilise electronically controlled spark duration limitation to maintain an adequate level of intrinsic safety. This Technical Specification contains requirements for intrinsically safe apparatus and wiring intended for use in explosive atmospheres and for associated apparatus intended for connection to intrinsically safe circuits entering such atmospheres. This Technical Specification excludes the level of protection "ia" and the use of software-controlled circuits. This Technical Specification applies to electrical equipment utilising voltages not higher than 40 V d.c. and a safety factor 1,5 for Groups IIB, IIA, I and III. It is also applicable to Group IIC "ic" apparatus with a safety factor 1,0. Group IIC "ib" apparatus with a safety factor 1,5 are restricted to voltages up to 32 V d.c. This type of protection is applicable to electrical equipment in which the electrical circuits themselves are incapable of causing an explosion of the surrounding explosive atmospheres. This Technical Specification is applicable to intrinsically safe apparatus and systems which utilise electronically controlled spark duration limitation with the aim of providing more electrical power while maintaining an adequate level of safety. This Technical Specification is also applicable to electrical equipment or parts of electrical equipment located outside hazardous areas or protected by another type of protection listed in the IEC 60079 series, where the intrinsic safety of the electrical circuits in explosive atmospheres depends on the design and construction of such electrical equipment or parts of such electrical equipment. The electrical circuits located in the hazardous area are evaluated for use in such locations by applying this Technical Specification. This Technical Specification supplements and modifies the requirements of IEC 60079-0, IEC 60079-11, IEC 60079-14, IEC 60079-17 and IEC 60079-25. Keywords: Power-i apparatus, intrinsically safe apparatus and wiring intended for use in explosive atmospheres
The contents of the corrigendum of October 2020 have been included in this copy.

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IEC 61788-21:2015 specifies the test methods used for validating the mechanical, electrical, and superconducting properties of practical SC wires.

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IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.

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IEC 61788-6:2011 covers a test method detailing the tensile test procedures to be carried out on Cu/Nb-Ti superconductive composite wires at room temperature. This test is used to measure modulus of elasticity, 0,2 % proof strength of the composite due to yielding of the copper component, and tensile strength. The value for percentage elongation after fracture and the second type of 0,2 % proof strength due to yielding of the Nb-Ti component serves only as a reference. The sample covered by this test procedure has a round or rectangular cross-section with an area of 0,15 mm2 to 2 mm2 and a copper to superconductor volume ratio of 1,0 to 8,0 and without the insulating coating. This third edition cancels and replaces the second edition published in 2008. It constitutes a technical revision which adds a new Annex C including specific examples of uncertainty estimation related to mechanical tests.

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IEC TR 61788:2014 which is a technical report, provides general characteristics and guidance on practical superconducting (SC) wires. Particular focus is given to the characteristics that are different from those of ordinary copper and aluminium wires, since practical SC wires have appearance nearly identical to common electrical wires and can be used interchangeably with them. On the other hand, the practical SC wires are typically composite materials consisting of several functional materials. Many forms of SC wires are described in Section 4 of IEC 60050-815, including single core wires, multi-filamentary superconducting wires, composite superconductors and coated conductors. These wires as well as others that might be described as monolithic composite superconducting wires will be the focus in this technical report. A wire is considered as being practical if it can be procured in sufficiently continuous lengths under ordinary commercial transactions to build devices. Conductors made of multiple wires, such as cables, for example, are not included in this scope. Since this report only addresses the characteristics of practical wires, other wires such as prototype, test sample and developmental wires are not included in the scope of this technical report. Key words: superconductivity, supraconductivité

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