IEC TS 61994-3:2021(E) gives the terms and definitions for piezoelectric, dielectric and electrostatic oscillators representing the state of the art, which are intended for use in the standards and documents of IEC TC 49.
The main changes with respect to the previous edition are as listed below:
- some definitions have been updated;
- the terminology given in IEC 60679-1:2017 has been taken into account;
- new terminologies are added.

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This part of IEC 63041 is applicable to piezoelectric physical sensors mainly used in the field
of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and
environmental sciences. This document provides users with technical guidelines as well as
basic knowledge of common physical sensors.
Piezoelectric sensors covered herein are those applied to the detection and measurement of
physical quantities such as force, pressure, torque, viscosity, temperature, film thickness,
acceleration, vibration, and tilt angle.

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IEC 63041-3:2020 is applicable to piezoelectric physical sensors mainly used in the field of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and environmental sciences. This document provides users with technical guidelines as well as basic knowledge of common physical sensors.
Piezoelectric sensors covered herein are those applied to the detection and measurement of physical quantities such as force, pressure, torque, viscosity, temperature, film thickness, acceleration, vibration, and tilt angle.

  • Standard
    25 pages
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This document defines the measurement method for the determination of the durability of
radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices,
such as filters and duplexers, with respect to high power RF signals, which are used in
telecommunications, measuring equipment, radar systems and consumer products. RF BAW
devices include two types: those based on the film bulk acoustic resonator (FBAR) technology
and those based on the solidly mounted resonator (SMR) technology.
This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to
set up the measurement system and to establish the procedure to estimate the time to failure
(TF). Since TF is mainly governed by the RF power applied in the devices, discussions are
focused on the power durability.
It is not the aim of this document to explain the theory, or to attempt to cover all the
eventualities which can arise in practical circumstances. This document draws attention to
some of the more fundamental questions which will need to be considered by the user before
he/she places an order for an RF SAW/BAW device for a new application. Such a procedure
will be the user's means of preventing unsatisfactory performance related to premature device
failure resulting from high-power exposure of RF SAW/BAW devices.

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IEC 62047-37:2020 specifies test methods for evaluating the durability of MEMS piezoelectric thin film materials under the environmental stress of temperature and humidity and under mechanical stress and strain, and test conditions for appropriate quality assessment. Specifically, this document specifies test methods and test conditions for measuring the durability of a DUT under temperature and humidity conditions and applied voltages. It further applies to evaluations of direct piezoelectric properties in piezoelectric thin films formed primarily on silicon substrates, i.e. piezoelectric thin films used as acoustic sensors, or as cantilever-type sensors.
This document does not cover reliability assessments, such as methods of predicting the lifetime of a piezoelectric thin film based on a Weibull distribution.

  • Standard
    34 pages
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IEC 63155:2020 defines the measurement method for the determination of the durability of radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices, such as filters and duplexers, with respect to high power RF signals, which are used in telecommunications, measuring equipment, radar systems and consumer products. RF BAW devices include two types: those based on the film bulk acoustic resonator (FBAR) technology and those based on the solidly mounted resonator (SMR) technology.
This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to set up the measurement system and to establish the procedure to estimate the time to failure (TF). Since TF is mainly governed by the RF power applied in the devices, discussions are focused on the power durability.
It is not the aim of this document to explain the theory, or to attempt to cover all the eventualities which can arise in practical circumstances. This document draws attention to some of the more fundamental questions which will need to be considered by the user before he/she places an order for an RF SAW/BAW device for a new application. Such a procedure will be the user's means of preventing unsatisfactory performance related to premature device failure resulting from high-power exposure of RF SAW/BAW devices.

  • Standard
    42 pages
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This part of IEC 62884 describes the methods for the measurement and evaluation of the
short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its
purpose is to unify the test and evaluation methods for short-term frequency stability.

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IEC 62884-4:2019 describes the methods for the measurement and evaluation of the short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its purpose is to unify the test and evaluation methods for short-term frequency stability.

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IEC TS 61994-5:2019(E) gives the terms and definition for sensors representing the state of the art, which are intended for manufacturing piezoelectric elements, cells and the modules.

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IEC 62884-4:2019 describes the methods for the measurement and evaluation of the short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its purpose is to unify the test and evaluation methods for short-term frequency stability.

  • Standard
    40 pages
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IEC 62047-34:2019 (E) describes test conditions and test methods of electric character, static performances and thermal performances for MEMS pressure-sensitive devices. This document applies to test for both open and closed loop piezoresistive MEMS pressure devices on wafer.

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    16 pages
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IEC 62047-33:2019 (E) defines terms, definitions, essential ratings and characteristics, as well as test methods applicable to MEMS piezoresistive pressure-sensitive device. This document applies to piezoresistive pressure-sensitive devices for automotive, medical treatment, electronic products.

  • Standard
    24 pages
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IEC 62047-36:2019 (E) specifies test methods for evaluating the durability of MEMS piezoelectric thin film materials under the environmental stress of temperature and humidity and under electrical stress, and test conditions for appropriate quality assessment. Specifically, this document specifies test methods and test conditions for measuring the durability of a DUT under temperature and humidity conditions and applied voltages. It further applies to evaluations of converse piezoelectric properties in piezoelectric thin films formed primarily on silicon substrates, i.e., piezoelectric thin films used as actuators. This document does not cover reliability assessments, such as methods of predicting the lifetime of a piezoelectric thin film based on a Weibull distribution.

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This part of IEC 60122 is applicable to crystal units with thermistors mainly used in the field of
mobile communication that requires high frequency stability such as local reference signal
generator for the mobile phone base station or GPS. This document provides users with
technical guidelines of crystal units with thermistors as well as basic knowledge of common
crystal units with thermistors.

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This part of IEC 60122 is applicable to crystal units with thermistors mainly used in the field of mobile communication that requires high frequency stability such as local reference signal generator for the mobile phone base station or GPS. This document provides users with technical guidelines of crystal units with thermistors as well as basic knowledge of common crystal units with thermistors.

  • Standard
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IEC 60122-4:2019 is applicable to crystal units with thermistors mainly used in the field of mobile communication that requires high frequency stability such as local reference signal generator for the mobile phone base station or GPS. This document provides users with technical guidelines of crystal units with thermistors as well as basic knowledge of common crystal units with thermistors

  • Standard
    29 pages
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IEC TS 61994-4-4:2018 is available as IEC TS 61994-4-4:2018 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61994-4-4:2018 gives the terms and definition for single crystal wafers for surface acoustic wave (SAW) devices representing the state of the art. This edition includes the following significant technical changes with respect to the previous edition:
- the new terms and definitions given in IEC 62276:2016 have been taken into account;
- the general title has been changed according to the change in the title of TC 49 in 2009.
- the part title has been changed according to the title of IEC 62276:2016.

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IEC TS 61994-4-1:2018 is available as IEC TS 61994-4-1:2018 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61994-4-1:2018 gives the terms and definition for synthetic quartz crystals representing the state of the art, which are intended for manufacturing piezoelectric and optical elements. This edition includes the following significant technical changes with respect to the previous edition:
- The new terms and definitions given in IEC 60758:2016 have been taken into account;
- The general title has been changed according to the change in the title of TC 49 in 2009.

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This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply
to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures,
and is based on IEC 61240:2016.

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IEC 61837-2:2018(E) deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240:2016. This edition includes the following significant technical changes with respect to the previous edition: a. revision of the figures to match the notation of the drawings of IEC 61240:2016; b. addition of 7 enclosures as follows: DCC-6/5032A, DCC-6/3225A, DCC-4/3215C, DCC-6/2016A, DCC-2/2012C, DCC-2/1610C, DCC-4/1210C. As a result, this third edition contains a total of 45 enclosure types, which are listed in Table 1.

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This part of IEC 62884 describes the methods for the measurement and evaluation of
frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including
Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as
"Oscillator"). The purpose of those tests is to provide statistical data supporting aging
predictions.

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IEC 62884-3:2018(E) describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions. This document was developed from the works related to IEC 60679-1:2007 (third edition), the measurement techniques of which were restructured into different parts under a new project reference. This document describes the measurement method for frequency aging only.

  • Standard
    16 pages
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IEC 61837-2:2018 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240:2016.
This edition includes the following significant technical changes with respect to the previous edition:
a. revision of the figures to match the notation of the drawings of IEC 61240:2016;
b. addition of 7 enclosures as follows: DCC-6/5032A, DCC-6/3225A, DCC-4/3215C, DCC-6/2016A, DCC-2/2012C, DCC-2/1610C, DCC-4/1210C.
As a result, this third edition contains a total of 45 enclosure types, which are listed in Table 1.

  • Standard
    198 pages
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This part of IEC 63041 applies to piezoelectric sensors of resonator, delay-line and
non-acoustic types, which are used in physical and engineering sciences, chemistry and
biochemistry, medical and environmental sciences, etc.
The purpose of this document is to specify the terms and definitions for the piezoelectric
sensors, and to make sure from a technological perspective that users understand the
state-of-art piezoelectric sensors and how to use them correctly.

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This part of IEC 63041 is applicable to piezoelectric chemical sensors mainly used in the field
of biological, medical, gas and environmental sciences. It provides users with technical
guidelines on biochemical sensors as well as basic knowledge of common chemical sensors.

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This part of IEC 62604 concerns duplexers which can separate receiving signals from
transmitting signals and are key components for two-way radio communications, and which
are generally used in mobile phone systems compliant with CDMA systems such as N-CDMA
in second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or
LTE (4G). While in 2G systems mainly dielectric duplexers have been used, the ongoing
miniaturization in 3G and 4G mobile communication systems promoted the development and
application of acoustic wave duplexers due to their small size, light weight and good electrical
performance. While standard surface acoustic wave (SAW) duplexers have been employed for
applications with moderate requirements regarding the steepness of individual filters,
applications with narrow duplex gap (e.g. Bands 2, 3, 8, 25), i.e. the frequency gap between
receiving and transmitting bands, require the application of temperature-compensated (TC)
SAW or bulk acoustic wave (BAW) technology, because of their better temperature
characteristics and resonator Q-factors.
It is neither the aim of these guidelines to explain theory, nor to attempt to cover all the
eventualities which may arise in practical circumstances. These guidelines draw attention to
some of the more fundamental questions, which should be considered by the user before he
places an order for SAW and BAW duplexers for a new application. Such a procedure will be
the user’s insurance against unsatisfactory performance. Because SAW and BAW duplexers
have very similar performance for the usage, it is useful and convenient for users that both
duplexers are described in one standard.
Standard specifications, such as those of IEC, of which these guidelines form a part, and
national specifications or detail specifications issued by manufacturers will define the
available combinations of centre frequency, pass bandwidth and insertion attenuation for each
sort of transmitting and receiving filters and the isolation level between transmitter and
receiver ports, etc. These specifications are compiled to include a wide range of SAW and
BAW duplexers with standardized performances. It cannot be over-emphasized that the user
should, wherever possible, select his duplexers from these specifications, when available,
even if it may lead to making small modifications to his circuit to enable the use of standard
duplexers. This applies particularly to the selection of the nominal frequency band.

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IEC 62884-3:2018 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions.
This document was developed from the works related to IEC 60679-1:2007 (third edition), the measurement techniques of which were restructured into different parts under a new project reference. This document describes the measurement method for frequency aging only.

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    26 pages
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IEC 63041-2:2017(E) is applicable to piezoelectric chemical sensors mainly used in the field of biological, medical, gas and environmental sciences. It provides users with technical guidelines on biochemical sensors as well as basic knowledge of common chemical sensors.

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    19 pages
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IEC 63041-1:2017(E) applies to piezoelectric sensors of resonator, delay-line and non‑acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc. The purpose of this document is to specify the terms and definitions for the piezoelectric sensors, and to make sure from a technological perspective that users understand the state‑of-art piezoelectric sensors and how to use them correctly.

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This part of IEC 62604 concerns duplexers which can separate receiving signals from transmitting signals and are key components for two-way radio communications, and which are generally used in mobile phone systems compliant with CDMA systems such as N-CDMA in second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or LTE (4G). While in 2G systems mainly dielectric duplexers have been used, the ongoing miniaturization in 3G and 4G mobile communication systems promoted the development and application of acoustic wave duplexers due to their small size, light weight and good electrical performance. While standard surface acoustic wave (SAW) duplexers have been employed for applications with moderate requirements regarding the steepness of individual filters, applications with narrow duplex gap (e.g. Bands 2, 3, 8, 25), i.e. the frequency gap between receiving and transmitting bands, require the application of temperature-compensated (TC) SAW or bulk acoustic wave (BAW) technology, because of their better temperature characteristics and resonator Q-factors. It is neither the aim of these guidelines to explain theory, nor to attempt to cover all the eventualities which may arise in practical circumstances. These guidelines draw attention to some of the more fundamental questions, which should be considered by the user before he places an order for SAW and BAW duplexers for a new application. Such a procedure will be the user’s insurance against unsatisfactory performance. Because SAW and BAW duplexers have very similar performance for the usage, it is useful and convenient for users that both duplexers are described in one standard. Standard specifications, such as those of IEC, of which these guidelines form a part, and national specifications or detail specifications issued by manufacturers will define the available combinations of centre frequency, pass bandwidth and insertion attenuation for each sort of transmitting and receiving filters and the isolation level between transmitter and receiver ports, etc. These specifications are compiled to include a wide range of SAW and BAW duplexers with standardized performances. It cannot be over-emphasized that the user should, wherever possible, select his duplexers from these specifications, when available, even if it may lead to making small modifications to his circuit to enable the use of standard duplexers. This applies particularly to the selection of the nominal frequency band.

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IEC 62228-1:2018 provides general information and definitions for electromagnetic compatibility (EMC) evaluation of integrated circuits (IC) with transceivers for wired network applications under network condition. It defines general test conditions, general test setups and test and measurement methods are applied to all parts of IEC 62228.

  • Standard
    17 pages
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IEC 63041-1:2017 applies to piezoelectric sensors of resonator, delay-line and non‑acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc. The purpose of this document is to specify the terms and definitions for the piezoelectric sensors, and to make sure from a technological perspective that users understand the state‑of-art piezoelectric sensors and how to use them correctly.

  • Standard
    49 pages
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IEC 63041-2:2017 is applicable to piezoelectric chemical sensors mainly used in the field of biological, medical, gas and environmental sciences. It provides users with technical guidelines on biochemical sensors as well as basic knowledge of common chemical sensors.

  • Standard
    33 pages
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This part of IEC 62884 specifies the methods for the measurement and evaluation of the
phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including
dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator
(FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that
allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise
measurement system is used.
NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

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Describes a high-performance backplane bus for use in microprocessor bases systems. This parallel bus supports single- and block-transfer cycles on a 32-bit non-multiplexed address and data highway. Transmission is governed by an asynchronous handshaken protocol. The bus allocation provides for multiprocessor architectures. This bus also supports inter-module interrupts for facilitating quick response to internal and external events. The mechanics of the boards and chassis are based on IEC 60297.[
]Note: -1.This bus is similar to the VME bus. 2.For the price of this publication, please consult the ISO/IEC price-code list.

  • Standard
    17 pages
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This part of IEC 60679 specifies general requirements for piezoelectric, dielectric and
electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using
FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability
approval or qualification approval procedures.
NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration.

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IEC 62884-2:2017(E) specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

  • Standard
    27 pages
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IEC 62604-2:2017 concerns duplexers which can separate receiving signals from transmitting signals and are key components for two-way radio communications, and which are generally used in mobile phone systems compliant with CDMA systems such as N-CDMA in second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or LTE (4G).
This second edition cancels and replaces the first edition published in 2011. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- diplexers are described;
- duplexers with a balanced RX port are considered in the measurement method subclause (7.3).
NOTE In this standard, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner especially in mobile phone systems and have same requirements of characteristics, test method and so on.

  • Standard
    48 pages
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IEC 60679-1:2017(E) specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability approval or qualification approval procedures. NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration. This edition includes the following significant technical changes with respect to the previous edition: a) the title has been changed; b) additional matters related to oscillator using SAW or MEMS resonator in "Terms, definitions and general information" have been included; c) measurement methods of IEC 60679-1:2007 have been removed (they will be moved to IEC 62884 series); d) the content of Annex A has been extended; e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been added; f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added; g) Annex D has been added.

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    39 pages
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This part of IEC 62884 specifies the measurement techniques for piezoelectric, dielectric and
electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators
using FBAR (hereinafter referred to as "Oscillator").
NOTE Dielectric Resonator Oscillators (DROs) and oscillators using FBAR are under consideration.

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    65 pages
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IEC 62884-1:2017(E) specifies the measurement techniques for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators using FBAR (hereinafter referred to as "Oscillator")

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IEC 62047-30:2017(E) specifies measuring methods of electro-mechanical conversion characteristics of piezoelectric thin film used for micro sensors and micro actuators, and its reporting schema to determine the characteristic parameters for consumer, industry or any other applications of piezoelectric devices. This document applies to piezoelectric thin films fabricated by MEMS process

  • Standard
    20 pages
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IEC 62884-2:2017 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

  • Standard
    48 pages
    English and French language
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IEC 60679-1:2017 specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability approval or qualification approval procedures.
NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration.
This edition includes the following significant technical changes with respect to the previous edition:
a) the title has been changed;
b) additional matters related to oscillator using SAW or MEMS resonator in "Terms, definitions and general information" have been included;
c) measurement methods of IEC 60679-1:2007 have been removed (they will be moved to IEC 62884 series);
d) the content of Annex A has been extended;
e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been added;
f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added;
g) Annex D has been added.

  • Standard
    73 pages
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