ASTM E1316-02
(Terminology)Standard Terminology for Nondestructive Examinations
Standard Terminology for Nondestructive Examinations
SCOPE
1.1 This standard defines the terminology used in the standards prepared by the E07 Committee on Nondestructive Testing. These nondestructive testing (NDT) methods include: acoustic emission, electromagnetic testing, gamma- and X-radiology, leak testing, liquid penetrant examination, magnetic particle examination, neutron radiology and gaging, ultrasonic examination, and other technical methods.
1.2 Section A defines terms that are common to multiple NDT methods, whereas, the subsequent sections define terms pertaining to specific NDT methods. An alphabetical list of the terms defined in this standard is given in Appendix X1, which also identifies the section in which each term is defined.
1.3 As shown on the chart below, when nondestructive testing produces an indication, the indication is subject to interpretation as false, nonrelevant or relevant. If it has been interpreted as relevant, the necessary subsequent evaluation will result in the decision to accept or reject the material. With the exception of accept and reject, which retain the meaning found in most dictionaries, all the words used in the chart are defined in Section A.
General Information
Relations
Standards Content (Sample)
Designation: E 1316 – 02
Standard Terminology for
1
Nondestructive Examinations
This standard is issued under the fixed designation E 1316; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
INDEX OF TERMS
Section Page
A: Common NDT Terms 2
B: Acoustic Emission 3
C: Electromagnetic Testing 7
D: Gamma- and X-Radiology 10
E: Leak Testing 15
F: Liquid Penetrant Examination 20
G: Magnetic Particle Examination 21
H: Neutron Radiology 24
I: Ultrasonic Examination 25
J: Infrared Examination 29
K: Optical Holography 31
L: Visual and Optical Methods 32
Appendix 32
1. Scope
1.1 This standard defines the terminology used in the
standards prepared by the E07 Committee on Nondestructive
Testing. These nondestructive testing (NDT) methods include:
acoustic emission, electromagnetic testing, gamma- and
X-radiology, leak testing, liquid penetrant examination, mag-
netic particle examination, neutron radiology and gaging,
ultrasonic examination, and other technical methods.
1.2 Section A defines terms that are common to multiple
NDT methods, whereas, the subsequent sections define terms
pertaining to specific NDT methods. An alphabetical list of the
terms defined in this standard is given in Appendix X1, which
also identifies the section in which each term is defined.
1.3 As shown on the chart below, when nondestructive
testing produces an indication, the indication is subject to
2. Referenced Documents
interpretation as false, nonrelevant or relevant. If it has been
2.1 ASTM Standards:
interpreted as relevant, the necessary subsequent evaluation
2
E 94 Guide for Radiographic Examination
will result in the decision to accept or reject the material. With
E 127 Practice for Fabricating and Checking Aluminum
the exception of accept and reject, which retain the meaning
2
Alloy Ultrasonic Standard Reference Blocks
found in most dictionaries, all the words used in the chart are
E 215 Practice for Standardizing Equipment for Electro-
defined in Section A.
magnetic Examination of Seamless Aluminum-Alloy
2
Tube
E 494 Practice for Measuring Ultrasonic Velocity in Mate-
2
1
rials
This terminology is under the jurisdiction of Committee E07 on Nondestructive
Testing and is the direct responsibility of Subcommittee E07.92 on Editorial
E 566 Practice for Electromagnetic (Eddy-Current) Sorting
Review. 2
of Ferrous Metals
Current edition approved February 10, 2002. Published April 2002. Originally
published as E 1316 – 89. Last previous edition E 1316 – 01.
2
Annual Book of ASTM Standards, Vol 03.03.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
1
---------------------- Page: 1 ----------------------
E 1316
E 664 Practice for Measurement of the Apparent Attenua- E 1067 Practice for Acoustic Emission Examination of
2
tion of Longitudinal Ultrasonic Waves by Immersion Fiberglass Reinforced Plastic Resin (FRP) Tanks/Vessels
2
Method E 1118 Practice for Acoustic Emission Examination of Re-
2
E 750 Practice for Characterizing Acoustic Emission Instru- inforced Thermosetting Resin Pipe (RTRP)
2
mentation E 1213 Test Method for Minimum Resolvable Temperature
2
E 804 Practice for Calibration of the Ultrasonic Test System Difference for Thermal Imaging Systems
3
by Extrapolation Between Flat Bottom Hole Sizes
3. Significance and Use
E 1033 Practice for Electromagnetic (Eddy-Current) Ex-
3.1 The terms found in this proposed standard are intended
amination of Type F-Continuously Welded (CW) Ferro-
to be used uniformly and consistently in all nondestructive
2
magnetic Pipe and Tubing Above the Curie Temperature
testing standards. The purpose of this standard is to promote a
clear understanding and interpretation of the NDT standards in
3
Discontinued. See 1993 Annual Book of ASTM Standards, Vol 03.03. which they are used.
Section A: Common NDT Terms
The terms defined in Section A are the direct responsibility of Subcommittee E07.92, Editorial Review.
4. Terminology flaw characterization, n—the process of quantifying the size,
shape, orientation, location, growth, or other properties, of a
acceptable quality level—the maximum percent defective or
flaw based on NDT response.
the maximum number of units defective per hundred units
imperfection, n—a departure of a quality characteristic from
that, for the purpose of sampling test, can be considered
its intended condition.
satisfactory as a process average.
indication—the response or evidence from a nondestructive
amorphous silicon (a-Si) X-ray detector, n—an amorphous
examination.
silicon (a-Si) X-ray detector consists of a glass substrate
with a matrix of photodiodes fabricated from amorphous DISCUSSION—An indication is determined by interpretation to be
relevant, non-relevant, or false.
silicon
...
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