ASTM F676-97(2003)

Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)

SIGNIFICANCE AND USE
Unsaturated sink current is a special parameter that is closely related to the gain of the output transistor of TTL circuits. This parameter is particularly useful in evaluating neutron degradation in TTL devices because it changes smoothly as the device degrades, and exhibits larger changes at moderate radiation levels than the standard electrical parameters.
SCOPE
1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.
1.2 Units—The values stated in the International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
WITHDRAWN RATIONALE
This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.
This test method is being withdrawn because the committee is not aware of the need to maintain the standard. Reference to the standard will remain available, but at this time, the committee does not wish to actively maintain the standard.
Formerly under the jursidiction of Committee F01 on Electronics and the direct responsibility of Subcommittee F01.11 on Nuclear and Space Radiation Effects, this test method was withdrawn in December 2009 with no replacement.

General Information

• Status: Withdrawn
• Publication Date: 09-Dec-1997
• Withdrawal Date: 30-Nov-2009
• Technical Committee: F01 - Electronics
• Drafting Committee: F01.11 - Nuclear and Space Radiation Effects

Relations

• Replaces: ASTM F676-97 - Standard Test Method for Measuring Unsaturated TTL Sink Current
• Effective Date: 10-Dec-1997

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information.
Designation:F676–97 (Reapproved 2003)
Standard Test Method for
Measuring Unsaturated TTL Sink Current
ThisstandardisissuedunderthefixeddesignationF676;thenumberimmediatelyfollowingthedesignationindicatestheyearoforiginal
adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.Asuperscript
epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 3.2.7 Accuracy and tolerances required for supply volt-
age(s), input voltages, pulse voltage, current measurement,
1.1 This test method covers the measurement of the unsat-
duty cycle, and pulse-width.
urated sink current of transistor-transistor logic (TTL) devices
under specified conditions.
4. Significance and Use
1.2 Units—The values stated in the International System of
4.1 Unsaturated sink current is a special parameter that is
Units (SI) are to be regarded as standard. No other units of
closely related to the gain of the output transistor of TTL
measurement are included in this standard.
circuits. This parameter is particularly useful in evaluating
1.3 This standard does not purport to address all of the
neutron degradation in TTL devices because it changes
safety concerns, if any, associated with its use. It is the
smoothly as the device degrades, and exhibits larger changes at
responsibility of the user of this standard to establish appro-
moderate radiation levels than the standard electrical param-
priate safety and health practices and determine the applica-
eters.
bility of regulatory limitations prior to use.
5. Interferences
2. Referenced Documents
5.1 Long pulses will cause many current probes to saturate.
2.1 ASTM Standards:
The current-time rating of the probe must not be exceeded.
E178 Practice for Dealing With Outlying Observations
5.2 Valid measurements will not be obtained unless the
3. Summary of Test Method voltage applied to the output is sufficient to bring the output
transistor out of saturation.
3.1 Input and bias voltage levels and any required input
5.3 If the voltage applied to the output exceeds 1.5 V, errors
signals are applied to the device under test to put the output to
may result. Some devices may change state. Some devices
be tested in the low-level state. Voltage pulses of sufficient
have internal diode connections which will conduct if the
magnitude to pull the output transistor out of saturation are
output exceeds 1.5 V.
applied to the output pin under test. The corresponding current
5.4 High contact resistance will cause the voltage at the
pulses are measured.
device to differ from the applied voltage. Kelvin contacts may
3.2 The following test conditions are not specified by the
be required.
test method and shall be agreed upon by the parties to the test:
5.5 Device temperature will affect this measurement. Pulse
3.2.1 The output pin(s) to be tested,
width and duty cycle must be maintained low enough that the
3.2.2 Ambient temperature range,
test does not cause heating of the device.
3.2.3 Supply voltage(s) to be used,
3.2.4 Input sequence to be applied before the device output
6. Apparatus
is pulsed,
6.1 Pulse Generator, capable of supplying the current
3.2.5 Pulsevoltagetobeappliedtotheoutputpinundertest,
required by the output pin under test at the agreed-upon
3.2.6 Duty cycle and duration of the applied pulses, and
voltage.
6.2 Oscilloscope, or Digital Recorder, dual-beam or dual-
This test method is under the jurisdiction of ASTM Committee F01 on trace, meeting the following requirements:
Electronics and is the direct responsibility of Subcommittee F01.11 on Quality and
6.2.1 Bandwidth of 30 MHz or greater.
Hardness Assurance.
6.2.2 Deflectionfactorrangeof5mVperdivisionto1Vper
Current edition approved Dec. 10, 1997. Published March 1998. Originally
division.
published as F676 – 80. Last previous edition F676 – 93. DOI: 10.1520/F0676-
97R03.
6.3 Termination R , suitable for the current probe used.
T
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
6.4 Current Probe, meeting the following requirements:
contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
6.4.1 Rise time less than 10 % of the agreed-upon pulse
Standards volume information, refer to the standard’s Document Summary page on
the ASTM website. width.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
F676–97 (2003)
6.4.2 Droop no more than 5 % of the agreed-upon pulse 7. Sampling
width.
7.1 This test method determines the properties of a single
6.4.3 Current-time rating sufficient to avoid saturation. See specimen. If sampling procedures are used to select devices for
4.1. test, the procedures shall be agreed upon by the parties to the
test.
6.5 Power Supplies and Pulse Generat
...