ASTM C657-19

Standard Test Method for D-C Volume Resistivity of Glass

SIGNIFICANCE AND USE
4.1 This experimental procedure yields meaningful data for the dc volume resistivity of glass. It is designed to minimize space charge, buildup polarization effects, and surface conductances. The temperature range is limited to room temperature to the annealing point of the specimen glass.
SCOPE
1.1 This test method covers the determination of the dc volume resistivity of a smooth, preferably polished, glass by measuring the resistance to passage of a small amount of direct current through the glass at a voltage high enough to assure adequate sensitivity. This current must be measured under steady-state conditions that is neither a charging current nor a space-charge, buildup polarization current.  
1.2 This test method is intended for the determination of resistivities less than 1016 Ω·cm in the temperature range from 25 °C to the annealing point of the glass.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. For specific hazard statements, see Section 5.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

General Information

• Status: Published
• Publication Date: 31-Oct-2019
• ICS: 81.040.10 - Raw materials and raw glass
• Technical Committee: C14 - Glass and Glass Products
• Drafting Committee: C14.04 - Physical and Mechanical Properties

Relations

• Refers: ASTM D1711-14a - Standard Terminology Relating to Electrical Insulation
• Effective Date: 01-Nov-2014
• Refers: ASTM D1711-15 - Standard Terminology Relating to Electrical Insulation
• Effective Date: 01-Nov-2015

Standards Content (Sample)

This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation: C657 − 19
Standard Test Method for
1
D-C Volume Resistivity of Glass
This standard is issued under the fixed designation C657; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
3
1. Scope Materials at Elevated Temperatures (Withdrawn 2001)
1.1 This test method covers the determination of the dc
3. Summary of Test Method
volume resistivity of a smooth, preferably polished, glass by
3.1 The dc volume resistance is measured in accordance
measuring the resistance to passage of a small amount of direct
with Test Methods D257, with the specimen located in a
current through the glass at a voltage high enough to assure
heating chamber with adequate temperature control, electrical
adequate sensitivity. This current must be measured under
shielding and insulation of the sample leads as described in
steady-state conditions that is neither a charging current nor a
Test Method D1829.
space-charge, buildup polarization current.
1.2 This test method is intended for the determination of
4. Significance and Use
16
resistivities less than 10 Ω·cm in the temperature range from
4.1 This experimental procedure yields meaningful data for
25 °C to the annealing point of the glass.
the dc volume resistivity of glass. It is designed to minimize
1.3 This standard does not purport to address all of the space charge, buildup polarization effects, and surface conduc-
safety concerns, if any, associated with its use. It is the tances. The temperature range is limited to room temperature
responsibility of the user of this standard to establish appro- to the annealing point of the specimen glass.
priate safety, health, and environmental practices and deter-
5. Cautions
mine the applicability of regulatory limitations prior to use.
For specific hazard statements, see Section 5.
5.1 Thermal emfs should be avoided. Connections involv-
1.4 This international standard was developed in accor- ing dissimilar metals can cause measurement difficulties. Even
dance with internationally recognized principles on standard- copper-copper oxide junctions can produce high thermal emfs.
ization established in the Decision on Principles for the Clean, similar metals should be used for electrical junctions.
Development of International Standards, Guides and Recom-
Platinum is recommended. Welded or crimped connections
mendations issued by the World Trade Organization Technical rather than soldered joints avoid difficulties. Specimen elec-
Barriers to Trade (TBT) Committee.
trodes shall have sufficient cross section for adequate electrical
conductance.
2. Referenced Documents
6. Apparatus
2
2.1 ASTM Standards:
6.1 Resistance-Measuring Devices, and the possible prob-
D257 Test Methods for DC Resistance or Conductance of
lems associated with them are discussed thoroughly in Section
Insulating Materials
7 and Appendixes X1 and X3 of Test Methods D257. Further
D374/D374M Test Methods for Thickness of Solid Electri-
discussion of electrometer circuitry is covered in AnnexA1 to
cal Insulation
this test method.
D1711 Terminology Relating to Electrical Insulation
D1829 Test Method for Electrical Resistance of Ceramic
6.2 Heating Chamber (Fig. 1)—For heating the specimen, a
suitable electric furnace shall be used. The construction of the
furnace shall be such that the specimen is subjected to a
uniform heat application with a minimum of temperature
1
This test method is under the jurisdiction of ASTM Committee C14 on Glass
fluctuation. An adequate muffle should be provided to shield
and Glass Products and is the direct responsibility of Subcommittee C14.04 on
Physical and Mechanical Properties.
the specimen from direct radiation by the heating elements.
Current edition approved Nov. 1, 2019. Published December 2019. Originally
This may be made of a ceramic such as aluminum oxide or
approved in 1970. Last previous edition approved in 2013 as C657 – 93 (2013).
equivalent. A grounded metallic shield shall also be provided
DOI: 10.1520/C0657-19.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
3
Standards volume information, refer to the standard’s Document Summary page on The last approved version of this historical standard is referenced on
the ASTM website. www.astm.org.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

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...

This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation: C657 − 93 (Reapproved 2013) C657 − 19
Standard Test Method for
1
D-C Volume Resistivity of Glass
This standard is issued under the fixed designation C657; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This test method covers the determination of the dc volume resistivity of a smooth, preferably polished, glass by measuring
the resistance to passage of a small amount of direct current through the glass at a voltage high enough to assure adequate
sensitivity. This current must be measured under steady-state conditions that is neither a charging current nor a space-charge,
buildup polarization current.
16
1.2 This test method is intended for the determination of resistivities less than 10 Ω·cm in the temperature range from
25°C25 °C to the annealing point of the glass.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety safety, health, and healthenvironmental practices and determine the
applicability of regulatory limitations prior to use. For specific hazard statements, see Section 5.
1.4 This international standard was developed in accordance with internationally recognized principles on standardization
established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued
by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
2. Referenced Documents
2
2.1 ASTM Standards:
D257 Test Methods for DC Resistance or Conductance of Insulating Materials
D374 Test Methods for Thickness of Solid Electrical Insulation (Metric) D0374_D0374M
D1711 Terminology Relating to Electrical Insulation
3
D1829 Test Method for Electrical Resistance of Ceramic Materials at Elevated Temperatures (Withdrawn 2001)
3. Summary of Test Method
3.1 The dc volume resistance is measured in accordance with Test Methods D257, with the specimen located in a heating
chamber with adequate temperature control, electrical shielding and insulation of the sample leads as described in Test Method
D1829.
4. Significance and Use
4.1 This experimental procedure yields meaningful data for the dc volume resistivity of glass. It is designed to minimize space
charge, buildup polarization effects, and surface conductances. The temperature range is limited to room temperature to the
annealing point of the specimen glass.
5. Cautions
5.1 Thermal emfs should be avoided. Connections involving dissimilar metals can cause measurement difficulties. Even
copper-copper oxide junctions can produce high thermal emfs. Clean, similar metals should be used for electrical junctions.
Platinum is recommended. Welded or crimped connections rather than soldered joints avoid difficulties. Specimen electrodes shall
have sufficient cross section for adequate electrical conductance.
1
This test method is under the jurisdiction of ASTM Committee C14 on Glass and Glass Products and is the direct responsibility of Subcommittee C14.04 on Physical
and Mechanical Properties.
Current edition approved Oct. 1, 2013Nov. 1, 2019. Published October 2013December 2019. Originally approved in 1970. Last previous edition approved in 20082013
as C657 – 93 (2008).(2013). DOI: 10.1520/C0657-93R13.10.1520/C0657-19.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
3
The last approved version of this historical standard is referenced on www.astm.org.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

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C657 − 19
NOTE 1—Heating elements attached to fused alumina core—covered with baked-on refractory cement.
FIG. 1 Heating Chamber
6. Apparatus
6.1 Resistance-Measuring Devices, and the possible problems associated with them are discussed thoroughly in Section 97 and
Appendixes A1X1 and A3X3 of Test Methods D257. Further discussion of electrometer circuitry is covered in Annex A1 to this
test method.
6.2 Heating Chamber (Fig. 1)—For heating the specimen, a suitable electric
...