ASTM E1829-09

Standard Guide for Handling Specimens Prior to Surface Analysis

SIGNIFICANCE AND USE
Proper handling and preparation of specimens is particularly critical for analysis. Improper handling of specimens can result in alteration of the surface composition and unreliable data. Specimens should be handled carefully so as to avoid the introduction of spurious contaminants. The goal must be to preserve the state of the surface so that analysis remains representative of the original subject.
AES, XPS, and SIMS are sensitive to surface layers that are typically a few nanometres thick. Such thin layers can be subject to severe perturbations from improper specimen handling (1).  
This guide describes methods to minimize the effects of specimen handling on the results obtained using surface-sensitive analytical techniques. It is intended for the specimen owner or the purchaser of surface analytical services and the surface analyst. Because of the wide range of types of specimens and desired information, only broad guidelines and general examples are presented here. The optimum handling procedures will be dependent on the particular specimen and the needed information. It is recommended that the specimen supplier consult the surface analyst as soon as possible with regard to specimen history, the specific problem to be solved or information needed, and the particular specimen preparation or handling procedures required. The surface analyst also is referred to Guide E 1078 that discusses additional procedures for preparing, mounting, and analysis of specimens.
SCOPE
1.1 This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines:
1.1.1 Auger electron spectroscopy (AES),
1.1.2 X-ray photoelectron spectroscopy (XPS or ESCA), and
1.1.3 Secondary ion mass spectrometry (SIMS).
1.1.4 Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis methods, such as ion scattering spectrometry, low-energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface-sensitive measurements.
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

General Information

• Status: Historical
• Publication Date: 30-Apr-2009
• ICS: 71.040.50 - Physicochemical methods of analysis
• Technical Committee: E42 - Surface Analysis
• Drafting Committee: E42.03 - Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

Relations

• Replaces: ASTM E1829-02 - Standard Guide for Handling Specimens Prior to Surface Analysis
• Effective Date: 01-May-2009
• Referred By: ASTM E1523-15 - Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
• Effective Date: 01-May-2009
• Referred By: ASTM E2735-14(2020) - Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
• Effective Date: 01-May-2009
• Referred By: ASTM F2150-19 - Standard Guide for Characterization and Testing of Biomaterial Scaffolds Used in Regenerative Medicine and Tissue-Engineered Medical Products
• Effective Date: 01-May-2009
• Referred By: ASTM E1127-08(2015) - Standard Guide for Depth Profiling in Auger Electron Spectroscopy
• Effective Date: 01-May-2009
• Referred By: ASTM E1078-14(2020) - Standard Guide for Specimen Preparation and Mounting in Surface Analysis
• Effective Date: 01-May-2009
• Referred By: ASTM F2847-17 - Standard Practice for Reporting and Assessment of Residues on Single-Use Implants and Single-Use Sterile Instruments
• Effective Date: 01-May-2009

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: E1829 − 09
StandardGuide for
1
Handling Specimens Prior to Surface Analysis
This standard is issued under the fixed designation E1829; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 4. Significance and Use
1.1 This guide covers specimen handling and preparation 4.1 Proper handling and preparation of specimens is par-
prior to surface analysis and applies to the following surface ticularly critical for analysis. Improper handling of specimens
analysis disciplines: can result in alteration of the surface composition and unreli-
1.1.1 Auger electron spectroscopy (AES), abledata.Specimensshouldbehandledcarefullysoastoavoid
1.1.2 X-ray photoelectron spectroscopy (XPS or ESCA), the introduction of spurious contaminants. The goal must be to
and preserve the state of the surface so that analysis remains
1.1.3 Secondary ion mass spectrometry (SIMS). representative of the original subject.
1.1.4 Although primarily written for AES, XPS, and SIMS,
4.2 AES, XPS, and SIMS are sensitive to surface layers that
these methods may also apply to many surface-sensitive
are typically a few nanometres thick. Such thin layers can be
analysis methods, such as ion scattering spectrometry, low-
subject to severe perturbations from improper specimen han-
energy electron diffraction, and electron energy loss 4
dling (1).
spectroscopy, where specimen handling can influence surface-
4.3 This guide describes methods to minimize the effects of
sensitive measurements.
specimen handling on the results obtained using surface-
1.2 The values stated in SI units are to be regarded as
sensitive analytical techniques. It is intended for the specimen
standard. No other units of measurement are included in this
owner or the purchaser of surface analytical services and the
standard.
surface analyst. Because of the wide range of types of
1.3 This standard does not purport to address all of the
specimens and desired information, only broad guidelines and
safety concerns, if any, associated with its use. It is the
general examples are presented here. The optimum handling
responsibility of the user of this standard to establish appro-
procedures will be dependent on the particular specimen and
priate safety and health practices and determine the applica-
the needed information. It is recommended that the specimen
bility of regulatory limitations prior to use.
supplier consult the surface analyst as soon as possible with
regardtospecimenhistory,thespecificproblemtobesolvedor
2. Referenced Documents
information needed, and the particular specimen preparation or
2
2.1 ASTM Standards:
handling procedures required. The surface analyst also is
E673 Terminology Relating to SurfaceAnalysis (Withdrawn
referred to Guide E1078 that discusses additional procedures
3
2012)
for preparing, mounting, and analysis of specimens.
E1078 Guide for Specimen Preparation and Mounting in
Surface Analysis
5. General Requirements
3. Terminology 5.1 The degree of cleanliness required by surface-sensitive
analyticaltechniquesoftenismuchgreaterthanforotherforms
3.1 Definitions—For definitions of surface analysis terms
of analysis.
used in this guide, see Terminology E673.
5.2 Specimens must never be in contact with the bare hand.
1
This guide is under the jurisdiction of ASTM Committee E42 on Surface Handling of the surface to be analyzed should be eliminated or
Analysis and is the direct responsibility of Subcommittee E42.03 on Auger Electron
minimized whenever possible.
Spectroscopy and X-Ray Photoelectron Spectroscopy.
Current edition approved May 1, 2009. Published June 2009. Originally
5.3 Specimens should be transported to the analyst in a
approved in 1996. Last previous edition approved in 2002 as E1829 – 02. DOI:
container that does not come into direct contact with the
10.1520/E1829-09.
surface of interest.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
Standards volume information, refer to the standard’s Document Summary page on
the ASTM website.
4
3
The last approved version of this historical standard is referenced on The boldface numbers in parentheses refer to a list of references at the end of
www.astm.org. this standard.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

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E1829 − 09
5.4 In most cases, the analysis will be performed on the “as obtain very different types of information about surfaces or
received” specim
...

This document is not anASTM standard and is intended only to provide the user of anASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation:E1829–02 Designation:E1829–09
Standard Guide for
1
Handling Specimens Prior to Surface Analysis
This standard is issued under the fixed designation E 1829; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis
disciplines:
1.1.1 Auger electron spectroscopy (AES),
1.1.2 X-ray photoelectron spectroscopy (XPS or ESCA), and
1.1.3Secondary ion mass spectrometry, SIMS.
1.1.3 Secondary ion mass spectrometry (SIMS).
1.1.4 Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis
methods, such as ion scattering spectrometry, low-energy electron diffraction, and electron energy loss spectroscopy, where
specimen handling can influence surface-sensitive measurements.
1.2
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
limitations prior to use.
2. Referenced Documents
2
2.1 ASTM Standards:
E 673 Terminology Relating to Surface Analysis
E 1078 Guide for Specimen Preparation and Mounting in Surface Analysis
3. Terminology
3.1 Definitions—For definitions of surface analysis terms used in this guide, see Terminology E 673.
4. Significance and Use
4.1 Properhandlingandpreparationofspecimensisparticularlycriticalforanalysis.Improperhandlingofspecimenscanresult
in alteration of the surface composition and unreliable data. Specimens should be handled carefully so as to avoid the introduction
of spurious contaminants. The goal must be to preserve the state of the surface so that analysis remains representative of the
original subject.
4.2Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and secondary ion mass spectroscopy (SIMS)
aresensitivetosurfacelayersthataretypicallyafewnanometresthick.Suchthinlayerscanbesubjecttosevereperturbationsfrom
improper specimen handling
4.2 AES, XPS, and SIMS are sensitive to surface layers that are typically a few nanometres thick. Such thin layers can be
3
subject to severe perturbations from improper specimen handling (1).
4.3 This guide describes methods to minimize the effects of specimen handling on the results obtained using surface-sensitive
analytical techniques. It is intended for the specimen owner or the purchaser of surface analytical services and the surface analyst.
Because of the wide range of types of specimens and desired information, only broad guidelines and general examples are
presented here. The optimum handling procedures will be dependent on the particular specimen and the needed information. It is
1
This guide is under the jurisdiction of ASTM Committee E42 on Surface Analysis and is the direct responsibility of Subcommittee E42.03 on Auger Electron
Spectroscopy and X-ray Photoelectron Spectroscopy.
Current edition approvedApril 10, 2002. PublishedApril 2002. Originally published as E 1829–96. Last previous edition E 1829–97.onAuger Electron Spectroscopy and
X-Ray Photoelectron Spectroscopy.
Current edition approved May 1, 2009. Published June 2009. Originally approved in 1996. Last previous edition approved in 2002 as E 1829 – 02.
2
For referencedASTM standards, visit theASTM website, www.astm.org, or contactASTM Customer Service at [e-mail]. For Annual Book of ASTM Standards
, Vol 03.06.volume information, refer to the standard’s Document Summary page on the ASTM website.
3
The boldface numbers in parentheses refer to thea list of references at the end of this standard.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
1

---------------------- Page: 1 ----------------------
E1829–09
recommended that the specimen supplier consult the surface analyst as soon as possible with regard to specimen history, the
specific problem to be solved or information needed, and the particular specimen preparation or handling procedures required.The
surface analyst also is referred
...