ASTM E1588-07
(Guide)Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
SCOPE
1.1 This guide covers the analysis of gunshot residue (GSR) by scanning electron microscopy/energy-dispersive X-ray spectrometry (SEM/EDS) by manual and automated methods. The analysis may be performed "manually," with the operator manipulating the microscope controls and the EDS system software, or in an automated fashion, where some amount of the analysis is controlled by pre-set software functions requiring little or no operator intervention.
1.2 Since software and hardware formats vary among commercial systems, guidelines will be offered in the most general terms possible. The software manual for each system should be consulted for proper terminology and operation.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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Designation:E1588–07
Standard Guide for
Gunshot Residue Analysis by Scanning Electron
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Microscopy/ Energy Dispersive X-ray Spectrometry
This standard is issued under the fixed designation E 1588; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope 4. Significance and Use
4.1 This document will be of use to forensic laboratory
1.1 This guide covers the analysis of gunshot residue (GSR)
by scanning electron microscopy/energy-dispersive X-ray personnel who are involved in the analysis of GSR samples by
spectrometry (SEM/EDS) by manual and automated methods. SEM/EDS.
The analysis may be performed “manually,” with the operator 4.2 SEM/EDS analysis of GSR is a non-destructive method
,
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manipulating the microscope controls and the EDS system that provides , both morphological information and the
software, or in an automated fashion, where some amount of elemental profiles of individual particles. This contrasts with
the analysis is controlled by pre-set software functions requir- bulk sample methods, such as atomic absorption spectropho-
ing little or no operator intervention. tometry, neutron activation analysis, inductively coupled
1.2 Since software and hardware formats vary among com- plasma atomic emission spectrometry, and inductively coupled
mercial systems, guidelines will be offered in the most general plasma mass spectrometry, where the sampled material is
termspossible.Thesoftwaremanualforeachsystemshouldbe dissolved or extracted prior to the determination of total
consulted for proper terminology and operation. element concentrations, thereby sacrificing morphological in-
1.3 This standard does not purport to address all of the formation and individual particle identification.
safety concerns, if any, associated with its use. It is the
5. Sample Preparation
responsibility of the user of this standard to establish appro-
5.1 Once the evidence seal is broken, care should be taken
priate safety and health practices and determine the applicabil-
ity of regulatory limitations prior to use. so that no object touches the surface of the adhesive SEM/EDS
sample collection stub and that the stub is not left uncovered
2. Referenced Documents
any longer than is reasonable for transfer, mounting, or
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2.1 ASTM Standard: labeling.
E 876 Practice for Use of Statistics in the Evaluation of 5.2 Label the sample collection stub in such a manner that it
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Spectrometric Data is distinguishable from other sample collection stubs without
compromising the sample; that is, label the bottom or side of
3. Summary of Practice
the stub.
3.1 From the total population of particles collected, those 5.3 If a non-conductive adhesive was used in the sample
that are determined by SEM to be within the limits of certain
collectionstub,thesamplewillneedtobecoatedtoincreaseits
parameters (e.g., atomic number, size, or shape) characteristic electrical conductivity, unless an environmental SEM or low
of or elemental composition by SEM/EDS. Typically, particles
pressure/low vacuum - SEM is used for the analysis. Carbon is
composed of high mean atomic number elements are detected a common choice of coating material, since it will not be
by their SEM backscattered electron signals and an EDS
detected with a beryllium window EDS detector and, thus, will
spectrum is obtained from each. The EDS elemental profile is not interfere with X-ray lines of interest. Furthermore, with
evaluated for constituent elements that may identify the par-
EDSsystemscapableofdetectingcarbon,itisstillignoreddue
ticle as being characteristic of or consistent with GSR. tothehighsignalintensityfromthecarbonintheadhesive.For
high vacuum SEM, a carbon film thickness of between 5 and
50 nm is typical, with less conductive samples requiring a
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thicker coat.
This guide is under the jurisdiction of ASTM Committee E30 on Forensic
Sciences and is the direct responsibility of Subcommittee E30.01 on Criminalistics.
Current edition approved Feb. 15, 2007. Published April 2007. Originally
approved in 1994. Last previous version approved in 2001 as E 1588 – 95(2001).
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For referenced ASTM standards, visit the ASTM website, www.astm.org, or Krishnan, S. S., “Detection of Gunshot Residue: Present Status,” Forensic
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM Science Handbook, Volume I, Prentice Hall, Inc., Englewood Cliffs, NJ, 1982.
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Standards volume information, refer to the standard’s Document Summary page on Wolten, G. M., Nesbitt, R. S., Calloway, A. R., Loper, G. L., and Jones, P. F.,
the ASTM website. “Final Report on ParticleAnalysis
...
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