iTeh StandardsiTeh Standards
EURUSD
Your shopping cart is empty.
ASTM

ASTM E983-19

(Guide)

Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy

Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy

SIGNIFICANCE AND USE
4.1 When electron beam excitation is used in AES, the incident electron beam can interact with the specimen material causing physical and chemical changes. In general, these effects are a hindrance to AES analysis because they cause localized specimen modification (1-4).5  
4.2 With specimens that have poor electrical conductivity the electron beam can stimulate the development of localized charge on the specimen surface. This effect is a hindrance to AES analysis because the potentials associated with the charge can either adversely affect the integrity of Auger data or make Auger data collection difficult (5, 6).
SCOPE
1.1 This guide outlines the origins and manifestations of unwanted electron beam effects in Auger electron spectroscopy (AES).  
1.2 Some general guidelines are provided concerning the electron beam parameters which are most likely to produce these effects and suggestions are offered on how to minimize them.  
1.3 General classes of materials are identified which are most likely to exhibit unwanted electron beam effects. In addition, a tabulation of some specific materials which have been observed to undergo electron damage effects is provided.  
1.4 A simple method is outlined for establishing the existence and extent of these effects during routine AES analysis.  
1.5 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.7 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

General Information

Status
Published
Publication Date
31-Mar-2019
ICS
17.180.30 - Optical measuring instruments
Technical Committee
E42 - Surface Analysis
Drafting Committee
E42.03 - Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
Current Stage
Ref Project

Relations

Replaces
ASTM E983-10(2018) - Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
Effective Date
01-Apr-2019
Refers
ASTM E996-10(2018) - Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
Effective Date
01-Nov-2018
Referred By
ASTM E996-19 - Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
Effective Date
01-Apr-2019
Referred By
ASTM E984-12(2020) - Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
Effective Date
01-Apr-2019
Referred By
ASTM E1078-14(2020) - Standard Guide for Specimen Preparation and Mounting in Surface Analysis
Effective Date
01-Apr-2019

Buy Standard

ASTM E983-19 - Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron SpectroscopyASTM E983-19 - Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
PreviousNext
Guide
ASTM E983-19 - Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
English language
5 pages
sale 15% off
Preview
sale 15% off
Preview
REDLINE ASTM E983-19 - Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron SpectroscopyREDLINE ASTM E983-19 - Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
PreviousNext
Guide
REDLINE ASTM E983-19 - Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
English language
5 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (Sample)

This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation: E983 − 19
Standard Guide for
Minimizing Unwanted Electron Beam Effects in Auger
1
Electron Spectroscopy
This standard is issued under the fixed designation E983; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope E673 Terminology Relating to SurfaceAnalysis (Withdrawn
3
2012)
1.1 This guide outlines the origins and manifestations of
E996 Practice for Reporting Data in Auger Electron Spec-
unwanted electron beam effects inAuger electron spectroscopy
troscopy and X-ray Photoelectron Spectroscopy
(AES).
4
2.2 ISO Standard:
1.2 Some general guidelines are provided concerning the
ISO 18115-1:2013 Surface chemical analysis -- Vocabulary
electron beam parameters which are most likely to produce
-- Part 1: General terms and terms used in spectroscopy
these effects and suggestions are offered on how to minimize
3. Terminology
them.
3.1 See ISO 18115-1:2013 for terms used inAuger electron
1.3 General classes of materials are identified which are
spectroscopy.
most likely to exhibit unwanted electron beam effects. In
addition, a tabulation of some specific materials which have
NOTE 1—Electron beam effects and their consequences are widely
been observed to undergo electron damage effects is provided.
referred to in the literature using any one or more of the following terms:
electron beam damage, sample damage, specimen damage, beam effects,
1.4 A simple method is outlined for establishing the exis-
electron beam induced processes, and electron irradiation effects.
tence and extent of these effects during routine AES analysis.
4. Significance and Use
1.5 The values stated in SI units are to be regarded as
standard. No other units of measurement are included in this 4.1 When electron beam excitation is used in AES, the
standard. incident electron beam can interact with the specimen material
causing physical and chemical changes. In general, these
1.6 This standard does not purport to address all of the
effects are a hindrance to AES analysis because they cause
safety concerns, if any, associated with its use. It is the
5
localized specimen modification (1-4).
responsibility of the user of this standard to establish appro-
priate safety, health, and environmental practices and deter-
4.2 With specimens that have poor electrical conductivity
mine the applicability of regulatory limitations prior to use.
the electron beam can stimulate the development of localized
1.7 This international standard was developed in accor-
charge on the specimen surface. This effect is a hindrance to
dance with internationally recognized principles on standard-
AES analysis because the potentials associated with the charge
ization established in the Decision on Principles for the
can either adversely affect the integrity of Auger data or make
Development of International Standards, Guides and Recom-
Auger data collection difficult (5, 6).
mendations issued by the World Trade Organization Technical
5. Origins of Electron Beam Effects
Barriers to Trade (TBT) Committee.
5.1 Electron beam effects inAES may originate from one or
2. Referenced Documents
more distinct processes.
2
5.1.1 Charge accumulation (7) (see Chapter 9) in materials
2.1 ASTM Standards:
with poor electrical conductivity leading to potentials that
cause distortion of Auger data or make AES data collection
1
This guide is under the jurisdiction of ASTM Committee E42 on Surface
difficult by virtue of:
Analysis and is the direct responsibility of Subcommittee E42.03 on Auger Electron
Spectroscopy and X-Ray Photoelectron Spectroscopy.
3
Current edition approved April 1, 2019. Published May 2019. Originally The last approved version of this historical standard is referenced on
approved in 1984. Last previous edition approved in 2018 as E983–10 (2018). DOI: www.astm.org.
4
10.1520/E0983–19. Available from International Organization for Standardization (ISO), ISO
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or Central Secretariat, BIBC II, Chemin de Blandonnet 8, CP 401, 1214 Vernier,
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM Geneva, Switzerland, http://www.iso.org.
5
Standards volume information, refer to the standard’s Document Summary page on The boldface numbers in parentheses refer to the references listed at the end of
the ASTM website. this standard.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428
...

This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation: E983 − 10 (Reapproved 2018) E983 − 19
Standard Guide for
Minimizing Unwanted Electron Beam Effects in Auger
1
Electron Spectroscopy
This standard is issued under the fixed designation E983; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This guide outlines the origins and manifestations of unwanted electron beam effects in Auger electron spectroscopy (AES).
1.2 Some general guidelines are provided concerning the electron beam parameters which are most likely to produce these
effects and suggestions are offered on how to minimize them.
1.3 General classes of materials are identified which are most likely to exhibit unwanted electron beam effects. In addition, a
tabulation of some specific materials which have been observed to undergo electron damage effects is provided.
1.4 A simple method is outlined for establishing the existence and extent of these effects during routine AES analysis.
1.5 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of
regulatory limitations prior to use.
1.7 This international standard was developed in accordance with internationally recognized principles on standardization
established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued
by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
2. Referenced Documents
2
2.1 ASTM Standards:
3
E673 Terminology Relating to Surface Analysis (Withdrawn 2012)
E996 Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
4
2.2 ISO Standard:
ISO 18115-1:2013 Surface chemical analysis -- Vocabulary -- Part 1: General terms and terms used in spectroscopy
3. Terminology
3.1 See TerminologyISO E67318115-1:2013 for terms used in Auger electron spectroscopy.
NOTE 1—Electron beam effects and their consequences are widely referred to in the literature using any one or more of the following terms: electron
beam damage, sample damage, specimen damage, beam effects, electron beam induced processes, and electron irradiation effects.
4. Significance and Use
4.1 When electron beam excitation is used in AES, the incident electron beam can interact with the specimen material causing
physical and chemical changes. In general, these effects are a hindrance to AES analysis because they cause localized specimen
5
modification (1-4).
1
This guide is under the jurisdiction of ASTM Committee E42 on Surface Analysis and is the direct responsibility of Subcommittee E42.03 on Auger Electron
Spectroscopy and X-Ray Photoelectron Spectroscopy.
Current edition approved Nov. 1, 2018April 1, 2019. Published November 2018May 2019. Originally approved in 1984. Last previous edition approved in 20102018 as
E983–10. –10 (2018). DOI: 10.1520/E0983–10R18.10.1520/E0983–19.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
3
The last approved version of this historical standard is referenced on www.astm.org.
4
Available from International Organization for Standardization (ISO), ISO Central Secretariat, BIBC II, Chemin de Blandonnet 8, CP 401, 1214 Vernier, Geneva,
Switzerland, http://www.iso.org.
5
The boldface numbers in parentheses refer to the references listed at the end of this standard.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
E983 − 19
4.2 With specimens that have poor electrical conductivity the electron beam can stimulate the development of localized charge
on the specimen surface. This effect is a hindrance to AES analysis because the potentials associated with the charge can either
adversely affect the integrity of Auger data or make Auger data collection difficult (5, 6).
5. Origins of Electron
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.

This May Also Interest You

ASTM
ASTM E995-16(Guide)
Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

SIGNIFICANCE AND USE
5.1 Background subtraction techniques in AES were originally employed as a method of enhancement of the relatively weak Auger signals to distinguish them from the slowly varying background of secondary and backscattered electrons. Interest in obtaining useful information from the Auger peak line shape, concern for greater quantitative accuracy from Auger spectra, and improvements in data gathering techniques, have led to the development of various background subtraction techniques.  
5.2 Similarly, the use of background subtraction techniques in XPS has evolved mainly from the interest in the determination of chemical states (from the binding-energy values for component peaks that may often overlap), greater quantitative accuracy from the XPS spectra, and improvements in data acquisition. Post-acquisition background subtraction is normally applied to XPS data.  
5.3 The procedures outlined in Section 7 are popular in XPS and AES; less popular procedures and rarely used procedures are described in Sections 8 and 9, respectively. General reviews of background subtraction methods and curve-fitting techniques have been published elsewhere (1-5).6  
5.4 Background subtraction is commonly performed prior to peak fitting, although it can be assessed (fitted) during peak fitting (active approach  (6, 7)). Some commercial data analysis packages require background removal before peak fitting. Nevertheless, a measured spectral region consisting of one or more peaks and background intensities due to inelastic scattering, Bremsstrahlung (for XPS with unmonochromated X-ray sources), and scattered primary electrons (for AES) can often be satisfactorily represented by applying peak functions for each component with parameters for each one determined in a single least-squares fit. The choice of the background to be removed, if required or desired, before or during peak fitting is suggested by the experience of the analysts, the capabilities of the peak fitting software, and the p...
SCOPE
1.1 The purpose of this guide is to familiarize the analyst with the principal background subtraction techniques presently in use together with the nature of their application to data acquisition and manipulation.  
1.2 This guide is intended to apply to background subtraction in electron, X-ray, and ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS).  
1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

  • Guide
    6 pages
    English language
    sale 15% off
  • Guide
    6 pages
    English language
    sale 15% off
ASTM
ASTM E3143-18b(2023)(Practice)
Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes

SIGNIFICANCE AND USE
5.1 Cryo-TEM is a technique used to record high resolution images of samples that are frozen and embedded in a thin layer of vitrified, amorphous ice (2-5). Because vitrification occurs so rapidly, the resultant specimen is almost instantly frozen, yielding a very accurate representation of the specimen at the moment of freezing, without the distortions typically associated with air drying delicate wet samples. Once frozen, images of the specimen are recorded at low temperature using a specially designed electron microscope equipped with a cryo-holder capable of operating under low dose conditions in order to prevent beam induced structural damage to the specimen. The cryo-TEM technique is the consensus choice to directly observe, analyze and accurately measure liposomes suspended in aqueous solutions. Fig. 1 illustrates this by comparing an electron micrograph from an air-dried negatively stained liposomal preparation with an electron micrograph of the same solution imaged by cryo-TEM.
FIG. 1 Left—An Electron Micrograph of an Air-Dried Liposomal Preparation that has been Negatively Stained with 2 % Uranyl Acetate for Contrast; Right—An Electron Micrograph of the Same Liposomal Preparation Prepared as a Frozen Vitrified Specimen for Cryo-TEM
Note 1: Both images are shown to the same scale; scale bar is 200 nm.  
5.1.1 Fig. 1 demonstrates that liposomes may become distorted and are difficult to measure and analyze when they are air-dried, while the same liposomal preparation is clearly easier to analyze when the specimen is near-instantly preserved by vitrification.  
5.1.2 Cryo-TEM involves applying a small volume of sample to a specially prepared holey, ultra-thin or continuous carbon grid suspended in a cryo-TEM plunger over a cup of liquid ethane cooled in a container filled with liquid nitrogen (2, 3). These grids can be purchased or prepared in the laboratory using a carbon evaporator with glow discharge capabilities. Once the sample has wet the surface o...
SCOPE
1.1 This practice covers procedures for vitrifying and recording images of a suspension of liposomes with a cryo-transmission electron microscope (cryo-TEM) for the purpose of evaluating their shape, size distribution and lamellarity for quality assessment. The sample is vitrified in liquid ethane onto specially prepared holey, ultra-thin, or continuous carbon TEM grids, and imaged in a cryo-holder placed in a cryo-TEM.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

  • Standard
    8 pages
    English language
    sale 15% off
ASTM
ASTM D3321-19(2023)(Test Method)
Standard Test Method for Use of the Refractometer for Field Test Determination of the Freezing Point of Aqueous Engine Coolants

SIGNIFICANCE AND USE
4.1 This practice is commonly used by vehicle service personnel to determine the freezing point, in degrees Celsius or Fahrenheit, of aqueous solutions of commercial ethylene and propylene glycol-based coolant. A durable hand-held refractometer is available that reads the freezing point, directly, in degrees Celsius or Fahrenheit, when a few drops of engine coolant are properly placed on the temperature-compensated prism surface of the refractometer. This refractometer is for glycol and water solutions, and is not suitable for other coolant solutions.  
4.2 The hand-held refractometer should be calibrated before use (see Section 7).  
4.3 Care must be taken to use the correct glycol freezing point scale for the glycol type being measured. Use of the wrong glycol scale can result in freezing point errors of 18 and more degrees Fahrenheit.  
4.4 Ethylene glycol/propylene glycol mixtures will result in inaccurate freezing point measurements using either freezing point scale.
SCOPE
1.1 This test method covers the use of a portable refractometer for determining the approximate freezing protection provided by ethylene and propylene glycol-based coolant solutions as used in engine cooling systems and special applications.  
Note 1: Some instruments have a supplementary freezing protection scale for methoxypropanol coolants. Others carry a supplemental scale calibrated in density or specific gravity readings of sulfuric acid solutions so that the refractometer can be used to determine the charged condition of lead acid storage batteries.  
1.2 The values stated in SI units are to be regarded as standard. The values given in parentheses after SI units are provided for information only and are not considered standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

  • Standard
    4 pages
    English language
    sale 15% off
ASTM
ASTM E520-08(2023)(Practice)
Standard Practice for Describing Photomultiplier Detectors in Emission and Absorption Spectrometry

ABSTRACT
This practice describes the photomultiplier properties that are essential to their judicious selection and use of in emission and absorption spectrometry. The properties covered here include structural features, electrical properties, and characteristics involved in precautions and problems. The structural features covered are envelope configurations, window materials, electrical connections, and housing for the external structure, and the photocathode, dynodes and anode, and rigidness of structural components for the internal structure. Electrical properties, on the other hand, incorporate the following: optical-electronic characteristics of the photocathode including spectral response; current amplification including gain per stage, overall gain, gain control (voltage-divider bridge), linearity of response, and anode saturation; signal nature; dark current including cathode size, internal aperture, and refrigeration effects; noise nature including additivity of noise power, signal-to-noise ratio, equivalent noise input; and photomultiplier properties as a component in an electrical circuit including output impedance, response time, and signal gating and integration possibilities. Finally, the characteristics involved in precautions and problems cover fatigue and hysteresis effects, illumination of photocathode, and gas leakage.
SCOPE
1.1 This practice covers photomultiplier properties that are essential to their judicious selection and use in emission and absorption spectrometry. Descriptions of these properties can be found in the following sections:    
Section  
Structural Features  
4  
General  
4.1  
External Structure  
4.2  
Internal Structure  
4.3  
Electrical Properties  
5  
General  
5.1  
Optical-Electronic Characteristics of the Photocathode  
5.2  
Current Amplification  
5.3  
Signal Nature  
5.4  
Dark Current  
5.5  
Noise Nature  
5.6  
Photomultiplier as a Component in an Electrical Circuit  
5.7  
Precautions and Problems  
6  
General  
6.1  
Fatigue and Hysteresis Effects  
6.2  
Illumination of Photocathode  
6.3  
Gas Leakage  
6.4  
Recommendations on Important Selection Criteria  
7  
1.2 Radiation in the frequency range common to analytical emission and absorption spectrometry is detected by photomultipliers presently to the exclusion of most other transducers. Detection limits, analytical sensitivity, and accuracy depend on the characteristics of these current-amplifying detectors as well as other factors in the system.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

  • Standard
    6 pages
    English language
    sale 15% off
ASTM
ASTM E2911-23(Guide)
Standard Guide for Relative Intensity Correction of Raman Spectrometers

SIGNIFICANCE AND USE
4.1 Generally, Raman spectra measured using grating-based dispersive or Fourier transform Raman spectrometers have not been corrected for the instrumental response (spectral responsivity of the detection system). Raman spectra obtained with different instruments may show significant variations in the measured relative peak intensities of a sample compound. This is mainly as a result of differences in their wavelength-dependent optical transmission and detector efficiencies. These variations can be particularly large when widely different laser excitation wavelengths are used, but can occur when the same laser excitation is used and spectra of the same compound are compared between instruments. This is illustrated in Fig. 1, which shows the uncorrected luminescence spectrum of SRM 2241, acquired upon four different commercially available Raman spectrometers operating with 785 nm laser excitation. Instrumental response variations can also occur on the same instrument after a component change or service work has been performed. Each spectrometer, due to its unique combination of filters, grating, collection optics and detector response, has a very unique spectral response. The spectrometer dependent spectral response will of course also affect the shape of Raman spectra acquired upon these systems. The shape of this response is not to be construed as either “good or bad” but is the result of design considerations by the spectrometer manufacturer. For instance, as shown in Fig. 1, spectral coverage can vary considerably between spectrometer systems. This is typically a deliberate tradeoff in spectrometer design, where spectral coverage is sacrificed for enhanced spectral resolution.
FIG. 1 SRM 2241 Measured on Four Commercial Raman Spectrometers Utilizing 785 nm Excitation  
4.2 Variations in spectral peak intensities can be mostly corrected through calibration of the Raman intensity (y) axis. The conventional method of calibration of the spectral response of a Raman...
SCOPE
1.1 This guide is designed to enable the user to correct a Raman spectrometer for its relative spectral-intensity response function using NIST Standard Reference Materials2 in the 224X series (currently SRMs 2241, 2242, 2243, 2244, 2245, 2246), or a calibrated irradiance source. This relative intensity correction procedure will enable the intercomparison of Raman spectra acquired from differing instruments, excitation wavelengths, and laboratories.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 Because of the significant dangers associated with the use of lasers, ANSI Z136.1 or suitable regional standards should be followed in conjunction with this practice.  
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

  • Guide
    12 pages
    English language
    sale 15% off
ASTM
ASTM E388-04(2023)(Test Method)
Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers

ABSTRACT
This test method covers the testing of the spectral bandwidth and wavelength accuracy of fluorescence spectrometers that use a monochromator for emission wavelength selection and photomultiplier tube detection. The method can be applied to instruments that use multi-element detectors, such as diode arrays, but results must be interpreted carefully. Atomic lines between 250 nm and 1000 nm are used in the method. The difference between the apparent wavelength and the known wavelength for a series of atomic emission lines is used as a test for wavelength accuracy. The apparent width of some of these lines is used as a test for spectral bandwidth.
SCOPE
1.1 This test method covers the testing of the spectral bandwidth and wavelength accuracy of fluorescence spectrometers that use a monochromator for emission wavelength selection and photomultiplier tube detection. This test method can be applied to instruments that use multi-element detectors, such as diode arrays, but results must be interpreted carefully. This test method uses atomic lines between 250 nm and 1000 nm.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

  • Standard
    3 pages
    English language
    sale 15% off
ASTM
ASTM E1840-96(2022)(Guide)
Standard Guide for Raman Shift Standards for Spectrometer Calibration

SIGNIFICANCE AND USE
4.1 Wavenumber calibration is an important part of Raman analysis. The calibration of a Raman spectrometer is performed or checked frequently in the course of normal operation and even more often when working at high resolution. To date, the most common source of wavenumber values is either emission lines from low-pressure discharge lamps (for example, mercury, argon, or neon) or from the non-lasing plasma lines of the laser. There are several good compilations of these well-established values (1-8).3 The disadvantages of using emission lines are that it can be difficult to align lamps properly in the sample position and the laser wavelength must be known accurately. With argon, krypton, and other ion lasers commonly used for Raman the latter is not a problem because lasing wavelengths are well known. With the advent of diode lasers and other wavelength-tunable lasers, it is now often the case that the exact laser wavelength is not known and may be difficult or time-consuming to determine. In these situations it is more convenient to use samples of known relative wavenumber shift for calibration. Unfortunately, accurate wavenumber shifts have been established for only a few chemicals. This guide provides the Raman spectroscopist with average shift values determined in seven laboratories for seven pure compounds and one liquid mixture.
SCOPE
1.1 This guide covers Raman shift values for common liquid and solid chemicals that can be used for wavenumber calibration of Raman spectrometers. The guide does not include procedures for calibrating Raman instruments. Instead, this guide provides reliable Raman shift values that can be used as a complement to low-pressure arc lamp emission lines which have been established with a high degree of accuracy and precision.  
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.3 Some of the chemicals specified in this guide may be hazardous. It is the responsibility of the user of this guide to consult material safety data sheets and other pertinent information to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to their use.  
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

  • Guide
    11 pages
    English language
    sale 15% off
ASTM
ASTM E1172-22(Practice)
Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer

SIGNIFICANCE AND USE
4.1 This practice describes the essential components of a wavelength dispersive X-ray spectrometer. This description is presented so that the user may gain a general understanding of the structure of an X-ray spectrometer system. It also provides a means for comparing and evaluating different systems as well as understanding the capabilities and limitations of each instrument.  
4.2 A laboratory may implement this practice or an X-ray fluorescence method in partnership with a manufacturer of the analytical instrumentation. If a laboratory chooses to consult with an instrument manufacturer, then the following should be considered. The laboratory should know the alloy matrices to be analyzed, elements and mass fraction ranges to be determined, and the expected performance requirements for each of these elements. The laboratory should inform the instrument manufacturer of these requirements so an analytical method may be developed which meets the laboratory’s expectations. Typically, instrument manufacturers customize the instrument configuration to satisfy the end-user’s requirements for elemental coverage, elemental precision, and detection limits. Instrument manufacturer developed analytical methods may include specific parameters for sample excitation, wavelengths, inter-element interference corrections, calibration and regression, equipment configuration/installation, and sample preparation requirements. Laboratories should have a basic understanding of the parameters derived by the manufacturer.
SCOPE
1.1 This practice covers the components of a wavelength dispersive X-ray spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, as these are unique for each instrument. However, the practice does attempt to identify which tolerances are critical and thus which should be specified.  
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in Section 7.  
1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

  • Standard
    5 pages
    English language
    sale 15% off
  • Standard
    5 pages
    English language
    sale 15% off
ASTM
ASTM E387-04(2022)(Test Method)
Standard Test Method for Estimating Stray Radiant Power Ratio of Dispersive Spectrophotometers by the Opaque Filter Method

SIGNIFICANCE AND USE
5.1 Stray radiant power can be a significant source of error in spectrophotometric measurements. SRP usually increases with the passage of time; therefore, testing should be performed periodically. Moreover, the SRPR test is an excellent indicator of the overall condition of a spectrophotometer. A control-chart record of the results of routinely performed SRPR tests can be a useful indicator of need for corrective action or, at least, of the changing reliability of critical measurements.  
5.2 This test method provides a means of determining the stray radiant power ratio of a spectrophotometer at selected wavelengths in a spectral range, as determined by the SRP filter used, thereby revealing those wavelength regions where significant photometric errors might occur. It does not provide a means of calculating corrections to indicated absorbance (or transmittance) values. The test method must be used with care and understanding, as erroneous results can occur, especially with respect to some modern grating instruments that incorporate moderately narrow bandpass SRP-blocking filters. This test method does not provide a basis for comparing the performance of different spectrophotometers.
Note 8: Kaye (3) discusses correction methods of measured transmittances (absorbances) that sometimes can be used if sufficient information on the properties and performance of the instrument can be acquired. See also A1.2.5.  
5.3 This test method describes the performance of a spectrophotometer in terms of the specific test parameters used. When an analytical sample is measured, absorption by the sample of radiation outside of the nominal bandpass at the analytical wavelength can cause a photometric error, underestimating the transmittance or overestimating the absorbance, and correspondingly underestimating the SRPR.  
5.4 The SRPR indicated by this test method using SRP filters is almost always an underestimation of the true value (see 1.3). A value cited in a manufacturer’s li...
SCOPE
1.1 Stray radiant power (SRP) can be a significant source of error in spectrophotometric measurements, and the danger that such error exists is enhanced because its presence often is not suspected (1-4).2 This test method affords an estimate of the relative radiant power, that is, the Stray Radiant Power Ratio (SRPR), at wavelengths remote from those of the nominal bandpass transmitted through the monochromator of an absorption spectrophotometer. Test-filter materials are described that discriminate between the desired wavelengths and those that contribute most to SRP for conventional commercial spectrophotometers used in the ultraviolet, the visible, the near infrared, and the mid-infrared ranges. These procedures apply to instruments of conventional design, with usual sources, detectors, including array detectors, and optical arrangements. The vacuum ultraviolet and the far infrared present special problems that are not discussed herein.
Note 1: Research (3) has shown that particular care must be exercised in testing grating spectrophotometers that use moderately narrow bandpass SRP-blocking filters. Accurate calibration of the wavelength scale is critical when testing such instruments. Refer to Practice E275.  
1.2 These procedures are neither all-inclusive nor infallible. Because of the nature of readily available filter materials, with a few exceptions, the procedures are insensitive to SRP of very short wavelengths in the ultraviolet, or of lower frequencies in the infrared. Sharp cutoff longpass filters are available for testing for shorter wavelength SRP in the visible and the near infrared, and sharp cutoff shortpass filters are available for testing at longer visible wavelengths. The procedures are not necessarily valid for “spike” SRP nor for “nearby SRP.” (See Annexes for general discussion and definitions of these terms.) However, they are adequate in most cases and for typical applications. They do cover...

  • Standard
    11 pages
    English language
    sale 15% off
ASTM
ASTM E925-09(2022)(Practice)
Standard Practice for Monitoring the Calibration of Ultraviolet-Visible Spectrophotometers whose Spectral Bandwidth does not Exceed 2 nm

SIGNIFICANCE AND USE
4.1 This practice permits an analyst to compare the performance of an instrument to the manufacturer's supplied performance specifications and to verify its suitability for continued routine use. It also provides generation of calibration monitoring data on a periodic basis, forming a base from which any changes in the performance of the instrument will be evident.
SCOPE
1.1 This practice covers the parameters of spectrophotometric performance that are critical for testing the adequacy of instrumentation for most routine tests and methods2 within the wavelength range of 200 nm to 700 nm and the absorbance range of 0 to 2. The recommended tests provide a measurement of the important parameters controlling results in spectrophotometric methods, but it is specifically not to be inferred that all factors in instrument performance are measured.  
1.2 This practice may be used as a significant test of the performance of instruments for which the spectral bandwidth does not exceed 2 nm and for which the manufacturer's specifications for wavelength and absorbance accuracy do not exceed the performance tolerances employed here. This practice employs an illustrative tolerance of ±1 % relative for the error of the absorbance scale over the range of 0.2 to 2.0, and of ±1.0 nm for the error of the wavelength scale. A suggested maximum stray radiant power ratio of 4 × 10-4 yields E275 to extensively evaluate the performance of an instrument.  
1.3 This practice should be performed on a periodic basis, the frequency of which depends on the physical environment within which the instrumentation is used. Thus, units handled roughly or used under adverse conditions (exposed to dust, chemical vapors, vibrations, or combinations thereof) should be tested more frequently than those not exposed to such conditions. This practice should also be performed after any significant repairs are made on a unit, such as those involving the optics, detector, or radiant energy source.  
1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

  • Standard
    7 pages
    English language
    sale 15% off