ASTM E1548-09(2017)
(Practice)Standard Practice for Preparation of Aerospace Contamination Control Plans
Standard Practice for Preparation of Aerospace Contamination Control Plans
ABSTRACT
This practice is intended to assist in the preparation of formal plans for contamination control, especially of aerospace critical surfaces. The extent of detail and level of cleanliness required can vary with the particular application and type of hardware being built, but all aspects of contamination control must be included in a final plan. Therefore, each of the following elements must be considered for inclusion in a contamination control plan (CCP): cleanliness requirements, implementation plans, environmental controls, personnel and operational controls.
SCOPE
1.1 This practice is intended to assist in the preparation of formal plans for contamination control, especially of aerospace critical surfaces. Requirements may be established at the systems level, either by the customer or the systems integrator, or at the subsystem level. Subsystem requirements may be imposed by the responsible subsystem supplier or they may be flowed down from the systems organization (4.7). The extent of detail and level of cleanliness required can vary with the particular application and type of hardware being built, but all aspects of contamination control must be included in a final plan. Therefore, each of the following elements must be considered for inclusion in a contamination control plan (CCP):
1.1.1 Cleanliness requirements for deliverable hardware addressing particulate, molecular, or biological contaminants or combination thereof. Specify contamination limits and any budget allocations.
1.1.2 Implementation plans to achieve, verify, and maintain the specified cleanliness requirements. Specify material and process controls, cleaning techniques, verification tests, protection and prevention plans, transportation controls, and corrective action for discrepancies.
1.1.3 Environmental controls including clean facilities to be used, facility maintenance, and monitoring schedule.
1.1.4 Personnel and operational controls including operating procedures, restrictions, training, motivation, and organizational responsibilities including the organization or individual for implementation and verification of the CCP.
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
General Information
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Designation: E1548 − 09 (Reapproved 2017)
Standard Practice for
Preparation of Aerospace Contamination Control Plans
This standard is issued under the fixed designation E1548; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope mendations issued by the World Trade Organization Technical
Barriers to Trade (TBT) Committee.
1.1 This practice is intended to assist in the preparation of
formalplansforcontaminationcontrol,especiallyofaerospace
2. Referenced Documents
critical surfaces. Requirements may be established at the
systems level, either by the customer or the systems integrator, 2.1 ASTM Standards:
E595 Test Method for Total Mass Loss and Collected Vola-
or at the subsystem level. Subsystem requirements may be
imposed by the responsible subsystem supplier or they may be tile Condensable Materials from Outgassing in a Vacuum
flowed down from the systems organization (4.7). The extent Environment
of detail and level of cleanliness required can vary with the E1216 Practice for Sampling for Particulate Contamination
particular application and type of hardware being built, but all by Tape Lift
aspects of contamination control must be included in a final E1235 Test Method for Gravimetric Determination of Non-
plan. Therefore, each of the following elements must be volatile Residue (NVR) in Environmentally Controlled
considered for inclusion in a contamination control plan Areas for Spacecraft
(CCP): E1549 Specification for ESD Controlled Garments Required
in Cleanrooms and Controlled Environments for Space-
1.1.1 Cleanliness requirements for deliverable hardware
addressing particulate, molecular, or biological contaminants craft for Non-Hazardous and Hazardous Operations
E1559 Test Method for Contamination Outgassing Charac-
or combination thereof. Specify contamination limits and any
budget allocations. teristics of Spacecraft Materials
E2042 Practice for Cleaning and Maintaining Controlled
1.1.2 Implementation plans to achieve, verify, and maintain
the specified cleanliness requirements. Specify material and Areas and Clean Rooms
E2217 Practice for Design and Construction of Aerospace
process controls, cleaning techniques, verification tests, pro-
tection and prevention plans, transportation controls, and Cleanrooms and Contamination Controlled Areas
F50 Practice for Continuous Sizing and Counting of Air-
corrective action for discrepancies.
1.1.3 Environmental controls including clean facilities to be borne Particles in Dust-Controlled Areas and Clean
Rooms Using Instruments Capable of Detecting Single
used, facility maintenance, and monitoring schedule.
1.1.4 Personnel and operational controls including operat- Sub-Micrometre and Larger Particles
F303 Practices for Sampling for Particles in Aerospace
ing procedures, restrictions, training, motivation, and organi-
zational responsibilities including the organization or indi- Fluids and Components
F312 Test Methods for Microscopical Sizing and Counting
vidual for implementation and verification of the CCP.
Particles from Aerospace Fluids on Membrane Filters
1.2 The values stated in SI units are to be regarded as
2.2 Government Standards:
standard. No other units of measurement are included in this
FED-STD-209E Airborne Particulate Cleanliness Classes in
standard.
3,4
Cleanrooms and Clean Zones
1.3 This international standard was developed in accor-
USAF Tech Order 00-25-203 Contamination Control of
dance with internationally recognized principles on standard-
Aerospace Facilities, U.S. Air Force
ization established in the Decision on Principles for the
Development of International Standards, Guides and Recom-
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
This practice is under the jurisdiction of ASTM Committee E21 on Space Standards volume information, refer to the standard’s Document Summary page on
Simulation andApplications of Space Technology and is the direct responsibility of the ASTM website.
Subcommittee E21.05 on Contamination. AvailablefromStandardizationDocumentsOrderDesk,Bldg.4SectionD,700
Current edition approved Sept. 1, 2017. Published October 2017. Originally Robbins Ave., Philadelphia, PA 19111-5094, Attn: NPODS.
approved in 1993. Last previous edition approved in 2009 as F1548 – 09. DOI: FED-STD-209 has been superceded by ISO 14644-1 and -2. It may continue to
10.1520/E1548-09R17. be used if mutually agreed to by customer and supplier.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
E1548 − 09 (2017)
2.3 International Standards: 3.1.5 clean zone—a defined space in which the concentra-
ISO 14644-1 Cleanrooms and Associated Controlled tion of airborne particles is controlled to meet a specified
Environments, Classification of Air Cleanliness airborne particulate cleanliness class.
ISO 14644-2 Cleanrooms and Associated Controlled
3.1.6 controlledarea—anareawhichdoesnotrequireahigh
Environments—Specifications for testing and monitoring
degree of temperature and humidity control but a semi-clean
to prove continued compliance with ISO 14644-1
atmosphereisdesired.Airconditioningisstandardcommercial
ISO 15388 Space Systems—Contamination and Cleanliness
design except that filtration is rated to 80-85 % for 1.0
Control
micrometer (µm) and larger particles to control airborne
2.4 IEST Standards:
contaminants. These areas shall not exceed the airborne par-
IEST-STD-CC1246D Product Cleanliness Levels and Con- ticle concentration of Class 8.5 (FED-STD-209E Class 300,
tamination Control Program
000) at 0.5 µm and Class 8 (Class 100,000) at 5.0 µm per ISO
14644-1 (FED-STD-209E). Reference USAF Tech Order 00-
NOTE 1—The Institute of Environmental Sciences has several Recom-
25-203.
mended Practices which may also be useful in the preparation of a CCP.
3.1.7 facility—the total real property required to accomplish
3. Terminology
the environmental control and operation of cleanrooms, clean
zones, and controlled areas as well as administrative and
3.1 Definitions:
personnel support.
3.1.1 bidirectional reflectance distribution function
(BRDF)—the scattering properties of light reflected off
NOTE 3—This includes the cleanroom proper, air locks, change rooms,
surfaces, expressed as the ratio of differential outputs of
parts cleaning, storage, HVAC equipment, offices, and so forth.
radiance divided by differential inputs of radiance. Surface
3.1.8 HVAC—Heating, Ventilating, and Air Conditioning.
contaminants scatter the incident radiation in all directions and
with variable intensities; BRDF is a method to quantify the 3.1.9 image analysis—the measurement of size, shape,
spatial distribution of the scattered energy. number, position, orientation, brightness, and other parameters
of small objects using the combination of an autofocusing
3.1.2 biological contamination—living material such as
microscope, an imaging sensor, and a dedicated computer
algae, bacteria, fungus, and so forth, which is capable of
system. Can be used to perform particle counts or measure
reproducing, thus being an increasing contaminant source.
particle dimensions automatically, with far greater accuracy
3.1.3 budget allocation—the itemized summary of contami-
than manual techniques.
nation accumulation for a given critical hardware item distrib-
3.1.10 molecular contamination—nonparticulate matter in
uted over all phases from manufacture through end of perfor-
the form of droplets or thin films which adversely affects
mance lifetime.
component or system performance.
3.1.4 cleanroom—an environmentally conditioned area
3.1.11 nonvolatile residue (NVR)—soluble material remain-
where temperature, humidity, and airborne contaminants are
ing after evaporation of a filtered volatile fluid or precipitate
controlled by design and operation. High Efficiency Particulate
from a gas phase, usually reported in milligrams per unit area
Air (HEPA) filters or better are usually required to achieve the
(or volume).
air cleanliness level. Air particulate cleanliness is classified in
accordance with ISO 14644-1.
3.1.12 particulate contamination—small discrete mass of
3.1.4.1 as-built cleanroom—a cleanroom that is complete
solid matter, usually measured in micrometers (µm), which
and ready for operation, with all services connected and
adversely affects component or system performance.
functional,butwithoutequipmentoroperatingpersonnelinthe
3.1.13 precision cleaning—cleaning of hardware surfaces
cleanroom.
by approved engineering methods to meet specific cleanliness
3.1.4.2 at-restcleanroom—acleanroomthatiscompleteand
criteria.
ready for operation, with all services connected and functional,
and with equipment installed and operable, as specified but 3.1.14 visibly clean—absence of particulate or molecular
without operating personnel in the cleanroom. contaminants when viewed from a specified distance with
normal (or corrected to normal) vision with a specified
3.1.4.3 operational cleanroom—a cleanroom in normal
operation, with all services functioning and with equipment illumination level.
and personnel, if applicable, present and performing their
normal work functions in the cleanroom. 4. Contents of CCP
NOTE 2—For batch operations, specific conditions and requirements 4.1 General Items and Information:
should be noted for monitoring and control.
4.1.1 All CCPs shall include an introduction or scope
specifying the contamination-sensitive component(s) or sys-
tem(s) being addressed, a list of applicable documents, and a
Available fromAmerican National Standards Institute (ANSI), 25 W. 43rd St., list of definitions including any acronyms and abbreviations
4th Floor, New York, NY 10036, http://www.ansi.org.
used in the document.
Available from Institute of Environmental Sciences and Technology (IEST),
4.1.2 The level of detail required and the nature and extent
Arlington Place One, 2340 S.Arlington Heights Rd., Suite 100,Arlington Heights,
IL 60005-4516, http://www.iest.org. of controls needed depends upon a number of factors. The
E1548 − 09 (2017)
systems organization or systems integrator has a better over- baffles,debrisshields,andsoforth,(3)cleaningandprocessing
view of contamination limitations, sensitivity of specific com- techniques that will effectively remove contaminants from
ponents and hardware, and total mission requirements than
surfaces, and (4) facilities to be used for various operations
sub-tier suppliers. Contamination limits for total systems are
such as cleanrooms of a specified class or controlled areas.
the primary responsibility of the systems organization. Final
Where pre-launch or post-launch cleaning operations are
contamination limits at delivery of the integrated system and at
planned, these shall be described here also. These elements
end of life should be established by agreement between the
may be contained in separate documents, but shall all be
purchaser and systems supplier. Each supplier is responsible
responsive to the requirements and cross-referenced in the
for defining and controlling the contamination level of the
CCP. ISO 15388 also contains recommendations on contami-
particular hardware being supplied, with the approval of the
nation control requirements and guidelines for establishing
systems organization, in addition to requirements levied by the
contamination control plans.
systems integrator.
4.3.2 Verification of Cleanliness Requirements—Identifythe
4.1.3 The buyer and seller should agree on the contents and
techniques planned to verify compliance with the cleanliness
implementation of the CCP before any parts are processed
requirements, including particulate, molecular, or biological
beyond the first cleaning or inspection point. Suppliers of
contaminants, or combination thereof. Rationale for use of
subsystems and components should prepare Contamination
witness samples versus direct examination or solvent extrac-
Control Plans so that the functional requirements of the
tion techniques should be included. Specify method of direct
hardware are protected. If a subsystem is particularly sensitive
sampling, such as tape-lift per Practice E1216, spray flush per
to contamination, there must be adequate controls and compli-
Practices F303, and so forth, and specify method of testing,
ance with system contamination requirements. Examples of
such as microscope counts per Test Methods F312, outgassing
sensitive subsystems include optical or non-optical sensors,
per Test Method E595, Test Method E1559 to evaluate outgas-
gyros, thermal control systems, liquid propellant systems, and
sing materials characteristics and properties, black or white
cryogenic devices.
light visual examination, BRDF, and so forth. Specify meth-
4.1.4 Some subsystems are relatively insensitive to con-
odology for obtaining representative samples and method of
tamination. These should be identified and justifications given
analysis for witness samples such as reflectance of mirrors,
for limited contamination control efforts. Even if a particular
image analysis, direct quantitative measurement, black or
subsystemorhardwareisnotsensitivetocontaminationitmust
white light visual examination, BRDF, and so forth. State the
not be a source of contamination for other, more sensitive or
frequency of sampling, whether sampling is directly on the
critical hardware.Also it is important that system performance
hardware or via witness samples, and the justification for the
or contamination allowables not be degraded by contaminants
sampling plan. Define the calibration of equipment used for
emanating from contamination tolerant hardware.
cleanliness verification tests.
4.2 Cleanliness Requirements:
4.3.3 Materials Control—Describe the process for control
4.2.1 Cleanliness requirements must be specified for deliv-
and disposition of discrepant materials. Identify the documents
erable components or systems addressing particulate,
which contain approved materials and those which have been
molecular, or biological contaminants, or combination thereof.
approved by waiver.
Primary responsibility for contamination control remains with
4.3.4 Maintaining Cleanliness Requirements—The CCP
the hardware or subsystem supplier. Levels of control and
must address the environmental controls and protection and
allowable types and quantities of contaminants shall be as
prevention plans which will be imposed to maintain the
agreed by the supplier and syst
...
This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation: E1548 − 09 E1548 − 09 (Reapproved 2017)
Standard Practice for
Preparation of Aerospace Contamination Control Plans
This standard is issued under the fixed designation E1548; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This practice is intended to assist in the preparation of formal plans for contamination control, especially of aerospace
critical surfaces. Requirements may be established at the systems level, either by the customer or the systems integrator, or at the
subsystem level. Subsystem requirements may be imposed by the responsible subsystem supplier or they may be flowed down from
the systems organization (4.7). The extent of detail and level of cleanliness required can vary with the particular application and
type of hardware being built, but all aspects of contamination control must be included in a final plan. Therefore, each of the
following elements must be considered for inclusion in a contamination control plan (CCP):
1.1.1 Cleanliness requirements for deliverable hardware addressing particulate, molecular, or biological contaminants or
combination thereof. Specify contamination limits and any budget allocations.
1.1.2 Implementation plans to achieve, verify, and maintain the specified cleanliness requirements. Specify material and process
controls, cleaning techniques, verification tests, protection and prevention plans, transportation controls, and corrective action for
discrepancies.
1.1.3 Environmental controls including clean facilities to be used, facility maintenance, and monitoring schedule.
1.1.4 Personnel and operational controls including operating procedures, restrictions, training, motivation, and organizational
responsibilities including the organization or individual for implementation and verification of the CCP.
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.3 This international standard was developed in accordance with internationally recognized principles on standardization
established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued
by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
2. Referenced Documents
2.1 ASTM Standards:
E595 Test Method for Total Mass Loss and Collected Volatile Condensable Materials from Outgassing in a Vacuum
Environment
E1216 Practice for Sampling for Particulate Contamination by Tape Lift
E1235 Test Method for Gravimetric Determination of Nonvolatile Residue (NVR) in Environmentally Controlled Areas for
Spacecraft
E1549 Specification for ESD Controlled Garments Required in Cleanrooms and Controlled Environments for Spacecraft for
Non-Hazardous and Hazardous Operations
E1559 Test Method for Contamination Outgassing Characteristics of Spacecraft Materials
E2042 Practice for Cleaning and Maintaining Controlled Areas and Clean Rooms
E2217 Practice for Design and Construction of Aerospace Cleanrooms and Contamination Controlled Areas
F50 Practice for Continuous Sizing and Counting of Airborne Particles in Dust-Controlled Areas and Clean Rooms Using
Instruments Capable of Detecting Single Sub-Micrometre and Larger Particles
F303 Practices for Sampling for Particles in Aerospace Fluids and Components
F312 Test Methods for Microscopical Sizing and Counting Particles from Aerospace Fluids on Membrane Filters
This practice is under the jurisdiction of ASTM Committee E21 on Space Simulation and Applications of Space Technology and is the direct responsibility of
Subcommittee E21.05 on Contamination.
Current edition approved April 1, 2009Sept. 1, 2017. Published April 2009October 2017. Originally approved in 1993. Last previous edition approved in 20032009 as
F1548 – 03.F1548 – 09. DOI: 10.1520/E1548-09.10.1520/E1548-09R17.
For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
E1548 − 09 (2017)
2.2 Government Standards:
3,4
FED-STD-209E Airborne Particulate Cleanliness Classes in Cleanrooms and Clean Zones
USAF Tech Order 00-25-203 Contamination Control of Aerospace Facilities, U.S. Air Force
2.3 International Standards:
ISO 14644-1 Cleanrooms and Associated Controlled Environments, Classification of Air Cleanliness
ISO 14644-2 Cleanrooms and Associated Controlled Environments—Specifications for testing and monitoring to prove
continued compliance with ISO 14644-1
ISO 15388 Space Systems—Contamination and Cleanliness Control
2.4 IEST Standards:
IEST-STD-CC1246D Product Cleanliness Levels and Contamination Control Program
NOTE 1—The Institute of Environmental Sciences has several Recommended Practices which may also be useful in the preparation of a CCP.
3. Terminology
3.1 Definitions:
3.1.1 bidirectional reflectance distribution function (BRDF)—the scattering properties of light reflected off surfaces, expressed
as the ratio of differential outputs of radiance divided by differential inputs of radiance. Surface contaminants scatter the incident
radiation in all directions and with variable intensities; BRDF is a method to quantify the spatial distribution of the scattered
energy.
3.1.2 biological contamination—living material such as algae, bacteria, fungus, and so forth, which is capable of reproducing,
thus being an increasing contaminant source.
3.1.3 budget allocation—the itemized summary of contamination accumulation for a given critical hardware item distributed
over all phases from manufacture through end of performance lifetime.
3.1.4 cleanroom—an environmentally conditioned area where temperature, humidity, and airborne contaminants are controlled
by design and operation. High Efficiency Particulate Air (HEPA) filters or better are usually required to achieve the air cleanliness
level. Air particulate cleanliness is classified in accordance with ISO 14644-1.
3.1.4.1 as-built cleanroom—a cleanroom that is complete and ready for operation, with all services connected and functional,
but without equipment or operating personnel in the cleanroom.
3.1.4.2 at-rest cleanroom—a cleanroom that is complete and ready for operation, with all services connected and functional, and
with equipment installed and operable, as specified but without operating personnel in the cleanroom.
3.1.4.3 operational cleanroom—a cleanroom in normal operation, with all services functioning and with equipment and
personnel, if applicable, present and performing their normal work functions in the cleanroom.
NOTE 2—For batch operations, specific conditions and requirements should be noted for monitoring and control.
3.1.5 clean zone—a defined space in which the concentration of airborne particles is controlled to meet a specified airborne
particulate cleanliness class.
3.1.6 controlled area—an area which does not require a high degree of temperature and humidity control but a semi-clean
atmosphere is desired. Air conditioning is standard commercial design except that filtration is rated to 80-85 % for 1.0 micrometer
(μm) and larger particles to control airborne contaminants. These areas shall not exceed the airborne particle concentration of Class
8.5 (FED-STD-209E Class 300,000) at 0.5 μm and Class 8 (Class 100,000) at 5.0 μm per ISO 14644-1 (FED-STD-209E).
Reference USAF Tech Order 00-25-203.
3.1.7 facility—the total real property required to accomplish the environmental control and operation of cleanrooms, clean
zones, and controlled areas as well as administrative and personnel support.
NOTE 3—This includes the cleanroom proper, air locks, change rooms, parts cleaning, storage, HVAC equipment, offices, and so forth.
3.1.8 HVAC—Heating, Ventilating, and Air Conditioning.
3.1.9 image analysis—the measurement of size, shape, number, position, orientation, brightness, and other parameters of small
objects using the combination of an autofocusing microscope, an imaging sensor, and a dedicated computer system. Can be used
to perform particle counts or measure particle dimensions automatically, with far greater accuracy than manual techniques.
3.1.10 molecular contamination—nonparticulate matter in the form of droplets or thin films which adversely affects component
or system performance.
Available from Standardization Documents Order Desk, Bldg. 4 Section D, 700 Robbins Ave., Philadelphia, PA 19111-5094, Attn: NPODS.
FED-STD-209 has been superceded by ISO 14644-1 and -2. It may continue to be used if mutually agreed to by customer and supplier.
Available from American National Standards Institute (ANSI), 25 W. 43rd St., 4th Floor, New York, NY 10036, http://www.ansi.org.
Available from Institute of Environmental Sciences and Technology (IEST), Arlington Place One, 2340 S. Arlington Heights Rd., Suite 100, Arlington Heights, IL
60005-4516, http://www.iest.org.
E1548 − 09 (2017)
3.1.11 nonvolatile residue (NVR)—soluble material remaining after evaporation of a filtered volatile fluid or precipitate from a
gas phase, usually reported in milligrams per unit area (or volume).
3.1.12 particulate contamination—small discrete mass of solid matter, usually measured in micrometers (μm), which adversely
affects component or system performance.
3.1.13 precision cleaning—cleaning of hardware surfaces by approved engineering methods to meet specific cleanliness criteria.
3.1.14 visibly clean—absence of particulate or molecular contaminants when viewed from a specified distance with normal (or
corrected to normal) vision with a specified illumination level.
4. Contents of CCP
4.1 General Items and Information:
4.1.1 All CCPs shall include an introduction or scope specifying the contamination-sensitive component(s) or system(s) being
addressed, a list of applicable documents, and a list of definitions including any acronyms and abbreviations used in the document.
4.1.2 The level of detail required and the nature and extent of controls needed depends upon a number of factors. The systems
organization or systems integrator has a better overview of contamination limitations, sensitivity of specific components and
hardware, and total mission requirements than sub-tier suppliers. Contamination limits for total systems are the primary
responsibility of the systems organization. Final contamination limits at delivery of the integrated system and at end of life should
be established by agreement between the purchaser and systems supplier. Each supplier is responsible for defining and controlling
the contamination level of the particular hardware being supplied, with the approval of the systems organization, in addition to
requirements levied by the systems integrator.
4.1.3 The buyer and seller should agree on the contents and implementation of the CCP before any parts are processed beyond
the first cleaning or inspection point. Suppliers of subsystems and components should prepare Contamination Control Plans so that
the functional requirements of the hardware are protected. If a subsystem is particularly sensitive to contamination, there must be
adequate controls and compliance with system contamination requirements. Examples of sensitive subsystems include optical or
non-optical sensors, gyros, thermal control systems, liquid propellant systems, and cryogenic devices.
4.1.4 Some subsystems are relatively insensitive to contamination. These should be identified and justifications given for limited
contamination control efforts. Even if a particular subsystem or hardware is not sensitive to contamination it must not be a source
of contamination for other, more sensitive or critical hardware. Also it is important that system performance or contamination
allowables not be degraded by contaminants emanating from contamination tolerant hardware.
4.2 Cleanliness Requirements:
4.2.1 Cleanliness requirements must be specified for deliverable components or systems addressing particulate, molecular, or
biological contaminants, or combination thereof. Primary responsibility for contamination control remains with the hardware or
subsystem supplier. Levels of control and allowable types and quantities of contaminants shall be as agreed by the supplier and
systems organization when applicable. Specify contamination limits and the point in time when the requirement must be verified
(for example, IEST-STD-CC1246D Level XXX after manufacture, or X.XX % area coverage at delivery to integration contractor).
Define any budget allocations if different cleanliness levels are to be verified at different time intervals. Also identify whether the
requirement is critical to the hardware performance or is necessary to protect other critical hardware.
4.2.2 Define how the cleanliness requirements will be imposed in operation; identify the relevant documents such as drawings,
process documents, inspection procedures, test plans, manufacturing flow diagrams, acceptance plans, and so forth.
4.3 Implementation Plan:
4.3.1 Attainment of Cleanliness Requirements—Describe the means for achieving the specified cleanliness requirements. This
focuses on (1) selection of low outgassing, low shedding, and low particle generating raw materials, (2) design features to protect
against contamination such as filters, cold traps, baffles, debris shields, and so forth, (3) cleaning and processing techniques that
will effectively remove contaminants from surfaces, and (4) facilities to be used for various operations such as cleanrooms of a
specified class or controlled areas. Where pre-launch or post-launch cleaning operations are planned, these shall be described here
also. These elements may be contained in separate documents, but shall all be responsive to the requirements and cross-referenced
in the CCP. ISO 15388 also contains recommendations on contamination control requirements and guidelines for establishing
contamination control plans.
4.3.2 Verification of Cleanliness Requirements—Identify the techniques planned to verify compliance with the cleanliness
requirements,
...
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