ASTM B567-98(2009)
(Test Method)Standard Test Method for Measurement of Coating Thickness by the Beta Backscatter Method
Standard Test Method for Measurement of Coating Thickness by the Beta Backscatter Method
SIGNIFICANCE AND USE
The thickness or mass per unit area of a coating is often critical to its performance.
For some coating-substrate combinations, the beta backscatter method is a reliable method for measuring the coating nondestructively.
The test method is suitable for thickness specification acceptance if the mass per unit area is specified. It is not suitable for specification acceptance if the coating thickness is specified and the density of the coating material can vary or is not known.
SCOPE
1.1 This test method covers the beta backscatter gages for the nondestructive measurement of metallic and nonmetallic coatings on both metallic and nonmetallic substrate materials.
1.2 The test method measures the mass of coating per unit area, which can also be expressed in linear thickness units provided that the density of the coating is known.
1.3 The test method is applicable only if the atomic numbers or equivalent atomic numbers of the coating and substrate differ by an appropriate amount (see 6.2).
1.4 Beta backscatter instruments employ a number of different radioactive isotopes. Although the activities of these isotopes are normally very low, they can present a hazard if handled incorrectly. This standard does not purport to address the safety issues and the proper handling of radioactive materials. It is the responsibility of the user to comply with applicable State and Federal regulations concerning the handling and use of radioactive material. Some States require licensing and registration of the radioactive isotopes.
1.5 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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Designation:B567–98(Reapproved 2009)
Standard Test Method for
Measurement of Coating Thickness by the Beta Backscatter
Method
This standard is issued under the fixed designation B567; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the Department of Defense.
1. Scope is called “activity.” Therefore, in beta backscatter measure-
ments, a higher activity corresponds to a greater emission of
1.1 This test method covers the beta backscatter gages for
betaparticles.Theactivityofaradioactiveelementusedinbeta
the nondestructive measurement of metallic and nonmetallic
backscatter gages is generally expressed in microcuries (1
coatings on both metallic and nonmetallic substrate materials.
µCi = 3.7 3 10 disintegrations per second).
1.2 The test method measures the mass of coating per unit
2.1.2 aperture—the opening of the mask abutting the test
area, which can also be expressed in linear thickness units
specimen. It determines the size of the area on which the
provided that the density of the coating is known.
coating thickness is measured. This mask is also referred to as
1.3 Thetestmethodisapplicableonlyiftheatomicnumbers
a platen, an aperture plate, a specimen support, or a specimen
or equivalent atomic numbers of the coating and substrate
mask.
differ by an appropriate amount (see 6.2).
2.1.3 backscatter—when beta particles pass through matter,
1.4 Beta backscatter instruments employ a number of dif-
they collide with atoms. Among other things, this interaction
ferent radioactive isotopes. Although the activities of these
will change their direction and reduce their speed. If the
isotopes are normally very low, they can present a hazard if
deflections are such that the beta particle leaves the body of
handled incorrectly. This standard does not purport to address
matter from the same surface at which it entered, the beta
the safety issues and the proper handling of radioactive
particle is said to be backscattered.
materials. It is the responsibility of the user to comply with
2.1.4 backscatter coeffıcient—the backscatter coefficient of
applicable State and Federal regulations concerning the han-
a body, R, is the ratio of the number of beta particles
dling and use of radioactive material. Some States require
backscattered to that entering the body. R is independent of the
licensing and registration of the radioactive isotopes.
activity of the isotope and of the measuring time.
1.5 The values stated in SI units are to be regarded as
2.1.5 backscatter count:
standard. No other units of measurement are included in this
2.1.5.1 absolute backscatter count—the absolute backscat-
standard.
ter count, X, is the number of beta particles that are backscat-
1.6 This standard does not purport to address all of the
tered during a finite interval of time and displayed by the
safety concerns, if any, associated with its use. It is the
instrument. X will, therefore, depend on the activity of the
responsibility of the user of this standard to establish appro-
source, the measuring time, the geometric configuration of the
priate safety and health practices and determine the applica-
measuring system, and the properties of the detector, as well as
bility of regulatory limitations prior to use.
the coating thickness and the atomic numbers of the coating
2. Terminology and substrate materials. X is the count produced by the
uncoated substrate, and Xs, that of the coating material. To
2.1 Descriptions of Terms:
obtain these values, it is necessary that both these materials are
2.1.1 activity—the nuclei of all radioisotopes are unstable
available with a thickness greater than the saturation thickness
and tend to change into a stable condition by spontaneously
(see 2.1.12).
emitting energy or particles, or both. This process is known as
2.1.5.2 normalized backscatter—the normalized backscat-
radioactive decay. The total number of disintegrations during a
ter, x , is a quantity that is independent of the activity of the
n
suitably small interval of time divided by that interval of time
source, the measuring time, and the properties of the detector.
The normalized backscatter is defined by the equation:
ThistestmethodisunderthejurisdictionofASTMCommitteeB08onMetallic
X 2 X
and Inorganic Coatings and is the direct responsibility of Subcommittee B08.10 on
x 5
n
X 2 X
Test Methods. s 0
Current edition approved June 15, 2009. Published September 2009. Originally
approved in 1972. Last previous edition approved in 2003 as B567 – 98 (2003). where:
DOI: 10.1520/B0567-98R09.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
B567–98 (2009)
3.3 The curve expressing coating thickness (mass per unit
X = count from the substrate,
area) versus beta backscatter intensity is continuous and can be
X = count from the coating material, and
s
subdivided into three distinct regions, as shown in Fig. 1. The
X = countfromthecoatedspecimen,andeachcountisfor
the same interval of time. normalized count rate, x , is plotted on the X-axis, and the
n
logarithm of the coating thickness, on the Y-axis. In the range
Because X is always$X and# X , x can only take values
0 s n
0# x # 0.35, the relationship is essentially linear. In the
between 0 and 1. (For reasons of simplicity, it is often
n
range 0.35#x # 0.85, the curve is nearly logarithmic; this
advantageous to express the normalized count as a percentage
n
means that, when drawn on semilogarithmic graph paper, as in
by multiplying x by 100.)
n
Fig. 1, the curve approximates a straight line. In the range
2.1.5.3 normalized backscatter curve—the curve obtained
0.85# x #1, the relationship is nearly hyperbolic.
by plotting the coating thickness as a function of x .
n
n
3.4 Radiation other than the beta rays are emitted or
2.1.6 beta particles—beta particles or beta rays are high-
backscattered by the coating or substrate, and may be included
speed electrons that are emitted from the nuclei of materials
in the backscatter measurements. Whenever the term backscat-
undergoing a nuclear transformation. These materials are
ter is used in this method, it is to be assumed that reference is
called beta-emitting isotopes, beta-emitting sources, or beta
made to the total radiation measured.
emitters.
2.1.7 coating thickness—in this test method, coating thick-
ness refers to mass per unit area as well as geometrical
thickness.
2.1.8 dead time or resolving time—Geiger-Müller tubes
used for counting beta particles have characteristic recovery
times that depend on their construction and the count rate.
Afterreadingapulse,thecounterisunresponsivetosuccessive
pulsesuntilatimeintervalequaltoorgreaterthanitsdeadtime
has elapsed.
2.1.9 energy—it is possible to classify beta emitters by the
maximum energy of the particles that they release during their
disintegration. This energy is generally given in mega-
electronvolts, MeV.
2.1.10 equivalent (or apparent) atomic number— the
equivalent atomic number of an alloy or compound is the
atomic number of an element that has the same backscatter
coefficient as the material.
2.1.11 half-life, radioactive—for a single radioactive decay
process, the time required for the activity to decrease by half.
2.1.12 saturation thickness—the minimum thickness of a
material that produces a backscatter that is not changed when
the thickness is increased. (See also Appendix X1.)
2.1.13 sealed source or isotope—a radioactive source
sealedinacontainerorhavingabondedcover,thecontaineror
cover being strong enough to prevent contact with and disper-
sion of the radioactive material under the conditions of use and
wear for which it was designed.
2.1.14 source geometry—the spatial arrangement of the
source,theaperture,andthedetectorwithrespecttoeachother.
3. Summary of Test Method
3.1 When beta particles impinge upon a material, a certain
portion of them is backscattered.This backscatter is essentially
a function of the atomic number of the material.
3.2 If the body has a surface coating and if the atomic
numbers of the substrate and of the coating material are
sufficiently different, the intensity of the backscatter will be
between two limits: the backscatter intensity of the substrate
and that of the coating. Thus, with proper instrumentation and
if suitably displayed, the intensity of the backscatter can be
used for the measurement of mass per unit area of the coating,
which, if the density remains the same, is directly proportional
to the thickness. FIG. 1 Normalized Backscatter
B567–98 (2009)
4. Significance and Use deviation,theonlywaytodeterminethemeasuringprecisionis
to make a large number of measurements at the same coated
4.1 The thickness or mass per unit area of a coating is often
location on the same coated specimen, and calculate the
critical to its performance.
standard deviation by conventional means.
4.2 For some coating-substrate combinations, the beta back-
scatter method is a reliable method for measuring the coating
NOTE 1—The accuracy of a thickness measurement by beta backscatter
nondestructively.
is generally poorer than the precision described in 5.1, inasmuch as it also
4.3 The test method is suitable for thickness specification depends on other factors that are described below. Methods to determine
the random errors of thickness measurements before an actual measure-
acceptance if the mass per unit area is specified. It is not
ment are available from some manufacturers.
suitable for specification acceptance if the coating thickness is
specified and the density of the coating material can vary or is
6.2 Coating and Substrate Materials—Because the back-
not known.
scatter intensity depends on the atomic numbers of the sub-
strateandthecoating,therepeatabilityofthemeasurementwill
5. Instrumentation
depend to a large degree on the difference between these
atomicnumbers;thus,withthesamemeasuringparameters,the
5.1 In general, a beta backscatter instrument will comprise:
greater this difference, the more precise the measurement will
(1)aradiationsource(isotope)emittingprimarilybetaparticles
be.As a rule of thumb, for most applications, the difference in
having energies appropriate to the coating thickness to be
atomic numbers should be at least 5. For materials with atomic
measured (seeAppendix X2), (2) a probe or measuring system
numbers below 20, the difference may be reduced to 25 % of
with a range of apertures that limit the beta particles to the area
the higher atomic number; for materials with atomic numbers
of the test specimen on which the coating thickness is to be
above 50, the difference should be at least 10 % of the higher
measured, and containing a detector capable of counting the
atomicnumber.Mostplasticsandrelatedorganicmaterials(for
number of backscattered particles (for example, a Geiger-
example, photoresists) may be assumed to have an equivalent
Müller counter (or tube)), and (3) a readout instrument where
atomicnumbercloseto6.(AppendixX3givesatomicnumbers
the intensity of the backscatter is displayed. The display, in the
of commonly used coating and substrate materials.)
form of a meter reading or a digital readout can be: (a)
6.3 Aperture:
proportional to the count, ( b) the normalized count, or (c) the
coating thickness expressed either in thickness or mass per unit 6.3.1 Despite the collimated nature of the sources used in
area units. commercial backscatter instruments, the backscatter recorded
by the detector is, nearly always, the sum of the backscatter
6. Factors Affecting the Measuring Accuracy produced by the test specimen exposed through the aperture
andthatoftheapertureplate(n).Itis,therefore,desirabletouse
6.1 Counting Statistics:
amaterialwithalowatomicnumberfortheconstructionofthe
6.1.1 Radioactive disintegration takes place randomly.
platen and to select the largest aperture possible. Measuring
Thus, during a fixed time interval, the number of beta particles
errors will be increased if the edges of the aperture opening are
backscattered will not always be the same. This gives rise to
worn or damaged, or if the test specimen does not properly
statisticalerrorsinherenttoradiationcounting.Inconsequence,
contact these edges.
an estimate of the counting rate based on a short counting
6.3.2 Because the measuring area on the test specimen has
interval (for example, 5 s) may be appreciably different from
to be constant to prevent the introduction of another variable,
an estimate based on a longer counting interval, particularly if
namely the geometrical dimensions of the test specimen, it is
the counting rate is low. To reduce the statistical error to an
essentialthattheaperturebesmallerthanthecoatedareaofthe
acceptable level, it is necessary to use a counting interval long
surface on which the measurement is made.
enough to accumulate a sufficient number of counts.
6.4 Coating Thickness:
6.1.2 At large total counts, the standard deviation (s) will
6.4.1 In the logarithmic range, the relative measuring error
closely approximate the square root of the total count, that is
is nearly constant and has its smallest value.
s5 X; in 95 % of all cases, the true count will be within
=
6.4.2 In the linear range, the absolute measuring error,
X 6 2s. To judge the significance of the precision, it is often
expressed in mass per unit area or thickness, is nearly constant,
helpful to express the standard deviation as a percentage of the
which means that as the coating thickness decreases, the
count, that is, 100 X/X, or 100/ X. Thus, a count of
= =
relative measuring error increases. At or near x = 0.35, the
100 000 will give a value ten times more precise than that
n
relativeerrorsofthelinearandlogarithmicrangesareaboutthe
obtained with a count of 1000. Whenever possible, a counting
same. Thus, the relative error at this point may, for most
interval should be chosen that will provide a total count of at
practical purposes, be used to calculate the absolute error over
least 10 000, which corresponds to a statistical error of 1 % for
the linear range.
the count rate. It should be noted, however, that a 1 % error in
the count rate can correspond to a much larger percentage error 6.4.3 In the hyperbolic range, the measuring error is always
large because a small variation in the intensity of the beta
in the thickness measurement, the relative error depending on
the atomic number spread or ratio between coating and backscatter will produce a la
...
This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation:B 567–98(Reapproved 2003) Designation: B 567 – 98 (Reapproved 2009)
Standard Test Method for
Measurement of Coating Thickness by the Beta Backscatter
Method
This standard is issued under the fixed designation B 567; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the Department of Defense.
1. Scope
1.1 This test method covers the beta backscatter gages for the nondestructive measurement of metallic and nonmetallic coatings
on both metallic and nonmetallic substrate materials.
1.2 The test method measures the mass of coating per unit area, which can also be expressed in linear thickness units provided
that the density of the coating is known.
1.3 The test method is applicable only if the atomic numbers or equivalent atomic numbers of the coating and substrate differ
by an appropriate amount (see 7.26.2).
1.4 Beta backscatter instruments employ a number of different radioactive isotopes.Although the activities of these isotopes are
normally very low, they can present a hazard if handled incorrectly.This standard does not purport to address the safety issues and
the proper handling of radioactive materials. It is the responsibility of the user to comply with applicable State and Federal
regulations concerning the handling and use of radioactive material. Some States require licensing and registration of the
radioactive isotopes.
1.5
1.5 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
limitations prior to use.
2. Referenced Documents
2.1 International standard:
ISO3543:Metallic and Nonmetallic Coatings—Measurement of Thickness—Beta Backscatter Method
3.Terminology
3.1
2.1 Descriptions of Terms:
3.1.1
2.1.1 activity—the nuclei of all radioisotopes are unstable and tend to change into a stable condition by spontaneously emitting
energy or particles, or both.This process is known as radioactive decay.The total number of disintegrations during a suitably small
interval of time divided by that interval of time is called “activity.” Therefore, in beta backscatter measurements, a higher activity
corresponds to a greater emission of beta particles.The activity of a radioactive element used in beta backscatter gages is generally
expressed in microcuries (1 µCi = 3.7 3 10 disintegrations per second).
3.1.2
2.1.2 aperture—the opening of the mask abutting the test specimen. It determines the size of the area on which the coating
thickness is measured. This mask is also referred to as a platen, an aperture plate, a specimen support, or a specimen mask.
3.1.3
2.1.3 backscatter—when beta particles pass through matter, they collide with atoms. Among other things, this interaction will
change their direction and reduce their speed. If the deflections are such that the beta particle leaves the body of matter from the
same surface at which it entered, the beta particle is said to be backscattered.
3.1.4
This test method is under the jurisdiction ofASTM Committee B08 on Metallic and Inorganic Coatings and is the direct responsibility of Subcommittee B08.10 on Test
Methods.
Current edition approved Oct. 1, 2003. Published October 2003. Originally approved in 1972. Last previous edition approved in 1998 as B567–98.
Current edition approved June 15, 2009. Published September 2009. Originally approved in 1972. Last previous edition approved in 2003 as B 567 – 98 (2003).
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
B 567 – 98 (2009)
2.1.4 backscatter coeffıcient—the backscatter coefficient of a body, R, is the ratio of the number of beta particles backscattered
to that entering the body. R is independent of the activity of the isotope and of the measuring time.
3.1.5
2.1.5 backscatter count:
3.1.5.1
2.1.5.1 absolute backscatter count—the absolute backscatter count, X, is the number of beta particles that are backscattered
during a finite interval of time and displayed by the instrument. X will, therefore, depend on the activity of the source, the
measuring time, the geometric configuration of the measuring system, and the properties of the detector, as well as the coating
thickness and the atomic numbers of the coating and substrate materials. X is the count produced by the uncoated substrate, and
Xs,thatofthecoatingmaterial.Toobtainthesevalues,itisnecessarythatboththesematerialsareavailablewithathicknessgreater
than the saturation thickness (see 3.1.122.1.12).
3.1.5.2
2.1.5.2 normalized backscatter—the normalized backscatter, x , is a quantity that is independent of the activity of the source,
n
the measuring time, and the properties of the detector. The normalized backscatter is defined by the equation:
X 2 X
x 5
n
X 2 X
s 0
where:
X = count from the substrate,
X = count from the coating material, and
s
X = count from the coated specimen, and each count is for the same interval of time.
Because X is always$X and# X , x can only take values between 0 and 1. (For reasons of simplicity, it is often advantageous
0 s n
to express the normalized count as a percentage by multiplying x by 100.)
n
3.1.5.3
2.1.5.3 normalized backscatter curve—the curve obtained by plotting the coating thickness as a function of x .
n
3.1.6
2.1.6 beta particles—beta particles or beta rays are high-speed electrons that are emitted from the nuclei of materials
undergoing a nuclear transformation. These materials are called beta-emitting isotopes, beta-emitting sources, or beta emitters.
3.1.7
2.1.7 coating thickness—in this test method, coating thickness refers to mass per unit area as well as geometrical thickness.
3.1.82.1.8 dead time or resolving time—Geiger-Müller tubes used for counting beta particles have characteristic recovery times
that depend on their construction and the count rate. After reading a pulse, the counter is unresponsive to successive pulses until
a time interval equal to or greater than its dead time has elapsed.
3.1.9
2.1.9 energy—it is possible to classify beta emitters by the maximum energy of the particles that they release during their
disintegration. This energy is generally given in mega-electronvolts, MeV.
3.1.10
2.1.10 equivalent (or apparent) atomic number— the equivalent atomic number of an alloy or compound is the atomic number
of an element that has the same backscatter coefficient as the material.
3.1.11
2.1.11 half-life, radioactive—for a single radioactive decay process, the time required for the activity to decrease by half.
3.1.122.1.12 saturation thickness—the minimum thickness of a material that produces a backscatter that is not changed when
the thickness is increased. (See also Appendix X1.)
3.1.13
2.1.13 sealed source or isotope—a radioactive source sealed in a container or having a bonded cover, the container or cover
being strong enough to prevent contact with and dispersion of the radioactive material under the conditions of use and wear for
which it was designed.
3.1.14
2.1.14 source geometry—the spatial arrangement of the source, the aperture, and the detector with respect to each other.
4.
3. Summary of Test Method
4.1When3.1 When beta particles impinge upon a material, a certain portion of them is backscattered. This backscatter is
essentially a function of the atomic number of the material.
4.2If3.2 If the body has a surface coating and if the atomic numbers of the substrate and of the coating material are sufficiently
different, the intensity of the backscatter will be between two limits: the backscatter intensity of the substrate and that of the
coating. Thus, with proper instrumentation and if suitably displayed, the intensity of the backscatter can be used for the
measurement of mass per unit area of the coating, which, if the density remains the same, is directly proportional to the thickness.
4.3The3.3 The curve expressing coating thickness (mass per unit area) versus beta backscatter intensity is continuous and can
B 567 – 98 (2009)
be subdivided into three distinct regions, as shown in Fig. 1. The normalized count rate, x , is plotted on the X-axis, and the
n
logarithm of the coating thickness, on the Y-axis. In the range 0# x # 0.35, the relationship is essentially linear. In the range
n
0.35#x # 0.85, the curve is nearly logarithmic; this means that, when drawn on semilogarithmic graph paper, as in Fig. 1, the
n
curve approximates a straight line. In the range 0.85# x #1, the relationship is nearly hyperbolic.
n
43.4 Radiation other than the beta rays are emitted or backscattered by the coating or substrate, and may be included in the
backscatter measurements. Whenever the term backscatter is used in this method, it is to be assumed that reference is made to the
total radiation measured.
5.4. Significance and Use
5.1The4.1 The thickness or mass per unit area of a coating is often critical to its performance.
5.2For4.2 For some coating-substrate combinations, the beta backscatter method is a reliable method for measuring the coating
nondestructively.
5.3The4.3 The test method is suitable for thickness specification acceptance if the mass per unit area is specified. It is not
suitable for specification acceptance if the coating thickness is specified and the density of the coating material can vary or is not
known.
FIG. 1 Normalized Backscatter
B 567 – 98 (2009)
6.5. Instrumentation
6.1
5.1 In general, a beta backscatter instrument will comprise: (1) a radiation source (isotope) emitting primarily beta particles
having energies appropriate to the coating thickness to be measured (see Appendix X2), (2) a probe or measuring system with a
range of apertures that limit the beta particles to the area of the test specimen on which the coating thickness is to be measured,
and containing a detector capable of counting the number of backscattered particles (for example, a Geiger-Müller counter (or
tube)), and (3) a readout instrument where the intensity of the backscatter is displayed. The display, in the form of a meter reading
or a digital readout can be: (a) proportional to the count, ( b) the normalized count, or (c) the coating thickness expressed either
in thickness or mass per unit area units.
7.
6. Factors Affecting the Measuring Accuracy
7.1
6.1 Counting Statistics:
76.1.1 Radioactive disintegration takes place randomly. Thus, during a fixed time interval, the number of beta particles
backscattered will not always be the same. This gives rise to statistical errors inherent to radiation counting. In consequence, an
estimate of the counting rate based on a short counting interval (for example, 5 s) may be appreciably different from an estimate
based on a longer counting interval, particularly if the counting rate is low. To reduce the statistical error to an acceptable level,
it is necessary to use a counting interval long enough to accumulate a sufficient number of counts.
7.1.2At6.1.2 At large total counts, the standard deviation (s) will closely approximate the square root of the total count, that
iss5 X;in95 %ofallcases,thetruecountwillbewithin X 6 2s.Tojudgethesignificanceoftheprecision,itisoftenhelpful
=
to express the standard deviation as a percentage of the count, that is, 100 X/X, or 100/ X. Thus, a count of 100 000 will give
= =
a value ten times more precise than that obtained with a count of 1000. Whenever possible, a counting interval should be chosen
thatwillprovideatotalcountofatleast10 000,whichcorrespondstoastatisticalerrorof1 %forthecountrate.Itshouldbenoted,
however, that a 1 % error in the count rate can correspond to a much larger percentage error in the thickness measurement, the
relative error depending on the atomic number spread or ratio between coating and substrate materials.
76.1.3 Direct-readinginstrumentsarealsosubjecttothesestatisticalrandomerrors.However,iftheseinstrumentsdonotpermit
the display of the actual counting rate or the standard deviation, the only way to determine the measuring precision is to make a
large number of measurements at the same coated location on the same coated specimen, and calculate the standard deviation by
conventional means.
NOTE 1—The accuracy of a thickness measurement by beta backscatter is generally poorer than the precision described in 6.15.1, inasmuch as it also
depends on other factors that are described below. Methods to determine the random errors of thickness measurements before an actual measurement are
available from some manufacturers.
7.2
6.2 Coating and Substrate Materials—Because the backscatter intensity depends on the atomic numbers of the substrate and
the coating, the repeatability of the measurement will depend to a large degree on the difference between these atomic numbers;
thus,withthesamemeasuringparameters,thegreaterthisdifference,themoreprecisethemeasurementwillbe.Asaruleofthumb,
for most applications, the difference in atomic numbers should be at least 5. For materials with atomic numbers below 20, the
differencemaybereducedto25 %ofthehigheratomicnumber;formaterialswithatomicnumbersabove50,thedifferenceshould
be at least 10 % of the higher atomic number. Most plastics and related organic materials (for example, photoresists) may be
assumed to have an equivalent atomic number close to 6. (Appendix X3 gives atomic numbers of commonly used coating and
substrate materials.)
7.3
6.3 Aperture:
76.3.1 Despite the collimated nature of the sources used in commercial backscatter instruments, the backscatter recorded by the
detector is, nearly always, the sum of the backscatter produced by the test specimen exposed through the aperture and that of the
aperture plate(n). It is, therefore, desirable to use a material with a low atomic number for the construction of the platen and to
select the largest aperture possible. Measuring errors will be increased if the edges of the aperture opening are worn or da
...
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