ASTM D6095-12(2023)
(Test Method)Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
SIGNIFICANCE AND USE
4.1 The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety, static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds. Also see Test Method D4496.
SCOPE
1.1 This test method covers the procedure for determining the volume resistivity, measured longitudinally, of extruded crosslinked and thermoplastic semiconducting, conductor and insulation shields for wire and cable.
1.2 In common practice the conductor shield is often referred to as the strand shield.
1.3 Technically, this test method is the measurement of a resistance between two electrodes on a single surface and modifying that value using dimensions of the specimen geometry to calculate a resistivity. However, the geometry of the specimen is such as to support the assumption of a current path primarily throughout the volume of the material between the electrodes, thus justifying the use of the term “longitudinal volume resistivity.” (See 3.1.2.1.)
1.4 Whenever two sets of values are presented, in different units, the values in the first set are the standard, while those in parentheses are for information only.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. For a specific hazard statement, see 7.1.
1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
General Information
Relations
Standards Content (Sample)
This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation: D6095 − 12 (Reapproved 2023)
Standard Test Method for
Longitudinal Measurement of Volume Resistivity for
Extruded Crosslinked and Thermoplastic Semiconducting
Conductor and Insulation Shielding Materials
This standard is issued under the fixed designation D6095; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 2. Referenced Documents
2.1 ASTM Standards:
1.1 This test method covers the procedure for determining
D257 Test Methods for DC Resistance or Conductance of
the volume resistivity, measured longitudinally, of extruded
Insulating Materials
crosslinked and thermoplastic semiconducting, conductor and
D1711 Terminology Relating to Electrical Insulation
insulation shields for wire and cable.
D4496 Test Method for D-C Resistance or Conductance of
1.2 In common practice the conductor shield is often re-
Moderately Conductive Materials
ferred to as the strand shield.
1.3 Technically, this test method is the measurement of a 3. Terminology
resistance between two electrodes on a single surface and
3.1 Definitions of Terms Specific to This Standard:
modifying that value using dimensions of the specimen geom-
3.1.1 semiconducting, adj—moderately conductive, see Ter-
etry to calculate a resistivity. However, the geometry of the
minology D1711 and Test Method D4496.
specimen is such as to support the assumption of a current path
3.1.2 longitudinal volume resistivity, n—an electrical resis-
primarily throughout the volume of the material between the
tance multiplied by a factor calculated from the geometry of a
electrodes, thus justifying the use of the term “longitudinal
specimen volume between electrodes in contact with one, and
volume resistivity.” (See 3.1.2.1.)
only one, surface of the specimen.
1.4 Whenever two sets of values are presented, in different
3.1.2.1 Discussion—In normal wire and cable usage, the
units, the values in the first set are the standard, while those in
longitudinal volume resistivity is simply referred to as “volume
parentheses are for information only.
resistivity.” This usage is at variance with terminology in Test
Methods D257, Terminology D1711, and Test Method D4496.
1.5 This standard does not purport to address all of the
safety concerns, if any, associated with its use. It is the
4. Significance and Use
responsibility of the user of this standard to establish appro-
priate safety, health, and environmental practices and deter-
4.1 The electrical behavior of semiconducting extruded
mine the applicability of regulatory limitations prior to use.
shielding materials is important for a variety of reasons, such
For a specific hazard statement, see 7.1.
as safety, static charges, and current transmission. This test
1.6 This international standard was developed in accor-
method is useful in predicting the behavior of such semicon-
dance with internationally recognized principles on standard-
ducting compounds. Also see Test Method D4496.
ization established in the Decision on Principles for the
Development of International Standards, Guides and Recom-
5. Apparatus
mendations issued by the World Trade Organization Technical
5.1 See Test Method D4496 for a description of the
Barriers to Trade (TBT) Committee.
apparatus, except the electrode system which is described in
7.2.
This test method is under the jurisdiction of ASTM Committee D09 on
Electrical and Electronic Insulating Materials and is the direct responsibility of
Subcommittee D09.07 on Electrical Insulating Materials. For referenced ASTM standards, visit the ASTM website, www.astm.org, or
Current edition approved May 1, 2023. Published May 2023. Originally contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
approved in 1997. Last previous edition approved in 2018 as D6095 – 12 (2018). Standards volume information, refer to the standard’s Document Summary page on
DOI: 10.1520/D6095-12R23. the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
D6095 − 12 (2023)
6. Sampling and Test Specimens at 23 6 2 °C (73 6 4 °F) and one at the rated operating
temperature of the insulation material.
6.1 Take one 2-ft (600 mm) sample from each lot, or from
each 25 000 ft (7600 m) of completed cable, whichever is less.
8. Calculation
6.2 The specimen consists of a 10 in. (250 mm) length of
8.1 For each shielding material and each temperature, cal-
cable core with all layers external to the semi-conducting
culate the volume resistivity by using the following equations:
insulation shield removed. Use this specimen to test the
Insulation Shielding:
insulation shield. To test the conductor shield, bisect the
2 2
sample longitudinally and remove the conductor. Use only one ρ 5 2R D 2 d /L (1)
@ ~ ! #
b b
piece of the conductor shield as the test specimen.
Conductor Shielding:
6.3 Condition the specimens in accordance with Test
2 2
ρ 5 @R ~D 2 d ! #/L (2)
a a
Method D4496.
where:
6.3.1 If the shielding materials are crosslinked, condition
the cable core (jacket removed) overnight at 50 °C to eliminate ρ = volume resistivity, Ω-cm,
any acetophenone that is potentially present. Then proceed R = measured resistance, Ω,
L = distance between potential electrodes, in.,
with the conditioning in accordance with Test Method D4496.
D = diameter over conductor shielding, in.,
a
7. Procedure
d = diameter over conductor, in.,
a
D = diameter over insulation shiel
...
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