EN 16603-20-08:2023

Space engineering - Photovoltaic assemblies and components

This Standard specifies the general requirements for the qualification, procurement, storage and delivery of photovoltaic assemblies, solar cell assemblies, bare solar cells, coverglasses and protection diodes suitable for space applications.
This standard does not cover the particular qualification requirements for a specific mission.
This Standard primarily applies to qualification approval for photovoltaic assemblies, solar cell assemblies, bare solar cells, coverglasses and protection diodes, and to the procurement of these items.
This standard is limited to crystaline Silicon and single and multi-junction GaAs solar cells with a thickness of more than 50 m and does not include thin film solar cell technologies and poly-crystaline solar cells.
This Standard does not cover the concentration technology, and especially the requirements related to the optical components of a concentrator (e.g. reflector and lens) and their verification (e.g. collimated light source).
This Standard does not apply to qualification of the solar array subsystem, solar panels, structure and solar array mechanisms.

Raumfahrttechnik - Fotovoltaische Baugruppen und Komponenten

Ingéniérie spatiale - Ensembles et composants photovoltaïques

La présente norme spécifie les exigences générales pour la qualification,
l'approvisionnement, le stockage et la livraison des ensembles photovoltaïques,
ensembles de cellule solaire, cellules solaires brutes, couvertures en verre, diodes de
protection et diodes anti-retour planaires adaptés aux applications spatiales.
La présente norme ne couvre pas les exigences de qualification particulières applicables
à une mission spécifique.
La présente norme est principalement applicable à l'approbation de la qualification pour
les ensembles photovoltaïques, ensembles de cellule solaire, cellules solaires brutes,
couvertures en verre, diodes de protection et diodes anti-retour planaires, ainsi qu'à
l'approvisionnement de ces éléments.
La présente norme est limitée aux cellules solaires en silicium cristallin et en GaAs monojonction
et multi-jonction, avec une épaisseur supérieure à 50 m ; elle ne traite pas des
technologies de cellule solaire à film mince et des cellules solaires polycristallines.
La présente norme ne traite pas des technologies de concentration, en particulier des
exigences relatives aux composantes optiques d'un concentrateur (par exemple :
réflecteur et lentille) et à leur vérification (par exemple : source de lumière collimatée).
La présente norme n’est pas applicable à la qualification des sous-systèmes du
générateur solaire, des panneaux solaires, de la structure et des mécanismes du
générateur solaire.
La présente norme peut être adaptée aux caractéristiques et contraintes spécifiques d'un
projet spatial, conformément à l'ECSS-S-ST-00.
La qualification est un processus qui permet de confirmer la conformité aux exigences
établies en référence aux programmes d'essais de caractérisation et d'ingénierie ci-après.
Les lignes directrices relatives aux essais de caractérisation et d'ingénierie et à
l'assouplissement des essais de qualification en raison d'une similarité avec une
qualification antérieure sont décrites dans le manuel ECSS-E-HB-20-08. Les articles de la
présente norme, pour lesquels le manuel donne des informations supplémentaires, font
référence au manuel.

Vesoljska tehnika - Fotonapetostni sestavi in komponente

Ta standard določa splošne zahteve za ustreznost, naročanje, shranjevanje in dobavo fotonapetostnih sestavov, sestavov sončnih celic, posameznih sončnih celic, zaščitnih stekel in diod, primernih za vesoljske aplikacije.
Ta standard ne zajema posebnih zahtev ustreznosti za določeno misijo.
Ta standard se uporablja predvsem za odobritev ustreznosti fotonapetostnih sestavov, sestavov sončnih celic, posameznih sončnih celic, zaščitnih stekel in diod ter za naročanje teh elementov.
Standard zajema le sončne celice iz kristalnega silicija in enojne ter večspojne sončne celice GaAs debeline več kot 50 m, ne zajema pa tehnologij sončnih celic s tankimi filmi in polikristalnih sončnih celic.
Standard ne zajema koncentracijske tehnologije, in še zlasti zahtev, povezanih z optičnimi komponentami koncentratorja (npr. reflektor in leča) in preverjanja njihove ustreznosti (npr. kolimiran vir svetlobe).
Ta standard ne velja za ustreznost podsistemov sončnih sistemov, sončne kolektorje in strukturo ter mehanizme sončnih sistemov.

General Information

• Status: Published
• Publication Date: 12-Sep-2023
• ICS: 49.140 - Space systems and operations
• Technical Committee: CEN/CLC/TC 5 - Space
• Drafting Committee: CEN/CLC/TC 5/WG 6 - Upstream standards
• Current Stage: 6060 - Definitive text made available (DAV) - Publishing
• Start Date: 13-Sep-2023
• Due Date: 18-Sep-2022
• Completion Date: 13-Sep-2023
• Mandate: M/496 - Mandate addressed to CEN, CENELEC and ETSI to develop standardisation regarding space industry (Phase 3 of the process)
• Ref Project: SIST EN 16603-20-08:2023 - Space engineering - Photovoltaic assemblies and components

Relations

• Replaces: EN 16603-20-08:2014 - Space engineering - Part 20-08: Photovoltaic assemblies and components
• Effective Date: 18-Jan-2023

Standards Content (Sample)

SLOVENSKI STANDARD
01-december-2023
Vesoljska tehnika - Fotonapetostni sestavi in komponente
Space engineering - Photovoltaic assemblies and components
Raumfahrttechnik - Fotovoltaische Baugruppen und Komponenten
Ingéniérie spatiale - Ensembles et composants photovoltaïque
Ta slovenski standard je istoveten z: EN 16603-20-08:2023
ICS:
27.160 Sončna energija Solar energy engineering
49.140 Vesoljski sistemi in operacije Space systems and
operations
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 16603-20-08

NORME EUROPÉENNE
EUROPÄISCHE NORM
September 2023
ICS 49.140
Supersedes EN 16603-20-08:2014
English version
Space engineering - Photovoltaic assemblies and
components
Ingéniérie spatiale - Ensembles et composants Raumfahrttechnik - Fotovoltaische Baugruppen und
photovoltaïques Komponenten
This European Standard was approved by CEN on 23 July 2023.

CEN and CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for
giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical
references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to
any CEN and CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by
translation under the responsibility of a CEN and CENELEC member into its own language and notified to the CEN-CENELEC
Management Centre has the same status as the official versions.

CEN and CENELEC members are the national standards bodies and national electrotechnical committees of Austria, Belgium,
Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia,
Slovakia, Slovenia, Spain, Sweden, Switzerland, Türkiye and United Kingdom.

CEN-CENELEC Management Centre:
Rue de la Science 23, B-1040 Brussels
© 2023 CEN/CENELEC All rights of exploitation in any form and by any means
Ref. No. EN 16603-20-08:2023 E
reserved worldwide for CEN national Members and for
CENELEC Members.
Table of contents
European foreword . 12
Introduction . 13
1 Scope . 14
2 Normative references . 15
3 Terms, definitions and abbreviated terms . 17
3.1 Terms from other standards . 17
3.2 Terms specific to the present standard . 17
3.3 Abbreviated terms . 22
3.4 Nomenclature . 25
4 General . 26
4.1 Overview . 26
4.1.1 Objective and organization . 26
4.1.2 Interfaces with other areas . 28
4.2 Physical properties . 29
4.3 Test and storage . 29
4.3.1 Test environment . 29
4.3.2 Test tolerances and accuracies . 30
4.3.3 <> . 31
4.4 Critical materials . 31
5 Photovoltaic assemblies . 32
5.1 Overview . 32
5.1.1 Description. 32
5.1.2 Purpose and objective . 32
5.2 Conditions and method of test . 33
5.3 Photovoltaic assembly design . 34
5.3.1 Overview . 34
5.3.2 Parameters related to parts, materials and processes (PMP) . 34
5.3.3 Parameters related to design . 35
5.4 PVA manufacturing . 39
5.4.1 Process validation . 39
5.4.2 Defect acceptability . 39
5.4.3 In-process testing . 39
5.4.4 Identification and traceability . 41
5.4.5 Recording . 41
5.5 PVA tests . 41
5.5.1 Qualification tests . 41
5.5.2 Acceptance tests for qualification coupons . 50
5.5.3 Definition of tests and checks . 51
5.6 Failure definition . 62
5.6.1 Failure criteria . 62
5.6.2 Failed qualification coupons . 63
5.7 Data documentation . 63
5.8 Delivery . 63
5.9 Packaging, packing, handling and storage . 63
6 Solar cell assemblies . 64
6.1 General . 64
6.1.1 Testing . 64
6.1.2 Conditions and methods of test . 64
6.1.3 Deliverable components . 64
6.1.4 Identification and traceability . 64
6.2 Production control (process identification document) . 65
6.3 Acceptance tests . 65
6.3.1 General . 65
6.3.2 Test methods and conditions . 65
6.3.3 Electrical performance acceptance test (EPA) . 66
6.4 Qualification tests . 66
6.4.1 General . 66
6.4.2 Qualification . 68
6.4.3 Test methods, conditions and measurements . 69
6.5 Failure definition . 85
6.5.1 Failure criteria . 85
6.5.2 Failed SCAs . 85
6.6 Data documentation . 85
6.7 Delivery . 85
6.8 Packing, dispatching, handling and storage . 86
6.8.1 Overview . 86
6.8.2 ESD Sensitivity . 86
7 Bare solar cells . 87
7.1 Testing, deliverable components and marking . 87
7.1.1 Testing . 87
7.1.2 Deliverable components . 88
7.1.3 Marking . 88
7.2 Production control (process identification document) . 88
7.3 Acceptance tests . 89
7.3.1 General . 89
7.3.2 Test methods and conditions . 89
7.3.3 Documentation . 90
7.4 Qualification tests . 90
7.4.1 General . 90
7.4.2 Qualification . 92
7.5 Test methods, conditions and measurements . 93
7.5.1 Visual inspection including ELM (VI) . 93
7.5.2 Dimensions and weight (DW). 95
7.5.3 Electrical performance (EP) . 96
7.5.4 Temperature coefficients (TC) . 96
7.5.5 Spectral response (SR). 97
7.5.6 Optical properties (OP) . 98
7.5.7 Humidity and temperature (HT) . 98
7.5.8 Coating adherence (CA) . 100
7.5.9 Contact uniformity (CU) . 100
7.5.10 Contact thickness (CT) . 101
7.5.11 Surface finish (SF) . 101
7.5.12 Pull test (PT) . 101
7.5.13 Electron irradiation (EI) . 102
7.5.14 Proton irradiation (PI) . 103
7.5.15 Photon irradiation and temperature annealing (PH) . 105
7.5.16 Solar cell reverse bias test (RB) . 105
7.5.17 Thermal cycling (CY) . 106
7.5.18 Active-passive interface evaluation test (IF) . 106
7.5.19 Flatness test (FT) . 106
7.6 Failure definition . 107
7.6.1 Failure criteria . 107
7.6.2 Failed components . 107
7.7 Data documentation . 107
7.8 Delivery . 108
7.9 Packing, dispatching, handling and storage . 108
7.9.1 Overview . 108
7.9.2 ESD Sensitivity . 108
8 Coverglasses . 109
8.1 Overview . 109
8.1.1 Purpose . 109
8.1.2 Description. 109
8.2 Interfaces . 109
8.3 Testing, deliverable components and marking . 109
8.3.1 Testing . 109
8.3.2 Deliverable components . 110
8.3.3 Marking (coating orientation) . 110
8.4 Production control (Process identification document) . 111
8.5 Acceptance test . 111
8.5.1 Acceptance test samples . 111
8.5.2 Acceptance test sequence . 111
8.5.3 Test methods and conditions . 112
8.5.4 Documentation . 112
8.6 Qualification tests . 112
8.6.1 General . 112
8.6.2 Qualification . 113
8.7 Test methods, conditions and measurements . 115
8.7.1 Visual inspection (VI) . 115
8.7.2 Transmission into air (TA) . 116
8.7.3 Electro-optical properties (EO) . 117
8.7.4 Mechanical properties (MP) . 117
8.7.5 Reflectance properties (OP) . 118
8.7.6 Normal emittance (NE) . 119
8.7.7 Surface resistivity (SC) . 119
8.7.8 Flatness or bow (FT) . 120
8.7.9 Transmission into adhesive (TH) . 120
8.7.10 Boiling water test (BW) . 121
8.7.11 Humidity and temperature . 121
8.7.12 UV exposure (UV) . 122
8.7.13 Electron irradiation (EI) . 122
8.7.14 Proton irradiation (PI) . 123
8.7.15 Breaking strength (BS). 123
8.7.16 Thermal cycling (CY) . 123
8.7.17 Abrasion resistance (coated surface) (AE) . 124
8.7.18 Coating adhesion (TD) . 124
8.8 Failure definition . 124
8.8.1 Failure criteria . 124
8.8.2 Failed components . 124
8.9 Data documentation . 125
8.10 Delivery . 125
8.11 Packing, dispatching, handling and storage . 125
9 Solar cell protection diodes . 126
9.1 Overview . 126
9.2 Testing, deliverable components and marking . 126
9.2.1 Testing . 126
9.2.2 Deliverable components . 127
9.2.3 Marking . 128
9.3 Production control (process identification document) . 128
9.3.1 Integral protection diodes . 128
9.3.2 External protection diodes . 128
9.4 Acceptance tests . 128
9.4.1 General . 128
9.4.2 Integral protection diodes . 129
9.4.3 External protection diodes . 129
9.4.4 External and integral diodes . 129
9.4.5 Test methods and conditions . 130
9.4.6 Documentation . 130
9.5 Qualification tests . 131
9.5.1 General . 131
9.5.2 Integral protection diodes . 131
9.5.3 External protection diodes . 132
9.5.4 Integral and external protection diodes . 134
9.6 Test methods, conditions and measurements . 135
9.6.1 General . 135
9.6.2 Visual inspection (VI) . 135
9.6.3 Dimensions and weight (DW). 136
9.6.4 Thermal cycling (CY) . 137
9.6.5 Burn in (BI) . 137
9.6.6 Humidity and temperature . 138
9.6.7 Contact uniformity (CU) . 139
9.6.8 Contact thickness (CT) . 139
9.6.9 Surface Finish (SF) . 139
9.6.10 Contact adherence (CA) . 140
9.6.11 Pull test (PT) . 141
9.6.12 Electron irradiation (EI) . 142
9.6.13 Temperature annealing (TA) . 142
9.6.14 Temperature behaviour (TB) . 143
9.6.15 Diode characterization (DC) . 143
9.6.16 Human body ESD (DE) . 144
9.6.17 Switching test (DS) . 145
9.6.18 Long Duration – Life test (LT) . 147
9.7 Failure definition . 149
9.7.1 Failure criteria . 149
9.7.2 Failed components . 150
9.8 Data documentation . 150
9.9 Delivery . 150
9.10 Packing, despatching, handling and storage . 150
9.10.1 Overview . 150
9.10.2 ESD sensitivity . 150
10 Solar simulators and calibration procedures . 151
10.1 Solar simulators. 151
10.1.1 Spectral distribution . 151
10.1.2 Irradiance uniformity . 153
10.1.3 Irradiance stability . 154
10.2 Standard cell and Solar simulator calibration . 155
10.2.1 Primary standards . 155
10.2.2 Secondary working standards (SWS) . 155
10.2.3 Standards cells documentation . 157
10.2.4 Maintenance of standards . 157
10.2.5 Recalibration and intercomparison . 157
10.2.6 Solar simulator calibration and maintenance . 157
11 Capacitance measurement methods . 159
11.1 Single junction solar cell capacitance measurement . 159
11.1.1 Overview . 159
11.1.2 Signal measurement method . 159
11.1.3 Measurement procedure . 160
11.1.4 Measurement analysis . 163
11.1.5 Measurement of the capacitance of a multi-junction cell . 166
11.2 Time domain capacitance measurement . 167
11.2.1 Overview . 167
11.2.2 Measurement procedure . 168
12 Planar Blocking Diodes . 170
12.1 Overview . 170
12.2 Testing, deliverable components and Marking . 170
12.2.1 Testing . 170
12.2.2 Deliverable components . 171
12.2.3 Marking . 171
12.3 Production control (process identification document) . 172
12.4 Acceptance test . 172
12.4.1 General . 172
12.4.2 Planar blocking diodes . 172
12.5 Qualification tests . 173
12.5.1 General . 173
12.5.2 Blocking diodes . 173
12.5.3 Production and test schedule . 173
12.5.4 Qualification test samples . 173
12.5.5 Qualification testing . 174
12.6 Test methods, conditions and measurements . 177
12.6.1 Visual inspection (VI) . 177
12.6.2 Dimensions and weight (DW). 177
12.6.3 Diode characterization (DC) . 178
12.6.4 Humidity and Temperature . 178
12.6.5 Temperature Cycling (CY) . 180
12.6.6 Contact Adherence (CA) . 180
12.6.7 Burn-in (BI) . 181
12.6.8 Long duration-Life Test (LT) . 182
12.6.9 Temperature behaviour test (TB) . 182
12.6.10 Temperature robustness test (TR) . 183
12.6.11 Total Dose Radiation Testing (RT) . 183
12.6.12 Temperature Annealing (TA) . 185
12.6.13 Contact uniformity test (CU) . 185
12.6.14 Surface Finish test (SF) . 186
12.6.15 Human Body ESD test (ESD) . 186
12.6.16 Pull test (PT) / Interconnector adherence test (IA) . 187
12.6.17 Surge test (ST) . 187
12.6.18 Thermo-optical data (TO) . 188
12.7 Failure definition . 188
12.7.1 Failure criteria . 188
12.7.2 Failed Blocking Diodes . 188
12.8 Data documentation . 189
12.9 Delivery . 189
12.10 Packing, despatching, handling and storage . 189
12.10.1 Overview . 189
12.10.2 ESD sensitivity . 189
Annex A (normative) Source control drawing for photovoltaic assembly
(SCD-PVA) - DRD. 190
Annex B (normative) Source control drawing for solar cell assembly
(SCD-SCA) - DRD . 196
Annex C (normative) Source control drawing for bare solar cell
(SCD-BSC) - DRD . 201
Annex D (normative) Source control drawing for coverglass
(SCD-CVG) - DRD . 209
Annex E (normative) Source control drawing for External Protection
Diodes (SCD-EPD) - DRD . 215
Annex F (normative) Process identification document (PID) - DRD . 219
Annex G (normative) Data documentation package (DDP) - DRD . 221
Annex H (normative) Source control drawing for Planar Blocking Diodes
(SCD-PBD) - DRD . 224
Bibliography . 229

Figures
Figure 4-1: Specification hierarchy . 28
Figure 6-1: Definition of cell defects . 70
Figure 6-2: Test points for electrical performance measurement . 72
Figure 7-1: Definition of bare solar cell defects. 94
Figure 8-1: Methods of defining coverglass orientation . 111
Figure 8-2: Edge chip parameters . 116
Figure 8-3: Corner chip parameters . 116
Figure 8-4: Coverglass manufacturing tolerance limits . 117
Figure 8-5: Schematic for calculating surface resistivity . 120
Figure 8-6: Definition of coverglass flatness . 120
Figure 9-1: Diode forward and reverse test profile . 147
Figure 9-2: Diode switching test profile . 147
Figure 11-1: Solar cell impedance measurement equipment . 161
Figure 11-2: Channel balancing and reduction of the parasitic inductances . 162
Figure 11-3: Measurement of the resistance value of the shunt in the measuring
conditions (shunt in parallel with the input of the network analyser) . 162
Figure 11-4: Small signal electrical schema biased with a DC voltage associated
impedance . 165
Figure C-1 : BSC front side . 203
Figure C-2 : BSC rear side . 203
Figure C-3 : BSC contact . 203

Tables
Table 4-1: Test tolerances on temperature . 30
Table 5-1: Qualification test plan for PVA . 42
Table 5-2: Acceptance test plan . 51
Table 6-1: Qualification test plan for SCA. 67
Table 6-2: Maximum dimensions of corner chips, edge chips and surface nicks . 70
Table 7-1: Acceptance test matrix . 89
Table 7-2: Qualification test plan for bare solar cells . 91
Table 7-3: Maximum dimensions of corner chips, edge chips and surface nicks . 94
Table 8-1: Qualification test plan for coverglasses . 114
Table 9-1: Acceptance test matrix IPD . 129
Table 9-2: Acceptance test matrix EPD . 129
Table 9-3: Qualification test plan for integral protection diode . 132
Table 9-4: Qualification test plan for bare protection diodes . 133
Table 9-5: Diode long duration-life test parameters . 149
Table 10-1: <> . 152
Table 10-2: Classes of single and multi-source solar simulators (informative) . 152
Table 10-3: Classes of solar simulators with respect to nonconformity of irradiance
uniformity (informative) . 154
Table 10-4: Classes of solar simulators with respect to temporal instability of
irradiance . 155
Table 12-1: Acceptance test matrix planar blocking diodes . 172
Table 12-2: Qualification test plan for bare blocking diodes . 175
Table 12-3: Qualification test plan for connector integrated blocking diodes . 176
Table 12-4: Diode Irradiation and bias conditions . 184
Table B-1 : Minimum current requirement for solar assemblies (25 °C or operating
temperature) . 198
Table C-1 : Electrical performance pass-fail criteria . 205
Table D-1 : Average transmission into air before test (%) . 211
Table D-2 : Maximum average deviation of transmission into air after test (%). 212
European foreword
This document (EN 16603-20-08:2023) has been prepared by Technical
Committee CEN-CENELEC/TC 5 “Space”, the secretariat of which is held by
DIN.
This standard (EN 16603-20-08:2023) originates from ECSS-E-ST-20-08C
Rev.2.
This European Standard shall be given the status of a national standard,
either by publication of an identical text or by endorsement, at the latest by
March 2024, and conflicting national standards shall be withdrawn at the
latest by March 2024.
Attention is drawn to the possibility that some of the elements of this
document may be the subject of patent rights. CEN [and/or CENELEC] shall
not be held responsible for identifying any or all such patent rights.
This document supersedes EN 16603-20-08:2014.
The main changes with respect to EN 16603-20-08:2014 are listed below:
• Implementation of change requests
• Addition of new clause 12 “Planar Blocking Diodes”
• Check and update of the use of the verb “define” in the document
This document has been prepared under a standardization request given to
CEN by the European Commission and the European Free Trade
Association.
This document has been developed to cover specifically space systems and
has therefore precedence over any EN covering the same scope but with a
wider domain of applicability (e.g. : aerospace).
According to the CEN-CENELEC Internal Regulations, the national standards
organizations of the following countries are bound to implement this
European Standard: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech
Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of
Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland,
Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

Introduction
The qualification, procurement, storage and delivery of space solar arrays are
specified in the dedicated solar array specification, where requirements for the
solar array electrical layout, structure and mechanism are specified.
This Standard outlines the requirements for the qualification, procurement,
storage and delivery of the main assemblies and components of the space solar
array electrical layout: photovoltaic assemblies, solar cell assemblies, bare solar
cells, coverglass and protection diodes. This Standard does not outline the
requirements for the qualification, procurement, storage and delivery of the
solar array subsystem, comprising the solar panels, structural parts and
mechanisms.
The general requirements are covered in the main part of this Standard (clauses 5
to 11). Annex A to Annex E specify the contents of the source control drawing of
photovoltaic and solar cell assemblies, bare solar cells coverglasses and
protection diodes and include the inspection data, physical and electrical
characteristics, other ratings and acceptance and qualification specific
requirements, which can be different for each space project.
This Standard is divided into five specific subjects, each one corresponding to
each assembly or component:
• Clause 5 for photovoltaic assemblies,
• Clause 6 for solar cell assemblies,
• Clause 7 for bare solar cells,
• Clause 8 for coverglasses,
• Clause 9 for protection diodes,
• Clause 12 for planar blocking diodes.
Two additional clauses are dedicated to Sun simulators and calibration
procedures (clause 10) and capacitance measurement methods (clause 11).
NOTE At the time of the publication of this Standard the
handbook ECSS-E-HB-20-08A, that is called in this
document, has not yet been published.
Scope
This Standard specifies the general requirements for the qualification,
procurement, storage and delivery of photovoltaic assemblies, solar cell
assemblies, bare solar cells, coverglasses, protection diodes and planar blocking
diodes suitable for space applications.
This standard does not cover the particular qualification requirements for a
specific mission.
This Standard is primarily applicable for qualification approval for photovoltaic
assemblies, solar cell assemblies, bare solar cells, coverglasses, protection diodes
and planar blocking diodes, and to the procurement of these items.
This standard is limited to crystalline Silicon and single and multi-junction GaAs
solar cells with a thickness of more than 50 µm and does not include thin film
solar cell technologies and poly-crystalline solar cells.
This Standard does not cover the concentration technology, and especially the
requirements related to the optical components of a concentrator (e.g. reflector
and lens) and their verification (e.g. collimated light source).
This Standard is not applicable for qualification of the solar array subsystem,
solar panels, structure and solar array mechanisms.
This standard may be tailored for the specific characteristic and constrains of a
space project in conformance with ECSS-S-ST-00.
Qualification is a process to confirm compliance with requirements that have
been established with reference to foregoing characterization and engineering
test programs. Guidelines for characterization and engineering tests and for
relaxation of qualification tests due to similarity with earlier performed
qualification are described in the handbook ECSS-E-HB-20-08. Those clauses in
this standard, for which the Handbook gives additional information, will refer
to the Handbook.
Normative references
The following normative documents contain provisions which, through
reference in this text, constitute provisions of this ECSS Standard. For dated
references, subsequent amendments to, or revision of any of these publications
do not apply, However, parties to agreements based on this ECSS Standard are
encouraged to investigate the possibility of applying the more recent editions of
the normative documents indicated below. For undated references, the latest
edition of the publication referred to applies.

EN reference Reference in text Title
EN 16601-00-01 ECSS-S-ST-00-01 ECSS system – Glossary of terms
EN 16603-10-03 ECSS-E-ST-10-03 Space engineering – Testing
EN 16603-20 ECSS-E-ST-20 Space engineering –Electrical and electronic
EN 16603-20-06 ECSS-E-ST-20-06 Space engineering – Spacecraft charging
EN 16602-60 ECSS-Q-ST-60 Space product assurance — Electrical, electronic
and electromechanical (EEE) components
EN 16602-70-01 ECSS-Q-ST-70-01 Space product assurance – Cleanliness and
contamination control
EN 16602-70-06 ECSS-Q-ST-70-06 Space product assur
...