EN ISO 14880-2:2024
(Main)Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2024)
Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2024)
This document specifies methods for testing wavefront aberrations for microlenses within microlens arrays. It is applicable to microlens arrays with very small lenses formed inside or on one or more surfaces of a common substrate.
Optik und Photonik-Mikrolinsenarrays-Teil 2:Prüfverfahren für Wellenfrontaberrationen (ISO 14880‑2:2024)
Dieses Dokument legt die Verfahren zum Prüfen der Wellenfrontaberrationen für Mikrolinsen innerhalb von Mikrolinsenarrays fest. Es ist anwendbar für Mikrolinsenarrays mit sehr kleinen Linsen in oder auf einer bzw. mehreren Oberflächen eines gemeinsamen Substrats.
Optique et photonique - Réseaux de microlentilles - Partie 2: Méthodes d'essai pour les aberrations du front d'onde (ISO 14880-2:2024)
Le présent document spécifie des méthodes d'essai des aberrations du front d'onde pour les microlentilles en réseaux. Il s'applique aux réseaux de très petites lentilles qui composent l'intérieur ou bien une ou plusieurs surfaces d'un substrat commun.
Optika in fotonska tehnologija - Vrste mikroleč - 2. del: Preskusne metode za ugotavljanje odstopanja valovne fronte (ISO 14880-2:2024)
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
01-januar-2025
Nadomešča:
SIST EN ISO 14880-2:2007
Optika in fotonska tehnologija - Vrste mikroleč - 2. del: Preskusne metode za
ugotavljanje odstopanja valovne fronte (ISO 14880-2:2024)
Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
(ISO 14880-2:2024)
Optik und Photonik - Mikrolinsenarrays - Teil 2: Prüfverfahren für
Wellenfrontaberrationen (ISO 14880-2:2024)
Optique et photonique - Réseaux de microlentilles - Partie 2: Méthodes d'essai pour les
aberrations du front d'onde (ISO 14880-2:2024)
Ta slovenski standard je istoveten z: EN ISO 14880-2:2024
ICS:
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EN ISO 14880-2
EUROPEAN STANDARD
NORME EUROPÉENNE
November 2024
EUROPÄISCHE NORM
ICS 31.260 Supersedes EN ISO 14880-2:2006
English Version
Optics and photonics - Microlens arrays - Part 2: Test
methods for wavefront aberrations (ISO 14880-2:2024)
Optique et photonique - Réseaux de microlentilles - Optik und Photonik-Mikrolinsenarrays-Teil
Partie 2: Méthodes d'essai pour les aberrations du 2:Prüfverfahren für Wellenfrontaberrationen (ISO
front d'onde (ISO 14880-2:2024) 14880-2:2024)
This European Standard was approved by CEN on 23 November 2024.
CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this
European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references
concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN
member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by
translation under the responsibility of a CEN member into its own language and notified to the CEN-CENELEC Management
Centre has the same status as the official versions.
CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway,
Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Türkiye and
United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION
EUROPÄISCHES KOMITEE FÜR NORMUNG
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2024 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO 14880-2:2024 E
worldwide for CEN national Members.
Contents Page
European foreword . 3
European foreword
This document (EN ISO 14880-2:2024) has been prepared by Technical Committee ISO/TC 172 “Optics
and photonics” in collaboration with Technical Committee CEN/TC 123 “Lasers and photonics” the
secretariat of which is held by DIN.
This European Standard shall be given the status of a national standard, either by publication of an
identical text or by endorsement, at the latest by May 2025, and conflicting national standards shall be
withdrawn at the latest by May 2025.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN shall not be held responsible for identifying any or all such patent rights.
This document supersedes EN ISO 14880-2:2006.
Any feedback and questions on this document should be directed to the users’ national standards
body/national committee. A complete listing of these bodies can be found on the CEN website.
According to the CEN-CENELEC Internal Regulations, the national standards organizations of the
following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland,
Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of
North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Türkiye and the
United Kingdom.
Endorsement notice
The text of ISO 14880-2:2024 has been approved by CEN as EN ISO 14880-2:2024 without any
modification.
International
Standard
ISO 14880-2
Second edition
Optics and photonics — Microlens
2024-11
arrays —
Part 2:
Test methods for wavefront
aberrations
Optique et photonique — Réseaux de microlentilles —
Partie 2: Méthodes d'essai pour les aberrations du front d'onde
Reference number
ISO 14880-2:2024(en) © ISO 2024
ISO 14880-2:2024(en)
© ISO 2024
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
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Published in Switzerland
ii
ISO 14880-2:2024(en)
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms, definitions, symbols and abbreviated terms . 1
3.1 Terms and definitions .1
3.2 Symbols and abbreviated terms .1
4 Apparatus . 2
5 Test principle . 3
6 Measurement arrangements . 3
6.1 Measurement arrangement for single microlenses .3
6.2 Measurement arrangements for microlens arrays .3
6.3 Geometrical alignment of the sample .4
6.4 Preparation .4
7 Procedure . 4
8 Evaluation . 4
9 Uncertainty of measurement . 4
10 Test report . 5
Annex A (informative) Measurement requirements for test methods for microlenses . 6
Annex B (informative) Microlens test Methods 1 and 2 using Mach-Zehnder interferometer
systems . 8
Annex C (informative) Microlens test Methods 3 and 4 using a lateral shearing interferometer
system. 14
Annex D (informative) Microlens test Method 5 using a Shack-Hartmann sensor system .18
Annex E (informative) Microlens array test Method 1 using a Twyman-Green interferometer
system.20
Annex F (informative) Measurement of uniformity of microlens array using test Method 2 .22
Bibliography .25
iii
ISO 14880-2:2024(en)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out through
ISO technical committees. Each member body interested in a subject for which a technical committee
has been established has the right to be represented on that committee. International organizations,
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with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of ISO document should be noted. This document was drafted in accordance with the editorial rules of the
ISO/IEC Directives, Part 2 (see www.iso.org/directives).
ISO draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed patent
rights in respect thereof. As of the date of publication of this document, ISO had not received notice of (a)
patent(s) which may be required to implement this document. However, implementers are cautioned that
this may not represent the latest information, which may be obtained from the patent database available at
www.iso.org/patents. ISO shall not be held responsible for identifying any or all such patent rights.
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related to conformity assessment, as well as information about ISO's adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 172, Optics and Photonics, Subcommittee SC 9,
Laser and electro-optical systems, in collaboration with the European Committee for Standardization (CEN)
Technical Committee CEN/TC 123, Lasers and photonics, in accordance with the Agreement on technical
cooperation between ISO and CEN (Vienna Agreement).
This second edition cancels and replaces the first edition (ISO 14880-2:2006), which has been technically
revised.
The main changes are as follows:
— text for Annex E was revised;
— Figure E.1 was replaced;
— references and numbering confirmed.
A list of all parts in the ISO 14880 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org
...
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