EN ISO 14880-4:2024
(Main)Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880‑4:2024)
Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880‑4:2024)
This document specifies methods for testing geometrical properties of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded-index microlenses.
Optik und Photonik - Mikrolinsenarrays - Teil 4: Prüfverfahren für geometrische Eigenschaften (ISO 14880‑4:2024)
Dieses Dokument legt Verfahren zum Prüfen der geometrischen Eigenschaften von Mikrolinsen in Mikrolinsenarrays fest. Die Norm gilt für Mikrolinsenarrays mit sehr kleinen Linsen, die auf einer oder mehreren Oberflächen eines gemeinsamen Substrats angeordnet sind, und für Gradientenindex-Mikrolinsen.
Optique et photonique - Réseaux de microlentilles - Partie 4: Méthodes d'essai pour les propriétés géométriques (ISO 14880‑4:2024)
L'ISO 14880-4:2006 spécifie des méthodes d'essai pour les propriétés géométriques des microlentilles dans les réseaux de microlentilles. Elle s'applique aux réseaux de microlentilles avec de très petites lentilles qui composent une ou plusieurs surfaces d'un substrat commun et aux microlentilles à gradient d'indice.
Optika in fotonska tehnologija - Vrste mikroleč - 4. del: Preskusne metode za geometrične lastnosti (ISO 14880‑4:2024)
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Standards Content (Sample)
SLOVENSKI STANDARD
oSIST prEN ISO 14880-4:2023
01-junij-2023
Nadomešča:
SIST EN ISO 14880-4:2006
Optika in fotonska tehnologija - Vrste mikroleč - 4. del: Preskusne metode za
geometrične lastnosti (ISO/DIS 14880-4:2023)
Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties
(ISO/DIS 14880-4:2023)
Optik und Photonik - Mikrolinsenarrays - Teil 4: Prüfverfahren für geometrische
Eigenschaften (ISO/DIS 14880-4:2023)
Optique et photonique - Réseaux de microlentilles - Partie 4: Méthodes d'essai pour les
propriétés géométriques (ISO/DIS 14880-4:2023)
Ta slovenski standard je istoveten z: prEN ISO 14880-4
ICS:
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
oSIST prEN ISO 14880-4:2023 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
oSIST prEN ISO 14880-4:2023
oSIST prEN ISO 14880-4:2023
DRAFT INTERNATIONAL STANDARD
ISO/DIS 14880-4
ISO/TC 172/SC 9 Secretariat: DIN
Voting begins on: Voting terminates on:
2023-04-11 2023-07-04
Optics and photonics — Microlens arrays —
Part 4:
Test methods for geometrical properties
Optique et photonique — Réseaux de microlentilles —
Partie 4: Méthodes d'essai pour les propriétés géométriques
ICS: 31.260
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oSIST prEN ISO 14880-4:2023
ISO/DIS 14880-4:2023(E)
DRAFT INTERNATIONAL STANDARD
ISO/DIS 14880-4
ISO/TC 172/SC 9 Secretariat: DIN
Voting begins on: Voting terminates on:
Optics and photonics — Microlens arrays —
Part 4:
Test methods for geometrical properties
Optique et photonique — Réseaux de microlentilles —
Partie 4: Méthodes d'essai pour les propriétés géométriques
ICS: 31.260
This document is circulated as received from the committee secretariat.
THIS DOCUMENT IS A DRAFT CIRCULATED
FOR COMMENT AND APPROVAL. IT IS
© ISO 2023
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ii
PROVIDE SUPPORTING DOCUMENTATION. © ISO 2023
oSIST prEN ISO 14880-4:2023
ISO/DIS 14880-4:2023(E)
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Coordinate system .3
5 Test methods . 3
5.1 Pitch and surface modulation depth measurement . 3
5.1.1 Use of stylus instrument . 3
5.1.2 Use of confocal microscope . 5
5.2 Physical thickness. 8
5.2.1 Principle . 8
5.2.2 Set-up and preparation . 8
5.3 Radius of curvature. 8
5.3.1 Principle . 8
5.3.2 Measurement arrangement and test equipment . 10
5.4 Surface preparation of microlens array for measurement . 11
6 Procedure .12
6.1 Measurement of pitch and surface modulation depth (lens sag) .12
6.1.1 Preliminary measurements.12
6.2 Making measurements and interpreting the results .12
6.3 Measurement of physical thickness .12
6.4 Measurement of radius of curvature .12
7 Results and uncertainties .13
8 Test report .13
Annex A (informative) Measurement with a Fizeau interferometer system .15
Annex B (informative) Uniformity of array spacing .18
Bibliography .21
iii
oSIST prEN ISO 14880-4:2023
ISO/DIS 14880-4:2023(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
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ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
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on the ISO list of patent declarations received (see www.iso.org/patents).
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expressions related to conformity assessment, as well as information about ISO's adherence to
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www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 172, Optics and Photonics, Subcommittee
SC 09, Laser and electro-optical systems.
This second edition cancels and replaces the first edition (ISO 14880-4:2006), which has been
technically revised.
The main changes are as follows:
— Introduction revised
— Updated the references to terms defined in 14880-1.
— Figure 8 replaced.
— References updated.
A list of all parts in the ISO 14880 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.
iv
oSIST prEN ISO 14880-4:2023
ISO/DIS 14880-4:2023(E)
Introduction
This document specifies methods for testing geometrical properties of microlens arrays. Examples of
applications for microlens arrays include three-dimensional displays, coupling optics associated with
arrayed light sources and photo-detectors, enhanced optics for liquid crystal displays, and optical
parallel processor elements.
The market in microlens arrays has generated a need for agreement on basic terminology and test
methods. Standard terminology and clear definitions are needed not only to promote applications
but also to encourage scientists and engineers to exchange ideas and new concepts based on common
understanding.
This document contributes to the purpose of the series of ISO 14880 standards, which is to improve the
compatibility and interchangeability of lens arrays from different suppliers and to enhance development
of the technology using microlens arrays.
Characteristic parameters are defined and examples of applications given in ISO 14880-1, Vocabulary.
It has been completed by a set of three other International Standards, i.e. Part 2, Test methods for
wavefront aberrations, Part 3, Test methods for optical properties other than wavefront aberrations and
Part 4, Test methods for geometrical properties.
The measurement of physical characteristics of pitch and surface modulation depth can be made using
a stylus instrument and non-contact optical probe system. Physical thickness can be measured with a
micrometer. The measurement processes are described in the body of this document.
v
oSIST prEN ISO 14880-4:2023
oSIST prEN ISO 14880-4:2023
DRAFT INTERNATIONAL STANDARD ISO/DIS 14880-4:2023(E)
Optics and photonics — Microlens arrays —
Part 4:
Test methods for geometrical properties
1 Scope
This document specifies methods for testing geometrical properties of microlenses in microlens arrays.
It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common
substrate and to graded-index microlenses.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO 14880-1, Optics and photonics — Microlens arrays — Part 1: Vocabulary
3 Terms and definitions
For the purposes of this document
...
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