CR 10320:2004

Optical emission analysis of low alloy steels (routine method) - Method for determination of C, Si, S, P, Mn, Cr, Ni and Cu

This document specifies an optical emission spectrometry spark source routine standard method for multi-element analysis of unalloyed steel and iron.

Optische Emissionsanalyse von niedriglegierten Stählen (Reihenanalyse) - Verfahren zur Bestimmung von C, Si, S, P, Mn, Cr, Ni und Cu

Analyse des aciers faiblement alliés par spectrométrié d´émission optique (méthode de routine) - Méthode de détermination de C, Si, S, P, Mn, Cr, Ni et Cu

Optična emisijska analiza malolegiranih jekel (rutinska metoda) – Metoda za določevanje C, Si, S, P, Mn, Cr, Ni in Cu

General Information

• Status: Published
• Publication Date: 28-Sep-2004
• ICS: 77.040.30 - Chemical analysis of metals
• ICS: 77.140.20 - Stainless steels
• Technical Committee: ECISS/TC 102 - Methods of chemical analysis for iron and steel
• Drafting Committee: ECISS/TC 102 - Methods of chemical analysis for iron and steel
• Current Stage: 6060 - Definitive text made available (DAV) - Publishing
• Start Date: 29-Sep-2004
• Completion Date: 29-Sep-2004
• Mandate: M/005 - Mandate to CEN/ECISS concerning standardization in the iron and steel sector
• Ref Project: SIST-TP CEN/CR 10320:2004 - Optical emission analysis of low alloy steels (routine method) - Method for determination of C, Si, S, P, Mn, Cr, Ni and Cu

Relations

• Parent: CR 10316:2001 - Optical emission analysis of low alloy steels (routine method) - Guidelines for the preparation of standard routine method for optical emission spectrometry
• Effective Date: 22-Dec-2008

Standards Content (Sample)

SLOVENSKI STANDARD
SIST-TP CEN/CR 10320:2004
01-december-2004
2SWLþQDHPLVLMVNDDQDOL]DPDOROHJLUDQLKMHNHOUXWLQVNDPHWRGD±0HWRGD]D
GRORþHYDQMH&6L630Q&U1LLQ&X
Optical emission analysis of low alloy steels (routine method) - Method for determination
of C, Si, S, P, Mn, Cr, Ni and Cu
Optische Emissionsanalyse von niedriglegierten Stählen (Reihenanalyse) - Verfahren zur
Bestimmung von C, Si, S, P, Mn, Cr, Ni und Cu
Analyse des aciers faiblement alliés par spectrométrié d´émission optique (méthode de
routine) - Méthode de détermination de C, Si, S, P, Mn, Cr, Ni et Cu
Ta slovenski standard je istoveten z: CR 10320:2004
ICS:
77.040.30 Kemijska analiza kovin Chemical analysis of metals
77.080.20 Jekla Steels
SIST-TP CEN/CR 10320:2004 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST-TP CEN/CR 10320:2004

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SIST-TP CEN/CR 10320:2004
CEN REPORT
CR 10320
RAPPORT CEN
CEN BERICHT
September 2004
ICS 77.040.20; 77.140.20

English version
Optical emission analysis of low alloy steels (routine method) -
Method for determination of C, Si, S, P, Mn, Cr, Ni and Cu
Analyse des aciers faiblement alliés par spectrométrié Optische Emissionsanalyse von niedriglegierten Stählen
d´émission optique (méthode de routine) - Méthode de (Reihenanalyse) - Verfahren zur Bestimmung von C, Si, S,
détermination de C, Si, S, P, Mn, Cr, Ni et Cu P, Mn, Cr, Ni und Cu
This CEN Report was approved by CEN on 3 June 2001. It has been drawn up by the Technical Committee ECISS/TC 20.
CEN members are the national standards bodies of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France,
Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia,
Slovenia, Spain, Sweden, Switzerland and United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION
EUROPÄISCHES KOMITEE FÜR NORMUNG
Management Centre: rue de Stassart, 36  B-1050 Brussels
© 2004 CEN All rights of exploitation in any form and by any means reserved Ref. No. CR 10320:2004: E
worldwide for CEN national Members.

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SIST-TP CEN/CR 10320:2004
CR 10320:2004 (E)
Contents          page
Foreword.3
1 Scope .4
2 Test sample preparation .4
3 Calibration of the instrument.4
3.1 Determination of calibration curve .4
3.2 Linear correlation.5
3.3 Quadratic correlation .6
3.4 Confidence limit (Syc) and standard error (Syx) in a linear correlation .7
3.5 Confidence limit (Syc) and standard error (Syx) in a quadratic correlation.7
3.6 Correlation accuracy .8
4 Calculation of interferences .8
4.1 Spectral interferences .8
4.2 Matrix interferences.10
4.3 Calculation of an interfered element due to either matrix effect or spectral interference.10
5 Determination of performance criteria .11
5.1 Determination of background equivalent concentration BEC .11
5.2 Determination of detection limit DL.11
...