Nanotechnology - Nanoparticles in powder form - Characteristics and measurements (ISO/TS 17200:2013)

ISO/TS 17200:2013 lists fundamental characteristics which are commonly determined for nanoparticles in powder form. ISO/TS 17200:2013 prescribes specific measurement methods for each of these characteristics.

Nanotechnologien - Nanopartikel in Pulverform - Eigenschaften und Messung (ISO/TS 17200:2013)

Diese Technische Spezifikation führt grundlegende Eigenschaften auf, die im Allgemeinen für Nanopartikel in Pulverform bestimmt werden. Sie legt für jede dieser Eigenschaften spezielle Messverfahren fest.
Diese Technische Spezifikation legt keine annehmbaren quantitativen Kriterien für die Eigenschaften fest, da diese zwischen Verkäufern, Kunden und Regulierungsbehörden zu vereinbaren sind.
Ausgenommen von dieser Technischen Spezifikation sind Eigenschaften, die sich speziell auf Gesundheits-, Sicherheits- und Umweltschutzprobleme beziehen, wie auch Eigenschaften, die spezielle Anwendungen von Nanopartikeln in Pulverform betreffen.

Nanotechnologies - Nanoparticules sous forme de poudre - Caractéristiques et mesures (ISO/TS 17200:2013)

L'ISO/TS 17200:2013 dresse la liste des caractéristiques fondamentales communément déterminées pour les nanoparticules sous forme de poudre. L'ISO/TS 17200:2013 spécifie les méthodes de mesure spécifiques pour chacune de ces caractéristiques.

Nanotehnologija - Nanodelci v obliki prahu - Karakteristike in mere (ISO/TS 17200:2013)

General Information

Status
Withdrawn
Publication Date
19-May-2015
Technical Committee
Current Stage
9960 - Withdrawal effective - Withdrawal
Completion Date
23-Sep-2020

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SLOVENSKI STANDARD
SIST-TS CEN ISO/TS 17200:2015
01-julij-2015
Nanotehnologija - Nanodelci v obliki prahu - Karakteristike in mere (ISO/TS
17200:2013)
Nanotechnology - Nanoparticles in powder form - Characteristics and measurements
(ISO/TS 17200:2013)

Nanotechnologien - Nanopartikel in Pulverform - Eigenschaften und Messung (ISO/TS

17200:2013)

Nanotechnologies - Nanoparticules sous forme de poudre - Caractéristiques et mesures

(ISO/TS 17200:2013)
Ta slovenski standard je istoveten z: CEN ISO/TS 17200:2015
ICS:
07.120 Nanotehnologije Nanotechnologies
SIST-TS CEN ISO/TS 17200:2015 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST-TS CEN ISO/TS 17200:2015
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SIST-TS CEN ISO/TS 17200:2015
TECHNICAL SPECIFICATION
CEN ISO/TS 17200
SPÉCIFICATION TECHNIQUE
TECHNISCHE SPEZIFIKATION
May 2015
ICS 07.030
English Version
Nanotechnology - Nanoparticles in powder form - Characteristics
and measurements (ISO/TS 17200:2013)

Nanotechnologies - Nanoparticules sous forme de poudre - Nanotechnologien - Nanopartikel in Pulverform -

Caractéristiques et mesures (ISO/TS 17200:2013) Eigenschaften und Messung (ISO/TS 17200:2013)

This Technical Specification (CEN/TS) was approved by CEN on 16 May 2015 for provisional application.

The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to submit their

comments, particularly on the question whether the CEN/TS can be converted into a European Standard.

CEN members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS available

promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in parallel to the CEN/TS)

until the final decision about the possible conversion of the CEN/TS into an EN is reached.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,

Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania,

Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United

Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION
EUROPÄISCHES KOMITEE FÜR NORMUNG
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels

© 2015 CEN All rights of exploitation in any form and by any means reserved Ref. No. CEN ISO/TS 17200:2015 E

worldwide for CEN national Members.
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SIST-TS CEN ISO/TS 17200:2015
CEN ISO/TS 17200:2015 (E)
Contents
Page

Foreword ..............................................................................................................................................................3

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SIST-TS CEN ISO/TS 17200:2015
CEN ISO/TS 17200:2015 (E)
Foreword

The text of ISO/TS 17200:2013 has been prepared by Technical Committee ISO/TC 229 “Nanotechnologies”

of the International Organization for Standardization (ISO) and has been taken over as

CEN ISO/TS 17200:2015 by Technical Committee CEN/TC 352 “Nanotechnologies” the secretariat of which is

held by AFNOR.

Attention is drawn to the possibility that some of the elements of this document may be the subject of patent

rights. CEN [and/or CENELEC] shall not be held responsible for identifying any or all such patent rights.

According to the CEN-CENELEC Internal Regulations, the national standards organizations of the following

countries are bound to announce this Technical Specification: Austria, Belgium, Bulgaria, Croatia, Cyprus,

Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,

Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland,

Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.

Endorsement notice

The text of ISO/TS 17200:2013 has been approved by CEN as CEN ISO/TS 17200:2015 without any

modification.
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SIST-TS CEN ISO/TS 17200:2015
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SIST-TS CEN ISO/TS 17200:2015
TECHNICAL ISO/TS
SPECIFICATION 17200
First edition
2013-06-01
Nanotechnology — Nanoparticles in
powder form — Characteristics and
measurements
Nanotechnologies — Nanoparticules sous forme de poudre —
Caractéristiques et mesures
Reference number
ISO/TS 17200:2013(E)
ISO 2013
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SIST-TS CEN ISO/TS 17200:2015
ISO/TS 17200:2013(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2013

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form

or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior

written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of

the requester.
ISO copyright office
Case postale 56 • CH-1211 Geneva 20
Tel. + 41 22 749 01 11
Fax + 41 22 749 09 47
E-mail copyright@iso.org
Web www.iso.org
Published in Switzerland
ii © ISO 2013 – All rights reserved
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SIST-TS CEN ISO/TS 17200:2015
ISO/TS 17200:2013(E)
Contents Page

Foreword ........................................................................................................................................................................................................................................iv

Introduction ..................................................................................................................................................................................................................................v

1 Scope ................................................................................................................................................................................................................................. 1

2 Normative references ...................................................................................................................................................................................... 1

3 Terms and definitions ..................................................................................................................................................................................... 1

4 Fundamental characteristics with corresponding measurement methods ...........................................2

5 Sample preparation ........................................................................................................................................................................................... 2

6 Measurement methods .................................................................................................................................................................................. 3

6.1 Chemical composition ...................................................................................................................................................................... 3

6.2 Specific surface area by BET method ......... .......................................................................................................................... 4

6.3 Crystal structure by XRD method ........................................................................................................................................... 4

6.4 Average crystallite size by XRD (Scherrer formula) method .......................................................................... 4

6.5 Average and standard deviation of the measured primary particle sizes by TEM method .. 4

7 Test report ................................................................................................................................................................................................................... 4

Annex A (informative) Applicability of this Technical Specification ................................................................................... 6

Bibliography ................................................................................................................................................................................................................................ 7

© ISO 2013 – All rights reserved iii
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SIST-TS CEN ISO/TS 17200:2015
ISO/TS 17200:2013(E)
Foreword

ISO (the International Organization for Standardization) is a worldwide federation of national standards

bodies (ISO member bodies). The work of preparing International Standards is normally carried out

through ISO technical committees. Each member body interested in a subject for which a technical

committee has been established has the right to be represented on that committee. International

organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.

ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of

electrotechnical standardization.

The procedures used to develop this document and those intended for its further maintenance are

described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the

different types of ISO documents should be noted. This document was drafted in accordance with the

editorial rules of the ISO/IEC Directives, Part 2. www.iso.org/directives

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of

any patent rights identified during the development of the document will be in the Introduction and/or

on the ISO list of patent declarations received. www.iso.org/patents

Any trade name used in this document is information given for the convenience of users and does not

constitute an endorsement.
The committee responsible for this document is ISO/TC 229, Nanotechnologies.
iv © ISO 2013 – All rights reserved
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SIST-TS CEN ISO/TS 17200:2015
ISO/TS 17200:2013(E)
Introduction

As is commonly noticed for every technology concerned with the development of new materials, and for

nanotechnology in particular, information sharing on material characteristics by sellers and buyers, and

sometimes also by regulators, is important and is facilitated by the development of appropriate material

specifications. For a comprehensive exchange of information, it is essential to agree on the description

of the material characteristics. However, many characteristics of nanomaterials cannot be determined

using general and well-established measurement methods. This may become the cause for inconsistency

in experimental results and induce confusion in commerce and technology transfer. Furthermore, the

rapid discovery of new materials from nanotechnology increases the number of characteristics that

need to be specified for an appropriate dissemination of information.

In order to address this need, a systematic arrangement of characteristics has been carried out

across different fields of application specific to each nano-object by identifying a list of fundamental

characteristics commonly used in these circumstances and by developing tailor-made technical

specifications for the list, as seen in ISO/TS 11931 and ISO/TS 11937.

Another approach that was followed for ISO/TS 12805 resulted in the development of a list of

characteristics applicable to specifying nano-objects that are useful to the wider community of users of

information on nano-objects.

To increase the reach of outcomes from these efforts, members of ISO/TC 229 have discussed and

planned the systematic development of an ISO technical specification for defining a list of fundamental

characteristics that are widely applicable to a broad range of nano-objects. This Technical Specification

is intended to define the list of fundamental characteristics universally for nanoparticles in powder

form, which covers a very broad range of nano-objects.

In order to develop a common understanding among sellers, buyers, and regulators, this Technical

Specification uses the chemical composition, crystal structure, particle size, and surface area as

fundamental measures for characterizing nano-objects from a chemical, physical, and surface scientific

point of view that is of significant interest to users of the nano-objects. However, since measurement

procedures used for determining the characteristics of nano-objects often rely on various idealized

assumptions, the resulting characteristics of nano-objects with identical name may not guarantee the

equivalence of measured results. This issue can be addressed by adopting well-recognized measurement

methods that can provide reliable measurement results.

The measurement methods adopted in this Technical Specification are well known in the industry.

Instruments used for measurement and data processing software are well developed and provide

reliable measurement results when operated under a valid quality system.

The description of measurement methods is limited in this Technical Specification to important

supplementary notices. For basic information about applying the methods, it is assumed that operating

instructions are provided with any instruments, appropriate data processing software is available, and

analysis has the required technical skills. The methods are applicable to situations where procedures are

subcontracted to independent test laboratories. Since quantitative criteria concerning characteristics

depend on the specific intentions among users, they are not described in this Technical Specification.

These criteria are subject to agreement between users of this Technical Specification, namely, sellers,

buyers, and regulators of nanoparticles in powder form.

Nanotechnology is a rapidly growing and evolving field. Users of this Technical Specification should

maintain familiarity with the legislative environment and latest developments in human and

environmental health and safety regarding nanotechnology.

If the seller or the buyer wishes to assess the environmental, safety, or health risks of the material, they

may refer to ISO
...

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