prEN IEC 63185:2024
(Main)Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
Messung der komplexen Dielektrizitätskonstante für verlustarme dielektrische Substrate nach dem symmetrischen Kreisscheibenresonatorverfahren
Méthode au résonateur à disque circulaire de type symétrique pour mesurer la permittivité complexe des substrats diélectriques à faible perte
Merjenje kompleksne permisivnosti za dielektrične podlage z nizkimi izgubami, uravnotežene z metodo krožnega diskastega resonatorja
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Standards Content (Sample)
SLOVENSKI STANDARD
oSIST prEN IEC 63185:2024
01-julij-2024
Merjenje kompleksne permisivnosti za dielektrične podlage z nizkimi izgubami,
uravnotežene z metodo krožnega diskastega resonatorja
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type
circular disk resonator method
Messung der komplexen Dielektrizitätskonstante für verlustarme dielektrische Substrate
nach dem symmetrischen Kreisscheibenresonatorverfahren
Méthode au résonateur à disque circulaire de type symétrique pour mesurer la
permittivité complexe des substrats diélectriques à faible perte
Ta slovenski standard je istoveten z: prEN IEC 63185:2024
ICS:
33.120.30 Radiofrekvenčni konektorji RF connectors
(RF)
oSIST prEN IEC 63185:2024 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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oSIST prEN IEC 63185:2024
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oSIST prEN IEC 63185:2024
46F/672/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 63185 ED2
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2024-05-24 2024-08-16
SUPERSEDES DOCUMENTS:
46F/656/CD, 46F/669/CC
IEC SC 46F : RF AND MICROWAVE PASSIVE COMPONENTS
SECRETARIAT: SECRETARY:
United States of America Mr John Morelli
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
Other TC/SCs are requested to indicate their interest, if any,
in this CDV to the secretary.
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TITLE:
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk
resonator method
PROPOSED STABILITY DATE: 2027
Copyright © 2024 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.
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oSIST prEN IEC 63185:2024
IEC CDV 63185 © IEC 2024 2 46F/672/CDV
NOTE FROM TC/SC OFFICERS:
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oSIST prEN IEC 63185:2024
46F/672/CDV 3 IEC CDV 63185 © IEC 2024
1 CONTENTS
2
3 FOREWORD . 4
4 1 Scope . 6
5 2 Normative references . 6
6 3 Terms and definitions . 6
7 4 Measurement parameters . 6
8 5 Theory and calculation equations . 7
9 6 Measurement system . 9
10 7 Measurement procedure . 10
11 7.1 Preparation of measurement apparatus. 10
12 7.2 Adjustment of measurement conditions . 10
13 7.3 Calibration of a vector network analyzer . 10
14 7.4 Measurement of complex permittivity of test sample . 10
15 7.5 Periodic checkup of metal in resonator.
...
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