EN 61000-4-3:2006/A1:2008
(Amendment)Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
Elektromagnetische Verträglichkeit (EMV) - Teil 4-3: Prüf- und Messverfahren - Prüfung der Störfestigkeit gegen hochfrequente elektromagnetische Felder
Compatibilité électromagnétique (CEM) - Partie 4-3: Techniques d'essai et de mesure - Essai d'immunité aux champs électromagnétiques rayonnés aux fréquences radioélectriques
Elektromagnetna združljivost (EMC) - 4-3. del: Preskusne in merilne tehnike - Preskušanje odpornosti proti sevanim radiofrekvenčnim elektromagnetnim poljem (IEC 61000-4-3:2006/A1:2007)
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
01-junij-2008
(OHNWURPDJQHWQD]GUXåOMLYRVW (0& GHO 3UHVNXVQHLQPHULOQHWHKQLNH
3UHVNXãDQMHRGSRUQRVWLSURWLVHYDQLPUDGLRIUHNYHQþQLPHOHNWURPDJQHWQLPSROMHP
,(& $
Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques -
Radiated, radio-frequency, electromagnetic field immunity test
Elektromagnetische Verträglichkeit (EMV) - Teil 4-3: Prüf- und Messverfahren - Prüfung
der Störfestigkeit gegen hochfrequente elektromagnetische Felder
Compatibilité électromagnétique (CEM) - Partie 4-3: Techniques d'essai et de mesure -
Essai d'immunité aux champs électromagnétiques rayonnés aux fréquences
radioélectriques
Ta slovenski standard je istoveten z: EN 61000-4-3:2006/A1:2008
ICS:
33.100.20 Imunost Immunity
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD
EN 61000-4-3/A1
NORME EUROPÉENNE
February 2008
EUROPÄISCHE NORM
ICS 33.100.20
English version
Electromagnetic compatibility (EMC) -
Part 4-3: Testing and measurement techniques -
Radiated, radio-frequency, electromagnetic field immunity test
(IEC 61000-4-3:2006/A1:2007)
Compatibilité électromagnétique (CEM) - Elektromagnetische Verträglichkeit (EMV) -
Partie 4-3: Techniques d'essai Teil 4-3: Prüf- und Messverfahren -
et de mesure - Prüfung der Störfestigkeit gegen
Essai d'immunité aux champs hochfrequente elektromagnetische Felder
électromagnétiques rayonnés (IEC 61000-4-3:2006/A1:2007)
aux fréquences radioélectriques
(CEI 61000-4-3:2006/A1:2007)
This amendment A1 modifies the European Standard EN 61000-4-3:2006; it was approved by CENELEC on
2008-02-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which
stipulate the conditions for giving this amendment the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This amendment exists in three official versions (English, French, German). A version in any other language
made by translation under the responsibility of a CENELEC member into its own language and notified to the
Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61000-4-3:2006/A1:2008 E
Foreword
The text of document 77B/546/FDIS, future amendment 1 to IEC 61000-4-3:2006, prepared by SC 77B,
High frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as amendment A1 to EN 61000-4-3:2006
on 2008-02-01.
The following dates were fixed:
– latest date by which the amendment has to be
implemented at national level by publication of
(dop) 2008-11-01
an identical national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2011-02-01
with the amendment have to be withdrawn
__________
Endorsement notice
The text of amendment 1:2007 to the International Standard IEC 61000-4-3:2006 was approved by
CENELEC as an amendment to the European Standard without any modification.
__________
IEC 61000-4-3
Edition 3.0 2007-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Electromagnetic compatibility (EMC) –
Part 4-3: Testing and measurement techniques – Radiated, radio-frequency,
electromagnetic field immunity test
Compatibilité électromagnétique (CEM) –
Partie 4-3: Techniques d’essai et de mesure – Essai d’immunité aux champs
électromagnétiques rayonnés aux fréquences radioélectriques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
R
CODE PRIX
ICS 33.100.20 ISBN 2-8318-9354-2
– 2 – 61000-4-3 Amend.1 © IEC:2007
FOREWORD
This amendment has been prepared by subcommittee 77B: High frequency phenomena of IEC
technical committee 77: Electromagnetic compatibility.
The text of this amendment is based on the following documents:
FDIS Report on voting
77B/546/FDIS 77B/556/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the maintenance result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
Page 3
CONTENTS
Add, to the existing list of annexes, the following new title:
Annex I (informative) Calibration method for E-field probes
Page 25
Add, at the end of the sixth dashed item (beginning with “– An isotropic field sensor”), the
following new sentence:
Annex I provides a calibration method for E-field probes.
Page 111
Add the following new annex:
61000-4-3 Amend.1 © IEC:2007 – 3 –
Annex I
(informative)
Calibration method for E-field probes
I.1 Overview
E-field probes with broad frequency range and large dynamic response are extensively used
in the field uniformity calibration procedures in accordance with IEC 61000-4-3. Among other
aspects, the quality of the field probe calibration directly impacts the uncertainty budget of a
radiated immunity test.
Generally, probes are subject to relatively low field strengths, e.g. 1 V/m – 30 V/m, during the
field uniformity calibration in accordance with IEC 61000-4-3. Therefore a calibration of the E-
field probes used within IEC 61000-4-3 shall take the intended frequency and dynamic ranges
into consideration.
Currently probe calibration results may show differences when the probe is calibrated in
different calibration laboratories. Therefore the environment and method for a field probe
calibration are to be specified. This annex provides relevant information on calibration of
probes to be used in IEC 61000-4-3.
For frequencies above the several hundred megahertz to gigahertz range, using standard gain
horn antennas to establish a standard field inside an anechoic chamber is one of the most
widely used methods for calibrating probes for IEC 61000-4-3 applications. However, there is
a lack of an established method for validating the test environment for field probe calibrations.
In using this method, differences have been observed between calibration laboratories,
beyond their reported measurement uncertainties.
Field probe calibrations in the 80 MHz to a few hundred megahertz range that are usually
carried out in TEM waveguides are generally found to be more reproducible.
This informative annex therefore concentrates on improving the probe calibration procedures
with horn antennas in anechoic chambers to which a comprehensive calibration procedure is
depicted.
I.2 Probe calibration requirements
I.2.1 General
The calibration of E-Field probes intended to be used for UFA calibration procedure as
defined in IEC 61000-4-3 shall satisfy the following requirements.
I.2.2 Calibration frequency range
The frequency range shall normally cover 80 MHz to 6 GHz but it may be limited to the
frequency range required by the tests.
I.2.3 Frequency steps
To be able to compare test results between different calibration laboratories, it is necessary to
use fixed frequencies for the calibration.
– 4 – 61000-4-3 Amend.1 © IEC:2007
80 MHz to 1 GHz:
Use the following frequencies for the calibration of E-field probes (typically 50 MHz step
width)
80, 100, 150, 200,…, 950, 1 000 MHz
1 GHz to 6 GHz:
Use the following frequencies for the calibration of E-field probes (200 MHz step width)
1 000, 1 200, 1 400,…, 5 800, 6 000 MHz
NOTE It is not intended to measure a probe at 1 GHz twice, but in case it is used up to or from 1 GHz, the probe
needs to be measured at that frequency.
I.2.4 Field strength
The field strength at which a probe is calibrated should be based on the field strength
required for the immunity test. As the preferred method for uniformity field calibration is
carried out at field strength of at least 1,8 times the field strength to be applied to the EUT, it
is recommended that the probe calibration be carried out at twice the intended test field
strength (see Table I.1). If a probe is to be used at different field levels, it has to be calibrated
at multiple levels according to its linearity, at least the minimum and maximum levels. See
also I.3.2.
NOTE 1 This also covers the 1 dB compression requirement of the power amplifier.
NOTE 2 The calibration is performed using CW signals without modulation.
Table I.1 – Calibration field strength level
Calibration level Calibration field strength
1 2 V/m
2 6 V/m
3 20 V/m
4 60 V/m
X Y V/m
NOTE X,Y is an open calibration level which can be higher
or lower than one of the other levels 1-4. This level may be
given in the product specification or test laboratory.
I.3 Requirements for calibration instrumentation
I.3.1 Harmonics and spurious signals
Any harmonics or spurious signals from the power amplifiers shall be at least 20 dB below the
level at the carrier frequency. This is required for all field strength levels used during
calibration and linearity check. Since the harmonic content of power amplifiers is usually
worse at higher power levels, the harmonic measurement may be performed only at the
highest calibration field strength. The harmonic measurement can be performed using a
calibrated spectrum analyzer which is connected to the amplifier output through an attenuator,
or through a directional coupler.
NOTE 1 The antenna may have additional influence on harmonic content and may need to be checked separately.
Calibration laboratories shall perform a measurement to validate that the harmonic and/or
spurious signals from the amplifier satisfy the requirements for all measurement setups. This
61000-4-3 Amend.1 © IEC:2007 – 5 –
may be done by connecting a spectrum analyzer to Port 3 of the directional coupler (replacing
the power meter sensor with the spectrum analyzer input – see Figure I.2).
NOTE 2 It should be assured that the power level does not exceed the maximum allowable input power of the
spectrum analyzer. An attenuator may be used.
The frequency span shall cover at least the third harmonic of the intended frequency. The
validation measurement shall be performed at the power level that will generate the highest
intended field strength.
Harmonic suppression filters may be used to improve the spectrum purity of the power
amplifier(s) (see Annex D).
I.3.2 Linearity check for probe
The linearity of the probe which is used for the chamber validation according to I.4.2.5 shall
be within ±0,5 dB from an ideal linear response in the required dynamic range (see Figure I.1).
Linearity shall be confirmed for all intended range settings if the probe has multiple ranges or
gain settings.
In general probe linearity does not change significantly with frequency. Linearity checking can
be performed at a spot frequency that is close to the central region of the intended use of
frequency range, and where the probe response versus frequency is relatively flat. The
selected spot frequency is to be documented in the calibration certificate.
The field strength for which the linearity of the probe is measured should be within –6 dB to
+6 dB of the field strength which is used during the validation of the chamber, with a
sufficiently small step size, e.g. 1 dB. Table I.2 shows an example of the field strength levels
to be checked for a 20 V/m application.
Table I.2 – Example for the probe linearity check
Calibration field
Signal level
strength
dB V/m
-6,0 13,2
-5,0 14,4
-4,0 14,8
-3,0 15,2
-2,0 16,3
-1,0 18,0
0 20,0
1,0 22,2
2,0 24,7
3,0 27,4
4,0 30,5
5,0 34,0
6,0 38,0
– 6 – 61000-4-3 Amend.1 © IEC:2007
100,0
Nonlinear curve
10,0
1,0
–6,0 –4,0 –2,0 0,0 2,0 4,0 6,0
Signal level dB
IEC 2043/07
Figure I.1 – Example of linearity for probe
I.3.3 Determination of the gain of the standard horn antennas
Far field gain of the standard pyramidal horn antennas can be determined fairly accurately
(less than 0,1 dB of uncertainties have been reported in [1] ). The far-field gain is typically
valid for distances greater than 8D / λ (where D is the largest dimension of the horn aperture,
and λ is the wavelength). Calibrations of field probes at such distances may not be practical
due to the large anechoic chamber and high power amplifiers required. Field probes are
typically calibrated in the near field region of the transmitting antennas. The near-field gain of
standard gain horn antennas have been determined by using equations such as those
described in [2]. The gain is computed based on the physical dimensions of a standard
pyramidal horn, and by assuming a quadratic phase distribution at the horn aperture. The gain
determined in this manner is inadequate for use in performing the chamber VSWR test and
subsequent probe calibrations.
The equations (as given in [2]) were derived using aperture integration, by assuming that no
reflection occurs at the aperture of the horn and that the field incident on the aperture is a
TE mode, but with a quadratic phase distribution across the aperture. Some approximations
were applied during the integration to obtain the close form result. Other effects such as
multiple reflections from the horn edge, and higher order modes at the aperture are not
accounted for.
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.