EN IEC 61788-7:2020
(Main)Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies
Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies
IEC 61788-7:2020 is available as IEC 61788-7:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61788-7:2020 describes measurement of the surface resistance (Rs) of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of Rs for this method is as follows: - Frequency: 8 GHz < f < 30 GHz - Measurement resolution: 0,01 m Ω at 10 GHz The Rs data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule for comparison, is reported. This third edition cancels and replaces the second edition, published in 2006. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) informative Annex B, relative combined standard uncertainty for surface resistance measurement has been added; b) precision and accuracy statements have been converted to uncertainty; c) reproducibility in surface resistant measurement has been added.
Supraleitfähigkeit - Teil 7: Messungen der elektronischen Charakteristik – Oberflächenwiderstand von Hochtemperatur-Supraleitern bei Frequenzen im Mikrowellenbereich
Supraconductivité - Partie 7: Mesurages des caractéristiques électronique - Résistance de surface des supraconducteurs haute température critique aux hyperfréquences
IEC 61788-7:2020 est disponible sous forme de IEC 61788-7:2020 RLV qui contient la Norme internationale et sa version Redline, illustrant les modifications du contenu technique depuis l'édition précédente.IEC 61788-7:2020 décrit le mesurage de la résistance de surface (Rs) des supraconducteurs aux hyperfréquences par la méthode normalisée à deux résonateurs. L'objet du mesurage est la dépendance de la résistance de surface Rs vis-à-vis de la température à la fréquence de résonance. La plage de mesures applicable des résistances de surface Rs pour cette méthode est la suivante: - Fréquence: 8 GHz < f < 30 GHz - Résolution de mesure: 0,01 m Ω à 10 GHz Les données de Rs à la fréquence mesurée, et celles mises à l'échelle à 10 GHz, en prenant pour hypothèse la règle de comparaison f 2, doivent être consignées. Cette troisième édition annule et remplace la deuxième édition parue en 2006. Cette édition constitue une révision technique. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: a) l’ajout de l’Annexe B informative, incertitude type composée relative pour le mesurage de la résistance de surface; b) les déclarations de fidélité et d'exactitude ont été converties en incertitude; c) l'ajout de la reproductibilité du mesurage de résistance de surface.
Superprevodnost - 7. del: Meritve elektronskih lastnosti - Površinska upornost visokotemperaturnih superprevodnikov pri mikrovalovnih frekvencah (IEC 61788-7:2020)
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
01-julij-2020
Nadomešča:
SIST EN 61788-7:2007
Superprevodnost - 7. del: Meritve elektronskih lastnosti - Površinska upornost
visokotemperaturnih superprevodnikov pri mikrovalovnih frekvencah (IEC 61788-
7:2020)
Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance
of high-temperature superconductors at microwave frequencies (IEC 61788-7:2020)
Supraleitfähigkeit - Teil 7: Charakteristische elektronische Messungen -
Oberflächenwiderstand von Supraleitern bei Frequenzen im Mikrowellenbereich (IEC
61788-7:2020)
Supraconductivité - Partie 7: Mesures des caractéristiques électroniques - Résistance de
surface des supraconducteurs aux hyperfréquences (IEC 61788-7:2020)
Ta slovenski standard je istoveten z: EN IEC 61788-7:2020
ICS:
17.220.20 Merjenje električnih in Measurement of electrical
magnetnih veličin and magnetic quantities
29.050 Superprevodnost in prevodni Superconductivity and
materiali conducting materials
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD EN IEC 61788-7
NORME EUROPÉENNE
EUROPÄISCHE NORM
May 2020
ICS 29.050; 17.220.20 Supersedes EN 61788-7:2006 and all of its amendments
and corrigenda (if any)
English Version
Superconductivity - Part 7: Electronic characteristic
measurements - Surface resistance of high-temperature
superconductors at microwave frequencies
(IEC 61788-7:2020)
Supraconductivité - Partie 7: Mesurages des Supraleitfähigkeit - Teil 7: Messungen der elektronischen
caractéristiques électronique - Résistance de surface des Charakteristik - Oberflächenwiderstand von
supraconducteurs haute température critique aux Hochtemperatur-Supraleitern bei Frequenzen im
hyperfréquences Mikrowellenbereich
(IEC 61788-7:2020) (IEC 61788-7:2020)
This European Standard was approved by CENELEC on 2020-04-24. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
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Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2020 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 61788-7:2020 E
European foreword
The text of document 90/447/FDIS, future edition 3 of IEC 61788-7, prepared by IEC/TC 90
"Superconductivity" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2021-01-24
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2023-04-24
document have to be withdrawn
This document supersedes EN 61788-7:2006 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 61788-7:2020 was approved by CENELEC as a European
Standard without any modification.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60050-815 - International Electrotechnical Vocabulary - - -
Part 815: Superconductivity
IEC 61788-7 ®
Edition 3.0 2020-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Superconductivity –
Part 7: Electronic characteristic measurements – Surface resistance of
high‑temperature superconductors at microwave frequencies
Supraconductivité –
Partie 7: Mesurages des caractéristiques électronique – Résistance de surface
des supraconducteurs haute température critique aux hyperfréquences
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 17.220.20; 29.050 ISBN 978-2-8322-7917-5
– 2 – IEC 61788-7:2020 © IEC 2020
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 Requirements . 8
5 Apparatus . 9
5.1 Measurement system . 9
5.2 Measurement apparatus for R . 10
s
5.3 Dielectric rods . 12
6 Measurement procedure . 12
6.1 Specimen preparation . 12
6.2 Set-up . 13
6.3 Measurement of reference level . 13
6.4 Measurement of the frequency response of resonators . 14
6.5 Determination of surface resistance of the superconductor and ε′ and tan δ
of the standard sapphire rods. 16
7 Uncertainty of the test method . 17
7.1 Surface resistance . 17
7.2 Temperature . 18
7.3 Specimen and holder support structure . 18
7.4 Specimen protection . 19
7.5 Uncertainty of surface resistance measured by standard two-resonator
method . 19
8 Test report . 19
8.1 Identification of test specimen . 19
8.2 Report of R values . 19
s
8.3 Report of test conditions . 19
Annex A (informative) Additional information relating to Clauses 1 to 8 . 20
A.1 Scope . 20
A.1.1 General . 20
A.1.2 Cylindrical cavity method [10] [17] . 20
A.1.3 Parallel-plates resonator method [18] [19] . 20
A.1.4 Microstrip-line resonance method [20] [21] . 20
A.1.5 Dielectric resonator method [22] [23] [24] [25] . 20
A.1.6 Image-type dielectric resonator method [26] [27] . 21
A.1.7 Two-resonator method [28] [29] . 22
A.2 Requirements . 22
A.3 Theory and calculation equations . 22
A.4 Apparatus . 25
A.5 Dimensions of the standard sapphire rods . 26
A.6 Dimension of the closed type resonator . 28
A.7 Sapphire rod reproducibility . 30
A.8 Test results . 30
A.9 Reproducibility of measurement method . 31
IEC 61788-7:2020 © IEC 2020 – 3 –
A.10 tan δ deviation effect of sapphire rods on surface resistance . 32
Annex B (informative) Evaluation of relative combined standard uncertainty for surface
resistance measurement . 34
B.1 Practical surface resistance measurement . 34
B.2 Determination of surface resistance of the superconductor . 35
B.3 Combined standard uncertainty . 36
B.3.1 General . 36
B.3.2 Calculation of c to c (12 GHz resonance at 20 K) . 36
2 5
B.3.3 Determination of u to u . 37
1 5
B.3.4 Combined relative standard uncertainty . 39
Bibliography . 41
Figure 1 – Schematic diagram of measurement system for temperature dependence of
R using a cryocooler . 9
s
Figure 2 – Typical measurement apparatus for R . 11
s
Figure 3 – Insertion attenuation, IA, resonant frequency, f , and half power bandwidth,
∆f, measured at T kelvin . 14
Figure 4 – Reflection scattering parameters (S and S ) . 16
11 22
Figure 5 – Term definitions in Table 4 . 18
Figure A.1 – Schematic configuration of several measurement methods for the surface
resistance . 21
Figure A.2 – Configuration of a cylindrical dielectric rod resonator short-circuited at
both ends by two parallel superconductor films deposited on dielectric substrates . 23
Figure A.3 – Computed result
...
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