EN 55017:2011

Methods of measurement of the suppression characteristics of passive EMC filtering devices

CISPR 17:2011 specifies methods to measure the radio interference suppression characteristics of passive EMC filtering devices used in power and signal lines, and in other circuits. The defined methods may also be applied to combinations of over-voltage protection devices and EMC filtering devices. The measurement method covers the frequency range from 9 kHz to several GHz depending on the device and test circuit. The standard describes procedures for laboratory tests (type tests) as well as factory tests. The suppression characteristics of EMC filters and components used for the suppression of EM disturbances, are a function of numerous variables such as impedance of the circuits to which they connect, operating voltage and current, and ambient temperature. This standard specifies uniform test methods that will enable comparison of filtering and suppression characteristics determined by test laboratories or specified by manufacturers. Measurement procedures are provided for unbiased and bias conditions. Measurements under bias conditions are performed to determine potential non-linear behaviour of the EMC filtering devices such as saturation effects in inductors with magnetic cores. This testing serves to show the usability in a specific application (such as frequency converters that produce high amplitudes of common mode pulse current and thus may drive inductors into saturation). Measurement under bias conditions may be omitted if the non-linear behaviour can be determined by other methods (e.g. separate saturation measurement of the inductors used). The first edition of CISPR 17 (1981) prescribed the measurement methods of insertion loss mainly for power-line filters. Today, however, many types of sophisticated EMC filters and suppression components can be found in various electronic devices. Those filters need to be characterized using standardized measurement methods. New methods for measurement of impedance and S-parameters for such EMI devices are included in this second edition.

Verfahren zur Messung der Entstöreigenschaften von passiven EMV-Filtern

Méthodes de mesure des caractéristiques d'antiparasitage des dispositifs de filtrage CEM passifs

La CISPR 17:2011 spécifie les méthodes de mesure des caractéristiques d'antiparasitage des perturbations radioélectriques des dispositifs de filtrage CEM passifs utilisés dans les lignes électriques et de transmission de signaux et dans d'autres circuits. Les méthodes définies peuvent également s'appliquer aux combinaisons de dispositifs de protection contre les surtensions et les dispositifs de filtrage CEM. La méthode de mesure décrite couvre la gamme de fréquences comprise entre 9 kHz et plusieurs GHz, en fonction du dispositif et du circuit d'essai. La norme décrit des méthodes applicables aux essais en laboratoire (essais de type) et aux essais en usine. Des méthodes d'essai avec et sans conditions de polarisation sont définies. Les caractéristiques d'antiparasitage des filtres et éléments CEM utilisés pour la réduction des perturbations CEM sont fonction de nombreuses variables telles que l'impédance des circuits auxquels elles sont associées, la tension et le courant d'utilisation et la température ambiante. La présente norme spécifie des méthodes d'essai uniformes qui permettent de comparer les caractéristiques de filtrage et d'antiparasitage déterminées par les laboratoires d'essai ou précisées par les constructeurs. Des méthodes de mesure sont fournies pour des conditions avec et sans polarisation. Les mesures effectuées dans des conditions de polarisation permettent de déterminer le comportement non linéaire potentiel des dispositifs de filtrage CEM, comme les effets de saturation exercés sur les inductances à noyaux magnétiques. Ces essais permettent de montrer la facilité d'emploi dans une application spécifique (telle que dans les cas de convertisseurs de fréquence qui produisent de grandes amplitudes de courant de choc de mode commun, et peuvent ainsi entraîner la saturation des inductances). Il n'est pas nécessaire d'effectuer des mesures dans des conditions de polarisation si le comportement non linéaire peut être déterminé par d'autres méthodes (par exemple, mesure séparée de la saturation des inductances utilisées). La première édition du document CISPR 17 (1981) spécifiait les méthodes de mesure de l'affaiblissement d'insertion principalement pour les filtres réseau. Aujourd'hui, divers dispositifs électroniques comportent toutefois de nombreux types de filtres et d'éléments d'antiparasitage CEM complexes. Ces filtres doivent être caractérisés au moyen de méthodes de mesure normalisées. Cette seconde édition comporte les nouvelles méthodes de mesure de l'impédance et des paramètres S pour ce type de dispositifs EMI.

Postopki za merjenje dušenja pasivnih EMC filtrskih naprav (CISPR 17:2011)

Ta mednarodni standard določa metode za merjenje karakteristik dušenja radijskih motenj pasivnih filtrov EMC, ki se uporabljajo pri napajalnih in signalnih vodih ter drugih tokokrogih. Opredeljene metode lahko veljajo za kombinacije zaščitnih naprav pred presežno napetostjo in filtre EMC. Merilna metoda zajema frekvenčni razpon med 9 kHz in več GHz, odvisno od naprave in preskušanega tokokroga. OPOMBA: Merilne metode v tem standardu se lahko uporabljajo do 40 GHz. Standard opisuje postopke za laboratorijske preskuse (tipske preskuse) in tovarniške preskuse. Opredeljene so preskusne metode s pogoji vplivanja in brez njih. Podani so merilni postopki za pogoje brez vplivanja in z njim. Meritve v pogojih vplivanja se izvajajo za ugotavljanje potencialnega nelinearnega obnašanja filtrov EMC, kot so učinki nasičenosti v induktorjih z magnetnimi jedri. To preskušanje je namenjeno prikazu uporabnosti pri določeni aplikaciji (kot so frekvenčni pretvorniki, ki proizvajajo visoke amplitude pulznega toka v splošnem načinu, kar lahko povzroči nasičenost pretvornikov). Merjenje v okoliščinah vplivanja se lahko izpusti, če se nelinearno obnašanje lahko določi z drugimi metodami (npr. ločeno merjenje nasičenosti uporabljenih induktorjev).

General Information

• Status: Published
• Publication Date: 29-Sep-2011
• Withdrawal Date: 14-Jul-2014
• ICS: 33.100.01 - Electromagnetic compatibility in general
• Technical Committee: CLC/TC 210 - Electromagnetic Compatibility (EMC)
• Drafting Committee: IEC/SC CISPR/A - Merjenje radijskih interferenc in statistične metode
• Parallel Committee: IEC/SC CISPR/A - Merjenje radijskih interferenc in statistične metode
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 30-Sep-2011
• Completion Date: 30-Sep-2011
• Directive: 2004/108/EC - Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2004/108/EU - DIRECTIVE 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2014/30/EU - Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)
• Ref Project: SIST EN 55017:2011 - Methods of measurement of the suppression characteristics of passive EMC filtering devices (CISPR 17:2011)

Standards Content (Sample)

SLOVENSKI STANDARD
01-november-2011
Postopki za merjenje dušenja pasivnih EMC filtrskih naprav (CISPR 17:2011)
0HWKRGVRIPHDVXUHPHQWRIWKHVXSSUHVVLRQFKDUDFWHULVWLFVRISDVVLYH(0&ILOWHULQJ
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&,635
Verfahren zur Messung der Entstöreigenschaften von passiven EMV-Filtern (CISPR
17:2011)
Méthodes de mesure des caractéristiques d'antiparasitage des dispositifs de filtrage
CEM passifs (CISPR 17:2011)
Ta slovenski standard je istoveten z: EN 55017:2011
ICS:
33.100.99 Drugi vidiki v zvezi z EMC Other aspects related to
EMC
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 55017
NORME EUROPÉENNE
September 2011
EUROPÄISCHE NORM
ICS 33.100.01
English version
Methods of measurement of the suppression characteristics of passive
EMC filtering devices
(CISPR 17:2011)
Méthodes de mesure des caractéristiques Verfahren zur Messung der
d'antiparasitage des dispositifs de filtrage Entstöreigenschaften von passiven EMV-
CEM passifs Filtern
(CISPR 17:2011) (CISPR 17:2011)

This European Standard was approved by CENELEC on 2011-07-15. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the CEN-CENELEC Management Centre has the same status as the official versions.

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the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
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Spain, Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
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Europäisches Komitee für Elektrotechnische Normung

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© 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 55017:2011 E
Foreword
The text of document CISPR/A/941/FDIS, future edition 2 of CISPR 17, prepared by CISPR SC A,
"Radio-interference measurements and statistical methods", was submitted to the IEC-CENELEC parallel
vote and was approved by CENELEC as EN 55017 on 2011-07-15.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2012-04-15
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2014-07-15
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard CISPR 17:2011 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
CISPR 12:2007 NOTE  Harmonized as EN 55012:2007 (not modified).
__________
- 3 - EN 55017:2011
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

IEC 60050-161 - International Electrotechnical Vocabulary - -
(IEV) -
Chapter 161: Electromagnetic compatibility

CISPR 17 ®
Edition 2.0 2011-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE
COMITÉ INTERNATIONAL SPÉCIAL DES PERTURBATIONS RADIOÉLECTRIQUES

Methods of measurement of the suppression characteristics of passive EMC
filtering devices
Méthodes de mesure des caractéristiques d’antiparasitage des dispositifs de
filtrage CEM passifs
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XB
ICS 33.100.01 ISBN 978-2-88912-526-5

– 2 – CISPR 17  IEC:2011
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative references . 9
3 Terms, definitions and abbreviations . 9
3.1 Terms and definitions . 9
3.2 Abbreviations . 12
4 Classification of EMC filtering devices . 12
4.1 Insertion loss . 14
4.1.1 Insertion loss calculation . 14
4.1.2 Asymmetrical (common) mode . 14
4.1.3 Symmetrical (differential) mode . 14
4.1.4 Unsymmetrical mode . 14
4.2 Impedance . 14
4.3 S-parameters . 15
4.3.1 General . 15
4.3.2 Two-port S-parameters . 15
4.3.3 Four-port S-parameters . 16
5 Insertion loss measurement . 17
5.1 General . 17
5.2 Measurement set-up . 18
5.2.1 General . 18
5.2.2 Test equipment . 18
5.2.3 Asymmetrical (common mode) test circuit . 19
5.2.4 Symmetrical (differential mode) test circuit . 19
5.2.5 Unsymmetrical test circuit . 20
5.3 Measurement methods (procedure) . 21
5.3.1 General . 21
5.3.2 Measurement without bias . 22
5.3.3 Measurement with bias . 22
5.4 Calibration and verification . 23
5.4.1 General . 23
5.4.2 Validation of test set-up without bias . 23
5.4.3 Validation of test set-up with bias . 24
5.5 Uncertainty . 26
6 Impedance measurement . 26
6.1 General . 26
6.2 Direct method . 26
6.2.1 Measurement set-up and procedure . 26
6.2.2 Calibrations of the test set-up . 27
6.2.3 Measurement uncertainty . 27
6.3 Indirect method . 27
6.3.1 Measurement set-up and procedure . 27
6.3.2 Calibration of the test set-up . 29
6.3.3 Measurement uncertainty . 29
7 S-parameter measurement . 30

CISPR 17  IEC:2011 – 3 –
7.1 Measurement set-up and procedure . 30
7.1.1 General . 30
7.1.2 Test fixture . 31
7.2 Calibration of test set-up . 36
7.3 Measurement uncertainties . 36
8 Presentation of results . 36
8.1 General . 36
8.2 Insertion loss . 37
8.3 Impedance . 37
8.4 S-parameters . 37
Annex A (normative) Uncertainty estimation for the measurement of the suppression
characteristics of EMC filtering devices . 38
Annex B (informative) Examples of test boxes for insertion loss measurement . 43
Annex C (informative) Insertion loss test methods with non-50 Ω systems . 47
Annex D (informative) Realization of the buffer-network for insertion loss
measurement . 49
Annex E (informative) Insertion loss measurement – General discussion . 51
Annex F (informative) Set-up for impedance measurement . 54
Annex G (informative) S-parameter measurement of common-mode choke coils . 59
Annex H (informative) Measurement set-up for S-parameters of a DUT without wire
leads . 64
Bibliography . 66

Figure 1 – Measurement arrangement for S-parameters of a two-terminal device . 15
Figure 2 – Measurement arrangement for S-parameters of a three-terminal device . 15
Figure 3 – Measurement arrangement for four-port S-parameters . 16
Figure 4 – Test circuit for insertion loss measurement (example: 4-line-filter) . 18
Figure 5 – Test circuit for asymmetrical insertion loss measurement (example:
4-line-filter) . 19
Figure 6 – Test circuit for symmetrical insertion loss measurement (example: 4-line-
filter) . 20
Figure 7 – Test circuit for unsymmetrical insertion loss measurement (example:
4-line filter) .
...