High-voltage test techniques for low-voltage equipment - Part 1: Definitions, test and procedure requirements

Applies to: -dielectric tests with direct voltage -dielectric tests with alternating voltage -dielectric tests with impulse voltage -tests with impulse current -tests with combinations of the above.

Hochspannungs-Prüftechnik für Niederspannungsgeräte - Teil 1: Begriffe, Prüfung und Prüfbedingungen

Techniques des essais à haute tension pour matériels à basse tension - Partie 1: Définitions, prescriptions et modalités relatives aux essais

S'applique aux: - essais diélectriques en tension continue - essais diélectriques en tension alternative - essais diélectriques en tension de choc - essais en courant de choc - essais combinant les essais ci-dessus.

High-voltage test techniques for low-voltage equipment - Part 1: Definitions, test and procedure requirements (IEC 61180-1:1992)

General Information

Status
Withdrawn
Publication Date
05-Sep-1994
Withdrawal Date
14-Mar-1995
Drafting Committee
Parallel Committee
Current Stage
9960 - Withdrawal effective - Withdrawal
Start Date
29-Jul-2019
Completion Date
29-Jul-2019

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SLOVENSKI STANDARD
01-januar-1998
High-voltage test techniques for low-voltage equipment - Part 1: Definitions, test
and procedure requirements (IEC 61180-1:1992)
High-voltage test techniques for low-voltage equipment -- Part 1: Definitions, test and
procedure requirements
Hochspannungs-Prüftechnik für Niederspannungsgeräte -- Teil 1: Begriffe, Prüfung und
Prüfbedingungen
Techniques des essais à haute tension pour matériels à basse tension -- Partie 1:
Définitions, prescriptions et modalités relatives aux essais
Ta slovenski standard je istoveten z: EN 61180-1:1994
ICS:
19.080 (OHNWULþQRLQHOHNWURQVNR Electrical and electronic
SUHVNXãDQMH testing
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

CEI
NORME
IEC
INTERNATIONALE
1180-1
INTERNATIONAL
Première édition
STANDARD First edition
1992-10
essais à haute tension
Techniques des
à basse tension
pour matériels
Partie 1:
Définitions, prescriptions et modalités
relatives aux essais
High-voltage test techniques
for low-voltage equipment
Part 1:
procedure requirements
Definitions, test and
reserved
roduction réservés— Copyright — all rights
© CEI 1992 Droits de rep
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les microfilms, sans raccord écrit de réditeur.
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1180-1 ©IEC – 3 –
CONTENTS
Page
FOREWORD 9
INTRODUCTION
Clause
SECTION 1: GENERAL
1.1 Scope
13 1.2 Normative references
SECTION 2: DEFINITIONS
15 2.1 Impulse techniques and insulation
2.1.1 Impulse
2.1.2 Partial breakdown
Clearance [IEV 441-17-31] 15
2.1.3
2.1.4 Creepage distance [IEV 151-03-37]
15 2.1.5 Solid insulation
2.2 Characteristics related to disruptive discharge and test voltages
2.2.1 Disruptive discharge
2.2.2 Characteristics of the test voltage
Disruptive discharge voltage 2.2.3
2.2.4 Withstand voltage
2.2.5 Assured disruptive discharge voltage
SECTION 3: GENERAL REQUIREMENTS RELATING TO TEST PROCEDURES
AND TEST OBJECTS
19 General requirements for test procedures 3.1
19 General arrangement of the test object 3.2
3.3 Atmospheric conditions
Standard reference atmosphere 19
3.3.1
3.3.2 Atmospheric correction factor
SECTION 4: TESTS WITH DIRECT VOLTAGE
Definitions for direct voltage tests 4.1
4.1.1 Value of the test voltage
4.1.2 Ripple
4.2 Test voltage 23
4.2.1 Requirements for the test voltage
4.2.2 Generation and measurement of the test voltage 23

1180-1 ©I EC – 5 –
Clause Page
4.3 Test procedures
4.3.1 Withstand voltage tests
4.3.2 Assured disruptive discharge voltage tests 25
SECTION 5: TESTS WITH ALTERNATING VOLTAGE
25 5.1 Definitions for alternating voltage tests
5.1.1 Peak value
5.1.2 R.M.S value
5.2 Test voltage
25 5.2.1 Requirements for the test voltage
5.2.2 Generation and measurement of the test voltage
5.2.3 Measurement of the test voltage
5.3 Test procedures
5.3.1 Withstand voltage tests
5.3.2 Assured disruptive discharge voltage tests
SECTION 6: TESTS WITH IMPULSE VOLTAGE
6.1 Definitions for impulse tests 29
Definitions of general applicability 6.1.1
6.2 Test voltage
6.2.1 Standard impulse 31
31 6.2.2 Tolerances on standard impulse
31 6.2.3 Generation of the test voltage
6.2.4 Measurement of the test voltage and impulse voltage waveshape
6.3 Test procedures
Calibration of impulse voltage waveshape 6.3.1
33 6.3.2 Withstand voltage tests
6.3.3 Assured disruptive discharge voltage tests
SECTION 7: TESTS WITH IMPULSE CURRENT
7.1 Definitions for impulse current tests
7.1.1 Impulse current
7.1.2 Value of the test current
7.1.3 Virtual front time T1
7.1.4 Virtual origin 0 1
7.1.5 Time to half-value T2
Td 35
7.1.6 Duration of peak of a rectangular impulse current
t 35
7.1.7 Total duration of a rectangular impulse current T

1180-1 ©IEC - 7 -
Page
Clause
7.2 Test current 37
7.2.1 Standard impulse currents
7.2.2 Tolerances 37
7.2.3 Measurement of the test current
7.2.4 Measurement of voltages during tests with impulse current
7.3 Test procedures 39
SECTION 8: COMPOSITE TESTS
39 Definitions for composite tests 8.1
8.1.1 General
8.1.2 Definitions 41
8.2 Tests with hybrid impulse generators
8.2.1 Introduction 41
8.2.2 Test voltages and currents
8.2.3 Generation of test voltage and current
8.2.4 Verification of hybrid impulse generator characteristics
8.2.5 Measurement of test voltage and current
8.3 Test procedures with the hybrid impulse generator alone
8.3.1 Preparation of equipment
8.3.2 Impulse test sequence
8.3.3 Assessment of test results
Test procedures with the hybrid impulse generator and mains 45
8.4
8.4.1 General
8.4.2 Preparation of equipment
8.4.3 Impulse test sequence
8.4.4 Assessment of test results
Test procedure with the conventional 1,2/50 impulse generator and mains 47
8.5
Figures
Annexes
Arrangements for composite tests (clauses 8.4 or 8.5) 55
A
B Information to be given in the test report

- 9 -
1180-1©IEC
INTERNATIONAL ELECTROTECHNICAL COMMISSION
VOLTAGE TEST TECHNIQUES
HIGH-
FOR LOW-VOLTAGE EQUIPMENT
Part 1: Definitions, test and procedure requirements
FOREWORD
The formal decisions or agreements of the IEC on technical matters, prepared by technical committees on
1)
which all the National Committees having a special interest therein are represented, express, as nearly as
possible, an international consensus of opinion on the subjects dealt with.
They have the form of recommendations for international use and they are accepted by the National
2)
Committees in that sense.
3) In order to promote international unification, the IEC expresses the wish that all National Committees
should adopt the text of the IEC recommendation for their national rules in so far as national conditions will
permit. Any divergence between the IEC recommendation and the corresponding national rules should, as
far as possible, be clearly indicated in the latter.
This standard has been prepared by technical committee 42: High-voltage testing
techniques.
The text of this standard is based on the following documents:
Six Months' Rule Report on Voting
42(CO)51
42(CO)49
Full information on the voting for the approval of this standard can be found in the Voting
Report indicated in the above table.

1180-1 © I EC –11 –
INTRODUCTION
This International Standard has been prepared in accordance with the decision taken by
technical committee 42 to provide a standard covering the high voltage testing of low-
voltage equipment. It is based on IEC 60-1 (1989). The standard is in two parts. Part 1
covers general definitions and requirements, where sections 1 to 3 may be applicable to
all kinds of electrical equipment, sections 4 to 6 apply to electrical equipment without
voltage limiting devices, section 7 applies to voltage limiting devices alone, and section 8
applies to equipment incorporating non-linear or voltage limiting devices. Part 2 covers
measuring systems and test apparatus (in preparation).
This standard includes high-voltage and impulse current testing as well as a combination
of both.
This standard will be of special interest to product committees such as TC 2, SC 12B,
SC 17B, SC 17D, TC 22, TC 23, SC 37A, TC 61, TC 64, TC 65, SC 66E and TC 74.

1180-1 ©IEC – 13 –
HIGH-VOLTAGE TEST TECHNIQUES
FOR LOW-VOLTAGE EQUIPMENT
Part 1: Definitions, test and procedure requirements
SECTION 1: GENERAL
1.1 Scope
of IEC 1180 is applicable to:
This pa rt
– dielectric tests with direct voltage;
dielectric tests with alternating voltage;

– dielectric tests with impulse voltage;
– tests with impulse current;
– tests with combinations of the above.
This standard is applicable only to tests on equipment having a rated voltage of not more
than 1 kV a.c. or 1,5 kV d.c.
This standard is mainly applicable to type testing. It may also be applied or adapted for
sample and routine testing as specified by the relevant technical committee.
It is not intended to be used for electromagnetic compatibility tests on electric or electronic
equipment.
This standard provides the relevant technical committees as far as possible with:
defined terms of both general and specific applicability;

– general requirements regarding test objects and test procedures;
methods for generation and measurement of test voltages and currents;
-
– test procedures;
methods for the evaluation of test results and to indicate criteria for acceptance;
-
requirements concerning approved measuring devices and checking methods.

Alternative test procedures may be required and these shall be specified by the relevant
technical committees.
1.2 Normative references
The following normative documents contain provisions which, through reference in this
text, constitute provisions of this part of IEC 1180. At the time of publication, the editions
indicated were valid. All normative documents are subject to revision, and parties to

-15 -
1180-1 © IEC
agreements based on this part of IEC 1180 are encouraged to investigate the possibility of
applying the most recent editions of the normative documents indicated below. Members
of IEC and ISO maintain registers of currently valid International Standards.
Environmental testing. Part 1: General and guidance.
IEC 68-1: 1988,
IEC 270: 1981, Partial discharge measurements
Insulation co-ordination within low-voltage systems including clearances
IEC 664: 1980,
and creepage distances for equipment.
Amendment No. 1, 1989.
SECTION 2: DEFINITIONS
2.1 Impulse techniques and insulation
2.1.1 Impulse
An intentionally applied aperiodic transient voltage or current which usually rises rapidly to
a peak value and then falls more slowly to zero.
NOTE - The term "impulse" is distinguished from the term "surge", which refers to transients occurring in
electrical equipment or networks in service.
2.1.2 Partial breakdown
This phenomenon may occur when solid insulation is stressed by impulse voltages. It is
indicated by a stepwise reduction in impulse voltage waveform which occurs earlier in time
in successive impulses, or by other effects specified by the relevant technical committee.
This indicates progressive deterioration of the insulation.
[I EV 441-17-31]
2.1.3 Clearance
The shortest distance in air between two conductive parts.
2.1.4 Creepage distance [IEV 151-03-37]
The shortest distance along the surface of an insulating material between two conductive
parts.
2.1.5 Solid insulation
Solid insulating material interposed between two conductive parts.
2.2 Characteristics related to disruptive discharge and test voltages
2.2.1 Disruptive discharge
The failure of insulation under electrical stress, in which the discharge completely bridges
the insulation under test, reducing the voltage between the electrodes practically to zero.
It applies to electrical breakdown in solid, liquid and gaseous dielectrics and combinations
of these.
1180-1 © IEC –17 –
NOTES
1 Non-sustained disruptive discharges in which the test object is momentarily bridged by a spark or arc
may occur. During these events, the voltage across the test object is momentarily reduced to zero or to a
very small value. Depending on the characteristics of the test circuit and the test object, a recovery of
dielectric strength may occur and may even permit the test voltage to reach a higher value. Such an event
should be interpreted as a disruptive discharge unless otherwise specified by the relevant technical
committee.
2 Some non-disruptive discharges are termed "partial discharges" and are dealt with in IEC 270.
3 The term "sparkover" is used when a disruptive discharge occurs in a gaseous or liquid medium.
ace of a dielectric in a
The term "flashover is used when a disruptive discharge occurs over the su rf
gaseous or liquid medium.
The term "puncture" is used when a disruptive discharge occurs through a solid dielectric.
Characteristics of the test voltage
2.2.2
Those characteristics specified in this standard in order to define the different types of test
voltage.
2.2.2.1 Prospective characteristics of a test voltage
The characteristics which would have been obtained if no disruptive discharge or
operation of a voltage limiting device had occurred. When a prospective characteristic is
referred to, this shall always be stated.
2.2.2.2 Actual characteristics of a test voltage
Those which occur during the test at the terminals of the test object.
2.2.2.3 Value of the test voltage
The value of the test voltage is defined in 4.1.1, 5.1.1 and 6.1.1.1.
2.2.3 Disruptive discharge voltage
The value of the test voltage causing disruptive discharge, as specified, for the various
tests by 4.3.2, 5.3.2 and 6.3.3.
2.2.4 Withstand voltage
A specified voltage value which characterizes the insulation of the object with regard to a
withstand test.
Unless otherwise specified, withstand voltages are referred to the standard reference
atmosphere (see 3.3.1).
2.2.5 Assured disruptive discharge voltage
rformance with regard to a
A specified prospective voltage value which characterizes its pe
disruptive discharge test. Unless otherwise specified, assured disruptive discharge
voltages refer to standard reference atmospheric conditions (see 3.3.1).

1180-1 © I EC - 19 -
SECTION 3: GENERAL REQUIREMENTS RELATING TO TEST PROCEDURES
AND TEST OBJECTS
3.1 General requirements for test procedures
The test procedures applicable to particular types of test objects, for example, the polarity
to be used, the preferred order if both polarities are to be used, the number of applications
and the interval between
...

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