Polymeric thermistors - Directly heated positive step function temperature coefficient - Part 1: Generic specification

Prescribes terms and methods of test for polymeric positive temperature coefficient thermistors, insulated and non-insulated types, typically intended for use in current limiting and overcurrent protection applications. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components.

Temperaturabhängige Widerstände aus Polymerwerkstoffen - Direkt geheizte temperaturabhängige Widerstände mit positivem Temperaturkoeffizienten - Teil 1: Fachgrundspezifikation

Thermistances polymères - Coefficient de température positif de fonction échelon à chauffage direct - Partie 1: Spécification générique

Prescribes terms and methods of test for polymeric positive temperature coefficient thermistors, insulated and non-insulated types, typically intended for use in current limiting and overcurrent protection applications. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components.

Polimerni termistorji – Neposredno ogrevani s pozitivnim temperaturnim koeficientom – 1. del: Generična specifikacija (IEC 62319-1:2005)

General Information

Status
Published
Publication Date
10-Mar-2005
Current Stage
6060 - Document made available
Start Date
11-Mar-2005
Completion Date
11-Mar-2005

Buy Standard

Standard
EN 62319-1:2005
English language
37 pages
sale 10% off
Preview
sale 10% off
Preview
e-Library read for
1 day

Standards Content (sample)

SIST EN 62319-1:2005SLOVENSKIdecember 2005

STANDARDPolimerni termistorji – Neposredno ogrevani s pozitivnim temperaturnim koeficientom – 1. del: Generična specifikacija (IEC 62319-1:2005)Polymeric thermistors – Directly heated positive step function temperature coefficient – Part 1: Generic specification (IEC 62319-1:2005)©

Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljenoReferenčna številkaSIST EN 62319-1:2005(en)ICS31.040.30

EUROPEAN STANDARD
EN 62319-1 NORME EUROPÉENNE EUROPÄISCHE NORM

March 2005 CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2005 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 62319-1:2005 E
ICS 31.040.30
English version
Polymeric thermistors -

Directly heated positive step function temperature coefficient Part 1: Generic specification (IEC 62319-1:2005)

Thermistances polymères -
Coefficient de température positif

de fonction échelon à chauffage direct Partie 1: Spécification générique (CEI 62319-1:2005)

Temperaturabhängige Widerstände
aus Polymerwerkstoffen -

Direkt geheizte temperaturabhängige Widerstände mit positivem Temperaturkoeffizienten Teil 1: Fachgrundspezifikation (IEC 62319-1:2005)

This European Standard was approved by CENELEC on 2005-02-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom.

EN 62319-1:2005 - 2 - Foreword The text of document 40/1505/FDIS, future edition 1 of IEC 62319-1, prepared by IEC TC 40, Capacitors and resistors for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62319-1 on 2005-02-01. The following dates were fixed: – latest date by which the EN has to be implemented

at national level by publication of an identical
national standard or by endorsement
(dop)
2005-12-01 – latest date by which the national standards conflicting
with the EN have to be withdrawn
(dow)

2008-02-01 Annex ZA has been added by CENELEC. __________ Endorsement notice The text of the International Standard IEC 62319-1:2005 was approved by CENELEC as a European Standard without any modification. __________

- 3 - EN 62319-1:2005
Annex ZA
(normative)
Normative references to international publications

with their corresponding European publications The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE Where an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60027-1

- 1) Letter symbols to be used in electrical technology Part 1: General

HD 60027-1 2004 2) IEC 60050 Series International Electrotechnical Vocabulary EN 60050 Series IEC 60068-1 - 1) Environmental testing Part 1: General and guidance

EN 60068-1 1994 2) IEC 60068-2-6 - 1) Part 2: Tests - Test Fc: Vibration (sinusoidal)

EN 60068-2-6 1995 2) IEC 60068-2-14 - 1) Part 2: Tests - Test N: Change of temperature

EN 60068-2-14 1999 2) IEC 60068-2-20 - 1) Part 2: Tests - Test T: Soldering

HD 323.2.20 S3 1988 2) IEC 60068-2-21 - 1) Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices

EN 60068-2-21 1999 2) IEC 60068-2-27 - 1) Part 2: Tests - Test Ea and guidance: Shock

EN 60068-2-27 1993 2) IEC 60068-2-29 - 1) Part 2: Tests - Test Eb and guidance: Bump

EN 60068-2-29 1993 2) IEC 60068-2-45 - 1) Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents

EN 60068-2-45 1992 2) IEC 60294 - 1) Measurement of the dimensions of a cylindrical component having two axial terminations

- - IEC 60410 - 1) Sampling plans and procedures for inspection by attributes
- - IEC 60617
database Graphical symbols for diagrams
- -
1) Undated reference.
2) Valid edition at date of issue.

EN 62319-1:2005 - 4 - Publication Year Title EN/HD Year IECQ 001002-3 - 1) IEC Quality Assessment System for Electronic Components (IECQ) - Rules of Procedure Part 3: Approval procedures

- - IECQ 001003 - 1) IEC Quality Assessment System for Electronic Components (IECQ) - Guidance documents

- - ISO 1000 - 1) SI units and recommendations for the use of their multiples and of certain other units

- -

INTERNATIONAL STANDARD IEC62319-1 First edition2005-02 Polymeric thermistors – Directly heated positive step function temperature coefficient – Part 1: Generic specification

 IEC 2005

Copyright - all rights reserved No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission,

3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch

Web: www.iec.ch V For price, see current catalogue PRICE CODE

Commission Electrotechnique InternationaleInternational Electrotechnical Commission

– 2 – 62319-1  IEC:2005(E) CONTENTS FOREWORD.........................................................................................................................4

1 General..........................................................................................................................6 1.1 Scope....................................................................................................................6 1.2 Normative references............................................................................................6 2 Technical data................................................................................................................7 2.1 Units and symbols.................................................................................................7 2.2 Terms and definitions..............................................................................................7 2.3 Preferred values..................................................................................................10 2.4 Marking...............................................................................................................11 3 Quality assessment procedures....................................................................................11 3.1 General...............................................................................................................11 3.2 Primary stage of manufacture..............................................................................11 3.3 Subcontracting....................................................................................................12 3.4 Structurally similar components...........................................................................12 3.5 Qualification approval procedures........................................................................12 3.6 Rework and repair...............................................................................................18 3.7 Release for delivery.............................................................................................18 3.8 Certified test records of released lots...................................................................19 3.9 Delayed delivery..................................................................................................19 3.10 Alternative test methods......................................................................................19 3.11 Manufacture outside the geographical limits of IECQ NSIs....................................19 3.12 Unchecked parameters........................................................................................19 4 Test and measurement procedures...............................................................................19 4.1 Standard conditions for testing.............................................................................19 4.2 Drying and recovery.............................................................................................20 4.3 Visual inspection and check of dimensions...........................................................20 4.4 Zero power resistance.........................................................................................21 4.5 Insulation resistance (for insulated types only).....................................................21 4.6 Voltage proof (for insulated types only)................................................................22 4.7 Robustness of terminations (for leaded types only)...............................................22 4.8 Soldering.............................................................................................................23 4.9 Mounting.............................................................................................................23 4.10 Rapid change of temperature...............................................................................24 4.11 Climatic sequence...............................................................................................24 4.12 Cycle life testing..................................................................................................25 4.13 Trip endurance....................................................................................................27 4.14 Trip current.........................................................................................................28 4.15 Hold current........................................................................................................28 4.16 Residual current and power dissipation................................................................29 4.17 Time-to-trip.........................................................................................................29 4.18 Cold environmental electrical cycling....................................................................30 4.19 Thermal runaway.................................................................................................30

62319-1  IEC:2005(E) – 3 – Annex A (normative)

Fixed sample size test schedules for qualification approval.................31 Annex B (normative)

Vibration-, bump-, shock-, shear-, substrate bending test....................32 B.1 Vibration......................................................................................................................32 B.2 Bump...........................................................................................................................32 B.3 Shock...........................................................................................................................33 B.4 Shear (adhesion) test...................................................................................................33 B.5 Substrate bending test..................................................................................................33

Figure 1 – Test schedule flow chart.....................................................................................15 Figure 2 – Circuit for Trip endurance...................................................................................28

Table 1 – Fixed sample size test schedule for qualification approval of Polymeric PTC thermistors for current limitation, assessment level EZ.........................................................16 Table 2 – Quality conformance inspection for lot-by-lot inspection........................................17 Table 3 – Quality conformance inspection for periodic testing..............................................18 Table 4 – Loading weight for wire terminations....................................................................22 Table 5 – Number of cycles.................................................................................................25

– 4 – 62319-1  IEC:2005(E) INTERNATIONAL ELECTROTECHNICAL COMMISSION ____________

POLYMERIC THERMISTORS – DIRECTLY HEATED POSITIVE STEP FUNCTION
TEMPERATURE COEFFICIENT – Part 1: Generic specification

FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62319-1 has been prepared by IEC technical committee 40: Capacitors and resistors for electronic equipment. The text of this standard is based on the following documents: FDIS Report on voting 40/1505/FDIS 40/1534/RVD

Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

62319-1  IEC:2005(E) – 5 – The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to the specific publication. At this date, the publication will be

• reconfirmed; • withdrawn; • replaced by a revised edition, or • amended.
A bilingual version of this publication may be issued at a later date.

– 6 – 62319-1  IEC:2005(E) POLYMERIC THERMISTORS – DIRECTLY HEATED POSITIVE STEP FUNCTION

TEMPERATURE COEFFICIENT –
Part 1: Generic specification

1 General 1.1 Scope This part of IEC 62319 prescribes terms and methods of test for polymeric positive temperature coefficient thermistors, insulated and non-insulated types, typically intended for use in current limiting and overcurrent protection applications. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components.

1.2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60027-1: Letter symbols to be used in electrical technology – Part 1: General IEC 60050: International Electrotechnical Vocabulary IEC 60068-1: Environmental testing – Part 1: General and guidance IEC 60068-2-6: Environmental testing – Part 2: Tests – Test Fc: Vibration (sinusoidal)

IEC 60068-2-14: Environmental testing – Part 2: Tests – Test N: Change of temperature

IEC 60068-2-20: Environmental testing – Part 2: Tests – Test T: Soldering

IEC 60068-2-21: Environmental testing – Part 2-21: Tests – Test U: Robustness of terminations and integral mounting devices IEC 60068-2-27: Environmental testing – Part 2: Tests – Test Ea and guidance: Shock IEC 60068-2-29: Environmental testing – Part 2: Tests – Test Eb and guidance: Bump IEC 60068-2-45: Environmental testing – Part 2: Tests – Test XA and guidance: Immersion in cleaning solvents IEC 60294: Measurement of the dimensions of a cylindrical component having two axial terminations IEC 60410: Sampling plans and procedures for inspection by attributes.

62319-1  IEC:2005(E) – 7 – IEC 60617-DB: 20011 Graphical symbols for diagrams IECQ 001003: IEC Quality Assessment System for Electronic Components – Guidance documents IECQ 001002-3: IEC Quality Assessment System for Electronic Components – Rules of Procedure – Part 3: Approval procedures ISO 1000: SI units and recommendations for the use of their multiples and of certain other units 2 Technical data 2.1 Units and symbols Units, graphical symbols, letter symbols and terminology shall, whenever possible, be taken from the following documents: IEC 60027 IEC 60050 IEC 60617 ISO 1000 The following subclauses contain additional terminology applicable to thermistors. Where further items are required they shall be derived in accordance with the principles of the documents listed above. 2.2 Terms and definitions For the purposes of this document, the following terms and definitions apply. 2.2.1 thermistor thermally sensitive semiconducting resistor whose primary function is to exhibit an important change in electrical resistance with a change in body temperature 2.2.2 positive temperature coefficient thermistor thermistor in which the resistance increases with increasing temperature throughout the useful part of its characteristic. The PTC thermistors covered in this specification typically exhibit a very sharp increase in resistance over a narrow temperature range 2.2.3 directly heated positive temperature coefficient thermistor thermistor in which the change in temperature is obtained either by the flow of current through the thermo-sensitive element, or by a change in ambient temperature, or by a combination of both of these means ___________ 1 “DB” refers to the IEC on-line database.

– 8 – 62319-1  IEC:2005(E) 2.2.4 zero power resistance

RT value of the resistance of a PTC thermistor, at a given temperature, under such conditions that the change in resistance due to the internal generation of heat is negligible with respect to the total error of measurement NOTE Any resistance value of a PTC thermistor is dependent on the value and the mode of the applied voltage (AC or DC).

2.2.5 nominal zero power resistance

Rn zero power resistance used as a reference value for which the following conditions should be given in the detail specification: a) reference temperature, preferably 25 °C b) applied voltage (DC or AC) 2.2.6 resistance/temperature characteristics relationship between the zero power resistance of a thermistor and the temperature of the thermosensitive element when measured under specified reference conditions 2.2.7 upper category temperature

UCT maximum ambient operating temperature of the thermistor 2.2.8 lower category temperature

LCT minimum ambient operating temperature of the thermistor 2.2.9 trip event event of rapid increasing resistance of the thermistor in response to an overcurrent surge

2.2.10 minimum initial resistance
Rmin minimum resistance of the thermistor 2.2.11 maximum initial resistance

Rmax maximum resistance of the thermistor before it’s initial trip event 2.2.12 maximum resistance 1 h after tripping

R1max for leaded thermistors the maximum resistance of the thermistor 1 h after it’s first trip event; for surface mount thermistors, the maximum resistance of the thermistor 1 h after reflow 2.2.13 maximum voltage

Umax maximum AC or DC voltage which may be applied to the thermistor

62319-1  IEC:2005(E) – 9 – 2.2.14 operating temperature range at maximum voltage range of ambient temperatures at which the thermistor can operate at the maximum voltage 2.2.15 isolation voltage (applicable only to insulated thermistors) maximum peak voltage which may be applied under continuous operating conditions between any of the thermistor terminations and any conducting surface 2.2.16 maximum current

Imax value of current for the operating temperature range, which should not be exceeded 2.2.17 residual current

Ires value of current in the tripped thermistor at a specified ambient temperature (preferably 25 °C) under steady state conditions; the applied voltage is the maximum voltage unless otherwise specified 2.2.18 trip current

It lowest current which will cause the thermistor to trip to its high resistance state at a specified temperature (preferably 25 °C) and within a time specified in the detail specification 2.2.19 hold current

Ih the maximum current at specified ambient temperature, preferably 25 °C, which will not cause the trip event 2.2.20 fault current

Ifault current used when measuring time to trip 2.2.21 power dissipation

Pd product of the current flowing through a device and the voltage across it, under steady state conditions; the applied voltage is the maximum voltage unless otherwise specified 2.2.22 time-to-trip

ttrip under specified ambient conditions, starting from the time the fault current (Ifault) is applied, the time-to-trip is the time required for a device to switch into the tripped state 2.2.23 insulated thermistors thermistors capable of meeting the requirements of the insulation resistance and voltage proof tests when specified in the test schedule

– 10 – 62319-1  IEC:2005(E) 2.3 Preferred values 2.3.1 Climatic categories The thermistors covered by this specification are classified into climatic categories according to the general rules given in the annex to IEC 60068-1. The detail specification prescribes the appropriate category. 2.3.2 Bump test severities The test severity given in the detail specification shall preferably be the following: Test Eb (IEC 60068-2-29) Acceleration: 400 m/s2 Number of bumps: 4 000 total. Thermistors shall be mounted by their normal means, in such a manner that there shall be no parasitic vibration. 2.3.3 Shock test severities Test severities given in detail specifications shall preferably be the following: Test Ea (IEC 60068-2-27) Pulse shape: Half sine Acceleration: 500 m/s2 Pulse duration: 11 ms. Severity: 3 successive shocks in each axis direction per specimen. Separate specimens to be used for each axis (6 shocks total per specimen). NOTE The shock and bump tests are normally specified as alternatives. 2.3.4 Vibration severities Test severities given in the detail specifications shall preferably be selected from the following: Test Fc (IEC 60068-2-6) Frequency range: 10 Hz to 55 Hz or 10 Hz to 500 Hz Amplitude: 0,75 mm or 98 m/s2 (whichever is the less severe) Sweep endurance: Total duration 6 h. Thermistors shall be mounted by their normal means, in such a manner that there shall be no parasitic vibration. During vibration testing there shall be no interruption in electrical continuity greater than 0,5 ms.

62319-1  IEC:2005(E) – 11 – 2.4 Marking 2.4.1 General The following shall be clearly marked on the thermistor in the following order of precedence as space permits: a) values of the primary characteristics appropriate to the application of the thermistor to be specified in the detail specification. When these values are coded (including colour coding), details shall be given in the detail specification or type designation; b) manufacturer's name and/or trade mark; c) date of manufacture or date code; d) the number of the detail specification and style. The package containing the thermistors shall be clearly marked with all the information listed above. Any additional marking shall be so applied that no confusion can arise. 3 Quality assessment procedures 3.1 General When these documents are being used for the purposes of a full quality assessment system such as the IEC Quality Assessment System for Electronic Components (IECQ), compliance with 3.5 is required. When these documents are used outside such quality assessment systems for purposes such as design proving or type testing, the procedures and requirements of 3.5.1 and 3.5.3 b) may be used, but if used, the test and parts of tests shall be applied in the order given in the test schedule. Before thermistors can be qualified according to the procedures of this clause, the manufacturer shall obtain the approval of his organisation in accordance with the provisions of IECQ 001002-3. The method for the approval of thermistors of assessed quality given in 3.5 is qualification approval according to the provisions of Clause 3 of IECQ 001002-3. 3.1.1 Applicability of qualification approval Qualification approval is appropriate for a standard range of thermistors manufactured to similar design and production processes and conforming to a published detail specification. The programme of tests defined in the detail specification for the appropriate assessment and performance levels applies directly to the subfamily of thermistors to be qualified, as prescribed in 3.5 and the relevant blank detail specification. 3.2 Primary stage of manufacture The primary stage of manufacture is defined as the initial compounding process of the ingredients.

– 12 – 62319-1  IEC:2005(E) 3.3 Subcontracting If subcontracting of the primary stage of manufacture and/or subsequent stages is employed it shall be in accordance with 4.2.2 of IECQ 001002-3. The blank detail specification may restrict subcontracting in accordance with 4.2.2.2 of IECQ 001002-3. 3.4 Structurally similar components Thermistors may be grouped as structurally similar for the purpose of forming inspection lots provided the following requirements are met: a) they shall be produced by one manufacturer on one site using essentially the same design, materials, processes and methods; b) the sample taken shall be determined from the total lot size of the grouped devices; c) structurally similar devices should preferably be included in one detail specification but the details of all claims to structural similarity shall be declared in the qualification approval test reports. 3.4.1 For electrical tests, devices having the same electrical characteristics may be grouped provided the element determining the characteristic is similar for all the devices concerned. 3.4.2 For environmental tests, devices having the same

type of insulation, basic internal structure and finishing processes may be grouped. 3.4.3 For visual inspection (except marking), devices may be grouped if they have been made on the same production line, have the same dimensions, type of insulation and external finish. This grouping may also be used for robustness of terminations and soldering tests where it is convenient to group devices with different internal structures. 3.4.4 For endurance tests, thermistors may be grouped if they have been made on the same production line using the same design and differing only in electrical characteristics. If it can be shown that one type from the group is more heavily stressed than the others then tests on this type may be accepted for the remaining members of the group. 3.5 Qualification approval procedures 3.5.1 Eligibility for qualification approval The manufacturer

...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.