EN 61000-4-4:2012

Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test

NEW! IEC 61000-4-4:2012 is available as IEC Standards+ 61000-4-4:2012 which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition. IEC 61000-4-4:2012 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It has the status of a basic EMC publication in accordance with IEC Guide 107. It gives immunity requirements and test procedures related to electrical fast transients/bursts. It additionally defines ranges of test levels and establishes test procedures. The object of this standard is to establish a common and reproducible reference in order to evaluate the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this standard describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. This third edition cancels and replaces the second edition published in 2004 and its amendment 1 (2010). It constitutes a technical revision which improves and clarifies simulator specifications, test criteria and test setups.

Elektromagnetische Verträglichkeit (EMV) - Teil 4-4: Prüf- und Messverfahren - Prüfung der Störfestigkeit gegen schnelle transiente elektrische Störgrößen/Burst

Compatibilité électromagnétique (CEM) - Partie 4-4: Techniques d'essai et de mesure - Essai d'immunité aux transitoires électriques rapides en salves

NEW! La CEI 61000-4-4:2012 est disponible sous forme de IEC Standards+ 61000-4-4:2012 qui contient la Norme internationale et sa version Redline, illustrant les modifications du contenu technique depuis l'édition précédente. La CEI 61000-4-4:2012 concerne l'immunité des matériels électriques et électroniques aux transitoires rapides répétitifs. Elle a le statut de publication fondamentale en CEM en accord avec le Guide 107 de la CEI. Elle donne les exigences d'immunité et les procédures d'essai relatives aux transitoires électriques rapides en salves. Elle définit en outre des gammes de niveaux d'essais et établit des procédures d'essai. L'objet de la présente norme est d'établir une référence commune et reproductible dans le but d'évaluer l'immunité des matériels électriques et électroniques quand ils sont soumis aux transitoires électriques rapides en salves sur les accès d'alimentat ion, de signal, de commande et de terre. La méthode d'essai documentée dans la présente norme décrit une méthode cohérente dans le but d'évaluer l'immunité d'un matériel ou système vis-à-vis d'un phénomène défini. La présente troisième édition annule et remplace la deuxième édition, parue en 2004, et son amendement 1 (2010). Elle constitue une révision technique qui améliore et clarifie les spécifications du simulateur, les critères et les montages d'essai.

Elektromagnetna združljivost (EMC) - 4-4. del: Preskusne in merilne tehnike - Preskus odpornosti proti hitrim električnim prehodnim pojavom/razpoku (IEC 61000-4-4:2012)

Ta del standarda IEC 61000 se nanaša na odpornost električne in elektronske opreme proti hitrim električnim prehodnim pojavom. Določa zahteve glede odpornosti in preskusne postopke, povezane s hitrimi električnimi prehodnimi pojavi/razpoki. Poleg tega določa razpone preskusnih ravni in opredeljuje preskusne postopke. Cilj tega standarda je vzpostaviti skupno in ponovljivo sklicevanje za oceno odpornosti električne in elektronske opreme, podvržene hitrim električnim prehodnim pojavom/razpokom na napajalnih, signalnih, nadzornih in ozemljitvenih vratih. Preskusna metoda, dokumentirana v tem delu standarda IEC 61000, opisuje skladno metodo za oceno odpornosti opreme ali sistema proti opredeljenemu pojavu. Standard določa: – valovno obliko preskusne napetosti, – razpon preskusnih ravni, – preskusno opremo, – postopke za kalibracijo in preverjanje preskusne opreme, – preskusne nastavitve, – preskusni postopek. Standard določa specifikacije za laboratorijske preskuse in preskuse na kraju samem.

General Information

• Status: Published
• Publication Date: 08-Nov-2012
• Withdrawal Date: 03-Jun-2015
• ICS: 33.100.20 - Immunity
• Technical Committee: CLC/TC 210 - Electromagnetic Compatibility (EMC)
• Drafting Committee: IEC/SC 77B - IEC_SC_77B
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 09-Nov-2012
• Completion Date: 09-Nov-2012
• Directive: 2004/108/EC - Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2004/108/EU - DIRECTIVE 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2014/30/EU - Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)
• Mandate: M/490 - Standardisation mandate to the European Standardisation Organisations (ESOs) to support European Smart Grid deployment
• Ref Project: SIST EN 61000-4-4:2013 - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test

Relations

• Replaces: EN 61000-4-4:2004/A1:2010 - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
• Effective Date: 28-Jan-2023
• Replaces: EN 61000-4-4:2004 - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
• Effective Date: 28-Jan-2023

Overview

EN 61000-4-4:2012 (IEC 61000-4-4:2012) is a fundamental EMC standard that defines testing and measurement techniques for electrical fast transient (EFT) / burst immunity. It establishes a reproducible, laboratory and in‑situ method to evaluate the immunity of electrical and electronic equipment when subjected to repetitive fast transients on supply, signal, control and earth ports. This third edition replaces the 2004 edition and 2010 amendment, clarifying simulator specifications, test criteria and test setups.

Key Topics

• Scope and purpose: Provides common reference methods and reproducible procedures for EFT/burst immunity testing as a basic EMC publication (IEC Guide 107).
• Test levels and criteria: Defines ranges of test levels and acceptance criteria for immunity verification.
• Burst generator specifications: Describes the required characteristics, waveform representation and calibration of EFT/burst generators used to produce fast transients.
• Coupling/decoupling network (CDN): Requirements and calibration procedures for CDNs used on a.c./d.c. power ports to inject bursts without upsetting the supply.
• Capacitive coupling clamp (CCC): Use and calibration of CCCs for coupling fast transients to signal and control cables.
• Test setups: Detailed laboratory and in‑situ test arrangements, including equipment layout, grounding, cable routing and verification procedures.
• Execution and evaluation: Step-by-step test procedure, environmental and electromagnetic reference conditions, measurement uncertainty considerations and test reporting requirements.
• Calibration and measurement uncertainty: Guidance on calibrating simulators, transducers and on accounting for measurement uncertainty in test results.

Applications

EN 61000-4-4:2012 is essential for anyone who needs to assess or demonstrate resilience to fast transient bursts:

• EMC test laboratories performing type and compliance testing.
• Product designers and R&D teams validating circuit immunity during development (industrial, medical, telecoms, consumer electronics, control systems).
• Manufacturers and quality engineers establishing robustness and production test criteria.
• Certification bodies and compliance managers preparing EMC technical files and reports.
• Field engineers conducting in‑situ immunity checks on installed systems.

Practical applications include verifying immunity of power supplies, communication interfaces, PLCs, instrumentation, control panels and any equipment with exposed signal/control ports susceptible to EFTs.

Related Standards

• IEC/EN 61000-4-2 (ESD immunity) - complementary immunity testing.
• IEC/EN 61000-4-5 (Surge immunity) - addresses high-energy transients.
• IEC Guide 107 - guidance on drafting basic EMC publications.

Keywords: EN 61000-4-4:2012, IEC 61000-4-4, electrical fast transient, burst immunity, EMC testing, burst generator, coupling/decoupling network, capacitive coupling clamp, test levels, calibration, measurement uncertainty.

Standards Content (Sample)

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Elektromagnetische Verträglichkeit (EMV) - Teil 4-4: Prüf- und Messverfahren - Prüfung der Störfestigkeit gegen schnelle transiente elektrische Störgrößen/BurstCompatibilité électromagnétique (CEM) - Partie 4-4: Techniques d'essai et de mesure - Essais d'immunité aux transitoires électriques rapides en salvesElectromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test33.100.20ImunostImmunityICS:Ta slovenski standard je istoveten z:EN 61000-4-4:2012SIST EN 61000-4-4:2013en01-januar-2013SIST EN 61000-4-4:2013SLOVENSKI
STANDARDSIST EN 61000-4-4:20051DGRPHãþD

EUROPEAN STANDARD EN 61000-4-4 NORME EUROPÉENNE
EUROPÄISCHE NORM November 2012
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2012 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61000-4-4:2012 E
ICS 33.100.20 Supersedes EN 61000-4-4:2004 + A1:2010
English version
Electromagnetic compatibility (EMC) -
Part 4-4: Testing and measurement techniques -
Electrical fast transient/burst immunity test (IEC 61000-4-4:2012)
Compatibilité électromagnétique (CEM) - Partie 4-4: Techniques d'essai
et de mesure -
Essai d'immunité aux transitoires électriques rapides en salves (CEI 61000-4-4:2012)
Elektromagnetische Verträglichkeit (EMV) - Teil 4-4: Prüf- und Messverfahren -
Prüfung der Störfestigkeit gegen schnelle transiente elektrische Störgrößen/Burst (IEC 61000-4-4:2012)
This European Standard was approved by CENELEC on 2012-06-04. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
This document supersedes EN 61000-4-4:2004 + A1:2010.
This edition improves and clarifies simulator specifications, test criteria and test setups.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61000-4-4:2012 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 61000-4-2:2008 NOTE Harmonised as EN 61000-4-2:2009 (not modified). IEC 61000-4-4:2004 NOTE Harmonised as EN 61000-4-4:2004 (not modified). IEC 61000-4-4:2004/A1:2010 NOTE Harmonised as EN 61000-4-4:2004/A1:2010 (not modified). IEC 61000-4-5:2005 NOTE Harmonised as EN 61000-4-5:2006 (not modified).
- 3 - EN 61000-4-4:2012 Annex ZA
(normative)
Normative references to international publications with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title EN/HD Year
IEC 60050-161 1990 International Electrotechnical Vocabulary (IEV) -
Chapter 161: Electromagnetic compatibility - -
IEC 61000-4-4Edition 3.0 2012-04INTERNATIONAL STANDARD NORME INTERNATIONALEElectromagnetic compatibility (EMC) –
Part 4-4: Testing and measurement techniques – Electrical fast transient/burst immunity test
Compatibilité électromagnétique (CEM) –
Partie 4-4: Techniques d'essai et de mesure – Essai d'immunité aux transitoires électriques rapides en salves INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XICS 33.100.20 PRICE CODECODE PRIXISBN 978-2-83220-016-2BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM® Registered trademark of the International Electrotechnical Commission
– 2 – 61000-4-4 © IEC:2012 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope . 7 2 Normative references . 7 3 Terms, definitions and abbreviations . 7 3.1 Terms and definitions . 7 3.2 Abbreviations . 10 4 General . 10 5 Test levels . 10 6 Test equipment . 11 6.1 Overview . 11 6.2 Burst generator . 11 6.2.1 General . 11 6.2.2 Characteristics of the fast transient/burst generator . 12 6.2.3 Calibration of the characteristics of the fast transient/burst generator . 14 6.3 Coupling/decoupling network for a.c./d.c. power port . 15 6.3.1 Characteristics of the coupling/decoupling network . 15 6.3.2 Calibration of the coupling/decoupling network . 16 6.4 Capacitive coupling clamp . 17 6.4.1 General . 17 6.4.2 Calibration of the capacitive coupling clamp . 18 7 Test setup . 20 7.1 General . 20 7.2 Test equipment . 20 7.2.1 General . 20 7.2.2 Verification of the test instrumentation . 20 7.3 Test setup for type tests performed in laboratories . 21 7.3.1 Test conditions . 21 7.3.2 Methods of coupling the test voltage to the EUT . 24 7.4 Test setup for in situ tests . 26 7.4.1 Overview . 26 7.4.2 Test on power ports and earth ports . 26 7.4.3 Test on signal and control ports . 27 8 Test procedure . 28 8.1 General . 28 8.2 Laboratory reference conditions . 28 8.2.1 Climatic conditions . 28 8.2.2 Electromagnetic conditions . 28 8.3 Execution of the test . 28 9 Evaluation of test results . 29 10 Test report. 29 Annex A (informative)
Information on the electrical fast transients . 30 Annex B (informative)
Selection of the test levels . 32 Annex C (informative)
Measurement uncertainty (MU) considerations . 34 Bibliography . 43 SIST EN 61000-4-4:2013

61000-4-4 © IEC:2012 – 3 –
Figure 1 – Simplified circuit diagram showing major elements of a fast transient/burst generator . 12 Figure 2 – Representation of an electrical fast transient/burst . 13 Figure 3 – Ideal waveform of a single pulse into a 50 Ω load
with nominal parameters tr = 5 ns and tw = 50 ns . 13 Figure 4 – Coupling/decoupling network for a.c./d.c. power mains supply ports/terminals . 16 Figure 5 – Calibration of the waveform at the output of the coupling/decoupling network . 17 Figure 6 – Example of a capacitive coupling clamp . 18 Figure 7 – Transducer plate for coupling clamp calibration . 19 Figure 8 – Calibration of a capacitive coupling clamp using the transducer plate . 19 Figure 9 – Block diagram for electrical fast transient/burst
immunity test . 20 Figure 10 – Example of a verification setup of the capacitive coupling clamp . 21 Figure 11 – Example of a test setup for laboratory type tests . 22 Figure 12 – Example of test setup using a floor standing system of two EUTs. 23 Figure 13 – Example of a test setup for equipment with elevated cable entries . 24 Figure 14 – Example of a test setup for direct coupling of the test voltage to a.c./d.c. power ports for laboratory type tests . 25 Figure 15 – Example for in situ test on a.c./d.c. power ports and protective earth terminals for stationary, floor standing EUT . 26 Figure 16 – Example of in situ test on signal and control ports without the capacitive coupling clamp . 27
Table 1 – Test levels. 11 Table 2 – Output voltage peak values and repetition frequencies . 15 Table C.1 – Example of uncertainty budget for voltage rise time (tr) . 36 Table C.2 – Example of uncertainty budget for EFT/B peak voltage value (VP) . 37 Table C.3 – Example of uncertainty budget for EFT/B voltage pulse width (tw) . 38 Table C.4 – . factor (Equation (C.4)) of different unidirectional impulse responses corresponding to the same bandwidth of the system B . 40
– 4 – 61000-4-4 © IEC:2012 INTERNATIONAL ELECTROTECHNICAL COMMISSION ___________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-4: Testing and measurement techniques –
Electrical fast transient/burst immunity test
FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61000-4-4 has been prepared by subcommittee 77B: High frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility. It forms Part 4-4 of IEC 61000. It has the status of a basic EMC publication in accordance with IEC Guide 107, Electromagnetic compatibility – Guide to the drafting of electromagnetic compatibility publications. This third edition cancels and replaces the second edition published in 2004 and its amendment 1 (2010) and constitutes a technical revision.
This third edition improves and clarifies simulator specifications, test criteria and test setups.
61000-4-4 © IEC:2012 – 5 – The text of this standard is based on the following documents: FDIS Report on voting 77B/670/FDIS 77B/673/RVD
Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The list of all currently available parts of the IEC 61000 series, under the general title Electromagnetic compatibility (EMC), can be found on the IEC web site. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to the specific publication. At this date, the publication will be
• reconfirmed, • withdrawn, • replaced by a revised edition, or • amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer.
– 6 – 61000-4-4 © IEC:2012 INTRODUCTION IEC 61000 is published in separate parts, according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into several parts, published either as international standards or as technical specifications or technical reports, some of which have already been published as sections. Others are published with the part number followed by a dash and a second number identifying the subdivision (example: IEC 61000-6-1). This part is an international standard which gives immunity requirements and test procedures related to electrical fast transients/bursts. SIST EN 61000-4-4:2013

61000-4-4 © IEC:2012 – 7 – ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-4: Testing and measurement techniques –
Electrical fast transient/burst immunity test
1 Scope This part of IEC 61000 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It gives immunity requirements and test procedures related to electrical fast transients/bursts. It additionally defines ranges of test levels and establishes test procedures. The object of this standard is to establish a common and reproducible reference in order to evaluate the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. NOTE As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard is applied or not, and if applied, they are responsible for determining the appropriate test levels and performance criteria.1 The standard defines: – test voltage waveform; – range of test levels; – test equipment; – calibration and verification procedures of test equipment; – test setups; – test procedure. The standard gives specifications for laboratory and in situ tests. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-161:1990, International Electrotechnical Vocabulary – Chapter 161: Electromagnetic compatibility 3 Terms, definitions and abbreviations 3.1 Terms and definitions For the purposes of this document, the terms and definitions of IEC 60050-161, as well as the following apply. ————————— 1
TC 77 and its subcommittees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products. SIST EN 61000-4-4:2013

– 8 – 61000-4-4 © IEC:2012 NOTE Several of the most relevant terms and definitions from IEC 60050-161 are presented among the definitions below. 3.1.1
auxiliary equipment AE equipment necessary to provide the equipment under test (EUT) with the signals required for normal operation and equipment to verify the performance of the EUT 3.1.2
burst sequence of a limited number of distinct pulses or an oscillation of limited duration [SOURCE: IEC 60050-161:1990, 161-02-07] 3.1.3
calibration set of operations which establishes, by reference to standards, the relationship which exists, under specified conditions, between an indication and a result of a measurement Note 1 to entry: This term is based on the "uncertainty" approach. Note 2 to entry: The relationship between the indications and the results of measurement can be expressed, in principle, by a calibration diagram. [SOURCE: IEC 60050-311:2001, 311-01-09] 3.1.4
coupling interaction between circuits, transferring energy from one circuit to another 3.1.5
common mode (coupling) simultaneous coupling to all lines versus the ground reference plane 3.1.6
coupling clamp device of defined dimensions and characteristics for common mode coupling of the disturbance signal to the circuit under test without any galvanic connection to it 3.1.7
coupling network electrical circuit for the purpose of transferring energy from one circuit to another 3.1.8
decoupling network electrical circuit for the purpose of preventing EFT voltage applied to the EUT from affecting other devices, equipment or systems which are not under test 3.1.9
degradation (of performance) undesired departure in the operational performance of any device, equipment or system from its intended performance Note 1 to entry: The term "degradation" can apply to temporary or permanent failure. [SOURCE: IEC 60050-161:1990, 161-01-19] 3.1.10
EFT/B electrical fast transient/burst SIST EN 61000-4-4:2013

61000-4-4 © IEC:2012 – 9 – 3.1.11
electromagnetic compatibility EMC ability of an equipment or system to function satisfactorily in its electromagnetic environment without introducing intolerable electromagnetic disturbances to anything in that environment [SOURCE: IEC 60050-161:1990, 161-01-07] 3.1.12
EUT equipment under test 3.1.13
ground reference plane GRP flat conductive surface whose potential is used as a common reference [SOURCE: IEC 60050-161:1990, 161-04-36] 3.1.14
immunity (to a disturbance) ability of a device, equipment or system to perform without degradation in the presence of an electromagnetic disturbance [SOURCE: IEC 60050-161:1990, 161-01-20] 3.1.15
port particular interface of the EUT with the external electromagnetic environment 3.1.16
pulse width interval of time between the first and last instants at which the instantaneous value reaches 50 % value of the rising and falling edge of the pulse [SOURCE: IEC 60050-702:1992, 702-03-04, modified] 3.1.17
rise time interval of time between the instants at which the instantaneous value of a pulse first reaches 10 % value and then the 90 % value [SOURCE: IEC 60050-161:1990, 161-02-05, modified] 3.1.18
transient pertaining to or designating a phenomenon or a quantity which varies between two consecutive steady states during a time interval which is short compared with the time-scale of interest [IEC 60050-161:1990, 161-02-01] 3.1.19
unsymmetric mode (coupling) single line coupling versus the ground reference plane SIST EN 61000-4-4:2013

– 10 – 61000-4-4 © IEC:2012 3.1.20
verification set of operations which is used to check the test equipment system (e.g. the test generator and the interconnecting cables) and to gain confidence that the test system is functioning within the specifications given in Clause 6 Note 1 to entry: The methods used for verification may be different from those used for calibration. Note 2 to entry: For the purposes of this basic EMC standard this definition is different from the definition given in IEC 60050-311:2001, 311-01-13. 3.2 Abbreviations AE Auxiliary Equipment CDN Coupling/Decoupling Network EFT/B Electrical Fast Transient/Burst EMC ElectroMagnetic Compatibility ESD ElectroStatic Discharge EUT Equipment Under Test GRP Ground Reference Plane MU Measurement Uncertainty PE Protective Earth TnL Terminator non Linearity 4 General The repetitive fast transient test is a test with bursts consisting of a number of fast transients, coupled into power, control, signal and earth ports of electrical and electronic equipment. Significant for the test are the high amplitude, the short rise time, the high repetition frequency, and the low energy of the transients. The test is intended to demonstrate the immunity of electrical and electronic equipment when subjected to types of transient disturbances such as those originating from switching transients (interruption of inductive loads, relay contact bounce, etc.). 5 Test levels The preferred test levels for the electrical fast transient test, applicable to power, control, signal and earth ports of the equipment are given in Table 1. SIST EN 61000-4-4:2013

61000-4-4 © IEC:2012 – 11 – Table 1 – Test levels Open circuit output test voltage and repetition frequency of the impulses Level Power ports, earth port (PE) Signal
and control ports Voltage peak kV Repetition frequency kHz Voltage peak kV Repetition frequency kHz 1 0,5 5 or 100 0,25 5 or 100 2 1 5 or 100 0,5 5 or 100 3 2 5 or 100 1 5 or 100 4 4 5 or 100 2 5 or 100 X a Special Special Special Special The use of 5 kHz repetition frequency is traditional, however, 100 kHz is closer to reality. Product committees should determine which frequencies are relevant for specific products or product types. With some products, there may be no clear distinction between power ports and signal ports, in which case it is up to product committees to make this determination for test purposes. a "X" can be any level, above, below or in between the others. The level shall be specified in the dedicated equipment specification. For selection of test levels, see Annex B. 6 Test equipment 6.1 Overview The calibration procedures of 6.2.3, 6.3.2 and 6.4.2 ensure the correct operation of the test generator, coupling/decoupling networks, and other items making up the test setup so that the intended waveform is delivered to the EUT. 6.2 Burst generator 6.2.1 General The simplified circuit diagram of the generator is given in Figure 1. The circuit elements Cc, Rs, Rm, and Cd are selected so that the generator delivers a fast transient under open circuit conditions and with a 50 Ω resistive load. The effective output impedance of the generator shall be 50 Ω. SIST EN 61000-4-4:2013

– 12 – 61000-4-4 © IEC:2012
Rc U 50 Ω coaxial output Switch Cc Rs Rm Cd IEC
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Components U high-voltage source Rc charging resistor Cc
energy storage capacitor Rs impulse duration shaping resistor Rm impedance matching resistor Cd d.c. blocking capacitor Switch high-voltage switch NOTE The characteristics of the switch together with stray elements (inductance and capacitance) of the layout shape the required rise time. Figure 1 – Simplified circuit diagram showing major elements of a fast transient/burst generator 6.2.2 Characteristics of the fast transient/burst generator The characteristics of the fast transient/burst generator are the following. – Output voltage range with 1 000 Ω load shall be at least 0,24 kV to 3,8 kV. –
Output voltage range with 50 Ω load shall be at least 0,125 kV to 2 kV. The generator shall be capable of operating under short-circuit conditions without being damaged. Characteristics: – polarity: positive/negative – output type: coaxial, 50 Ω – d.c. blocking capacitor
(10 ± 2) nF – repetition frequency: (see Table 2) ±20 % – relation to a.c. mains: asynchronous – burst duration: (15 ± 3) ms at 5 kHz
(see Figure 2) (0,75 ± 0,15) ms at 100 kHz – burst period: (300 ± 60) ms
(see Figure 2) – wave shape of the pulse
• into 50 Ω load rise time tr = (5 ± 1,5) ns
pulse width tw = (50 ± 15) ns
peak voltage = according to Table 2, ±10 %
61000-4-4 © IEC:2012 – 13 –
(see Figure 3for the 50 Ω wave shape) • into 1 000 Ω load rise time tr = (5 ± 1,5) ns
pulse width tw = 50 ns, with a tolerance of
–15 ns to +100 ns
peak voltage = according to Table 2, ±20 %
(see Note 1 of Table 2)
U Pulse Burst 1/repetition frequency Burst duration Burst period 300 ms U 200 µs at 5 kHz 10 µs at 100 kHz 15 ms at 5 kHz 0,75 ms at 100 kHz t t IEC
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Figure 2 – Representation of an electrical fast transient/burst
t r t w 1,00 0,75 0,50 0,25 0 0 50 100 150 200 250 300 1,0 0,9 0,8 0,7 0,6 0,5 0,4 0,3 0,2 0,1 0 0 1 2 3 4 5 6 7 8 9 10 tw tr ns ns Normalized voltage Normalized voltage IEC
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Figure 3 – Ideal waveform of a single pulse into a 50 Ω load
with nominal parameters tr = 5 ns and tw = 50 ns SIST EN 61000-4-4:2013

– 14 – 61000-4-4 © IEC:2012 The formula of the ideal waveform of Figure 3, νEFT(t), is as follows: ⋅+⋅=−2EFTEFT11EFT1vEFT1)(τττtnnettkvktv where EFT112EFT21EFTnnek⋅⋅−=ττττ and kv is maximum or peak value of the open-circuit voltage (kv = 1 means normalized voltage) ν1 = 0,92 τ1 = 3,5 ns τ2 = 51 ns nEFT = 1,8 NOTE The origin of this formula is given in IEC 62305-1:2010, Annex B. 6.2.3 Calibration of the characteristics of the fast transient/burst generator The test generator characteristics shall be calibrated in order to establish that they meet the requirements of this standard. For this purpose, the following procedure shall be undertaken. The test generator output shall be connected to a 50 Ω and 1 000 Ω coaxial termination respectively and the voltage monitored with an oscilloscope. The –3 dB bandwidth of the oscilloscope shall be at least 400 MHz. The test load impedance at 1 000 Ω is likely to become a complex network. The characteristics of the test load impedance are: – (50 ± 1) Ω; – (1 000 ± 20) Ω; the resistance measurement is made at d.c. The tolerance of the insertion loss of both test loads shall not exceed as follows: • ±1 dB up to 100 MHz • ±3 dB from 100 MHz up to 400 MHz. The following parameters shall be measured: • peak voltage;
For each of the set voltages of Table 2, measure the output voltage with a 50 Ω load [Vp (50 Ω)]. This measured voltage shall be Vp (50 Ω), with a tolerance of ±10 %.
With the same generator setting (set voltage), measure the voltage with a 1 000 Ω load [Vp (1 000 Ω)]. This measured voltage shall be Vp (1 000 Ω), with a tolerance of ±20 %. • rise time for all set voltages; • pulse width for all set voltages; • repetition frequency of the pulses within one burst for any one set voltage; • burst duration for any one set voltage; • burst period for any one set voltage. SIST EN 61000-4-4:2013

61000-4-4 © IEC:2012 – 15 – Table 2 – Output voltage peak values and repetition frequencies Set voltage
kV Vp (open circuit)
kV Vp (1 000 Ω)
kV Vp (50 Ω)
kV Repetition frequency kHz 0,25 0,25 0,24 0,125 5 or 100 0,5 0,5 0,48 0,25 5 or 100 1 1 0,95 0,5 5 or 100 2 2 1,9 1 5 or 100 4 4 3,8 2 5 or 100 Measures should be taken to ensure that stray capacitance is kept to a minimum. NOTE 1 Use of a 1 000 Ω load resistor will automatically result in a voltage reading that is 5 % lower than the set voltage, as shown in column Vp (1 000 Ω). The reading Vp at 1 000 Ω = Vp (open circuit) multiplied times 1 000/1 050 (the ratio of the test load to the total circuit impedance of 1 000 Ω plus 50 Ω). NOTE 2 With the 50
Ω load, the measured output voltage is 0,5 times the value of the unloaded voltage as reflected in the table above.
6.3 Coupling/decoupling network for a.c./d.c. power port 6.3.1 Characteristics of the coupling/decoupling network The coupling/decoupling network is used for tests of a.c./d.c. power ports. The circuit diagram (example for a three-phase power port) is given in Figure 4. The typical characteristics of the coupling/decoupling network are the following: – decoupling inductor with ferrite: >100 µH; – coupling capacitors: 33 nF. SIST EN 61000-4-4:2013

– 16 – 61000-4-4 © IEC:2012
EUT Cc Signal from test generator Connected to earth Decoupling section Coupling section Filtering Ferrites >100 µH Cc Cc Cc Cc Cc = 33 nF L1 L2 L3 N PE L1 L2 L3 N PE AC/DC supply IEC
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Components L1, L2, L3, phases N neutral PE protective earth Cc coupling capacitors Figure 4 – Coupling/decoupling network for a.c./d.c. power mains supply ports/terminals 6.3.2 Calibration of the coupling/decoupling network Measurement equipment that is specified as suitable to perform the calibrations defined in 6.2.3 shall also be used for the calibration of the characteristics of the coupling/decoupling network. The coupling/decoupling network shall be calibrated with a generator, which has been shown to be compliant with the requirements of 6.2.3. The waveform shall be calibrated in common mode coupling, this means to couple the transients to all lines simultaneously. The waveform shall be individually calibrated for each coupling line at each output terminal (L1, L2, L3, N and PE) of the coupling/decoupling network with a single 50 Ω termination to reference ground. Figure 5 shows one of the five calibration measurements, the calibration of L1 to reference ground. NOTE 1 Verifying each coupling line separately is done to ensure that each line is properly functioning and calibrated. Care should be taken to use coaxial adapters to interface with the output of the CDN. The connection between the output of the CDN and the coaxial adapter should be as short as possible; but not to exceed 0,1 m. SIST EN 61000-4-4:2013

61000-4-4 © IEC:2012 – 17 – The calibration is performed with the generator output at a set voltage of 4 kV. The generator is connected to the input of the coupling/decoupling network. Each individual output of the CDN (normally connected to the EUT) is terminated in sequence with a 50 Ω load while the other outputs are open. The peak voltage and waveform are recorded for each polarity. Rise time of the pulses shall be (5,5 ± 1,5) ns. Pulse width shall be (45 ± 15) ns. Peak voltage shall be (2 ± 0,2) kV, according to Table 2. NOTE 2 The values shown above are the result of the calibration method of the CDN. The residual test pulse voltage on the power inputs of the coupling/decoupling network when the EUT and the power network are disconnected shall not exceed 400 V when measured individually at each input terminal (L1, L2, L3, N to PE) with a single 50 Ω termination and when the generator is set to 4 kV and the coupling/decoupling network is set in common mode coupling, this means to couple the transients to all lines simultaneously.
Cc Signal from test generator L1 L2 L3 N PE Cc Cc Cc Cc EUT port Termination resistor 50 Ω L1 L2 L3 N PE Power supply port Open Decoupling network Reference ground IEC
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Figure 5 – Calibration of the waveform at the output of the coupling/decoupling network 6.4 Capacitive coupling clamp 6.4.1 General The clamp provides the ability of coupling the fast transients/bursts to the circuit under test without any galvanic connection to the terminals of the EUT's ports, shielding of the cables or any other part of the EUT. The coupling capacitance of the clamp depends on the cable diameter, material of the cables and cable shielding (if any). The device is composed of a clamp unit (made, for example, of galvanized steel, brass, copper or aluminium) for housing the cables (flat or round) of the circuits under test and shall SIST EN 61000-4-4:2013

– 18 – 61000-4-4 © IEC:2012 be placed on a ground reference plane. The ground reference plane shall extend beyond the clamp by a least 0,1 m on all sides. The clamp shall be provided at both ends with a high-voltage coaxial connector for the connection of the test generator at either end. The generator shall be connected to that end of the clamp which is nearest to the EUT. When the coupling clamp has only one HV coaxial connector, it should be arranged so that the HV coaxial connector is closest to the EUT. The clamp itself shall be closed as much as possible to provide maximum coupling capacitance between the cable and the clamp. An example of the mechanical arrangement of the coupling clamp is given in Figure 6. The following dimensions shall be used: Lower coupling plate height: (100 ± 5) mm Lower coupling plate width: (140 ± 7) mm Lower coupling plate length: (1 000 ± 50) mm The coupling method using the clamp is used for tests on lines connected to signal and control ports. It may also be used on power ports only if the coupling/decoupling network defined in 6.3 cannot be used (see 7.3.2.1). Dimensions in millimetres All dimensions are ±5 %
1 000 70 140 High-voltage coaxial connector Coupling plates High-voltage coaxial connector 100
Insulating supports IEC
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Figure 6 – Example of a capacitive coupling clamp 6.4.2 Calibration of the capacitive coupling clamp Measurement equipment that is specified as suitable to perform the calibrations defined in 6.2.3 shall also be used for the calibration of the characteristics of the capacitive coupling clamp. A transducer plate (see Figure 7) shall be inserted into the coupling clamp and a connecting adapter with a low inductance bond to ground shall be used for connection to the measurement terminator/attenuator. A setup is given in Figure 8. SIST EN 61000-4-4:2013

61000-4-4 © IEC:2012 – 19 – Dimensions in millimetres
1 050 ± 5 Connected to adapter 120 ± 1 IEC
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Figure 7 – Transducer plate for coupling clamp calibration The transducer plate shall consist of a metallic sheet 120 mm × 1 050 mm of maximum 0,5 mm thickness, insulated on top and bottom by a dielectric sheet of 0,5 mm. Insulation of at least 2,5 kV on all sides shall be guaranteed in order to avoid the clamp contacting the transducer plate. At one end it is connected by a maximum of 30 mm long low impedance connection to the connecting adapter. The transducer plate shall be placed in the capacitive coupling clamp such that the end with the connection is aligned with the end of the lower coupling plate. The connecting adapter shall support a low impedance connection to ground reference plane for grounding of the 50 Ω coaxial measurement terminator/attenuator. The distance between the transducer plate and the 50 Ω measurement terminator/attenuator shall not exceed 0,1 m. NOTE The clearance between the upper coupling plate and transducer plate is not significant. The waveform shall be calibrated with a single 50 Ω termination. The clamp shall be calibrated with a generator, which has been shown to be compliant with the requirements of 6.2.2 and 6.2.3. The calibration is performed with the generator output voltage set to 2 kV.
< 0,1 m Connecting adapter
50 Ω terminator/attenuator Transducer plate Capacitive coupling clamp EFT/B generator To oscilloscope Ground reference plane IEC
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Figure 8 – Calibration of a capacitive coupling clamp using the transducer plate The generator is connected to the input of the coupling clamp. The peak voltage and waveform parameters are recorded at the transducer plate output located at the opposite end of the clamp. The waveform characteristics shall meet the following requirements: • rise time (5 ± 1,5) ns; • pulse width (50 ± 15) ns; • peak voltage (1 000 ± 200) V. SIST EN 61000-4-4:2013

– 20 – 61000-4-4 © IEC:2012 7 Test setup 7.1 General Different types of tests are defined based on test environments. These are: – type (conformance) tests performed in laboratories; – in situ tests performed on equipment in its final installed condition. The preferred test method is that of type tests performed in laboratories. The EUT shall be arranged in accordance with the manufacturer's instructions for installation (if any). 7.2 Test equipment 7.2.1 General The test setup includes the following equipment (see Figure 9): – ground reference plane; – coupling device (network or clamp); – decoupling network, if appropriate; – test generator.
Coupling/decoupling sections shall be mounted directly on the reference ground plane Bonding connectors shall be as short as possible Lines/terminals to be tested Insulating support EUT Grounding connection according to the manufacturer’s specification Length to be specified in the test plan Coupling device Decoupling network Ground reference plane Electrical fast transient/burst generaor Ground reference plane Lines IEC
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Figure 9 – Block diagram for electrical fast transient/burst
immunity test 7.2.2 Verification of the test instrumentation The purpose of verification is to ensure that the EFT/B test setup is operating correctly between calibrations. The EFT/B test setup includes: – EFT/B generator; – CDN; – capacitive coupling clamp; – interconnection cables. SIST EN 61000-4-4:2013

61000-4-4 © IEC:2012 – 21 – To verify that the system functions correctly, the following signals should be checked: – EFT/B signal present at the output terminal of the CDN; – EFT/B signal present at the capacitive coupling clamp. It is sufficient to verify that burst transients (see Figure 2) are present at any level by using suitable measuring equipment (e.g. oscilloscope) without an EUT connected to the system.
Test laboratories may define an internal control reference value assigned to this verification procedure. An example of the verification procedure of the capacitive coupling clamp is given in Figure 10.
50 Ω terminator/attenuator Capaciti
...