EN 61000-4-5:2006

Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test

Relates to the immunity requirements, test methods, and range of recommended test levels for equipment to unidirectional surges caused by overvoltages from switching and lightning transients. Several test levels are defined which relate to different environment and installation conditions. These requirements are developed for and are applicable to electrical and electronic equipment. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to surges. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. This standard defines: - a range of test levels; - test equipment; - test setups; - test procedures. The task of the described laboratory test is to find the reaction of the EUT under specified operational conditions, to surge voltages caused by switching and lightning effects at certain threat levels. It is not intended to test the capability of the EUT's insulation to withstand high-voltage stress. Direct injections of lightning currents, i.e, direct lightning strikes, are not considered in this standard. It has the status of a basic EMC publication in accordance with IEC Guide 107.

Elektromagnetische Verträglichkeit (EMV) - Teil 4-5: Prüf- und Messverfahren - Prüfung der Störfestigkeit gegen Stoßspannungen

Compatiblité électromagnétique (CEM) - Partie 4-5: Techniques d'essai et de mesure - Essai d'immunité aux ondes de choc

Se rapporte aux exigences d'immunité pour les matériels, aux méthodes d'essai et à la gamme des niveaux d'essai recommandés, vis-à-vis des ondes de choc unidirectionnelles provoquées par des surtensions dues aux transitoires de foudre et de man uvres. Elle définit plusieurs niveaux d'essai se rapportant à différentes conditions d'environnement et d'installation. Ces exigences sont développées pour les matériels électrique et électronique et leur sont applicables. Cette norme a pour objet d'établir une référence commune dans le but d'évaluer l'immunité des matériels électriques et électroniques, quand ils sont soumis à des ondes de choc. La méthode d'essai documentée dans cette partie de la CEI 61000 décrit une méthode logique en vue d'évaluer l'immunité d'un équipement ou d'un système vis-à-vis d'un phénomène donné. Cette norme définit: - une gamme de niveaux d'essai; - le matériel d'essai; - les montages d'essai; - les procédures d'essai. L'essai de laboratoire décrit ici a pour but de déterminer la réaction de l'EST, dans des conditions opérationnelles spécifiées, aux surtensions d'origine atmosphérique ou dues à des man uvres, pour certains niveaux de menace. Il n'est pas destiné à évaluer la capacité de l'isolation à supporter des tensions élevées. Les injections directes de courants de foudre, par exemple les coups de foudre directs, ne sont pas prises en compte par cette norme. Cette norme a le statut de publication fondamentale en CEM en accord avec le Guide 107 de la CEI.

Elektromagnetna združljivost (EMC) - 4-5. del: Preskusne in merilne tehnike - Preskus odpornosti proti napetostnemu udaru (IEC 61000-4-5:2005)

General Information

• Status: Withdrawn
• Publication Date: 14-Nov-2006
• Withdrawal Date: 30-Sep-2009
• ICS: 33.100.20 - Immunity
• Technical Committee: CLC/TC 210 - Electromagnetic Compatibility (EMC)
• Drafting Committee: IEC/SC 77B - IEC_SC_77B
• Parallel Committee: IEC/SC 77B - IEC_SC_77B
• Current Stage: 9960 - Withdrawal effective - Withdrawal
• Start Date: 19-Jun-2017
• Completion Date: 19-Jun-2017
• Directive: 2004/108/EC - Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2004/108/EU - DIRECTIVE 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2014/30/EU - Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)
• Directive: 89/336/EEC - Electromagnetic compatibility (EMC)
• Mandate: M/490 - Standardisation mandate to the European Standardisation Organisations (ESOs) to support European Smart Grid deployment
• Ref Project: SIST EN 61000-4-5:2007 - Electromagnetic compatibility (EMC) -- Part 4-5: Testing and measurement techniques - Surge immunity test

Relations

• Replaces: EN 61000-4-5:1995 - Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test
• Effective Date: 29-Jan-2023
• Replaces: EN 61000-4-5:1995/A1:2001 - Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test
• Effective Date: 29-Jan-2023
• Replaced By: EN 61000-4-5:2014 - Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test
• Effective Date: 28-Jan-2023

Standards Content (Sample)

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EUROPEAN STANDARD
EN 61000-4-5
NORME EUROPÉENNE
November 2006
EUROPÄISCHE NORM
ICS 33.100.20 Supersedes EN 61000-4-5:1995 + A1:2001

English version
Electromagnetic compatibility (EMC)
Part 4-5: Testing and measurement techniques -
Surge immunity test
(IEC 61000-4-5:2005)
Compatiblité électromagnétique (CEM)  Elektromagnetische Verträglichkeit
Partie 4-5: Techniques d'essai (EMV)
et de mesure - Teil 4-5: Prüf- und Messverfahren -
Essai d'immunité aux ondes de choc Prüfung der Störfestigkeit gegen
(CEI 61000-4-5:2005) Stoßspannungen
(IEC 61000-4-5:2005)
This European Standard was approved by CENELEC on 2006-10-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61000-4-5:2006 E
Foreword
The text of document 77B/467/FDIS, future edition 2 of IEC 61000-4-5, prepared by SC 77B, High
frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC
parallel vote and was approved by CENELEC as EN 61000-4-5 on 2006-10-01.
This European Standard supersedes EN 61000-4-5:1995 + A1:2001.
Particularly the clauses dedicated to coupling/decoupling networks and to test setups are more detailed.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2007-07-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2009-10-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61000-4-5:2005 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60664 NOTE  Harmonized as EN 60664 (series) (not modified).
IEC 61643 NOTE  Harmonized as EN 61643 (series) (not modified).
__________
- 3 - EN 61000-4-5:2006
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

1)
IEC 60050-161 - International Electrotechnical Vocabulary - -
(IEV)
Chapter 161: Electromagnetic compatibility

1) 2)
IEC 60060-1 - High-voltage test techniques HD 588.1 S1 1991
Part 1: General definitions and test
requirements
1)
IEC 60469-1 - Pulse techniques and apparatus - -
Part 1: Pulse terms and definitions

1)
Undated reference.
2)
Valid edition at date of issue.

INTERNATIONAL IEC
STANDARD 61000-4-5
Second edition
2005-11
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-5:
Testing and measurement techniques –
Surge immunity test
 IEC 2005 Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical,
including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: [phone] Telefax: [phone] E-mail: [e-mail] Web: www.iec.ch
PRICE CODE
X
Commission Electrotechnique Internationale
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
For price, see current catalogue

61000-4-5  IEC:2005 – 3 –
CONTENTS
FOREWORD.7
INTRODUCTION.11

1 Scope and object.13
2 Normative references .13
3 Terms and definitions .15
4 General .21
4.1 Power system switching transients .21
4.2 Lightning transients .21
4.3 Simulation of the transients .21
5 Test levels.23
6 Test instrumentation.23
6.1 1,2/50 µs combination wave generator .23
6.2 10/700 µs combination wave generator .31
6.3 Coupling/decoupling networks .37
7 Test setup .63
7.1 Test equipment .63
7.2 Test setup for tests applied to EUT power ports .63
7.3 Test setup for tests applied to unshielded unsymmetrical interconnection
lines .63
7.4 Test setup for tests applied to unshielded symmetrical interconnections
communication lines.65
7.5 Test setup for tests applied to high speed communications lines .65
7.6 Test setup for tests applied to shielded lines .65
7.7 Test setup to apply potential differences .71
7.8 EUT mode of operation .71
8 Test procedure .73
8.1 Laboratory reference conditions .73
8.2 Application of the surge in the laboratory.73
9 Evaluation of test results .75
10 Test report.77

Annex A (informative) Selection of generators and test levels .79
Annex B (informative) Explanatory notes .83
Annex C (informative) Considerations for achieving immunity for equipment
connected to low voltage power systems .91

Bibliography.95

Figure 1 – Simplified circuit diagram of the combination wave generator (1,2/50 µs –
8/20 µs) .25
Figure 2 – Waveform of open-circuit voltage (1,2/50 µs) at the output of the generator
with no CDN connected (waveform definition according to IEC 60060-1).29

61000-4-5  IEC:2005 – 5 –
Figure 3 – Waveform of short-circuit current (8/20 µs) at the output of the generator
with no CDN connected (waveform definition according to IEC 60060-1).29
Figure 4 – Simplified circuit diagram of the combination wave generator (10/700 µs –
5/320 µs) according to ITU K series standards.31
Figure 5 – Waveform of open-circuit voltage (10/700 µs) (waveform definition
according to IEC 60060-1) .33
Figure 6 – Waveform of the 5/320 µs short-circuit current waveform (definition
according to IEC 60060-1) .35
Figure 7 – Example of test setup for capacitive coupling on a.c./d.c. lines; line-to-line
coupling (according to 7.2).37
Figure 8 – Example of test setup for capacitive coupling on a.c./d.c. lines; line-to-
ground coupling (according to 7.2).39
Figure 9 – Example of test setup for capacitive coupling on a.c. lines (3 phases); line
L3 to line L1 coupling (according to 7.2) .41
Figure 10 – Example of test setup for capacitive coupling on a.c. lines (3 phases); line
L3 to ground coupling (according to 7.2) .43
Figure 11 – Example of test set up for unshielded unsymmetrical interconnection lines;
line-to-line and line-to-ground coupling (according to 7.3), coupling via capacitors .45
Figure 12 – Example of test setup for unshielded unsymmetrical interconnection lines;
line-to-line and line-to-ground coupling (according to 7.3), coupling via arrestors.47
Figure 13 – Example of test setup for unshielded unsymmetrical interconnection lines;
line-to-line and line-to-ground coupling (according to 7.3), coupling via a clamping
circuit.49
Figure 14 – Example of test setup for unshielded symmetrical interconnection lines
(communication lines); lines-to-ground coupling (according to 7.4), coupling via
arrestors .51
Figure 15 – Example of a coupling/decoupling network for symmetrical high speed
communication lines using the 1,2/50 µs surge .53
Figure 16 – Example of test setup for tests applied to shielded lines (according to 7.6)
and to apply potential differences (according to 7.7) .67
Figure 17 – Example of test setup for tests applied to shielded lines grounded only at
one end (according to 7.6) and to apply potential differences (according to 7.7) .69
Figure 18 – Coupling method and test setup for tests applied to shielded lines and to
apply potential differences, especially in configurations with multiple shielded cable
wiring.71

Table 1 – Test levels.23
Table 2 – Definitions of the waveform parameters 1,2/50 µs – 8/20 µs.27
Table 3 – Relationship between peak open-circuit voltage and peak short-circuit
current .27
Table 4 – Definitions of the waveform parameters 10/700 µs – 5/320 µs .35
Table 5 – Relationship between peak open-circuit voltage and peak short-circuit current.35
Table 6 – Voltage waveform specification at the EUT port of the coupling/decoupling
network.
...