EN 62007-2:2009

Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods

IEC 62007-2:2009 describes the measuring methods applicable to the semiconductor optoelectronic devices to be used in the field of fibre optic digital communication systems and subsystems. This edition includes the following significant technical changes with respect to the previous edition: - descriptions related to analogue characteristics have been removed; - some definitions and terms have been revised for harmonisation with other standards originating from SC 86C.

Optoelektronische Halbleiterbauelemente für Anwendungen in Lichtwellenleitersystemen - Teil 2: Messverfahren

Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes à fibres optiques - Partie 2: Méthodes de mesure

La CEI 62007-2:2009 décrit les méthodes de mesure applicables aux dispositifs optoélectroniques à semi-conducteurs utilisés dans le domaine des systèmes et sous-systèmes de télécommunication numérique à fibres optiques. La présente édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: - les descriptions relatives aux caractéristiques analogiques ont été retirées; - certains termes et définitions ont été revus afin de les harmoniser avec ceux des autres normes émises par le SC 86C.

Polprevodniške optoelektronske naprave za uporabo v sistemih z optičnimi vlakni - 2. del: Merilne metode (IEC 62007-2:2009)

General Information

• Status: Published
• Publication Date: 12-Mar-2009
• Withdrawal Date: 31-Jan-2012
• ICS: 31.080.01 - Semiconductor devices in general
• ICS: 31.260 - Optoelectronics. Laser equipment
• ICS: 33.180.01 - Fibre optic systems in general
• Technical Committee: CLC/SR 86C - Fibre optic systems and active devices
• Drafting Committee: IEC/SC 86C - IEC_SC_86C
• Parallel Committee: IEC/SC 86C - IEC_SC_86C
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 13-Mar-2009
• Completion Date: 13-Mar-2009
• Ref Project: SIST EN 62007-2:2009 - Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods (IEC 62007-2:2009)

Relations

• Replaces: EN 62007-2:2000 - Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
• Effective Date: 28-Jan-2023
• Revised: prEN IEC 62007-2:2024 - Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
• Effective Date: 18-Jul-2023

Standards Content (Sample)

SLOVENSKI STANDARD
01-maj-2009
1DGRPHãþD
SIST EN 62007-2:2002
3ROSUHYRGQLãNHRSWRHOHNWURQVNHQDSUDYH]DXSRUDERYVLVWHPLK]RSWLþQLPLYODNQL
GHO0HULOQHPHWRGH,(&
Semiconductor optoelectronic devices for fibre optic system applications - Part 2:
Measuring methods (IEC 62007-2:2009)
Optoelektronische Halbleiterbauelemente für Anwendungen in Lichtwellenleitersystemen
- Teil 2: Messverfahren (IEC 62007-2:2009)
Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes à
fibres optiques - Partie 2: Méthodes de mesure (CEI 62007-2:2009)
Ta slovenski standard je istoveten z: EN 62007-2:2009
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
33.180.01 6LVWHPL]RSWLþQLPLYODNQLQD Fibre optic systems in
VSORãQR general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 62007-2
NORME EUROPÉENNE
March 2009
EUROPÄISCHE NORM
ICS 31.080.01; 31.260; 33.180.01 Supersedes EN 62007-2:2000

English version
Semiconductor optoelectronic devices
for fibre optic system applications -
Part 2: Measuring methods
(IEC 62007-2:2009)
Dispositifs optoélectroniques  Optoelektronische Halbleiterbauelemente
à semiconducteurs pour application für Anwendungen
dans les systèmes à fibres optiques - in Lichtwellenleitersystemen -
Partie 2: Méthodes de mesure Teil 2: Messverfahren
(CEI 62007-2:2009) (IEC 62007-2:2009)

This European Standard was approved by CENELEC on 2009-02-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: avenue Marnix 17, B - 1000 Brussels

© 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62007-2:2009 E
Foreword
The text of document 86C/868/FDIS, future edition 2 of IEC 62007-2, prepared by SC 86C, Fibre optic
systems and active devices, of IEC TC 86, Fibre optics, was submitted to the IEC-CENELEC parallel vote
and was approved by CENELEC as EN 62007-2 on 2009-02-01.
This European Standard supersedes EN 62007-2:2000.
– descriptions related to analogue characteristics have been removed;
– some definitions and terms have been revised for harmonisation with other standards originating from
SC 86C.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2009-11-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2012-02-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 62007-2:2009 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 61300 NOTE  Harmonized in EN 61300 series (not modified).
IEC 61315 NOTE  Harmonized as EN 61315:2006 (not modified).
ISO 1101 NOTE  Harmonized as EN ISO 1101:2005 (not modified).
__________
- 3 - EN 62007-2:2009
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

IEC 60050-731 1991 International Electrotechnical Vocabulary - -
(IEV) -
Chapter 731: Optical fibre communication

IEC 60793 (mod) Series Optical fibres EN 60793 Series

IEC 60794 Series Optical fibre cables EN 60794 Series

IEC 60874 Series Connectors for optical fibres and cables EN 60874 Series

IEC 62007-2
Edition 2.0 2009-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor optoelectronic devices for fibre optic system applications –
Part 2: Measuring methods
Dispositifs optoélectroniques à semiconducteurs pour application dans les
systèmes à fibres optiques –
Partie 2: Méthodes de mesure
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
W
CODE PRIX
ICS 31.080.01; 31.260; 33.180.01 ISBN 2-8318-1023-6
– 2 – 62007-2 © IEC:2009
CONTENTS
FOREWORD.0H4
INTRODUCTION.1H6
1 Scope.2H7
2 Normative references .3H7
3 Terms, definitions and abbreviations .4H7
3.1 Terms and definitions .5H7
3.2 Abbreviations .6H8
4 Measuring methods for photoemitters .7H8
4.1 Outline of the measuring methods .8H8
4.2 Radiant power or forward current of LEDs and LDs with or without optical
fibre pigtails .9H8
4.3 Small signal cut-off frequency (f ) of LEDs and LDs with or without optical
c
fibre pigtails .10H9
4.4 Threshold current of LDs with or without optical fibre pigtails .11H10
4.5 Relative intensity noise of LEDs and LDs with or without optical fibre pigtails.12H12
4.6 S parameter of LEDs, LDs and LD modules with or without optical fibre
pigtails .13H13
4.7 Tracking error for LD modules with optical fibre pigtails, with or without
cooler.14H15
4.8 Spectral linewidth of LDs with or without optical fibre pigtails .15H17
4.9 Modulation current at 1 dB efficacy compression (I ) of LEDs .16H18
F (1 dB)
4.10 Differential efficiency (η ) of a LD with or without pigtail and an LD module .17H20
d
4.11 Differential (forward) resistance r of an LD with or without pigtail .18H22
d
5 Measuring methods for receivers.19H23
5.1 Outline of the measuring methods .20H23
5.2 Noise of a PIN photodiode.21H23
5.3 Excess noise factor of an APD with or without optical fibre pigtails.22H25
5.4 Small-signal cut-off frequency of a photodiode with or without optical fibre
pigtails .23H27
5.5 Multiplication factor of an APD with or without optical fibre pigtails .24H28
5.6 Responsivity of a PIN-TIA module .25H30
5.7 Frequency response flatness (ΔS/S) of a PIN-TIA module .26H32
5.8 Output noise power (spectral) density P of a PIN-TIA module.27H33
λ
no,
5.9 Low frequency output noise power (spectral) density (P ) and corner
,λ,
no LF
frequency (f ) of a PIN-TIA module .28H35
cor
5.10 Minimum detectable power of PIN-TIA module .29H36
Bibliography.30H38

Figure 1 – Equipment setup for measuring radiant power and forward current of LEDs
and LDs .31H8
Figure 2 – Circuit diagram for measuring small-signal cut-off frequency LEDs and LDs .32H10
Figure 3 – Circuit diagram for measuring threshold current of a LD.33H11
Figure 4 – Graph to determine threshold current of lasers.34H11
Figure 5 – Circuit diagram for measuring RIN of LEDs and LDs .35H12
Figure 6 – Circuit diagram for measuring the S parameter LEDs, LDs and LD
modules.36H14

62007-2 © IEC:2009 – 3 –
Figure 7– Cathode and anode connected to the package of a LD.37H15
Figure 8 – Output radiant power versus time.38H16
Figure 9 – Output radiant power versus case temperature .39H16
Figure 10 – Circuit diagram for measuring linewidth of LDs.40H17
Figure 11 – Circuit diagram for measuring 1 dB efficacy compression of LDs.41H19
Figure 12 – Plot of log V versus log I .42H20
2 1
Figure 13 – Circuit diagram for measuring differential efficiency of a LD .43H21
Figure 14 – Current waveform for differential efficiency measurement .44H21
Figure 15 – Circuit diagram for measuring differential resistance .45H22
Figure 16 – Current waveform for differential resistance .46H23
Figure 17 – Circuit diagram for measuring noise of a PIN photoreceiver .47H24
Figure 18 – Circuit diagram for measuring noise with synchronous detection .48H25
Figure 19 – Circuit diagram for measuring excess noise of an APD.49H26
Figure 20 – Circuit diagram for measuring small-signal cut-off wavelength of a
photodiode.50H28
Figure 21 – Circuit diagram for measuring multiplication factor of an APD .51H29
Figure 22 – Graph showing measurement of I and I .52H30

R1 R2
Figure 23 – Circuit diagram for measuring responsivity of a PIN-TIA module .53H31
Figure 24 – Circuit diagram for measuring frequency response flatness of a PIN-TIA
module.54H32
Figure 25 – Circuit diagram for measuring output noise power (spectral) density of a
PIN-TIA module under matched output conditions.55H34
Figure 26 – Circuit diagram for measuring output noise power (spectral) density of a
non-irradiated PIN-TIA module in the low frequency region.56H35
Figure 27 – Graph of V versus frequency.57H36
m
Figure 28 – Circuit diagram for measuring minimum detectable power of a PIN-TIA
module at a specified bit-error rate (BER) or carrier-to-noise ratio (C/N) .58H37

– 4 – 62007-2 © IEC:2009
I
...