Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing 'no trouble found' (NTF) and 'electrical overstress' (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include: - a number of minor technical changes; - the addition of two new annexes covering the testing of special pins and temperature calculations.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung

Dispositifs à semiconducteurs - Méthodes d'essai mécaniques et climatiques - Partie 29: Essai de verrouillage

La CEI 60749-29:2011 couvre l'essai I et l'essai de verrouillage de surtension des circuits intégrés. L'objet de cet essai est d'établir une méthode pour déterminer les caractéristiques de verrouillage des circuits intégrés (CI) et pour définir les critères de défaillance de verrouillage. Les caractéristiques de verrouillage sont utilisées pour la détermination de la fiabilité de produit et la minimisation des défaillances en rapport avec 'l'absence d'observation de problèmes' (NTF, No Trouble Found) et la 'contrainte électrique excessive' (EOS, Electrical Overstress) dues au verrouillage. Cette deuxième édition annule et remplace la première édition publiée en 2003 et constitue une révision technique. Les modifications importantes apportées par rapport à l'édition antérieure concernent: - un certain nombre de modifications techniques mineures; - l'addition de deux nouvelles annexes traitant de l'essai des broches spéciales et des calculs de température.

Polprevodniški elementi - Mehanske in klimatske preskusne metode - 29. del: Preskus zapore

Ta del IEC 60749 zajema preskus I in prenapetostni preskus zapore integriranih vezij Ta preskus je klasificiran kot porušitveni. Namen tega preskusa je vzpostaviti metodo za določanje zapornih značilnosti integriranega vezja (IC) in opredeliti merila za neuspešnost zapore. Zaporne značilnosti se uporabljajo pri ugotavljanju zanesljivosti proizvoda in zmanjševanju napak zaradi zapore »Ne najdem težave« (NTF) in »Električna prenapetost« (EOS). Ta preskusna metoda se uporablja predvsem za elemente CMOS. Uporabnost za druge tehnologije je treba ugotoviti. Klasifikacija zapore kot funkcije temperature je opredeljena v 3.1, merila za stopnjo neuspešnosti pa v 3.2.

General Information

Status
Published
Publication Date
18-Aug-2011
Withdrawal Date
11-May-2014
Drafting Committee
Parallel Committee
Current Stage
6060 - Document made available - Publishing
Start Date
19-Aug-2011
Completion Date
19-Aug-2011

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SLOVENSKI STANDARD
SIST EN 60749-29:2011
01-oktober-2011
Polprevodniški elementi - Mehanske in klimatske preskusne metode - 29. del:
Preskus zapore
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie
29: Essai de verrouillage
Ta slovenski standard je istoveten z: EN 60749-29:2011
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
SIST EN 60749-29:2011 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 60749-29:2011

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SIST EN 60749-29:2011

EUROPEAN STANDARD
EN 60749-29

NORME EUROPÉENNE
August 2011
EUROPÄISCHE NORM

ICS 31.080.01 Supersedes EN 60749-29:2003 + corr. Mar.2004


English version


Semiconductor devices -
Mechanical and climatic test methods -
Part 29: Latch-up test
(IEC 60749-29:2011)


Dispositifs à semiconducteurs -  Halbleiterbauelemente -
Méthodes d'essai mécaniques et Mechanische und klimatische
climatiques - Prüfverfahren -
Partie 29: Essai de verrouillage Teil 29: Latch-up-Prüfung
(CEI 60749-29:2011) (IEC 60749-29:2011)





This European Standard was approved by CENELEC on 2011-05-12. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

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the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels


© 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60749-29:2011 E

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SIST EN 60749-29:2011
EN 60749-29:2011 - 2 -
Foreword
The text of document 47/2083/FDIS, future edition 2 of IEC 60749-29, prepared by IEC TC 47,
Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60749-29 on 2011-05-12.
This European Standard supersedes EN 60749-29:2003 + corrigendum March 2004.
The significant changes with respect to EN 60749-29:2003 include:
– a number of minor technical changes;
– the addition of two new annexes covering the testing of special pins and temperature calculations.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2012-02-12
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2014-05-12
with the EN have to be withdrawn
__________
Endorsement notice
The text of the International Standard IEC 60749-29:2011 was approved by CENELEC as a European
Standard without any modification.
__________

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SIST EN 60749-29:2011
IEC 60749-29
®

Edition 2.0 2011-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE


Semiconductor devices – Mechanical and climatic test methods –
Part 29: Latch-up test

Dispositifs à semiconducteurs – Méthodes d'essai mécaniques et climatiques –
Partie 29: Essai de verrouillage


INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX T
ICS 31.080.01 ISBN 978-2-88912-434-3

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN 60749-29:2011
– 2 – 60749-29  IEC:2011
CONTENTS
FOREWORD .
...

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