Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase

IEC 61000-4-11:2020 is available as IEC 61000-4-11:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61000-4-11:2020 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This document applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase, for connection to 50 Hz or 60 Hz AC networks. It does not apply to electrical and electronic equipment for connection to 400 Hz AC networks. Tests for these networks will be covered by future IEC documents. The object of this document is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations. NOTE 1 Voltage fluctuation immunity tests are covered by IEC 61000-4-14. The test method documented in this document describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon. NOTE 2 As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and, if applied, they are responsible for defining the appropriate test levels. Technical committee 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products. This third edition cancels and replaces the second edition published in 2004 and Amendment 1:2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: - rise time and fall time of transients are now defined terms in Clause 3; - the origin of voltage dips and short interruptions is now stated in Clause 4. Keywords: immunity test methods, low-voltage power supply networks

Elektromagnetische Verträglichkeit (EMV) - Teil 4-11: Prüf- und Messverfahren - Prüfungen der Störfestigkeit gegen Spannungseinbrüche, Kurzzeitunterbrechungen und Spannungsschwankungen für Geräte mit einem Eingangsstrom bis zu und einschließlich 16 A je Leiter

Compatibilité électromagnétique (CEM) - Partie 4-11: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et variations de tension pour les appareils à courant d’entrée inférieur ou égal à 16 A par phase

IEC 61000-4-11:2020 est disponible sous forme de IEC 61000-4-11:2020 RLV qui contient la Norme internationale et sa version Redline, illustrant les modifications du contenu technique depuis l'édition précédente.L'IEC 61000-4-11:2020 définit les méthodes d'essai d'immunité ainsi que la plage des niveaux d'essais préférentiels pour les matériels électriques et électroniques connectés à des réseaux d'alimentation à basse tension pour les creux de tension, les coupures brèves et les variations de tension. Le présent document s’applique aux matériels électriques et électroniques dont le courant assigné d’entrée ne dépasse pas 16 A par phase et destinés à être reliés à des réseaux électriques à courant alternatif de 50 Hz ou 60 Hz. Il ne s'applique pas aux matériels électriques et électroniques destinés à être reliés à des réseaux électriques à courant alternatif de 400 Hz. Les essais pour ces réseaux seront traités dans des documents IEC à venir. Le but du présent document est d'établir une référence commune pour l'évaluation de l'immunité des matériels électriques et électroniques soumis à des creux de tension, à des coupures brèves et à des variations de tension. NOTE 1 Les essais d’immunité aux fluctuations de tension sont traités dans l’IEC 61000-4-14. La méthode d’essai décrite dans le présent document détaille une méthode sans faille pour évaluer l’immunité d’un matériel ou d’un système à un phénomène prédéfini. NOTE 2 Comme cela est décrit dans le Guide 107 de l’IEC, ce document est une publication fondamentale en CEM destinée à l’usage des comités de produits de l’IEC. Comme cela est également mentionné dans le Guide 107, les comités de produits de l’IEC sont chargés de décider s’il convient d’utiliser ou non cette norme d’essai d’immunité et, si elle est utilisée, les comités sont responsables de la définition des niveaux d’essai appropriés. Le comité d’études 77 et ses sous-comités sont prêts à coopérer avec les comités de produits pour l’évaluation de la pertinence des essais particuliers d’immunité pour leurs produits. Cette troisième édition annule et remplace la deuxième édition parue en 2004 et l'Amendement 1:2017. Cette édition constitue une révision technique. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: - le temps de montée et le temps de descente sont désormais des termes définis à l’Article 3; - l’origine des creux de tension et des coupures brèves est désormais décrite à l’Article 4. Mots-clés : méthodes d'essai d'immunité, réseaux d'alimentation à basse tension

Elektromagnetna združljivost (EMC) - 4-11. del: Preskusne in merilne tehnike - Preskusi odpornosti proti upadom napetosti, kratkotrajnim prekinitvam in napetostnim kolebanjem za opremo z vhodnim tokom do 16 A na fazo

General Information

Status
Published
Publication Date
26-Mar-2020
Current Stage
6060 - Document made available
Due Date
27-Mar-2020
Completion Date
27-Mar-2020

RELATIONS

Buy Standard

Standard
EN IEC 61000-4-11:2020 - BARVE na PDF-str 18,19
English language
33 pages
sale 10% off
Preview
sale 10% off
Preview

e-Library read for
1 day

Standards Content (sample)

SLOVENSKI STANDARD
SIST EN IEC 61000-4-11:2020
01-maj-2020
Nadomešča:
SIST EN 61000-4-11:2005
SIST EN 61000-4-11:2005/A1:2017
Elektromagnetna združljivost (EMC) - 4-11. del: Preskusne in merilne tehnike -
Preskusi odpornosti proti upadom napetosti, kratkotrajnim prekinitvam in
napetostnim kolebanjem za opremo z vhodnim tokom do 16 A na fazo

Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques -

Voltage dips, short interruptions and voltage variations immunity tests for equipment with

input current up to 16 A per phase

Compatibilité électromagnétique (CEM) - Partie 4-11: Techniques d'essai et de mesure -

Essais d'immunité aux creux de tension, coupures brèves et variations de tension pour

les appareils à courant d’entrée inférieur ou égal à 16 A par phase
Ta slovenski standard je istoveten z: EN IEC 61000-4-11:2020
ICS:
33.100.20 Imunost Immunity
SIST EN IEC 61000-4-11:2020 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------
SIST EN IEC 61000-4-11:2020
---------------------- Page: 2 ----------------------
SIST EN IEC 61000-4-11:2020
EUROPEAN STANDARD EN IEC 61000-4-11
NORME EUROPÉENNE
EUROPÄISCHE NORM
March 2020
ICS 33.100.20 Supersedes EN 61000-4-11:2004 and all of its
amendments and corrigenda (if any)
English Version
Electromagnetic compatibility (EMC) - Part 4-11: Testing and
measurement techniques - Voltage dips, short interruptions and
voltage variations immunity tests for equipment with input current
up to 16 A per phase
(IEC 61000-4-11:2020)

Compatibilité électromagnétique (CEM) - Partie 4-11: Elektromagnetische Verträglichkeit (EMV) - Teil 4-11: Prüf-

Techniques d'essai et de mesure - Essais d'immunité aux und Messverfahren - Prüfungen der Störfestigkeit gegen

creux de tension, coupures brèves et variations de tension Spannungseinbrüche, Kurzzeitunterbrechungen und

pour les appareils à courant d'entrée inférieur ou égal à 16 Spannungsschwankungen für Geräte mit einem

A par phase Eingangsstrom bis zu und einschließlich 16 A je Leiter
(IEC 61000-4-11:2020) (IEC 61000-4-11:2020)

This European Standard was approved by CENELEC on 2020-03-03. CENELEC members are bound to comply with the CEN/CENELEC

Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC

Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation

under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the

same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,

Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the

Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,

Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels

© 2020 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Ref. No. EN IEC 61000-4-11:2020 E
---------------------- Page: 3 ----------------------
SIST EN IEC 61000-4-11:2020
EN IEC 61000-4-11:2020 (E)
European foreword

The text of document 77A/1039/FDIS, future edition 3 of IEC 61000-4-11, prepared by SC 77A "EMC -

Low frequency phenomena" of IEC/TC 77 "Electromagnetic compatibility" was submitted to the IEC-

CENELEC parallel vote and approved by CENELEC as EN IEC 61000-4-11:2020.
The following dates are fixed:

• latest date by which the document has to be implemented at national (dop) 2020-12-03

level by publication of an identical national standard or by endorsement

• latest date by which the national standards conflicting with the (dow) 2023-03-03

document have to be withdrawn

This document supersedes EN 61000-4-11:2004 and all of its amendments and corrigenda (if any).

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

This document has been prepared under a mandate given to CENELEC by the European Commission

and the European Free Trade Association.
Endorsement notice

The text of the International Standard IEC 61000-4-11:2020 was approved by CENELEC as a

European Standard without any modification.

In the official version, for Bibliography, the following notes have to be added for the standards

indicated:
IEC 61000-2 (series) NOTE Harmonized as EN 61000-2 (series)
IEC 61000-2-4 NOTE Harmonized as EN 61000-2-4
IEC 61000-4-11:2004 NOTE Harmonized as EN 61000-4-11:2004 (not modified)
IEC 61000-4-14 NOTE Harmonized as EN 61000-4-14
---------------------- Page: 4 ----------------------
SIST EN IEC 61000-4-11:2020
EN IEC 61000-4-11:2020 (E)
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any amendments)

applies.

NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the relevant

EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:

www.cenelec.eu.
Publication Year Title EN/HD Year
IEC TR 61000-2-8 - Electromagnetic compatibility (EMC) − Part 2-8: - -
Environment – Voltage dips and short interruptions
on public electric power supply systems with
statistical measurement results
---------------------- Page: 5 ----------------------
SIST EN IEC 61000-4-11:2020
---------------------- Page: 6 ----------------------
SIST EN IEC 61000-4-11:2020
IEC 61000-4-11
Edition 3.0 2020-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-11: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests for equipment with input
current up to 16 A per phase
Compatibilité électromagnétique (CEM) –
Partie 4-11: Techniques d'essai et de mesure – Essais d'immunité aux creux
de tension, coupures brèves et variations de tension pour les appareils
à courant d’entrée inférieur ou égal à 16 A par phase
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.20 ISBN 978-2-8322-7546-7

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 7 ----------------------
SIST EN IEC 61000-4-11:2020
– 2 – IEC 61000-4-11:2020 © IEC 2020
CONTENTS

FOREWORD ........................................................................................................................... 4

INTRODUCTION ..................................................................................................................... 6

1 Scope .............................................................................................................................. 7

2 Normative references ...................................................................................................... 7

3 Terms and definitions ...................................................................................................... 7

4 General ........................................................................................................................... 9

5 Test levels ....................................................................................................................... 9

5.1 General ................................................................................................................... 9

5.2 Voltage dips and short interruptions ........................................................................ 9

5.3 Voltage variations ................................................................................................. 11

6 Test instrumentation ...................................................................................................... 14

6.1 Test generator ...................................................................................................... 14

6.1.1 General........................................................................................................ 14

6.1.2 Characteristics and performance of the generator ........................................ 15

6.1.3 Verification of the characteristics of the voltage dips, short

interruptions generators ................................................................................. 15

6.2 Power source ........................................................................................................ 16

7 Test set-up .................................................................................................................... 16

8 Test procedures ............................................................................................................ 17

8.1 General ................................................................................................................. 17

8.2 Laboratory reference conditions ............................................................................ 17

8.2.1 Climatic conditions ....................................................................................... 17

8.2.2 Electromagnetic conditions .......................................................................... 18

8.3 Execution of the test ............................................................................................. 18

8.3.1 General........................................................................................................ 18

8.3.2 Voltage dips and short interruptions ............................................................. 18

8.3.3 Voltage variations ........................................................................................ 19

9 Evaluation of test results ............................................................................................... 19

10 Test report ..................................................................................................................... 20

Annex A (normative) Test circuit details ............................................................................... 21

A.1 Test generator peak inrush current drive capability ............................................... 21

A.2 Current monitor's characteristics for measuring peak inrush current

capability .............................................................................................................. 21

A.3 EUT peak inrush current requirement .................................................................... 21

Annex B (informative) Electromagnetic environment classes ................................................ 23

Annex C (informative) Test instrumentation.......................................................................... 24

Annex D (informative) Rationale for generator specification regarding voltage, rise-

time and fall-time, and inrush current capability .................................................................... 27

D.1 Concept of basic standard .................................................................................... 27

D.2 IEC 61000-4-11:1994 (first edition) ....................................................................... 27

D.3 Rationale for the need of rapid fall-times ............................................................... 27

D.4 Interpretation of the rise-time and fall-time requirements during EUT testing ......... 28

D.5 Main conclusions .................................................................................................. 28

D.6 Rationale for inrush current capability ................................................................... 28

Bibliography .......................................................................................................................... 30

---------------------- Page: 8 ----------------------
SIST EN IEC 61000-4-11:2020
IEC 61000-4-11:2020 © IEC 2020 – 3 –

Figure 1 – Voltage dip – Examples ........................................................................................ 12

Figure 2 – Short interruption ................................................................................................. 13

Figure 3 – Detailed view of rise and fall time ......................................................................... 13

Figure 4 – Voltage variation .................................................................................................. 14

Figure 5 – Phase-to-neutral and phase-to-phase testing on three-phase systems ................. 19

Figure A.1 – Circuit for determining the inrush current drive capability of the short

interruptions generator .......................................................................................................... 22

Figure A.2 – Circuit for determining the peak inrush current requirement of an EUT .............. 22

Figure C.1 – Schematics of test instrumentation for voltage dips, short interruptions

and voltage variations ........................................................................................................... 25

Figure C.2 – Schematic of test instrumentation for three-phase voltage dips, short

interruptions and voltage variations using a power amplifier .................................................. 26

Table 1 – Preferred test levels and durations for voltage dips ............................................... 10

Table 2 – Preferred test levels and durations for short interruptions ...................................... 11

Table 3 – Timing of short-term supply voltage variations ....................................................... 11

Table 4 – Generator specifications ........................................................................................ 15

---------------------- Page: 9 ----------------------
SIST EN IEC 61000-4-11:2020
– 4 – IEC 61000-4-11:2020 © IEC 2020
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-11: Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations immunity
tests for equipment with input current up to 16 A per phase
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC

Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested

in the subject dealt with may participate in this preparatory work. International, governmental and non-

governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely

with the International Organization for Standardization (ISO) in accordance with conditions determined by

agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence

between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in

the latter.

5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any

services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC

Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 61000-4-11 has been prepared by subcommittee 77A: EMC – Low

frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.

It forms Part 4-11 of IEC 61000. It has the status of a basic EMC publication in accordance

with IEC Guide 107.
This third edition cancels and replaces the second edition published in 2004 and
Amendment 1:2017. This edition constitutes a technical revision.

This edition includes the following significant technical changes with respect to the previous

edition:
a) rise time and fall time of transients are now defined terms in Clause 3;
b) the origin of voltage dips and short interruptions is now stated in Clause 4.
---------------------- Page: 10 ----------------------
SIST EN IEC 61000-4-11:2020
IEC 61000-4-11:2020 © IEC 2020 – 5 –
The text of this International Standard is based on the following documents:
FDIS Report on voting
77A/1039/FDIS 77A/1056/RVD

Full information on the voting for the approval of this International Standard can be found in

the report on voting indicated in the above table.

This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts in the IEC 61000 series, published under the general title Electromagnetic

compatibility (EMC), can be found on the IEC website.

The committee has decided that the contents of this document will remain unchanged until the

stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to

the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates

that it contains colours which are considered to be useful for the correct

understanding of its contents. Users should therefore print this document using a

colour printer.
---------------------- Page: 11 ----------------------
SIST EN IEC 61000-4-11:2020
– 6 – IEC 61000-4-11:2020 © IEC 2020
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits

Immunity limits (in so far as they do not fall under the responsibility of the product

committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous

Each part is further subdivided into several parts, published either as International Standards

or as technical specifications or technical reports, some of which have already been published

as sections. Others will be published with the part number followed by a dash and a second

number identifying the subdivision (example: IEC 61000-6-1).
---------------------- Page: 12 ----------------------
SIST EN IEC 61000-4-11:2020
IEC 61000-4-11:2020 © IEC 2020 – 7 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-11: Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations immunity
tests for equipment with input current up to 16 A per phase
1 Scope

This part of IEC 61000 defines the immunity test methods and range of preferred test levels

for electrical and electronic equipment connected to low-voltage power supply networks for

voltage dips, short interruptions, and voltage variations.

This document applies to electrical and electronic equipment having a rated input current not

exceeding 16 A per phase, for connection to 50 Hz or 60 Hz AC networks.

It does not apply to electrical and electronic equipment for connection to 400 Hz AC networks.

Tests for these networks will be covered by future IEC documents.

The object of this document is to establish a common reference for evaluating the immunity of

electrical and electronic equipment when subjected to voltage dips, short interruptions and

voltage variations.
NOTE 1 Voltage fluctuation immunity tests are covered by IEC 61000-4-14.

The test method documented in this document describes a consistent method to assess the

immunity of equipment or a system against a defined phenomenon.

NOTE 2 As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the

IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this

immunity test standard should be applied or not, and, if applied, they are responsible for defining the appropriate

test levels. Technical committee 77 and its sub-committees are prepared to co-operate with product committees in

the evaluation of the value of particular immunity tests for their products.
2 Normative references

The following documents are referred to in the text in such a way that some or all of their

content constitutes requirements of this document. For dated references, only the edition

cited applies. For undated references, the latest edition of the referenced document (including

any amendments) applies.

IEC TR 61000-2-8, Electromagnetic compatibility (EMC) − Part 2-8: Environment − Voltage

dips and short interruptions on public electric power supply systems with statistical

measurement results
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.

ISO and IEC maintain terminological databases for use in standardization at the following

addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
---------------------- Page: 13 ----------------------
SIST EN IEC 61000-4-11:2020
– 8 – IEC 61000-4-11:2020 © IEC 2020
3.1
immunity (to a disturbance)

ability of a device, equipment or system to perform without degradation in the presence of an

electromagnetic disturbance
[SOURCE: IEC 60050-161:1990, 161-01-20]
3.2
voltage dip

sudden reduction of the voltage at a particular point of an electricity supply system below a

specified dip threshold followed by its recovery after a brief interval

Note 1 to entry: Typically, a dip is associated with the occurrence and termination of a short circuit or other

extreme current increase on the system or installations connected to it.

Note 2 to entry: A voltage dip is a two-dimensional electromagnetic disturbance, the level of which is determined

by both voltage and time (duration).
3.3
short interruption

sudden reduction of the voltage on all phases at a particular point of an electric supply system

below a specified interruption threshold followed by its restoration after a brief interval

Note 1 to entry: Short interruptions are typically associated with switchgear operations related to the occurrence

and termination of short circuits on the system or on installations connected to it.

3.4
residual voltage

minimum value of RMS voltage recorded during a voltage dip or short

interruption

Note 1 to entry: The residual voltage can be expressed as a value in volts or as a percentage or per unit value

relative to the reference voltage.
3.5
malfunction

breakdown of the ability of equipment to carry out intended functions or the execution of

unintended functions by the equipment
3.6
calibration

method to prove that the measurement equipment is in compliance with its specifications

Note 1 to entry: For the purposes of this document, calibration is applied to the test generator.

3.7
verification

set of operations which are used to check the test equipment system (e.g. the test generator

and the interconnecting cables) to demonstrate that the test system is functioning within the

specifications given in Clause 6

Note 1 to entry: The methods used for verification can be different from those used for calibration.

Note 2 to entry: The verification procedure of 6.1.3 is meant as a guide to ensure the correct operation of the test

generator and other items making up the test set-up so that the intended waveform is delivered to the EUT.

3.8
rise time

interval of time between the instants at which the instantaneous value of a transition first

reaches a specified lower value and then a specified upper value

Note 1 to entry: The lower and upper values are fixed at 10 % and 90 % of the transition magnitude.

---------------------- Page: 14 ----------------------
SIST EN IEC 61000-4-11:2020
IEC 61000-4-11:2020 © IEC 2020 – 9 –
[SOURCE: IEC 60050-161:1990, 161-02-05]
3.9
fall time

interval of time between the instants at which the instantaneous value of a transition first

reaches a specified upper value and then a specified lower value

Note 1 to entry: The lower and upper values are fixed at 10 % and 90 % of the transition magnitude.

Note 2 to entry: This definition is derived from IEC 60050-161:1990, 161-02-05.
4 General

Electrical and electronic equipment can be affected by voltage dips, short interruptions or

voltage variations of the power supply.

Voltage dips and short interruptions occur due to faults in a (public or non-public) network or

in installations by sudden changes of large loads. In certain cases, two or more consecutive

dips or interruptions can occur. Voltage variations are caused by continuously varying loads

connected to the network.

These phenomena are random in nature and can be minimally characterized for the purpose

of laboratory simulation in terms of the deviation from the rated voltage and duration.

Consequently, different types of tests are specified in this document to simulate the effects of

abrupt voltage change. These tests are to be used only for particular and justified cases,

under the responsibility of product specification or product committees.

It is the responsibility of the product committees to establish which phenomena among the

ones considered in this document are relevant and to decide on the applicability of the test.

5 Test levels
5.1 General

The voltages in this document use the rated voltage for the equipment (U ) as a basis for the

voltage test level specification.
Where the equipment has a rated voltage range the following shall apply:

• if the voltage range does not exceed 20 % of the lower voltage specified for the rated

voltage range, a single voltage within that range may be specified as a basis for the test

level specification (U );

• in all other cases, the test procedure shall be applied for both the lowest and highest

voltages declared in the voltage range;

• guidance for the selection of test levels and durations is given in IEC TR 61000-2-8.

5.2 Voltage dips and short interruptions
The change between U and the changed voltage is abru
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.