EN 61830:1998
(Main)Microwave ferrite components - Measuring methods for major properties
Microwave ferrite components - Measuring methods for major properties
Gives guidance on the measuring methods for major microwave properties (return loss, forward loss, reverse loss, phase shift, group delay) of ferrite microwave components.
Mikrowellenferritbauelemente - Meßverfahren für die Hauptmikrowelleneigenschaften
Composants ferrites pour hyperfréquences - Méthodes de mesure des principales propriétés
Sert de guide pour les méthodes de mesure des principales propriétés hyperfréquences (facteur d'adaptation, affaiblissement direct, affaiblissement inverse, déplacement de phase, temps de propagation) des composants ferrites pour hyperfréquences.
Microwave ferrite components - Measuring methods for major properties (IEC 61830:1997)
General Information
Standards Content (Sample)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Microwave ferrite components - Measuring methods for major properties (IEC 61830:1997)Mikrowellenferritbauelemente - Meßverfahren für die HauptmikrowelleneigenschaftenComposants ferrites pour hyperfréquences - Méthodes de mesure des principales propriétésMicrowave ferrite components - Measuring methods for major properties29.100.10Magnetne komponenteMagnetic componentsICS:Ta slovenski standard je istoveten z:EN 61830:1998SIST EN 61830:2002en01-september-2002SIST EN 61830:2002SLOVENSKI
STANDARD
NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD61830Première éditionFirst edition1997-11Composants ferrites pour hyperfréquences –Méthodes de mesure des principales propriétésMicrowave ferrite components –Measuring methods for major properties Commission Electrotechnique Internationale International Electrotechnical
CommissionPour prix, voir catalogue en vigueurFor price, see current
catalogueÓ IEC 1997
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¾ Copyright - all rights reservedAucune partie de cette publication ne peut être reproduite niutilisée sous quelque forme que ce soit et par aucunprocédé, électronique ou mécanique, y compris la photo-copie et les microfilms, sans l'accord écrit de l'éditeur.No part of this publication may be reproduced or utilized inany form or by any means, electronic or mechanical,including photocopying and microfilm, without
permission inwriting
from the publisher.International Electrotechnical Commission3, rue de Varembé
Geneva, SwitzerlandTelefax: +41 22 919 0300e-mail: inmail@iec.ch IEC web site
http: //www.iec.chCODE PRIXPRICE CODEMSIST EN 61830:2002
61830 © IEC:1997– 3 –CONTENTSPageFOREWORD. 5Clause1 Scope.72 Normative reference.73 Return loss.73.1 The relationship between impedance, return loss, reflection coefficient and voltage standing wave ratio (VSWR).73.2 Method of measurement of return loss.93.3 General considerations of the measuring equipment.93.4 Measuring procedure.113.5 Presentation of results.113.6 Detail to be specified.134 Forward loss and reverse loss.134.1 Definition and general considerations.134.2 Method of measurement.134.3 General considerations of the measuring equipment.134.4 Measuring procedure.154.5 Presentation of results.155 Phase-shift and group-delay.175.1 Definition and general considerations.175.2 Method of measurement.175.3 Presentation of results.19SIST EN 61830:2002
61830 © IEC:1997– 5 –INTERNATIONAL ELECTROTECHNICAL COMMISSION___________MICROWAVE FERRITE COMPONENTS –MEASURING METHODS FOR MAJOR PROPERTIESFOREWORD1)The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprisingall national electrotechnical committees (IEC National Committees). The object of the IEC is to promoteinternational co-operation on all questions concerning standardization in the electrical and electronic fields. Tothis end and in addition to other activities, the IEC publishes International Standards. Their preparation isentrusted to technical committees; any IEC National Committee interested in the subject dealt with mayparticipate in this preparatory work. International, governmental and non-governmental organizations liaisingwith the IEC also participate in this preparation. The IEC collaborates closely with the International Organizationfor Standardization (ISO) in accordance with conditions determined by agreement between the twoorganizations.2)The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, aninternational consensus of opinion on the relevant subjects since each technical committee has representationfrom all interested National Committees.3)The documents produced have the form of recommendations for international use and are published in the formof standards, technical reports or guides and they are accepted by the National Committees in that sense.4)In order to promote international unification, IEC National Committees undertake to apply IEC InternationalStandards transparently to the maximum extent possible in their national and regional standards. Anydivergence between the IEC Standard and the corresponding national or regional standard shall be clearlyindicated in the latter.5)The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for anyequipment declared to be in conformity with one of its standards.6)Attention is drawn to the possibility that some of the elements of this International Standard may be the subjectof patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.International Standard IEC 61830 has been prepared by IEC technical committee 51: Magneticcomponents and ferrite materials.The text of this standard is based on the following documents:FDISReport on voting51/486/FDIS51/494/RVDFull information on the voting for the approval of this standard can be found in the report onvoting indicated in the above table.SIST EN 61830:2002
61830 © IEC:1997– 7 –MICROWAVE FERRITE COMPONENTS –MEASURING METHODS FOR MAJOR PROPERTIES1 ScopeThis International Standard gives guidance on the measuring methods for major microwaveproperties, such as return loss, forward loss, reverse loss, phase shift and group delay, ofmicrowave ferrite components.NOTE 1 – The methods of measurement are compiled after the model of IEC 60510-1-3.NOTE 2 – Network analyzers are being used by most manufacturers to evaluate such properties of microwaveferrite components at present. However, knowledge of basic measuring methods is necessary for understanding thegeneral purpose of measurements including the use of network analyzers. Therefore, orthodox methods ofmeasurement are described herein.2 Normative referenceThe following normative document contains provisions which, through reference in this text,constitute provisions of this standard. At the time of publication, the edition indicated was valid.All normative documents are subject to revision, and parties to agreements based on thisInternational Standard are encouraged to investigate the possibility of applying the most recentedition of the normative document indicated below. Members of IEC and ISO maintain registersof currently valid International Standards.IEC 60510-1-3: 1980, Methods of measurement for radio equipment used in satellite earthstations – Part 1: Measurements common to sub-systems and combinations of sub-systems –Section three: Measurements in the i.f. rangeAmendment 1 (1988)3 Return loss3.1 The relationship between impedance, return loss, reflection coefficientand voltage standing wave ratio (VSWR)In microwave ferrite components, interest is essentially in the measurement of return lossrather than that of impedance, reflection coefficient, or VSWR.The return loss L in decibels of an impedance Z relative to its nominal value Z0 is given by:LZZZZ = 20 log
+
1000-(1)Alternatively, the return loss in decibels is given by:
= 20 log 1 10Lr(2)SIST EN 61830:2002
61830 © IEC:1997– 9 –where r is the voltage reflection coefficient of the impedance Z relative to Z0, i.e.
=
+
00rZZZZ-(3)VSWR is given by:
=
1 +
VSWRrr-(4)3.2 Method of measurement of return lossMeasurements may be made by using either point-by-point or sweep-frequency methods. Forthe latter case, an example is described in following subclauses, but any alternative methodcapable of providing the required accuracy (typically ±1 dB) may be used. In this example, theequipments listed below and shown in figure 1, are needed:–a sweep-frequency generator;–a microwave bridge;–a calibrated attenuator;–an amplitude detector;–an oscilloscope.The method is intended for measuring the return loss of linear and passive ports, for examplethe input impedance of an isolator. It also may be used for measuring the return loss of linear,active and passive devices, for example at the output of device (source impedance) providedthat no signal is present and that the device under test can be considered as a linear, passivenetwork.The return loss of cables, attenuators, adapters, etc., used during the measurements, as wellas the return loss at the input and the output of measuring equipment, may be checked usingthe same method.3.3 General considerations of the measuring equipment3.3.1 Sweep-frequency generatorOver a specified frequency range, the generator should be able to generate a sinusoidal, radiofrequency signal, and its output level should be constant.The repetition rate fs of the sweep should be in the range 10 Hz to 100 Hz provided that thepassband of the receiver section, i.e., amplitude detector and oscilloscope, is about 50 times to100 times the chosen sweep rate.3.3.2 Microwave bridgeOver a specified range of signal levels, the voltage at the output of the bridge should beproportional to the magnitude of the reflection coefficient of the impedance under test.3.3.3 Detector sensitivityThe minimum level detectable by the detector should be at least 20 dB below the minimumlevel expected from the bridge under conditions given in 3.4.3.SIST EN 61830:2002
61830 © IEC:1997– 11 –3.4 Measuring procedure3.4.1 GeneralThe measuring procedure comprises three steps: namely, calibration, balance check of thebridge and measurement.3.4.2 CalibrationThe output level of the sweep-frequency generator is adjusted to obtain the desired voltageacross the impedance Z in the bridge. Care should be taken to avoid overloading theequipment under test.The test arm of the bridge is left short-circuited and the calibrated attenuator is then adjustedto obtain a suitable d.c. level at the output of the amplitude detector.3.4.3 Checking the residual return loss of the bridgeA matched load Z0, coaxial or waveguide, is connected to the bridge in place of the unknownimpedance Z.The residual return loss is then checked by adjusting the calibrated attenuator until the traceson the screen of the oscilloscope approach coincidence. It is possible to obtain exactcoincidence only if sufficient receiver sensitivity is available.The setting of the attenuator should be noted when coincidence of the traces occurs or whenthe limit of receiver sensitivity is reached. This setting determines the maximum value of returnloss which can be measured with specified accuracy. Return loss values up to 20 dB less thanthe value obtained above can be measured with an accuracy of ±1 dB. For example, when thevalue is 50 dB, return loss values up to 30 dB can be measured with an accuracy of ±1 dB.3.4.4 Measurement of return lossOne port of the device under test with unknown impedance Z is connected to the bridge andthe other port(s) of the device should be terminated by matched load(s) Z0. The calibratedattenuator is adjusted until the measuring trace and the reference trace on the screen of theoscilloscope coincide at the specified frequency as indicated by the frequency marker.The difference between this attenuator setting and that obtained under 3.4.2 is equal to thereturn loss of the unknown impedance Z.When it is necessary to measure return loss of the other ports of the device, repeat the aboveprocedure regarding the port to be measured.3.5 Presentation of resultsThe results of the measurements should be presented preferably as a curve or photograph ofthe oscilloscope display with the vertical scale as shown in figure 2 or with this scale inverted.Reference lines may be added on the oscilloscope display.In every case the residual return loss curve should be shown as well as the measured curve.SIST EN 61830:2002
61830 © IEC:1997– 13 –When the results of the measurements are not presented graphically, they should be given asin the following example:a) return loss more than 23 dB from 3,5 GHz to 4,5 GHz;b) residual return loss more than 45 dB.3.6 Detail to be specifiedThe following should be included as required in the detailed equipment specification:a) return loss limits;b) frequency band limits.4 Forward loss and reverse loss4.1 Definition and general considerationsThe forward loss and reverse loss are given by the curve representing the difference,expressed in decibels, between the output level and a reference level, as a function offrequency for a constant input level.4.2 Method of measurementMeasurements
may be made using either point-by-point or sweep-frequency methods. For thelatter case, an example of the arrangement of the measuring equipment is shown in figure 3.Use of isolators at the input and output port of the device under test is recommended to reducemismatch errors.4.3 General considerations of the measuring equipmentWhen using the sweep-frequency methods, repetition of the sweep-frequency generator, thewaveform of the sweep signal and the pass-band of the detector and the oscilloscope shouldconform to 3.3.1.Care should be taken to ensure that the results of the measurements are not affected byharmonics of the test signal.Before commencing the measurements on the equipment to be tested, the magnitude of theinherent errors of the measuring equipment including the cables, attenuators and otheraccessories which are to be used, should be calibrated by connecting the output of the signalgenerator to the input of the detector.When measuremen
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