EN IEC 63364-1:2023

Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection

This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.

Halbleiterbauelemente - Halbleiterbauelemente für IOT-Systeme - Teil 1: Prüfverfahren für die Erkennung von Schallschwankungen

Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie 1: Méthode d’essai de détection de variation acoustique

L’IEC 63364-1:2022 spécifie les termes, la méthode d’essai et le rapport du système de détection de variation acoustique basé sur l’IDO. Elle fournit la méthode d’évaluation pour chaque partie du système de détection de variation acoustique basé sur l’IDO dans le schéma de principe, les paramètres de caractérisation, les symboles, les montages d’essai et les conditions. En outre, le présent document définit les éléments de configuration et les critères de l’espace normalisé et de la situation d’application de flamme pour la mesure de l’évaluation de la qualité du système de détection de variation de champ acoustique avec IDO.

Polprevodniški elementi - Polprevodniški elementi za sistem IOT - 1. del: Preskusna metoda zaznavanja zvočnih variacij (IEC 63364-1:2022)

Ta del standarda IEC 63364-1 določa izraze, preskusno metodo in poročilo o sistemu za zaznavanje zvočnih sprememb na podlagi interneta stvari (IoT). Zagotavlja metodo vrednotenja za vsak del sistema za zaznavanje sprememb zvoka na podlagi interneta stvari v blokovni shemi, karakteristične parametre, simbole, preskusne nastavitve in pogoje. Poleg tega ta dokument opredeljuje elemente konfiguracije in merila standardne situacije prostora in rafala za meritve vrednotenja kakovosti sistema za zaznavanje sprememb zvočnega polja s pomočjo interneta stvari.

General Information

• Status: Published
• Publication Date: 26-Jan-2023
• ICS: 31.080.99 - Other semiconductor devices
• Technical Committee: CLC/SR 47 - Semiconductor devices
• Drafting Committee: IEC/TC 47 - IEC_TC_47
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 27-Jan-2023
• Due Date: 31-Mar-2023
• Completion Date: 27-Jan-2023
• Ref Project: SIST EN IEC 63364-1:2023 - Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection (IEC 63364-1:2022)

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN IEC 63364-1:2023
01-april-2023
Polprevodniški elementi - Polprevodniški elementi za sistem IOT - 1. del:
Preskusna metoda zaznavanja zvočnih variacij (IEC 63364-1:2022)
Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of
sound variation detection (IEC 63364-1:2022)
Halbleiterbauelemente - Halbleiterbauelemente für IOT-Systeme - Teil 1: Prüfverfahren
für die Erkennung von Schallschwankungen (IEC 63364-1:2022)
Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie
1: Méthode d’essai de détection de variation acoustique (IEC 63364-1:2022)
Ta slovenski standard je istoveten z: EN IEC 63364-1:2023
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
SIST EN IEC 63364-1:2023 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN IEC 63364-1:2023

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SIST EN IEC 63364-1:2023


EUROPEAN STANDARD EN IEC 63364-1

NORME EUROPÉENNE

EUROPÄISCHE NORM January 2023
ICS 31.080.99

English Version
Semiconductor devices - Semiconductor devices for IoT system
- Part 1: Test method of sound variation detection
(IEC 63364-1:2022)
Dispositifs à semiconducteurs - Dispositifs à Halbleiterbauelemente - Halbleiterbauelemente für IOT-
semiconducteurs pour système IDO - Partie 1: Méthode Systeme - Teil 1: Prüfverfahren für die Erkennung von
d'essai de détection de variation acoustique Schallschwankungen
(IEC 63364-1:2022) (IEC 63364-1:2022)
This European Standard was approved by CENELEC on 2023-01-18. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Türkiye and the United Kingdom.


European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2023 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN IEC 63364-1:2023 E

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SIST EN IEC 63364-1:2023
EN IEC 63364-1:2023 (E)
European foreword
The text of document 47/2782/FDIS, future edition 1 of IEC 63364-1, prepared by IEC/TC 47
"Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN IEC 63364-1:2023.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2023-10-18
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2026-01-18
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 63364-1:2022 was approved by CENELEC as a European
Standard without any modification.

2

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SIST EN IEC 63364-1:2023



IEC 63364-1

®


Edition 1.0 2022-12




INTERNATIONAL



STANDARD




NORME


INTERNATIONALE











Semiconductor devices – Semiconductor devices for IoT system –

Part 1: Test method of sound variation detection



Dispositifs à semiconducteurs – Dispositifs à semiconducteurs pour système

IDO –

Partie 1: Méthode d’essai de détection de variation acoustique















INTERNATIONAL

ELECTROTECHNICAL

COMMISSION

...

SLOVENSKI STANDARD
oSIST prEN IEC 63364-1:2022
01-marec-2022
Polprevodniški elementi - Polprevodniški elementi za sistem IOT - 1. del:
Preskusna metoda zaznavanja zvočnih variacij
Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of
sound variation detection
Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IOT - Partie
1: Méthode d’essai de détection de variation acoustique
Ta slovenski standard je istoveten z: prEN IEC 63364-1:2021
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
oSIST prEN IEC 63364-1:2022 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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oSIST prEN IEC 63364-1:2022

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oSIST prEN IEC 63364-1:2022
47/2742/CDV

COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 63364-1 ED1
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2021-12-24 2022-03-18
SUPERSEDES DOCUMENTS:
47/2701/CD, 47/2741/CC

IEC TC 47 : SEMICONDUCTOR DEVICES
SECRETARIAT: SECRETARY:
Korea, Republic of Mr Cheolung Cha
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:

ISO/IEC JTC 1/SC 41
Other TC/SCs are requested to indicate their interest, if any,
in this CDV to the secretary.
FUNCTIONS CONCERNED:

EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft for
Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.

This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of which
they are aware and to provide supporting documentation.

TITLE:
Semiconductor devices – Semiconductor devices for IOT system – Part 1: Test method of sound variation
detection

PROPOSED STABILITY DATE: 2027

NOTE FROM TC/SC OFFICERS:
At the WG 6 online meeting on 2021-10-05, the project leader presented a resolution on the CD document and
proceeding to the next stage (CDV) was approved.

Copyright © 2021 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.

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oSIST prEN IEC 63364-1:2022
IEC CDV 63364-1/Ed1  IEC (E) – 2 – 47/2742/CDV
1 CONTENTS
2

3 FOREWORD . 3
4 1 Scope . 5
5 2 Normative references . 5
6 3 Terms and definitions . 5
7 4 Evaluation method and test setup . 6
8 4.1 General . 6
9 4.2 Equipment and tools . 6
10 4.3 Block diagram and semiconductor components . 7
11 4.3.1 Microphone sensor . 7
12 4.3.2 Speaker . 8
13 4.3.3 Micro controller . 8
14 4.3.4 Transmitting module . 8
15 4.4 Test methods . 8
16 4.4.1 Cubic box . 8
17 4.4.2 Measurement and data analysis . 9
18 4.4.3 Evaluation method for the parts of sound variation detection system
...