EN IEC 63364-1:2023

Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection

This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.

Halbleiterbauelemente - Halbleiterbauelemente für IOT-Systeme - Teil 1: Prüfverfahren für die Erkennung von Schallschwankungen

Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie 1: Méthode d’essai de détection de variation acoustique

L’IEC 63364-1:2022 spécifie les termes, la méthode d’essai et le rapport du système de détection de variation acoustique basé sur l’IDO. Elle fournit la méthode d’évaluation pour chaque partie du système de détection de variation acoustique basé sur l’IDO dans le schéma de principe, les paramètres de caractérisation, les symboles, les montages d’essai et les conditions. En outre, le présent document définit les éléments de configuration et les critères de l’espace normalisé et de la situation d’application de flamme pour la mesure de l’évaluation de la qualité du système de détection de variation de champ acoustique avec IDO.

Polprevodniški elementi - Polprevodniški elementi za sistem IOT - 1. del: Preskusna metoda zaznavanja zvočnih variacij (IEC 63364-1:2022)

Ta del standarda IEC 63364-1 določa izraze, preskusno metodo in poročilo o sistemu za zaznavanje zvočnih sprememb na podlagi interneta stvari (IoT). Zagotavlja metodo vrednotenja za vsak del sistema za zaznavanje sprememb zvoka na podlagi interneta stvari v blokovni shemi, karakteristične parametre, simbole, preskusne nastavitve in pogoje. Poleg tega ta dokument opredeljuje elemente konfiguracije in merila standardne situacije prostora in rafala za meritve vrednotenja kakovosti sistema za zaznavanje sprememb zvočnega polja s pomočjo interneta stvari.

General Information

• Status: Published
• Publication Date: 26-Jan-2023
• ICS: 31.080.99 - Other semiconductor devices
• Technical Committee: CLC/TC 47X - Semiconductor devices and trusted chips
• Drafting Committee: IEC/TC 47 - IEC_TC_47
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 27-Jan-2023
• Due Date: 31-Mar-2023
• Completion Date: 27-Jan-2023
• Ref Project: SIST EN IEC 63364-1:2023 - Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection (IEC 63364-1:2022)

Standards Content (Sample)

SLOVENSKI STANDARD
01-april-2023
Polprevodniški elementi - Polprevodniški elementi za sistem IOT - 1. del:
Preskusna metoda zaznavanja zvočnih variacij (IEC 63364-1:2022)
Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of
sound variation detection (IEC 63364-1:2022)
Halbleiterbauelemente - Halbleiterbauelemente für IOT-Systeme - Teil 1: Prüfverfahren
für die Erkennung von Schallschwankungen (IEC 63364-1:2022)
Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie
1: Méthode d’essai de détection de variation acoustique (IEC 63364-1:2022)
Ta slovenski standard je istoveten z: EN IEC 63364-1:2023
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 63364-1

NORME EUROPÉENNE
EUROPÄISCHE NORM January 2023
ICS 31.080.99
English Version
Semiconductor devices - Semiconductor devices for IoT system
- Part 1: Test method of sound variation detection
(IEC 63364-1:2022)
Dispositifs à semiconducteurs - Dispositifs à Halbleiterbauelemente - Halbleiterbauelemente für IOT-
semiconducteurs pour système IDO - Partie 1: Méthode Systeme - Teil 1: Prüfverfahren für die Erkennung von
d'essai de détection de variation acoustique Schallschwankungen
(IEC 63364-1:2022) (IEC 63364-1:2022)
This European Standard was approved by CENELEC on 2023-01-18. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Türkiye and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2023 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 63364-1:2023 E

European foreword
The text of document 47/2782/FDIS, future edition 1 of IEC 63364-1, prepared by IEC/TC 47
"Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN IEC 63364-1:2023.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2023-10-18
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2026-01-18
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 63364-1:2022 was approved by CENELEC as a European
Standard without any modification.

IEC 63364-1 ®
Edition 1.0 2022-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Semiconductor devices for IoT system –

Part 1: Test method of sound variation detection

Dispositifs à semiconducteurs – Dispositifs à semiconducteurs pour système

IDO –
Partie 1: Méthode d’essai de détection de variation acoustique

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.99 ISBN 978-2-8322-6214-6

– 2 – IEC 63364-1:2022 © IEC 2022
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Evaluation method and test setup . 6
4.1 General . 6
4.2 Equipment and tools . 7
4.3 Block diagram and semiconductor components . 7
4.3.1 General . 7
4.3.2 Microphone sensor . 8
4.3.3 Speaker . 8
4.3.4 Micro controller . 8
4.3.5 Transmitting module . 8
4.4 Test methods . 8
4.4.1 Cubic box . 8
4.4.2 Measurement and data analysis . 10
4.4.3 Evaluation method for the parts of sound variation detection system for
IoT-based sound field detection . 11
4.5 Test report . 12

Figure 1 – Sound field space with boundary conditions and governing equation . 6
Figure 2 – Variation of transfer function due to obstacles in security area . 7
Figure 3 – Block diagram of the sound variation detection system for IoT-based event
detection . 8
Figure 4 – Cubic box for experiment for sound field variation detection system . 9
Figure 5 – Inner configuration within a cubic box . 9
Figure 6 – Experimental SPL spectra in the 3 744 Hz – 4 256 Hz range with 4 Hz steps
in the cube . 10
Figure 7 – FEM simulation of SPL spectra in the 3 744 Hz – 4 256 Hz range with 4 Hz
steps in the cube . 11

IEC 63364-1:2022 © IEC 2022 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
SEMICONDUCTOR DEVICES FOR IOT SYSTEM –

Part 1: Test method of sound variation detection

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 63364-1 has been prepared by IEC technical committee 47: Semiconductor devices. It is
an International Standard.
The text of this International Standard is based on the following documents:
Draft Report on voting
47/2782/FDIS 47/2792/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.

– 4 – IEC 63364-1:2022 © IEC 2022
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 63364 series, published under the general title Semiconductor
devices – Semiconductor devices for IoT system, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IEC 63364-1:2022 © IEC 2022 – 5 –
SEMICONDUCTOR DEVICES –
SEMICONDUCTOR DEVICES FOR IOT SYSTEM –

Part 1: Test method of sound variation detection

1 Scope
This part of IEC 63364 specifies terms, the test method, and the report of sound variation
detection system based on IoT. It provides the evaluation method for each part of the sound
variation detection system based on IoT in the block diagram, the characterization parameters,
symbols, test setups and the conditions. In addition, this document defines the configuration
items and criteria of standard space and firing situation for the quality evaluation measurement
of sound field variation detection system with IoT.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electrop
...