Superconductivity - Part 1: Critical current measurement - DC critical current of Nb-Ti composite superconductors

This part of IEC 61788 covers a test method for the determination of the d.c. critical current of either Cu/Nb-Ti composite superconductors that have a copper/superconductor ratio larger than 1 or Cu/Cu-Ni/Nb-Ti wires that have a copper/superconductor ratio larger than 0,9 and a copper alloy (Cu-Ni)/superconductor ratio larger than 0,2, where the diameter of Nb-Ti superconducting filaments is larger than 1 micrometre. The changes for the Cu/Cu-Ni/Nb-Ti are described in Annex C. The Cu-Ni uses all of the main part of the standard with the exceptions listed in Annex C that replace (and in some cases are counter to) some of the steps inthe main text. This method is intended for use with superconductors that have critical currents less than 1 000 A and n-values larger than 12, under standard test conditions and at magnetic fields less than or equal to 0,7 of the upper critical magnetic field. The test specimen is immersed in a liquid helium bath at a known temperature during testing. The test conductor has a monolithic structure with a round or rectangular cross-sectional area that is less than 2 mm2. The specimen geometry used in this test method is an inductively coiled specimen. Deviations from this test method that are allowed for routine tests and other specific restrictions are given in this standard. Test conductors with critical currents above 1 000 A or cross-sectional areas greater than 2 mm2 could be measured with the present method with an anticipated increase in uncertainty and a more significant self-field effect (see Annex B). Other, more specialized, specimen test geometries may be more appropriate for larger conductor testing which have been omitted from this present standard for simplicity and to retain a lower uncertainty. The test method given in this standard is expected to apply to other superconducting composite wires after some appropriate modifications.

Supraleitfähigkeit - Teil 1: Messen des kritischen Stromes - Kritischer Strom (Gleichstrom) von Nb-Ti Verbundsupraleitern

Supraconductivité - Partie 1: Mesure du courant critique - Courant critique continu de supraconducteurs en composite Nb-Ti

Cette partie de la CEI 61788 couvre une méthode d'essai pour la détermination du courant critique continu des supraconducteurs en composite Cu/Nb-Ti qui ont un rapport cuivre/supraconducteur supérieur à 1 ou des fils Cu/Cu-Ni/Nb-Ti qui ont un rapport cuivre/ supraconducteur supérieur à 0,9 et un alliage cuivre (Cu-Ni)/supraconducteur supérieur à 0,2, où le diamètre des filaments supraconducteurs Nb-Ti est supérieur à 1 micromètre. Les modifications pour les Cu/Cu-Ni/Nb-Ti sont décrites dans l' Annexe C. Les Cu-Ni pourront faire référence aux parties principales de cette norme avec les exceptions listées dans l'Annexe C qui remplacent (et dans certains cas contredisent) certaines étapes du texte principal. La présente méthode est destinée à être utilisée avec des supraconducteurs caractérisés par des courants critiques inférieurs à 1 000 A et des valeurs n supérieures à 12, dans des conditions d'essai normalisées et avec des champs magnétiques inférieurs ou égaux à 0,7 fois la valeur du champ magnétique critique le plus élevé. Le spécimen d'essai est immergé dans un bain d'hélium liquide à une température mesurée pendant l'essai. Le conducteur d'essai en composite Cu/Nb-Ti a une structure monolithique, avec une superficie de section ronde ou rectangulaire inférieure à 2 mm2. Le spécimen utilisé dans la présente méthode d'essai a la forme d'une bobine inductive. La présente norme présente les écarts par rapport à la méthode d'essai qui sont autorisés dans les essais de série, ainsi que d'autres restrictions spécifiques. Les conducteurs d'essai dont les courants critiques sont supérieurs à 1 000 A ou dont les superficies de section sont supérieures à 2 mm2 pourraient faire l'objet d'une mesure par la présente méthode, en prévoyant une augmentation de l'incertitude et avec un effet de champ induit plus important (voir Annexe B). Il est permis d'utiliser d'autres géométries de spécimen d'essai, plus spécialisées et mieux adaptées aux essais sur les conducteurs plus grands, qui ne sont pas incluses dans la présente norme, par souci de simplicité et pour réduire l'incertitude. La méthode d'essai décrite dans la présente norme est supposée adaptable à d'autres fils supraconducteurs en composite, après des modifications appropriées.

Superprevodnost - 1. del: Meritve kritičnega toka - Enosmerni kritični tok pri superprevodnikih iz Nb-Ti kompozita (IEC 61788-1:2006)

General Information

Status
Published
Publication Date
04-Jan-2007
Withdrawal Date
30-Nov-2009
Technical Committee
Drafting Committee
Parallel Committee
Current Stage
6060 - Document made available - Publishing
Start Date
05-Jan-2007
Completion Date
05-Jan-2007

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2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Superconductivity - Part 1: Critical current measurement - DC critical current of Nb-Ti composite superconductorsSupraconductivité Partie 1: Mesure du courant critique - Courant critique continu de supraconducteurs en composite Nb-TiSupraleitfähigkeit Teil 1: Messen des kritischen Stromes - Kritischer Strom (Gleichstrom) von Nb-Ti VerbundsupraleiternTa slovenski standard je istoveten z:EN 61788-1:2007SIST EN 61788-1:2008en,fr,de29.050Superprevodnost in prevodni materialiSuperconductivity and conducting materials17.220.20Measurement of electrical and magnetic quantitiesICS:SIST EN 61788-1:20011DGRPHãþDSLOVENSKI
STANDARDSIST EN 61788-1:200801-januar-2008

EUROPEAN STANDARD EN 61788-1 NORME EUROPÉENNE
EUROPÄISCHE NORM January 2007
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2007 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61788-1:2007 E
ICS 17.220; 29.050 Supersedes EN 61788-1:1998
English version
Superconductivity
Part 1: Critical current measurement -
DC critical current of Nb-Ti composite superconductors (IEC 61788-1:2006)
Supraconductivité
Partie 1: Mesure du courant critique -
Courant critique continu de supraconducteurs en composite Nb-Ti
(CEI 61788-1:2006)
Supraleitfähigkeit
Teil 1: Messen des kritischen Stromes -
Kritischer Strom (Gleichstrom) von Nb-Ti Verbundsupraleitern (IEC 61788-1:2006)
This European Standard was approved by CENELEC on 2006-12-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom.

Foreword The text of document 90/196/FDIS, future edition 2 of IEC 61788-1, prepared by IEC TC 90, Superconductivity, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61788-1 on 2006-12-01. This European Standard supersedes EN 61788-1:1998. It includes the following significant technical changes with respect to EN 61788-1:1998: – the addition of normative Annex C and informative Annex D; – accuracy and precision statements were converted to uncertainty statements; – the magnetic field uniformity statement was tightened from ± 2 % to be less than the larger of 0,5 % or 0,02 T. The following dates were fixed: – latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement
(dop)
2007-09-01 – latest date by which the national standards conflicting
with the EN have to be withdrawn
(dow)
2009-12-01 Annex ZA has been added by CENELEC. __________ Endorsement notice The text of the International Standard IEC 61788-1:2006 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following note has to be added for the standard indicated: IEC 61788-5 NOTE
Harmonized as EN 61788-5:2001 (not modified). __________

- 3 - EN 61788-1:2007 Annex ZA
(normative)
Normative references to international publications with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title EN/HD Year
IEC 60050-815 -1) International Electrotechnical Vocabulary (IEV)
Part 815: Superconductivity - -
1) Undated reference.
NORME INTERNATIONALECEIIEC INTERNATIONAL STANDARD 61788-1Deuxième éditionSecond edition2006-11 Supraconductivité – Partie 1: Mesure du courant critique – Courant critique continu de supraconducteurs
en composite Nb-Ti
Superconductivity – Part 1: Critical current measurement – DC critical current of Nb-Ti composite superconductors Pour prix, voir catalogue en vigueur For price, see current catalogue© IEC 2006
Droits de reproduction réservés

Copyright - all rights reserved Aucune partie de cette publication ne peut être reproduite ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie et les microfilms, sans l'accord écrit de l'éditeur. No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission,
3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch
Web: www.iec.ch CODE PRIX PRICE CODE U Commission Electrotechnique InternationaleInternational Electrotechnical Commission

61788-1 © IEC:2006 – 3 – CONTENTS FOREWORD.5 INTRODUCTION.9
1 Scope.11 2 Normative references.11 3 Terms and definitions.11 4 Principle.15 5 Requirements.15 6 Apparatus.17 6.1 Measurement mandrel material.17 6.2 Mandrel construction.17 7 Specimen preparation.19 7.1 Specimen bonding.19 7.2 Specimen mounting.19 8 Measurement procedure.21 9 Uncertainty of the test method.23 9.1 Critical current.23 9.2 Temperature.23 9.3 Magnetic field.23 9.4 Specimen and mandrel support structure.25 9.5 Specimen protection.25 10 Calculation of results.25 10.1 Critical current criteria.25 10.2 n-value (optional calculation, refer to A.7.2).27 11 Test report.29 11.1 Identification of test specimen.29 11.2 Report of Ic values.29 11.3 Report of test conditions.29
Annex A (informative)
Additional information relating to the standard.31 Annex B (informative)
Self-field effect.47 Annex C (normative)
Test method for Cu/Cu-Ni/Nb-Ti composite superconductors.51 Annex D (informative)
Guidance for estimating winding tensile force.53
Bibliography.57
Figure 1 – Intrinsic U-I characteristic.27 Figure 2 – U-I characteristic with a current transfer component.27 Figure A.1 – Instrumentation of specimen with a null voltage tap pair.45
Table D.1 – Typical values of E at room temperature for various materials.55

61788-1 © IEC:2006 – 5 – INTERNATIONAL ELECTROTECHNICAL COMMISSION ___________
SUPERCONDUCTIVITY –
Part 1: Critical current measurement – DC critical current of Nb-Ti composite superconductors
FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61788-1 has been prepared by IEC technical committee 90: Superconductivity. This second edition cancels and replaces the first edition published in 1998. It constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition: – the addition of normative Annex C and informative Annex D;
– accuracy and precision statements were converted to uncertainty statements;
– the magnetic field uniformity statement was tightened from ±2 % to be less than the larger of 0,5% or 0,02 T.

61788-1 © IEC:2006 – 7 – The text of this standard is based on the following documents: FDIS Report on voting 90/196/FDIS 90/201/RVD
Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. A list of all parts of IEC 61788 series, published under the general title Superconductivity, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to the specific publication. At this date, the publication will be
• reconfirmed; • withdrawn; • replaced by a revised edition, or • amended.

61788-1 © IEC:2006 – 9 – INTRODUCTION The critica
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