prEN IEC 62828-3:2025
(Main)Reference conditions and procedures for testing industrial and process measurement transmitters - Part 3: Specific procedures for temperature transmitters
Reference conditions and procedures for testing industrial and process measurement transmitters - Part 3: Specific procedures for temperature transmitters
Referenzbedingungen und Testmethoden für Industrie- und Prozessmessgrößenumformer - Teil 3: Spezielle Testmethoden für Temperaturmessumformer
Conditions de référence et procédures pour l'essai des transmetteurs de mesure industrielle et de processus - Partie 3: Procédures spécifiques pour les transmetteurs de température
Referenčni pogoji in postopki za preskušanje industrijskih in procesnih merilnih oddajnikov - 3. del: Posebni postopki za oddajnike temperature
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
01-julij-2025
Referenčni pogoji in postopki za preskušanje industrijskih in procesnih merilnih
oddajnikov - 3. del: Posebni postopki za oddajnike temperature
Reference conditions and procedures for testing industrial and process measurement
transmitters - Part 3: Specific procedures for temperature transmitters
Referenzbedingungen und Testmethoden für Industrie- und
Prozessmessgrößenumformer - Teil 3: Spezielle Testmethoden für
Temperaturmessumformer
Conditions de référence et procédures pour l'essai des transmetteurs de mesure
industrielle et de processus - Partie 3: Procédures spécifiques pour les transmetteurs de
température
Ta slovenski standard je istoveten z: prEN IEC 62828-3:2025
ICS:
17.200.20 Instrumenti za merjenje Temperature-measuring
temperature instruments
25.040.40 Merjenje in krmiljenje Industrial process
industrijskih postopkov measurement and control
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
65B/1287/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62828-3 ED2
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2025-05-09 2025-08-01
SUPERSEDES DOCUMENTS:
65B/1268/CD, 65B/1283/CC
IEC SC 65B : MEASUREMENT AND CONTROL DEVICES
SECRETARIAT: SECRETARY:
United States of America Mr Wallie Zoller
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):
ASPECTS CONCERNED:
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of
which they are aware and to provide supporting documentation.
Recipients of this document are invited to submit, with their comments, notification of any relevant “In Some
Countries” clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is
the final stage for submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).
TITLE:
Reference conditions and procedures for testing industrial and process measurement
transmitters - Part 3: Specific procedures for temperature transmitters
PROPOSED STABILITY DATE: 2030
NOTE FROM TC/SC OFFICERS:
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You m ay not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.
2 IEC CDV 62828-3 ED2 © IEC 2025
1 CONTENTS
3 FOREWORD . 5
4 INTRODUCTION . 7
5 1 Scope . 9
6 2 Normative references . 9
7 3 Terms and definitions and abbreviated terms . 10
8 3.1 Terms and definitions . 10
9 3.1.1 Emissivity setting . 10
10 3.1.2 Exposure time . 10
11 3.1.3 Field-of-view . 10
12 3.1.4 International Temperature Scale of 1990 (ITS-90) . 10
13 3.1.5 Measuring distance . 10
14 3.1.6 Noise equivalent temperature difference . 11
15 3.1.7 Radiation temperature transmitter . 11
16 3.1.8 Reference junction compensation (RJC) . 11
17 3.1.9 Resistance temperature detector (RTD) . 11
18 3.1.10 Short-term stability . 11
19 3.1.11 Size-of-source effect . 11
20 3.1.12 Spectral range. 11
21 3.1.13 Thermocouple (TC) . 11
22 3.1.14 Warm-up time . 12
23 3.2 Abbreviated terms . 12
24 4 General description of the device . 12
25 5 Reference test conditions . 12
26 6 Test procedures . 12
27 6.1 General . 12
28 6.1.1 Temperature Process Measurement Transmitter (PMT) for TC and
29 RTD . 12
30 6.1.2 Process Measurement Transmitter for Radiation temperature
31 measurement . 14
32 6.2 Type tests at standard and operating reference test conditions . 14
33 6.2.1 General . 14
34 6.2.2 Methods for inaccuracy determination in acceptance and routine
35 tests . 15
IEC CDV 62828-3 ED2 © IEC 2025 3
36 6.2.3 Specific test procedures for radiation temperature transmitter . 16
37 7 Test report . 20
38 7.1 General . 20
39 7.2 Total probable error (TPE) . 20
40 Annex A . 21
41 A.1 Temperature PMT (Contact thermometers) . 21
42 A.2 Temperature PMT (Radiation temperature transmitter) . 21
43 Annex B . 23
44 B.1 Properties of temperature transmitter classes . 23
45 B.1.1 Contact temperature transmitter . 23
46 B.1.2 Radiation (Non-contact) temperature transmitter . 25
47 Annex C . 27
48 C.1 Determination of the Inaccuracy . 27
49 C.2 Determination of the Noise equivalent temperature difference (NETD) . 27
50 C.3 Field-of-view (target size) . 28
51 C.4 Determination of the Size-of-Source-Effect (SSE) . 28
52 C.5 Influence of the internal instrument or ambient temperature
53 (temperature parameter) . 29
54 C.6 Short-term stability . 30
55 C.7 Exposure time . 31
56 C.8 Warm-Up time . 32
57 Annex D . 34
58 Bibliography . 36
60 Figure 1 Schematic example of test set-up for temperature measurement
61 transmitters . 13
62 Figure 2 Examples of terminals connection for RTD and TC . 13
63 Figure 3 Schematic example of a test set-up for radiation temperature
64 transmitters . 14
65 Figure 4 Example of measured error plot . 16
66 Figure 5 Relative signal to a signal at a defined aperture size (source size) of
67 100 mm in diameter for two infrared radiation temperature transmitters A and
68 B versus the source diameter . 17
69 Figure 6 Demonstration of the exposure time . 19
4 IEC CDV 62828-3 ED2 © IEC 2025
70 Figure 7 Possible arrangement for determining the exposure time with two
71 reference sources . 32
72 Figure 8 Example of warm-up time . 33
IEC CDV 62828-3 ED2 © IEC 2025 5
75 INTERNATIONAL ELECTROTECHNICAL COMMISSION
76 ____________
78 REFERENCE CONDITIONS AND PROCEDURES FOR TESTING
79 INDUSTRIAL AND PROCESS MEASUREMENT TRANSMITTERS
80 Part 3: Specific procedures for temperature transmitters
83 FOREWORD
84 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national
85 electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all
86 questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities,
87 IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS)
88 and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC
89 National Committee interested in the subject dealt with may participate in this preparatory work. International,
90 governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC
91 collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions
92 determined by agreement between the two organizations.
93 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus
94 of opinion on the relevant subjects since each technical committee has representation from all interested IEC National
95 Committees.
96 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in
97 that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC
98 cannot be held responsible for the way in which they are used or for any misinterpretation by any end user.
99 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently
100 to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication
101 and the corresponding national or regional publication shall be clearly indicated in the latter.
102 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment
103 services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by
104 independent certification bodies.
105 6) All users should ensure that they have the latest edition of this publication.
106 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of
107 its technical committees and IEC National Committees for any personal injury, property damage or other damage of any
108 nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the
109 publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
110 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
111 indispensable for the correct application of this publication.
112 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights.
113 IEC shall not be held responsible for identifying any or all such patent rights.
114 IEC 62828-3 has been prepared by subcommittee 65B: Measurement and control devices, of IEC
115 Technical Committee 65: Industria
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.