Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

IEC 60679-1:2017(E) specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability approval or qualification approval procedures. NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration. This edition includes the following significant technical changes with respect to the previous edition: a) the title has been changed; b) additional matters related to oscillator using SAW or MEMS resonator in "Terms, definitions and general information" have been included; c) measurement methods of IEC 60679-1:2007 have been removed (they will be moved to IEC 62884 series); d) the content of Annex A has been extended; e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been added; f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added; g) Annex D has been added.

Piezoelektrische, dielektrische und elektrostatische Oszillatoren mit bewerteter Qualität - Teil 1: Fachgrundspezifikation

Oscillateurs piézoélectriques, diélectriques et électrostatiques sous assurance de la qualité - Partie 1: Spécification générique

L’IEC 60679-1:2017 spécifie les exigences générales relatives aux oscillateurs piézoélectriques, diélectriques et électrostatiques, y compris les oscillateurs à résonateur diélectrique (DRO - Dielectric Resonator Oscillators) et les oscillateurs à résonateurs à ondes acoustiques de volume à couches (FBAR) (ci-après dénommés "Oscillateur"), sous assurance qualité par les procédures d’agrément de savoir-faire ou les procédures d’homologation. NOTE Les oscillateurs DRO et FBAR sont à l’étude. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: a) le titre a été modifié; b) des éléments supplémentaires relatifs aux oscillateurs utilisant un résonateur OAS ou MEMS ont été ajoutés dans "Termes, définitions et informations générales"; c) les méthodes de mesure de l’IEC 60679-1:2007 ont été supprimées (elles seront intégrées à la série IEC 62884); d) le contenu de l’Annexe A a été enrichi; e) un nouveau terme et sa définition, “DIXO” (digital interfaced crystal oscillator - oscillateur à quartz à interface numérique), ont été ajoutés; f) un nouveau terme et sa définition, “SSXO” (spread spectrum crystal oscillator - oscillateur à quartz à spectre étalé), ont été ajoutés; g) l’Annexe D a été ajoutée.

Piezoelektrični, dielektrični in elektrostatični oscilatorji ocenjene kakovosti - 1. del: Rodovna specifikacija (IEC 60679-1:2017)

Ta del standarda IEC 60679 določa splošne zahteve za piezoelektrične, dielektrične in elektrostatične oscilatorje ocenjene kakovosti, vključno z oscilatorji z dielektričnim resonatorjem (DRO) in oscilatorji, ki uporabljajo resonator FBAR (v nadaljevanju »oscilator«), ki vključujejo postopke za odobritev zmogljivosti ali kvalifikacije.
OPOMBA: Obravnavani so oscilatorji z dielektričnim resonatorjem (DRO) in oscilatorji, ki uporabljajo resonator FBAR.

General Information

Status
Published
Publication Date
16-Nov-2017
Current Stage
6060 - Document made available
Due Date
17-Nov-2017
Completion Date
17-Nov-2017

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SLOVENSKI STANDARD
SIST EN 60679-1:2018
01-januar-2018
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SIST EN 60679-1:2008

3LH]RHOHNWULþQLGLHOHNWULþQLLQHOHNWURVWDWLþQLRVFLODWRUMLRFHQMHQHNDNRYRVWLGHO

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Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic

specification (IEC 60679-1:2017)
Ta slovenski standard je istoveten z: EN 60679-1:2017
ICS:
31.140 3LH]RHOHNWULþQHQDSUDYH Piezoelectric devices
SIST EN 60679-1:2018 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 60679-1:2018
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SIST EN 60679-1:2018
EUROPEAN STANDARD EN 60679-1
NORME EUROPÉENNE
EUROPÄISCHE NORM
November 2017
ICS 31.140 Supersedes EN 60679-1:2007
English Version
Piezoelectric, dielectric and electrostatic oscillators of assessed
quality - Part 1: Generic specification
(IEC 60679-1:2017)

Oscillateurs piézoélectriques, diélectriques et Piezoelektrische, dielektrische und elektrostatische

électrostatiques sous assurance de la qualité - Partie 1: Oszillatoren mit bewerteter Qualität - Teil 1:

Spécification générique Fachgrundspezifikation
(IEC 60679-1:2017) (IEC 60679-1:2017)

This European Standard was approved by CENELEC on 2017-08-30. CENELEC members are bound to comply with the CEN/CENELEC

Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC

Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation

under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the

same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,

Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,

Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,

Switzerland, Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels

© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Ref. No. EN 60679-1:2017 E
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SIST EN 60679-1:2018
EN 60679-1:2017
European foreword

The text of document 49/1229/FDIS, future edition 4 of IEC 60679-1, prepared by IEC/TC 49

"Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control,

selection and detection" was submitted to the IEC-CENELEC parallel vote and approved by

CENELEC as EN 60679-1:2017.
The following dates are fixed:
(dop) 2018-05-30
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2020-08-30
standards conflicting with the
document have to be withdrawn
This document supersedes EN 60679-1:2007.

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice

The text of the International Standard IEC 60679-1:2017 was approved by CENELEC as a European

Standard without any modification.

In the official version, for Bibliography, the following notes have to be added for the standards indicated:

IEC 60068-2-6 NOTE Harmonized as EN 60068-2-6.
IEC 60068-2-17 NOTE Harmonized as EN 60068-2-17.
IEC 60068-2-27 NOTE Harmonized as EN 60068-2-27.
IEC 60068-2-64 NOTE Harmonized as EN 60068-2-64.
IEC 60122-1:2002 NOTE Harmonized as EN 60122-1:2002 (not modified).
IEC 60679-3:2012 NOTE Harmonized as EN 60679-3:2013 (not modified).
IEC 60679-4 NOTE Harmonized as EN 60679-4.
IEC 60679-5 NOTE Harmonized as EN 60679-5.
IEC 61019-1:2004 NOTE Harmonized as EN 61019-1:2005 (not modified).
IEC 61019-2:2005 NOTE Harmonized as EN 61019-2:2005 (not modified).
IEC 61837-1:2012 NOTE Harmonized as EN 61837-1:2012 (not modified).
IEC 61837-2:2011 NOTE Harmonized as EN 61837-2:2011 (not modified).
IEC 61837-3:2015 NOTE Harmonized as EN 61837-3:2015 (not modified).
IEC 61837-4:2015 NOTE Harmonized as EN 61837-4:2015 (not modified).
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SIST EN 60679-1:2018
EN 60679-1:2017
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any amendments)

applies.

NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the relevant

EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:

www.cenelec.eu.
Publication Year Title EN/HD Year
IEC TR 61000-4-1 - Electromagnetic compatibility (EMC) - Part - -
4-1: Testing and measurement techniques -
Overview of the IEC 61000-4 series
IEC 60027 series Letter symbols to be used in electrical EN 60027 series
technology
IEC 60050-561 - International electrotechnical vocabulary - - -
Part 561: Piezoelectric, dielectric and
electrostatic devices and associated
materials for frequency control, selection
and detection
IEC 60469 - Transitions, pulses and related waveforms - EN 60469 -
Terms, definitions and algorithms
IEC 60617 - Standard data element types with - -
associated classification scheme for electric
components - Part 4: IEC reference
collection for standard data element types
and component classes
IEC 60748-2 - Semiconductor devices - Integrated circuits - -
Part 2: Digital integrated circuits
IEC 60749-26 - Semiconductor devices - Mechanical and EN 60749-26 -
climatic test methods - Part 26: Electrostatic
discharge (ESD) sensitivity testing - Human
body model (HBM)
IEC 60749-27 - Semiconductor devices - Mechanical and EN 60749-27 -
climatic test methods - Part 27: Electrostatic
discharge (ESD) sensitivity testing -
Machine model (MM)
IEC 61340-5-1 - Electrostatics - Part 5-1: Protection of EN 61340-5-1 -
electronic devices from electrostatic
phenomena - General requirements
IEC 62884-1 2017 Measurement techniques of piezoelectric, EN 62884-1 2017
dielectric and electrostatic oscillators - Part
1: Basic methods for the measurement
ISO 80000-1 - Quantities and units - Part 1: General EN ISO 80000-1 -
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SIST EN 60679-1:2018
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SIST EN 60679-1:2018
IEC 60679-1
Edition 4.0 2017-07
INTERNATIONAL
STANDARD
Piezoelectric, dielectric and electrostatic oscillators of assessed quality –
Part 1: Generic specification
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.140 ISBN 978-2-8322-4608-5

Warning! Make sure that you obtained this publication from an authorized distributor.

® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 7 ----------------------
SIST EN 60679-1:2018
– 2 – IEC 60679-1:2017 © IEC 2017
CONTENTS

FOREWORD ........................................................................................................................... 4

1 Scope .............................................................................................................................. 6

2 Normative references ...................................................................................................... 6

3 Terms, definitions and general information ...................................................................... 7

3.1 General ................................................................................................................... 7

3.2 Terms and definitions .............................................................................................. 7

3.3 Preferred values for ratings and characteristics .................................................... 21

3.3.1 General ......................................................................................................... 21

3.3.2 Climatic category (40/85/56) .......................................................................... 22

3.3.3 Bump severity ................................................................................................ 22

3.3.4 Vibration severity ........................................................................................... 22

3.3.5 Shock severity ............................................................................................... 22

3.3.6 Leak rate ....................................................................................................... 22

3.4 Marking ................................................................................................................. 23

3.4.1 General ......................................................................................................... 23

3.4.2 Packaging...................................................................................................... 23

4 Quality assessment procedures ..................................................................................... 23

4.1 General ................................................................................................................. 23

4.2 Primary stage of manufacture ............................................................................... 23

4.3 Structurally similar components ............................................................................ 23

4.4 Subcontracting ...................................................................................................... 23

4.5 Incorporated components ...................................................................................... 24

4.6 Manufacturer’s approval ........................................................................................ 24

4.7 Approval procedures ............................................................................................. 24

4.7.1 General ......................................................................................................... 24

4.7.2 Capability approval ........................................................................................ 24

4.7.3 Qualification approval .................................................................................... 24

4.8 Procedures for capability approval ........................................................................ 25

4.8.1 General ......................................................................................................... 25

4.8.2 Eligibility for capability approval ..................................................................... 25

4.8.3 Application for capability approval ................................................................. 25

4.8.4 Granting of capability approval ...................................................................... 25

4.8.5 Capability manual .......................................................................................... 25

4.9 Procedures for qualification approval .................................................................... 25

4.9.1 General ......................................................................................................... 25

4.9.2 Eligibility for qualification approval ................................................................. 25

4.9.3 Application for qualification approval ............................................................. 25

4.9.4 Granting of qualification approval .................................................................. 25

4.9.5 Quality conformance inspection ..................................................................... 26

4.10 Test procedures .................................................................................................... 26

4.11 Screening requirements ........................................................................................ 26

4.12 Rework and repair work ........................................................................................ 26

4.12.1 Rework .......................................................................................................... 26

4.12.2 Repair work ................................................................................................... 26

4.13 Certified test records............................................................................................. 26

4.14 Validity of release ................................................................................................. 26

4.15 Release for delivery .............................................................................................. 26

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SIST EN 60679-1:2018
IEC 60679-1:2017 © IEC 2017 – 3 –

4.16 Unchecked parameters ......................................................................................... 27

Annex A (normative) Load circuit for logic drive ................................................................... 28

A.1 TTL and Schottky .................................................................................................. 28

A.2 CMOS ................................................................................................................... 30

A.3 ECL ...................................................................................................................... 30

A.4 LVDS .................................................................................................................... 31

Annex B (normative) Latch-up test ....................................................................................... 32

B.1 Definition .............................................................................................................. 32

B.1.1 Latch-up ........................................................................................................ 32

B.1.2 Test procedure .............................................................................................. 32

B.2 Test method .......................................................................................................... 32

Annex C (normative) Electrostatic discharge sensitivity classification .................................. 33

C.1 Definition .............................................................................................................. 33

C.1.1 Electrostatic discharge (ESD) ........................................................................ 33

C.1.2 Test procedure .............................................................................................. 33

C.2 Test methods ........................................................................................................ 33

C.2.1 General ......................................................................................................... 33

C.2.2 Leaded oscillator ........................................................................................... 33

C.2.3 SMD oscillator ............................................................................................... 33

C.2.4 The impact of ESD on Oscillator in steady-state ............................................ 33

Annex D (normative) Digital interfaced crystal oscillator’s function ....................................... 34

Bibliography .......................................................................................................................... 35

Figure 1 – Basic configurations of SAW resonators ................................................................. 9

Figure 2 – Example of the use of frequency offset................................................................. 11

Figure 3 – Linearity of frequency modulation deviation .......................................................... 16

Figure 4 – Characteristics of an output waveform .................................................................. 18

Figure 5 – Definition of start-up time ..................................................................................... 19

Figure 6 – Clock signal with period jitter................................................................................ 19

Figure 7 – Phase jitter measures .......................................................................................... 20

Figure 8 – Gaussian distribution of jitter ................................................................................ 20

Figure 9 – Jitter amplitude and period of jitter frequency ....................................................... 20

Figure 10 – Jitter tolerance according to ITU-T G.825, ATIS-0900101, Telcordia GR-

253 and ETSI EN 300 462 .................................................................................................... 21

Figure A.1 – Circuit for TTL ................................................................................................... 28

Figure A.2 – Circuit for Schottky logic ................................................................................... 29

Figure A.3 – Circuit for PECL ................................................................................................ 30

Figure A.4 – Circuit for LVDS ................................................................................................ 31

Table A.1 – Values to be used when calculating R and R ................................................... 30

1 2

Table A.2 – Operating condition ............................................................................................ 31

Table A.3 – DC Electrical characteristics output load = 50 Ω to Vcc-2V ................................. 31

Table D.1 – Function of the digital interface .......................................................................... 34

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SIST EN 60679-1:2018
– 4 – IEC 60679-1:2017 © IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC
OSCILLATORS OF ASSESSED QUALITY –
Part 1: Generic specification
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC

Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested

in the subject dealt with may participate in this preparatory work. International, governmental and non-

governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely

with the International Organization for Standardization (ISO) in accordance with conditions determined by

agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence

between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in

the latter.

5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any

services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC

Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 60679-1 has been prepared by IEC technical committee TC 49:

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency

control, selection and detection.

This fourth edition cancels and replaces the third edition published in 2007. This edition

constitutes a technical revision.

This edition includes the following significant technical changes with respect to the previous

edition:
a) the title has been changed;

b) additional matters related to oscillator using SAW or MEMS resonator in "Terms,

definitions and general information" have been included;

c) measurement methods of IEC 60679-1:2007 have been removed (they will be moved to

IEC 62884 series);
---------------------- Page: 10 ----------------------
SIST EN 60679-1:2018
IEC 60679-1:2017 © IEC 2017 – 5 –
d) the content of Annex A has been extended;

e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been added;

f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added;

g) Annex D has been added.
The text of this standard is based on the following documents:
FDIS Report on voting
49/1229/FDIS 49/1233/RVD

Full information on the voting for the approval of this International Standard can be found in

the report on voting indicated in the above table.

This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts of the IEC 60679 series, published under the general title piezoelectric,

dielectric and electrostatic oscillators of assessed quality can be found on the IEC website.

Future standards in this series will carry the new general title as cited above. Titles of existing

standards in this series will be updated at the time of the next edition.

The committee has decided that the contents of this document will remain unchanged until the

stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to

the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.
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SIST EN 60679-1:2018
– 6 – IEC 60679-1:2017 © IEC 2017
PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC
OSCILLATORS OF ASSESSED QUALITY –
Part 1: Generic specification
1 Scope

This part of IEC 60679 specifies general requirements for piezoelectric, dielectric and

electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using

FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability

approval or qualification approval procedures.

NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration.

2 Normative references

The following documents are referred to in the text in such a way that some or all of their

content constitutes requirements of this document. For dated references, only the edition

cited applies. For undated references, the latest edition of the referenced document (including

any amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology

IEC 60050-561, International electrotecnical vocabulary – Part 561: Piezoelectric, dielectric

and electrostatic devices and associated materials for frequency control, selection and

detection. Available at www.electropedia.org

IEC 60469, Transitions, pulses and related waveforms – Terms, definitions and algorithms

IEC 60617, Graphical symbols for diagrams. Available at http://std.iec.ch/iec60617

IEC 60748-2, Semiconductor devices – Integrated circuits – Part 2: Digital integrated circuits

IEC 60749-26, Semiconductor devices – Mechanical and climatic test methods – Part 26:

Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM)

IEC 60749-27, Semiconductor devices – Mechanical and climatic test methods – Part 27:

Electrostatic discharge (ESD) sensitivity testing – Machine model (MM)

IEC TR 61000-4-1, Electromagnetic compatibility (EMC) – Part 4-1: Testing and measurement

techniques – Overview of the IEC 61000-4 series

IEC 61340-5-1, Electrostatics – Part 5-1: Protection of electronic devices from electrostatic

phenomena – General requirements

IEC 62884-1:2017, Measurement techniques of piezoelectric, dielectric, and electrostatic

oscillators – Part 1: Basic methods for the measurement
ISO 80000-1, Quantities and units – Part 1: General

Where any discrepancies occur for any reason, documents shall rank in the following order of

precedence:
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SIST EN 60679-1:2018
IEC 60679-1:2017 © IEC 2017 – 7 –
• detail specification;
• sectional specification;
• generic specification;

• any other international documents (for example of the IEC) to which reference is made.

The same order of precedence shall apply to equivalent national documents.
3 Terms, definitions and general information
3.1 General

Units, graphical symbols, letter symbols and terminology shall, wherever possible, be taken

from the following standards:
• IEC 60027;
• IEC 60050-561;
• IEC 60469;
• IEC 60617;
• ISO 80000-1.
3.2 Terms and definitions
For the purposes of this document, the following terms and definitions apply.

ISO and IEC maintain terminological databases for use in standardization at the following

addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.2.1
simple packaged crystal oscillator
SPXO

crystal controlled oscillator having no means of temperature control or compensation,

exhibiting a frequency/temperature characteristic determined substantially by the quartz

crystal resonator employed
[SOURCE: IEC 60050-561:2014, 561-03-30]
3.2.2
overtone crystal controlled oscillator

oscillator designed to operate with the controlling piezoelectric resonator functioning in a

specified mechanical overtone order of vibration

[SOURCE: IEC 60050-561:2014, 561-03-20, modified – The word "functioning" has been

added.]
3.2.3
crystal cut

orientation of the crystal element with respect to the crystallographic axes of the crystal

Note 1 to entry: It can be desirable to specify the cut (and hence the general form of the frequency/temperature

performance) of a crystal unit used in an oscillator application. The choice of the crystal cut will imply certain

attributes of the oscillator which may not otherwise appear in the detail specification.

[SOURCE: IEC 60050-561:2014, 561-03-04]
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SIST EN 60679-1:2018
– 8 – IEC 60679-1:2017 © IEC 2017
3.2.4
voltage controlled crystal oscillator
VCXO

crystal controlled oscillator, the frequency of which can be deviated or modulated according to

a specific relation, through application of a control voltage
[SOURCE: IEC 60050-561:2014, 561-03-41]
3.2.5
temperature compensated crystal oscillator
TCXO

crystal controlled oscillator whose frequency deviation due to temperature is reduced by

means of a compensation system, incorporated in the device
[SOURCE: IEC 60050-561:2014
...

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