High-level test description table for development of production test programs

Tabela visokonivojskega opisa preizkusov za razvoj proizvodnih preizkusnih programov

General Information

Status
Not Published
Publication Date
24-Jan-2027
Current Stage
4020 - Enquiry circulated - Enquiry
Start Date
04-Jul-2025
Due Date
30-Sep-2024
Completion Date
04-Jul-2025
Draft
prEN IEC 63569:2025
English language
14 pages
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Standards Content (Sample)


SLOVENSKI STANDARD
01-september-2025
Tabela visokonivojskega opisa preizkusov za razvoj proizvodnih preizkusnih
programov
High-level test description table for development of production test programs
Ta slovenski standard je istoveten z: prEN IEC 63569:2025
ICS:
25.040.01 Sistemi za avtomatizacijo v Industrial automation
industriji na splošno systems in general
35.240.50 Uporabniške rešitve IT v IT applications in industry
industriji
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

91/2040/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 63569 ED1
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2025-07-04 2025-09-26
SUPERSEDES DOCUMENTS:
91/1993/CD, 91/2031/CC
IEC TC 91 : ELECTRONICS ASSEMBLY TECHNOLOGY
SECRETARIAT: SECRETARY:
Japan Mr Osamu IKEDA
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):

ASPECTS CONCERNED:
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
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This document is still under study and subject to change. It should not be used for reference purposes.
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submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).

TITLE:
High-level test description table for development of production test programs

PROPOSED STABILITY DATE: 2031
NOTE FROM TC/SC OFFICERS:
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
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IEC CDV 63569 © IEC 2025 2 91/2040/CDV

2 CONTENTS
4 FOREWORD . 3
5 INTRODUCTION . 5
6 1 Scope . 6
7 2 Normative references . 6
8 3 Terms and definitions . 6
9 4 High-Level Test Description Table (HTD Table) . 6
10 4.1 Frame (Including Columns) . 8
11 4.1.1 First Frame . 9
12 4.1.2 Second Frame . 9
13 4.1.3 Third Frame . 10
14 4.1.4 Fourth Frame . 11
15 4.1.5 Fifth Frame . 11
16 4.1.6 Sixth Frame (Note) . 12
17 4.2 Row . 13
18 4.3 Cell . 13
19 Annex A Visualization of Test Hierarchy . 14
21 Figure 1 – Test Program Development Flow Using HTD Table . 7
22 Figure 2 – Sample of HTD Table . 8
24 Table A.1 – Example of a Summary Table of Individual Function Test Flow . 14
IEC CDV 63569 © IEC 2025 3 91/2040/CDV

27 INTERNATIONAL ELECTROTECHNICAL COMMISSION
28 ____________
30 HIGH-LEVEL TEST DESCRIPTION TABLE FOR DEVELOPMENT OF PRODUCTION
31 TEST PROGRAMS
33 FOREWORD
34 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national
35 electrotechnical committees (IEC National Committees). The object of IEC is to promote international co -operation on all
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41 the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between
42 the two organizations.
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60 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable
61 for the correct application of this publication.
62 9) IEC and ISO draw attention to the possibility that the implementation of this document may involve the use of (a) patent(s).
63 IEC and ISO take no position concerning the evidence, validity or applicability of any claimed patent rights in respect thereof.
64 As of the date of publication of this document, IEC and ISO had not received notice of (a) patent(s), which may be required
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66 may be obtained from the patent database available at https://patents.iec.ch and/or www.iso.org/patents. EC and ISO sh all
67 not be held responsible for identifying any or all such patent rights.
68 IEC 63569 has been prepared by subcommittee WG15: Design Automation, of IEC technical committee
69 TC19. Electronics assembly technology. It is an International Standard.
70 The text of this International Standard is based on the following documents:
Draft Report on voting
XX/XX/FDIS XX/XX/RVD
72 Full information on the voting for its approval can be found in the report on voting indicated in the above
73 table.
74 The language used for the development of this International Standard is English.
75 This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in accordance
76 with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available at

IEC CDV 63569 © IEC 2025 4 91/2040/CDV

77 www.iec.ch/members_experts/refdocs. The main document types developed by IEC are described in
78 greater detail at www.iec.ch/publications.
79 The committee has decided that the contents of this document will remain unchanged until the stability
80 date indicated on the IEC website under webstore.iec.ch in the data related to the specific document.
81 At this date, the document will be
82 • reconfirmed,
83 • withdrawn,
84 • replaced by a revised edition, or
85 • amended.
IEC CDV 63569 © IEC 2025 5 91/2040/CDV

87 INTRODUCTION
88 The test program development process is divided into two stages, an upstream design process to clarify
89 the flow of program development, and a detailed design process to embody and execute the program
90 development flow using a programming language. The detailed design process is generally a program
91 description process using the Program Development Environment.
92 The upstream design process is not explicitly described in the relevant standards in general, and it is
93 left to the test program developer to decide how to execute the upstream design process. As a result,
94 the upstream design process is rarely standardized. In addition, the tools used to execute the upstream
95 design process are not standardized. These two factors create an "invisible process" in the upstream
96 design process.
97 Large companies are aware that the degree of completion of the upstream design process greatly affects
98 the quality of the final program, and therefore, they invest significant resources and costs in the
99 upstream design process of test program development. However, the upstream design process of large
100 companies is unique, and large companies do not share upstream design techniques as standard design
101 techniques. Therefore, large companies also incur extra costs by redeveloping from scratch each time
102 they develop a test program. On the other hand, companies with inferior financial and technological
103 capabilities are often unable to devote sufficient resources to upstream design.
104 It would be very beneficial for any manufacturer, regardless of the size of the company, to be able to
105 use standardized mechanisms and tools to easily perform upstream design with a high degree of
106 completeness, because this standardization will contribute to improving the market quality of final
107 products and accelerating the time to market, To achieve international standardization in this area
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109 HIGH-LEVEL TEST DESCRIPTION TABLE FOR DEVELOPMENT OF PRODUCTION
110 TEST PROGRAMS
112 Scope
113 This standard specifies the method for High-Level Test Description Table (HTD Table) for development
114 of production test program. High-level test description technology is a test verification technology that
115 takes into account the various operating environments of electronic equipment and systems. It is a
116 technology to effectively deploy the process of test program design and development, which was
117 developed to accurately and efficiently conduct electronic equipment and system tests.
118 The upstream design of a test program for an automated test system (ATS) is a complex process that
119 involves Test Requirement Data, Unit Under Test (UUT) Data, Diagnostics Data, Prognostics Data, and
120 Program Development Environment. It is the most important process in the verification of system test
121 products. Standardization of the upstream design of test programs is in line with the efficiency
122 requirements of the testing field.
123 Normative references
124 There are no normative references in this document.
125 Terms and definitions
126 For the purposes of this document, the terms and definitions given in IEC61671(IEEE Std 1671) apply.
127 ISO and IEC maintain terminology databases for use in standardization at the following addresses:
128 • IEC Electropedia: available at https://www.electropedia.org/
129 • ISO Online browsing platform: available at https://www.iso.org/obp
130 High-Level Test Description Table (HTD Table)
131 The following four documents are necessary to prepare for developing test program as inputs.
132 1) Customer requirements
133 2) UUT Hardware specifications
134 3) Basic test specifications
135 4) Quality information
136 The test program for the development of the High-Level Test Program is described by a description
137 containing the rules to which the above four files relate, and HTD Table, a table of test requirements
138 described in a formal format.
139 The Test Requirement Description Standard for Hig
...

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