Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions

This part of IEC 61967 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). The object of this document is to describe general conditions in order to establish a uniform testing environment and to obtain a quantitative measure of RF disturbances from integrated circuits (IC). Critical parameters that are expected to influence the test results are described. Deviations from this document are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit. The applicable frequency range is described in each part of IEC 61967.

Integrierte Schaltungen - Messung von elektromagnetischen Aussendungen - Teil 1: Allgemeine Bedingungen und Definitionen

Circuits intégrés - Mesure des émissions électromagnétiques - Partie 1: Conditions générales et définitions

IEC 61967-1:2018 est disponible sous forme de IEC 61967-1:2018 RLV qui contient la Norme internationale et sa version Redline, illustrant les modifications du contenu technique depuis l'édition précédente.L'IEC 61967-1:2018 fournit des informations générales et des définitions sur la mesure des perturbations électromagnétiques conduites et rayonnées par les circuits intégrés. Elle décrit également les conditions de mesure, l'appareillage et le montage d'essai, ainsi que les procédures d'essai et le contenu des rapports d'essai. L'Annexe A fournit des tableaux de comparaison des méthodes d'essai permettant de choisir la ou les méthodes de mesure appropriées. Le présent document a pour objet de définir des conditions générales afin d'établir un environnement d'essai uniforme et d'obtenir une mesure quantitative des perturbations RF par les circuits intégrés (CI). Il décrit les paramètres fondamentaux supposés avoir une incidence sur les résultats des essais. Tout écart par rapport au présent document est consigné de manière explicite dans les rapports d'essai. Les résultats des mesures peuvent être utilisés notamment à des fins de comparaison. La mesure de la tension et du courant des émissions RF conduits ou des perturbations RF rayonnées provenant d'un circuit intégré dans des conditions contrôlées, fournit des informations sur les perturbations RF potentielles dans une application du circuit intégré. La gamme de fréquences applicable est décrite dans chaque partie de l'IEC 61967. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: - la gamme de fréquences 150 kHz à 1 GHz a été supprimée du titre; - un palier de fréquences au-dessus de 1 GHz a été ajouté dans le Tableau 1, le Tableau 2 et au Paragraphe 5.4; - le Tableau A.1 a été divisé en deux tableaux et l'IEC 61967-8 a été ajoutée au Tableau A.2 de l'Annexe A; - la description générale de la carte d'essai a été déplacée à l'Annexe D.

Integrirana vezja - Meritve elektromagnetnega sevanja - 1. del: Splošni pogoji in definicije (IEC 61967-1:2018)

Ta del standarda IEC 61967 podaja splošne informacije in definicije za meritve prevodnih ter sevanih elektromagnetnih motenj integriranih vezij. Podaja tudi opis merilnih pogojev, preskuševalne opreme in namestitve, pa tudi preskusnih postopkov ter vsebine poročil o preskusih. Primerjalne preglednice preskusnih metod so vključene v dodatku A za pomoč pri izbiri ustrezne metode meritve.
Cilj tega dokumenta je opisati splošne pogoje za zagotovitev enotnega preskusnega okolja in pridobitev rezultatov količinske meritve RF motenj iz integriranih vezij (IC). Opisani so kritični parametri, za katere se pričakuje, da bodo vplivali na rezultate preskusa.
Odkloni od tega dokumenta so izrecno navedeni v poročilu o posameznem preskusu. Rezultate meritev je mogoče uporabiti za primerjavo ali za druge namene.
Meritev napetosti in toka prevodnih RF emisij ali sevanih RF motenj, do katerih pride v integriranem vezju pod nadzorovanimi pogoji, zagotavlja informacije o potencialnih RF motnjah pri uporabi integriranega vezja.
Razpon frekvence, ki ga je treba uporabiti, je opisan v posameznih delih standarda IEC 61967.

General Information

Status
Published
Publication Date
14-Feb-2019
Withdrawal Date
15-Jan-2022
Current Stage
6060 - Document made available - Publishing
Start Date
15-Feb-2019
Completion Date
15-Feb-2019

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SLOVENSKI STANDARD
01-april-2019
1DGRPHãþD
SIST EN 61967-1:2005
Integrirana vezja - Meritve elektromagnetnega sevanja - 1. del: Splošni pogoji in
definicije (IEC 61967-1:2018)
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General
conditions and definitions (IEC 61967-1:2018)
Integrierte Schaltungen - Messung von elektromagnetischen Aussendungen - Teil 1:
Allgemeine Bedingungen und Definitionen (IEC 61967-1:2018)
Circuits intégrés - Mesure des émissions électromagnétiques - Partie 1: Conditions
générales et définitions (IEC 61967-1:2018)
Ta slovenski standard je istoveten z: EN IEC 61967-1:2019
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 61967-1

NORME EUROPÉENNE
EUROPÄISCHE NORM
February 2019
ICS 31.200 Supersedes EN 61967-1:2002
English Version
Integrated circuits - Measurement of electromagnetic emissions -
Part 1: General conditions and definitions
(IEC 61967-1:2018)
Circuits intégrés - Mesure des émissions Integrierte Schaltungen - Messung von
électromagnétiques - Partie 1: Conditions générales et elektromagnetischen Aussendungen - Teil 1: Allgemeine
définitions Bedingungen und Definitionen
(IEC 61967-1:2018) (IEC 61967-1:2018)
This European Standard was approved by CENELEC on 2019-01-16. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2019 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 61967-1:2019 E

European foreword
The text of document 47A/1062/FDIS, future edition 2 of IEC 61967-1, prepared by SC 47A
"Integrated circuits" of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC
parallel vote and approved by CENELEC as EN IEC 61967-1:2019.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2019-10-16
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2022-01-16
document have to be withdrawn
This document supersedes EN 61967-1:2002.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 61967-1:2018 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards
indicated:
IEC 61967-2 NOTE Harmonized as EN 61967-2
IEC 61967-4 NOTE Harmonized as EN 61967-4
IEC 61967-5 NOTE Harmonized as EN 61967-5
IEC 61967-6 NOTE Harmonized as EN 61967-6
IEC 61967-8 NOTE Harmonized as EN 61967-8
IEC 62132-1 NOTE Harmonized as EN 62132-1
CISPR 25:2008 NOTE Harmonized as EN 55025:2008 (not modified)

Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
CISPR 16-1-1 - Specification for radio disturbance and EN 55016-1-1 -
immunity measuring apparatus
and Methods - Part 1-1: Radio disturbance and
immunity measuring apparatus - Measuring
apparatus
IEC 61967-1 ®
Edition 2.0 2018-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Integrated circuits – Measurement of electromagnetic emissions –
Part 1: General conditions and definitions
Circuits intégrés – Mesure des émissions électromagnétiques –
Partie 1: Conditions générales et définitions
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.200 ISBN 978-2-8322-6284-9
– 2 – IEC 61967-1:2018 © IEC 2018
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Test conditions . 10
4.1 General . 10
4.2 Ambient conditions. 10
4.2.1 General . 10
4.2.2 Ambient temperature . 11
4.2.3 Ambient RF field strength . 11
4.2.4 Other ambient conditions . 11
4.2.5 IC stability over time . 11
5 Test equipment . 11
5.1 General . 11
5.2 Shielding . 11
5.3 RF measuring instrument . 11
5.3.1 General . 11
5.3.2 Measuring receiver . 11
5.3.3 Spectrum analyser . 12
5.3.4 Other RBW for narrowband emissions . 12
5.3.5 Emission type, detector type and sweep speed . 12
5.3.6 Video bandwidth . 12
5.3.7 Verification of calibration for the RF measuring instrument . 12
5.4 Frequency range . 13
5.5 Preamplifier or attenuator . 13
5.6 System gain . 13
5.7 Other components . 13
6 Test set-up . 13
6.1 General . 13
6.2 Test circuit board . 13
6.3 IC pin loading. 13
6.4 Power supply requirements – Test board power supply . 14
6.5 IC specific considerations . 14
6.5.1 IC supply voltage . 14
6.5.2 IC decoupling . 14
6.5.3 Activity of IC . 14
6.5.4 Guidelines regarding IC operation . 14
7 Test procedure . 15
7.1 Ambient RF noise check . 15
7.2 Operational check . 15
7.3 Specific procedures . 15
8 Test report . 15
8.1 General . 15
8.2 Ambient RF noise . 15
8.3 Description of device . 15
8.4 Description of set-up . 16

IEC 61967-1:2018 © IEC 2018 – 3 –
8.5 Description of software . 16
8.6 Data presentation . 16
8.6.1 General . 16
8.6.2 Graphical presentation . 16
8.6.3 Measurement data . 16
8.6.4 Data processing . 16
8.7 RF emission limits . 16
8.8 Interpretation of results . 16
8.8.1 Comparison between IC(s) using the same test method . 16
8.8.2 Comparison between different test methods . 16
8.8.3 Correlation to module test methods . 16
Annex A (informative) Test method comparison tables . 17
Annex B (informative) Flow chart of a counter test code . 19
Annex C (informative) Description of worst-case application software . 20
Annex D (informative) General test board description . 21
D.1 General . 21
D.2 Board description – Mechanical . 21
D.3 Board description – Electrical . 21
D.4 Ground planes . 21
D.5 Package pins . 22
D.5.1 General .
...

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