prEN IEC 62228-7:2025
(Main)Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
Integrierte Schaltungen - Bewertung der elektromagnetischen Verträglichkeit von Sende-Empfangsgeräten – Teil 7: CXPI-Sende-Empfangsgeräte
Circuits intégrés - évaluation de la CEM des émetteurs-récepteurs - Partie 7: émetteurs-récepteurs CXPI
Integrirana vezja - Vrednotenje elektromagnetne združljivosti (EMC) oddajnikov-sprejemnikov - 7. del: Oddajniki-sprejemniki CXPI
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Standards Content (Sample)
SLOVENSKI STANDARD
01-april-2025
Integrirana vezja - Vrednotenje elektromagnetne združljivosti (EMC) oddajnikov-
sprejemnikov - 7. del: Oddajniki-sprejemniki CXPI
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
Integrierte Schaltungen - Bewertung der elektromagnetischen Verträglichkeit von Sende-
Empfangsgeräten – Teil 7: CXPI-Sende-Empfangsgeräte
Circuits intégrés - évaluation de la CEM des émetteurs-récepteurs - Partie 7: émetteurs-
récepteurs CXPI
Ta slovenski standard je istoveten z: prEN IEC 62228-7:2025
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.01 Elektromagnetna združljivost Electromagnetic compatibility
na splošno in general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
47A/1180/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62228-7 ED2
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2025-02-07 2025-05-02
SUPERSEDES DOCUMENTS:
47A/1166/CD, 47A/1175A/CC
IEC SC 47A : INTEGRATED CIRCUITS
SECRETARIAT: SECRETARY:
Japan Mr Yoshinori FUKUBA
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):
ASPECTS CONCERNED:
Electromagnetic Compatibility
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
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the final stage for submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).
TITLE:
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
PROPOSED STABILITY DATE: 2030
NOTE FROM TC/SC OFFICERS:
47A/1175A/CC of 47A/1166/CD were reviewed and addressed all comments, and SC47A decided next
step to be CDV on the SC47A plenary meeting held at 2024-11-28(47A/1177/RM Decision 47A-2024-
08).
download this electronic file, to make a copy and to print out the content for the sole purpose of preparing National
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IEC CDV 62228-7 © IEC 2024 – 2 – 47A/1180/CDV
1 CONTENTS
3 FOREWORD . 6
4 1 Scope . 8
5 2 Normative references . 8
6 3 Terms, definitions and abbreviated terms . 9
7 3.1 Terms and definitions. 9
8 3.2 Abbreviated terms . 9
9 4 General . 10
10 5 Test and operating conditions . 12
11 5.1 Supply and ambient conditions . 12
12 5.2 Test operation modes . 12
13 5.3 Test configuration . 12
14 5.3.1 General test configuration for functional test . 12
15 5.3.2 General test configuration for unpowered ESD test . 13
16 5.3.3 Coupling ports and coupling networks for functional tests . 14
17 5.3.4 Coupling ports and coupling networks for unpowered ESD tests . 15
18 5.3.5 Power supply with decoupling network . 16
19 5.4 Test signals . 16
20 5.4.1 General . 16
21 5.4.2 Test signals for normal operation mode . 16
22 5.4.3 Test signal for wake-up from sleep mode . 19
23 5.5 Evaluation criteria . 19
24 5.5.1 General . 19
25 5.5.2 Evaluation criteria in functional operation modes during exposure to
26 disturbances . 19
27 5.5.3 Evaluation criteria in unpowered condition after exposure to
28 disturbances . 21
29 5.5.4 Status classes . 22
30 6 Test and measurement . 22
31 6.1 Emission of RF disturbances . 22
32 6.1.1 Test method . 22
33 6.1.2 Test setup . 22
34 6.1.3 Test procedure and parameters . 23
35 6.2 Immunity to RF disturbances . 23
36 6.2.1 Test method . 23
37 6.2.2 Test setup . 24
38 6.2.3 Test procedure and parameters . 25
39 6.3 Immunity to impulses . 27
40 6.3.1 Test method . 27
41 6.3.2 Test setup . 27
42 6.3.3 Test procedure and parameters . 28
43 6.4 Electrostatic discharge (ESD) . 31
44 6.4.1 Test method . 31
45 6.4.2 Test setup . 31
46 6.4.3 Test procedure and parameters . 33
47 7 Test report . 33
IEC CDV 62228-7 © IEC 2024 – 3 – 47A/1180/CDV
48 Annex A (normative) CXPI test circuits . 34
49 A.1 General . 34
50 A.2 CXPI test circuit for functional tests on standard type-A CXPI transceiver ICs . 34
51 A.3 CXPI test circuit for functional tests on standard type-B CXPI transceiver ICs . 37
52 A.4 CXPI test circuit for functional tests on ICs with embedded CXPI transceiver . 39
53 A.5 CXPI test circuit for unpowered ESD test on a standard type-A CXPI
54 transceiver IC . 42
55 A.6 CXPI test circuit for unpowered ESD test on a standard type-B CXPI
56 transceiver IC . 42
57 Annex B (normative) Test circuit boards . 44
58 B.1 Test circuit board for functional tests . 44
59 B.2 ESD test . 44
60 Annex C (informative) Examples for test limits for CXPI transceiver in automotive
61 application . 46
62 C.1 General . 46
63 C.2 Emission of RF disturbances . 46
64 C.3 Immunity to RF disturbances . 47
65 C.4 Immunity to impulse . 48
66 C.5 Electrostatic discharge (ESD) . 49
67 Annex D (informative) Example of setting for test signals . 50
68 Annex E (informative) Points to note for impulse immunity measurement for functional
69 status class AIC . 52
70 E.1 General . 52
71 E.2 Points to note when testing Pulse 1 . 52
72 Bibliography . 54
74 Figure 1 – PHY sub-layers overview and CXPI transceiver types . 11
75 Figure 2 – General test configuration for tests in functional operation modes . 13
76 Figure 3 – General test configuration for unpowered ESD test . 14
77 Figure 4 – Coupling ports and networks for functional tests . 14
78 Figure 5 – Coupling ports and networks for unpowered ESD tests . 15
79 Figure 6 – Principal drawing of the maximum deviation in the I-V characteristic . 21
80 Figure 7 – Test setup for measurement of RF disturbances . 22
81 Figure 8 – Test setup for DPI tests . 24
82 Figure 9 – Test setup for impulse immunity tests . 28
83 Figure 10 – Test setup for direct ESD tests . 32
84 Figure A.1 – General drawing of the circuit diagram of the test network for standard
85 type-A CXPI transceiver ICs for functional tests . 36
86 Figure A.2 – General drawing of the circuit diagram of the test network for standard
87 type-B CXPI transceiver ICs for functional tests . 38
88 Figure A.3 – General drawing of the circuit diagram of the test network for ICs with
89 embedded CXPI transceiver for functional tests using standard type-A CXPI
90 transceiver IC as Node1 . 40
91 Figure A.4 – General drawing of the circuit diagram of the test network for ICs with
92 embedded CXPI transceiver for functional tests using IC with embedded CXPI
93 transceiver as Node1 . 41
94 Figure A.5 – A general drawing of the test circuit diagram for testing direct ESD of
95 CXPI transceiver in unpowered mode . 42
IEC CDV 62228-7 © IEC 2024 – 4 – 47A/1180/CDV
96 Figure A.6 – A general drawing of the test circuit diagram for testing direct ESD of
97 CXPI standard Type-B transceiver in unpowered mode . 43
98 Figure B.1 – Example of IC interconnections of CXPI signal . 44
99 Figure B.2 – Example of ESD test board for CXPI transceiver ICs . 45
100 Figure C.1 – Example of limits for RF emission – CXPI . 46
101 Figure C.2 – Example of limits for RF emission - VBAT .
...
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