ETSI EN 300 417-6-2 V1.1.1 (2000-09)

Transmission and Multiplexing (TM); Generic requirements of transport functionality of equipment; Part 6-2: Synchronization layer functions; Implementation Conformance Statement (ICS) proforma specification

DEN/TM-01015-6-2

Prenos in multipleksiranje (TM) – Generične zahteve za prenosno funkcionalnost opreme – 6-2. del: Funkcije sinhronizacijske plasti – Proforma specifikacija izjave o skladnosti izvedbe (ICS)

General Information

• Status: Published
• Publication Date: 20-Sep-2000
• Technical Committee: TM 1 - TM Core networks, fibres and cables
• Current Stage: 12 - Completion
• Due Date: 25-Aug-2000
• Completion Date: 21-Sep-2000
• Ref Project: SIST EN 300 417-6-2 V1.1.1:2003 - Transmission and Multiplexing (TM); Generic requirements of transport functionality of equipment; Part 6-2: Synchronization layer functions; Implementation Conformance Statement (ICS) proforma specification

Standards Content (Sample)

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.XQNFLRQDOQRVWTransmission and Multiplexing (TM); Generic requirements of transport functionality of equipment; Part 6-2: Synchronization layer functions; Implementation Conformance Statement (ICS) proforma specification33.040.20Prenosni sistemTransmission systemsICS:Ta slovenski standard je istoveten z:EN 300 417-6-2 Version 1.1.1SIST EN 300 417-6-2 V1.1.1:2003en01-december-2003SIST EN 300 417-6-2 V1.1.1:2003SLOVENSKI
STANDARD



SIST EN 300 417-6-2 V1.1.1:2003



ETSIEN300417-6-2V1.1.1(2000-09)EuropeanStandard(Telecommunicationsseries)TransmissionandMultiplexing(TM);Genericrequirementsoftransportfunctionalityofequipment;Part6-2:Synchronizationlayerfunctions;ImplementationConformanceStatement(ICS)proformaspecificationSIST EN 300 417-6-2 V1.1.1:2003



ETSIETSIEN300417-6-2V1.1.1(2000-09)2ReferenceDEN/TM-01015-6-2KeywordsArchitecture,SDH,testingETSI650RoutedesLuciolesF-06921SophiaAntipolisCedex-FRANCETel.:[phone]Fax:[phone]SiretN°34862356200017-NAF742CAssociationàbutnonlucratifenregistréeàlaSous-PréfecturedeGrasse(06)N°7803/88ImportantnoticeIndividualcopiesofthepresentdocumentcanbedownloadedfrom:http://www.etsi.orgThepresentdocumentmaybemadeavailableinmorethanoneelectronicversionorinprint.Inanycaseofexistingorperceiveddifferenceincontentsbetweensuchversions,thereferenceversionisthePortableDocumentFormat(PDF).Incaseofdispute,thereferenceshallbetheprintingonETSIprintersofthePDFversionkeptonaspecificnetworkdrivewithinETSISecretariat.Usersofthepresentdocumentshouldbeawarethatthedocumentmaybesubjecttorevisionorchangeofstatus.InformationonthecurrentstatusofthisandotherETSIdocumentsisavailableathttp://www.etsi.org/tb/status/Ifyoufinderrorsinthepresentdocument,sendyourcommentto:[e-mail]opartmaybereproducedexceptasauthorizedbywrittenpermission.Thecopyrightandtheforegoingrestrictionextendtoreproductioninallmedia.©EuropeanTelecommunicationsStandardsInstitute2000.Allrightsreserved.SIST EN 300 417-6-2 V1.1.1:2003



ETSIETSIEN300417-6-2V1.1.1(2000-09)3ContentsIntellectualPropertyRights.7Foreword.7Introduction.81Scope.92References.93Definitionsandabbreviations.103.1Definitions.103.2Abbreviations.104ConformancetothisICSproformaspecification.11AnnexA(normative):ICSproformaforEN300417-6-1.12A.1GuidanceforcompletingtheICSproforma.12A.1.1Purposesandstructure.12A.1.2Abbreviationsandconventions.12A.1.3InstructionsforcompletingtheICSproforma.13AnnexB(normative):ICSproformaforSD(SynchronizationDistribution)Layer.14B.1Identificationoftheimplementation.14B.1.1Dateofthestatement.14B.1.2ImplementationUnderTest(IUT)identification.14B.1.3SystemUnderTest(SUT)identification.15B.1.4Productsupplier.15B.1.5Client.16B.1.6ICScontactperson.16B.2IdentificationoftheEN.16B.3GlobalstatementofconformanceofSDLayer.17B.4SDLayerFunctions.17B.4.0SDLayerDescription.17B.4.0.1CharacteristicInformation.18B.4.0.2Adaptedinformation.18B.4.1SDConnectionfunction.18B.4.1.1Managementinformation(SD_C).18B.4.1.2Processes(SD_C).18B.4.1.3Consequentactions(SD_C).19B.4.2SDTrailTerminationfunctions.19B.4.2.1SDTrailTerminationSourcefunctionSD_TT_So.19B.4.2.1.1Processes(SD_TT_So).19B.4.2.1.2Consequentactions(SD_TT_So).19B.4.2.2SDtrailTerminationSinkfunctionSD_TT_Sk.20B.4.2.2.1Managementinformation(SD_TT_Sk).20B.4.2.2.2Processes(SD_TT_Sk).20B.4.2.2.3ConsequentActions(SD_TT_Sk).21B.4.2.2.4DefectCorrelation(SD_TT_Sk).22B.4.3SDAdaptationfunctions.22B.4.3.1SDlayertoNSlayerSECqualityAdaptationSourcefunctionSD/NS-SEC_A_So.22B.4.3.1.1Managementinformation(SD/NS-SEC_A_So).22B.4.3.1.2Processes(SD/NS-SEC_A_So).23B.4.3.1.3Defects(SD/NS-SEC_A_So).27B.4.3.1.4DefectCorrelation(SD/NS-SEC_A_So).28B.4.3.2SDlayertoNSlayerSECqualityAdaptationSinkfunctionSD/NS-SEC_A_Sk.28SIST EN 300 417-6-2 V1.1.1:2003



ETSIETSIEN300417-6-2V1.1.1(2000-09)4B.4.3.2.1Processes(SD/NS-SEC_A_Sk).28B.4.3.2.2ConsequentActions(SD/NS-SEC_A_Sk).28B.4.3.3SDlayertoNSlayerSSUqualityAdaptationSourcefunctionSD/NS-SSU_A_So.28B.4.3.4SDlayertoNSlayerSSUqualityAdaptationSinkfunctionSD/NS-SSU_A_Sk.29B.4.3.5SDlayertoNSlayerPRCqualityAdaptationSourcefunctionSD/NS-PRC_A_So.29B.4.3.6SDlayertoNSlayerAdaptationSourcefunctionSD/NS_A_So.29B.4.3.6.1Managementinformation(SD/NS_A_So).29B.4.3.6.2Processes(SD/NS_A_So).29B.4.3.6.3Defects(SD/NS_A_So).30B.4.3.6.4ConsequentActions(SD/NS_A_So).30B.4.3.6.5DefectCorrelation(SD/NS_A_So).30AnnexC(normative):ICSproformaforNS(NetworkSynchronization)Layer.31C.1Identificationoftheimplementation.31C.1.1Dateofthestatement.31C.1.2ImplementationUnderTest(IUT)identification.31C.1.3SystemUnderTest(SUT)identification.32C.1.4Productsupplier.32C.1.5Client.33C.1.6ICScontactperson.33C.2IdentificationoftheEN.33C.3GlobalstatementofconformanceofNSLayer.34C.4NSLayerFunctions.34C.4.0NSLayerDescription.34C.4.0.1CharacteristicInformation.34C.4.1NS_ConnectionfunctionsNS_C.34C.4.1.1Managementinformation.35C.4.1.2Processes(NS_C).36C.4.1.3ConsequentActions(NS_C).38C.4.2SelectionAlgorithmandprocesses.39C.4.2.1GenericsandselectionProcesses.39C.4.2.2Prioritiesassignment.39C.4.2.3Externalcommands.40C.4.2.4AutomaticSelectionprocess.42AnnexD(normative):ICSproformaforTransportLayer(TL)toSDlayeradaptationfunctions.43D.1Identificationoftheimplementation.43D.1.1Dateofthestatement.43D.1.2ImplementationUnderTest(IUT)identification.43D.1.3SystemUnderTest(SUT)identification.44D.1.4Productsupplier.44D.1.5Client.45D.1.6ICScontactperson.45D.2IdentificationoftheEN.45D.3GlobalstatementofconformanceofTLtoSDlayeradaptationfunctions.46D.4TLtoSDLayerAdaptationFunctions.46D.4.0TLtoSDLayerAdaptationFunctionsDescription.46D.4.1STM-1MultiplexSectionAdaptationfunctions.47D.4.1.1STM-1multiplexsectiontoSDLayerAdaptationSourceMS1/SD_A_So.47D.4.1.1.1ManagementInformation(MS1/SD_A_So).47D.4.1.1.2Processes(MS1/SD_A_So).47D.4.1.2STM-1multiplexsectiontoSDLayerAdaptationSinkMS1/SD_A_Sk.48D.4.1.2.1ManagementInformation(MS1/SD_A_Sk).48D.4.1.2.2Processes(MS1/SD_A_Sk).48D.4.1.2.3ConsequentActions(MS1/SD_A_Sk).49D.4.2STM-4MultiplexSectionAdaptationfunctions.49SIST EN 300 417-6-2 V1.1.1:2003



ETSIETSIEN300417-6-2V1.1.1(2000-09)5D.4.2.1STM-4multiplexsectiontoSDLayerAdaptationSourceMS4/SD_A_So.49D.4.2.1.1ManagementInformation(MS4/SD_A_So).49D.4.2.1.2Processes(MS4/SD_A_So).50D.4.2.2STM-4multiplexsectiontoSDLayerAdaptationSinkMS4/SD_A_Sk.50D.4.2.2.1ManagementInformation(MS4/SD_A_Sk).50D.4.2.2.2Processes(MS4/SD_A_Sk).51D.4.2.2.3ConsequentActions(MS4/SD_A_Sk).52D.4.3STM-16MultiplexSectionAdaptationfunctions.52D.4.3.1STM-16multiplexsectiontoSDLayerAdaptationSourceMS16/SD_A_So.52D.4.3.1.1ManagementInformation(MS16/SD_A_So).52D.4.3.1.2Processes(MS16/SD_A_So).52D.4.3.2STM-16multiplexsectiontoSDLayerAdaptationSinkMS16/SD_A_Sk.53D.4.3.2.1ManagementInformation(MS16/SD_A_Sk).53D.4.3.2.2Processes(MS16/SD_A_Sk).53D.4.3.2.3ConsequentActions(MS16/SD_A_Sk).54D.4.4P31sAdaptationFunctions.55D.4.4.1P31stoSDAdaptationSourceP31s/SD_A_So.55D.4.4.1.1Managementinformation(P31s/SD_A_So).55D.4.4.1.2Processes(P31s/SD_A_So).55D.4.4.2P31stoSDAdaptationSinkP31s/SD_A_Sk.57D.4.4.2.1Managementinformation(P31s/SD_A_Sk).57D.4.4.2.2Processes(P31s/SD_A_Sk).58D.4.4.2.3Defects(P31s/SD_A_Sk).60D.4.4.2.4ConsequentActions(P31s/SD_A_Sk).61D.4.4.2.5DefectCorrelation(P31s/SD_A_Sk).61D.4.5P4sAdaptationFunctions.61D.4.5.1P4stoSDAdaptationSourceP4s/SD_A_So.61D.4.5.1.1Managementinformation(P4s/SD_A_So).61D.4.5.1.2Processes(P4s/SD_A_So).62D.4.5.2P4stoSDAdaptationSinkP4s/SD_A_Sk.64D.4.5.2.1Managementinformation(P4s/SD_A_Sk).64D.4.5.2.2Processes(P4s/SD_A_Sk).65D.4.5.2.3Defects(P4s/SD_A_Sk).67D.4.5.2.4Consequentactions(P4s/SD_A_Sk).68D.4.5.2.5Defectcorrelation(P4s/SD_A_Sk).68D.4.6P12sLayerAdaptationFunctions.68D.4.6.1P12sLayerAdaptationSourceFunctions.68D.4.6.1.1Type1P12stoSDAdaptationSourceforstationclockoutputsupportingSSMP12s/SD-sc-1_A_So.68D.4.6.1.1.1Managementinformation(P12s/SD-sc-1_A_So).68D.4.6.1.1.2Processes(P12s/SD-sc-1_A_So).69D.4.6.1.1.3Consequentactions(P12s/SD-sc-1_A_So).70D.4.6.1.2Type2P12stoSDAdaptationSourceforstationclockoutputportnotsupportingSSMP12s/SD-sc-2_A_So.71D.4.6.1.2.1Managementinformation(P12s/SD-sc-2_A_So).71D.4.6.1.2.2Processes(P12s/SD-sc-2_A_So).71D.4.6.1.2.3Consequentactions(P12s/SD-sc-2_A_So).72D.4.6.2P12sLayerAdaptationSinkFunctions.72D.4.6.2.1Type1P12stoSDAdaptationSinkfortrafficinputportP12s/SD-tf_A_Sk.72D.4.6.2.1.1Managementinformation(P12s/SD-tf_A_Sk).72D.4.6.2.1.2Processes(P12s/SD-tf_A_Sk).73D.4.6.2.1.3Consequentactions(P12s/SD-tf_A_Sk).74D.4.6.2.2Type2P12stoSDAdaptationSinkforstationclockinputportP12s/SD-sc_A_Sk.74D.4.6.2.2.1Managementinformation(P12s/SD-sc_A_Sk).74D.4.6.2.2.2Processes(P12s/SD-sc_A_Sk).74D.4.6.2.2.3Consequentactions(P12s/SD-sc_A_Sk).76D.4.7T12LayerAdaptationFunctions.76D.4.7.1T12toSDAdaptationSourceT12/SD_A_So.76D.4.7.1.1ManagementInformation(T12/SD_A_So).76D.4.7.1.2Processes(T12/SD_A_So).76D.4.7.1.3Consequentactions(T12/SD_A_So).77D.4.7.2T12toSDAdaptationSinkT12/SD_A_Sk.77SIST EN 300 417-6-2 V1.1.1:2003



ETSIETSIEN300417-6-2V1.1.1(2000-09)6D.4.7.2.1Managementinformation(T12/SD_A_Sk).77D.4.7.2.2Processes(T12/SD_A_Sk).78D.4.7.2.3Consequentactions(T12/SD_A_Sk).78AnnexE(normative):ICSproformaforEquipmentclocktoTransportLayersadaptationfunctions.79E.1Identificationoftheimplementation.79E.1.1Dateofthestatement.79E.1.2ImplementationUnderTest(IUT)identification.79E.1.3SystemUnderTest(SUT)identification.80E.1.4Productsupplier.80E.1.5Client.81E.1.6ICScontactperson.81E.2IdentificationoftheEN.81E.3GlobalstatementofconformanceofEquipmentclocktoTransportLayersadaptationfunctions.82E.4EquipmentclocktoTransportLayersAdaptationFunctions.82E.4.0EquipmentclocktoTransportLayersAdaptationFunctionsDescription.82E.4.1STM-Nlayer.83E.4.1.1STM-1LayerClockAdaptationSource.83E.4.1.1.1Processes(MS1-LC_A_So).83E.4.1.2STM-4LayerClockAdaptationSourceMS4-LC_A_So.83E.4.1.2.1Processes(MS4-LC_A_So).84E.4.1.3STM-16LayerClockAdaptationSourceMS16-LC_A_So.84E.4.1.3.1Processes(MS16-LC_A_So).84E.4.2VClayers.85E.4.2.1VC-4LayerClockAdaptationSourceS4-LC_A_So.85E.4.2.1.1Processes(S4-LC_A_So).85E.4.2.2VC-3LayerClockAdaptationSourceS3-LC_A_So.85E.4.2.2.1Processes(S3-LC_A_So).85E.4.2.3VC-2LayerClockAdaptationSourceS2-LC_A_So.86E.4.2.3.1Processes(S2-LC_A_So).86E.4.2.4VC-12LayerClockAdaptationSourceS12-LC_A_So.86E.4.2.4.1Processes(S12-LC_A_So).
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