IEC 61169-1-5:2022
(Main)Radio frequency connectors - Part 1-5: Electrical test methods - Rise time degradation
Radio frequency connectors - Part 1-5: Electrical test methods - Rise time degradation
IEC 61169-1-5:2022 provides test methods for the rise time degradation of radio frequency (RF) connector.
This document is applicable to triaxial and other radio frequency connectors.
Connecteurs pour fréquences radioélectriques - Partie 1-5: Méthodes d’essai électrique - Dégradation du temps de montée
IEC 61169-1-5:2022 fournit des méthodes d’essai pour la dégradation du temps de montée d’un connecteur pour fréquences radioélectriques (RF, radio frequency).
Le présent document s’applique aux connecteurs triaxiaux et autres connecteurs pour fréquences radioélectriques.
General Information
Standards Content (sample)
IEC 61169-1-5
Edition 1.0 2022-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Radio frequency connectors –
Part 1-5: Electrical test methods – Rise time degradation
Connecteurs pour fréquences radioélectriques –
Partie 1-5: Méthodes d’essai électrique – Dégradation du temps de montée
IEC 61169-1-5:2022-02(en-fr)
---------------------- Page: 1 ----------------------
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IEC 61169-1-5
Edition 1.0 2022-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Radio frequency connectors –
Part 1-5: Electrical test methods – Rise time degradation
Connecteurs pour fréquences radioélectriques –
Partie 1-5: Méthodes d’essai électrique – Dégradation du temps de montée
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.120.10 ISBN 978-2-8322-1074-1
Warning! Make sure that you obtained this publication from an authorized distributor.
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® Registered trademark of the International Electrotechnical CommissionMarque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 3 ----------------------
– 2 – IEC 61169-1-5:2022 © IEC 2022
CONTENTS
FOREWORD ........................................................................................................................... 3
1 Scope .............................................................................................................................. 5
2 Normative references ...................................................................................................... 5
3 Terms and definitions ...................................................................................................... 5
4 Test principle ................................................................................................................... 6
5 Measurement system ....................................................................................................... 7
5.1 General ................................................................................................................... 7
5.2 Equipment .............................................................................................................. 8
6 Preparation of test sample ............................................................................................... 8
6.1 Insertion method ..................................................................................................... 8
6.2 Reference method .................................................................................................. 8
7 Test procedure ................................................................................................................ 9
7.1 General ................................................................................................................... 9
7.2 Insertion method ..................................................................................................... 9
7.3 Reference method ................................................................................................ 10
7.4 Calculation of test data ......................................................................................... 11
8 Failure criterion ............................................................................................................. 11
9 Information to be given in the relevant specification ....................................................... 11
10 Test report ..................................................................................................................... 12
Figure 1 – The equivalent distribution parameter of the sample under test .............................. 6
Figure 2 – Test principle ......................................................................................................... 7
Figure 3 – Preparation of cable RF connector test sample (insertion method) ......................... 8
Figure 4 – Preparation of cable RF connector test sample (reference method) ........................ 9
Figure 5 – Insertion method .................................................................................................. 10
Figure 6 – Reference method ................................................................................................ 11
Table 1 – Measurement system rise time ................................................................................ 7
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INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
RADIO FREQUENCY CONNECTORS –
Part 1-5: Electrical test methods – Rise time degradation
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 61169-1-5 has been prepared by subcommittee 46F: RF and microwave passivecomponents, of IEC technical committee 46: Cables, wires, waveguides, RF connectors, RF
and microwave passive components and accessories. It is an International Standard.
The text of this International Standard is based on the following documents:Draft Report on voting
46F/592/FDIS 46F/608/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.The language used for the development of this International Standard is English.
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– 4 – IEC 61169-1-5:2022 © IEC 2022
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/standardsdev/publications.A list of all parts of the IEC 61169 series, under the general title Radio frequency connectors
can be found on the IEC website.The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates that it
contains colours which are considered to be useful for the correct understanding of its
contents. Users should therefore print this document using a colour printer.---------------------- Page: 6 ----------------------
IEC 61169-1-5:2022 © IEC 2022 – 5 –
RADIO FREQUENCY CONNECTORS –
Part 1-5: Electrical test methods – Rise time degradation
1 Scope
This part of IEC 61169 provides test methods for the rise time degradation of radio frequency
(RF) connector.This document is applicable to triaxial and other radio frequency connectors.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.IEC 61169-1, Radio frequency connectors – Part 1: Generic specification – General
requirements and measuring methods3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 61169-1 and the
following apply.ISO and IEC maintain terminological databases for use in standardization at the following
addresses:• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1
rise time degradation
increase in rise time to a theoretically perfect (zero rise time) voltage step when the sample is
inserted in the transmission pathNote 1 to entry: In general, the formula used to calculate rise time degradation from 20 % to 80 % levels is as
follows:(1)
t (tt− )
3 21
where
t is the rise time degradation;
t is the measured rise time when the sample is inserted in the transmission path;
t is the measurement system rise time.---------------------- Page: 7 ----------------------
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3.2
single-ended measurement
measurement method in which the rise time degradation is measured in a single channel formed
by a signal line and the ground line3.3
differential measurement
measurement method in which the rise time degradation is measured in two channels formed
by two signal lines and the ground line(s) and the signals transmitted to the two signal lines are
differential signals4 Test principle
When a pulse signal with a transient rise time is connected to the input end of the sample under
test and is transmitted to the output end, due to the nonlinear characteristic of the measured
sample, the rise time of the pulse signal measured at the output end is increased compared
with the rise time of the pulse signal at the input end. The cause of this phenomenon is the
delay caused by the distributed inductance and distributed capacitance of the sample under
test. See Figure 1.Figure 1 – The equivalent distribution parameter of the sample under test
The test theory of rising time degradation generated by the pulse signal passing through the
sample under test is shown in Figure 2. Unless otherwise specified in the relevant specification,
rise time is measured from 20 % to 80 % levels. The rise time degradation is calculated
according to Formula (1).---------------------- Page: 8 ----------------------
IEC 61169-1-5:2022 © IEC 2022 – 7 –
a) The input end rise time (measurement system rise time)
b) The output end rise time (measured rise time with sample)
Figure 2 – Test principle
5 Measurement system
5.1 General
Unless otherwise specified, the entire measurement system (including test equipment, test
fixture, etc.) shall meet the following requirements:a) The rise time shall be as short as possible and shall be less than or equal to 70 % of the
rise time measured with the sample.b) The rise time shall conform to the requirements of Table 1.
Table 1 – Measurement system rise time
Expected rise time degradation of the Measurement system rise time
connector pair under test
ps ps
≤100
100~250
≤250
250~500
≤500
500~1 000
>1 000 ≤1 000
c) The specimen environment impedance (this impedance is a result of transmission lines,
termination resistors, attached receivers and signal sources, and fixture parasitic) shall
match the impedance of the test equipment. When the specimen environment impedance
does not match the impedance of the test equipment, an impedance converter should be
used.---------------------- Page: 9 ----------------------
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5.2 Equipment
Time domain reflectometer (TDR), signal generator and oscilloscope, or other suitable
equipment, with the rise time shall meet the requirements of Subclause 5.1.6 Preparation of test sample
6.1 Insertion method
Test samples are prepared as follows:
a) First, select one cable with a length of L and a uniform characteristic impedance that can
be matched with the sample. Depending on the connector, the cable can be coaxial or
symmetrical, with suitable connector or fixture at both ends, and directly connect the test
equipment.b) Then cut the cable assembly in the middle and connect to the tested connector pair
respectively; the connector pair under test shall be mated together to test, as shown in
Figure 3. When connecting to the test connector, the total length of the two pieces of the
cut cable shall not be shorter than length of the original cable.Figure 3 – Preparation of cable RF connector test sample (insertion method)
6.2 Reference method
Test samples are prepared as follows:
Select one cable with a uniform characteristic impedance that can be matched with the sample,
cut into two cables with equal length L, and separately connect the two ends of the cable with
suitable connectors or fixtures that can be connected with the test equipment. Use one of them
as a reference cable assembly. Cut the other cable assembly out in the middle and attach the
tested connector pair, and make sure that the cable is not shorter (excluding the tested
connector pair), as shown in Figure 4.---------------------- Page: 10 ----------------------
IEC 61169-1-5:2022 © IEC 2022 – 9 –
Figure 4 – Preparation of cable RF connector test sample (reference method)
7 Test procedure
7.1 General
The following two methods apply to both single-ended and differential measurements. It is
recommended to use the fastest output signal the equipment is capable of. Place the sample
at least 5 cm away from any object that could affect the measurement results.7.2 Insertion method
Test procedure is as follows:
a) After the test equipment is fully preheated, the test ports shall be calibrated. For differential
measurements, any phase and/or amplitude errors between the channels shall bedetermined and the necessary compensation for those errors shall be provided.
b) Set the test mode to measure the rise time and set the measurement range of rise time
levels.c) Measure the measurement system rise time: Connect the cable assembly to the equipment
as shown in Figure 5a) and record the rise time td) Maintain the test equipment with no change and take the cable assembly off. Then cut the
cable assembly in the middle and connect respectively to the connector pair under test.
Mate connectors under test and reconnect them to the test equipment as shown inFigure 5b) and record the rise time t .
---------------------- Page: 11 ----------------------
– 10 – IEC 61169-1-5:2022 © IEC 2022
a) Measure the measurement system rise time
b) Measure the rise time with sample
NOTE Only one output and receiving port is available for single-end testing.
Figure 5 – Insertion method
7.3 Reference method
Test procedure is as follows:
a) After the test equipment is fully preheated, the test ports shall be calibrated. For differential
measurements, any phase and/or amplitude errors between the channels shall bedetermined and the necessary compensation for those errors shall be provided.
b) Set the test mode to measure the rise time and set the measurement range of rise time
levels.c) Measure the measurement system rise time: Connect the reference cable assembly to the
test equipment as shown in Figure 6a) and record the rise time t .d) Maintain the test equipment with no change and take the reference fixture off, then connect
the test cable assembly with the tested connector pair to the test equipment, as shown in
Figure 6b) and record the rise time t .---------------------- Page: 12 ----------------------
IEC 61169-1-5:2022 © IEC 2022 – 11 –
a) Measure the measurement system rise time
b) Measure the rise time with sample
NOTE Only one output and receiving port is available for single-end testing.
Figure 6 – Reference method
7.4 Calculation of test data
The rise time degradation is calculated according to Formula (1).
8 Failure criterion
The results shall not exceed the values specified in the relevant specification.
9 Information to be given in the relevant specification
The following information shall be given in the relevant specification:
a) measurement range of rise time levels (if other than 20 % to 80 %);
b) test fixture requirement (if applicable);
c) difference from the test methods specified in this document.
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10 Test report
Test report should at least include the following information:
• test procedure and method;
• environmental conditions;
• name of the test equipment used, validity of the measurement;
• test cable type to be used to test the connector pair;
• test fixture (if applicable);
• test results, including test curves, etc.
___________
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SOMMAIRE
AVANT-PROPOS .................................................................................................................. 15
1 Domaine d’application ................................................................................................... 17
2 Références normatives .................................................................................................. 17
3 Termes et définitions ..................................................................................................... 17
4 Principe d’essai ............................................................................................................. 18
5 Système de mesure ....................................................................................................... 19
5.1 Généralités ........................................................................................................... 19
5.2 Équipement........................................................................................................... 20
6 Préparation des échantillons d’essai .............................................................................. 20
6.1 Méthode par insertion ........................................................................................... 20
6.2 Méthode de référence ........................................................................................... 20
7 Procédure d’essai .......................................................................................................... 21
7.1 Généralités ........................................................................................................... 21
7.2 Méthode par insertion ........................................................................................... 21
7.3 Méthode de référence ........................................................................................... 22
7.4 Calcul des données d'essai ................................................................................... 23
8 Critère d’échec .............................................................................................................. 23
9 Informations devant figurer dans la spécification applicable ........................................... 23
10 Rapport d’essai ............................................................................................................. 24
Figure 1 – Paramètre de répartition équivalente de l’échantillon en essai ............................. 18
Figure 2 – Principe d’essai .................................................................................................... 19
Figure 3 – Préparation de l’échantillon d’essai de connecteur RF pour câble (méthode
par insertion) ........................................................................................................................ 20
Figure 4 – Préparation de l’échantillon d’essai de connecteur RF pour câble (méthode
de référence) ........................................................................................................................ 21
Figure 5 – Méthode par insertion .......................................................................................... 22
Figure 6 – Méthode de référence .......................................................................................... 23
Tableau 1 – Temps de montée du système de mesure .......................................................... 19
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COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________
CONNECTEURS POUR FRÉQUENCES RADIOÉLECTRIQUES –
Partie 1-5: Méthodes d’essai électrique – Dégradation du temps de montée
AVANT-PROPOS
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