IEC 61169-1-5:2022

Radio frequency connectors - Part 1-5: Electrical test methods - Rise time degradation

IEC 61169-1-5:2022 provides test methods for the rise time degradation of radio frequency (RF) connector.
This document is applicable to triaxial and other radio frequency connectors.

Connecteurs pour fréquences radioélectriques - Partie 1-5: Méthodes d’essai électrique - Dégradation du temps de montée

IEC 61169-1-5:2022 fournit des méthodes d’essai pour la dégradation du temps de montée d’un connecteur pour fréquences radioélectriques (RF, radio frequency).
Le présent document s’applique aux connecteurs triaxiaux et autres connecteurs pour fréquences radioélectriques.

General Information

• Status: Published
• Publication Date: 02-Feb-2022
• ICS: 33.120.10 - Coaxial cables. Waveguides
• Technical Committee: SC 46F - RF and microwave passive components
• Current Stage: PPUB - Publication issued
• Completion Date: 03-Feb-2022

Standards Content (sample)

IEC 61169-1-5
Edition 1.0 2022-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Radio frequency connectors –
Part 1-5: Electrical test methods – Rise time degradation
Connecteurs pour fréquences radioélectriques –
Partie 1-5: Méthodes d’essai électrique – Dégradation du temps de montée
IEC 61169-1-5:2022-02(en-fr)
---------------------- Page: 1 ----------------------
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---------------------- Page: 2 ----------------------
IEC 61169-1-5
Edition 1.0 2022-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Radio frequency connectors –
Part 1-5: Electrical test methods – Rise time degradation
Connecteurs pour fréquences radioélectriques –
Partie 1-5: Méthodes d’essai électrique – Dégradation du temps de montée
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.120.10 ISBN 978-2-8322-1074-1

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 3 ----------------------
– 2 – IEC 61169-1-5:2022 © IEC 2022
CONTENTS

FOREWORD ........................................................................................................................... 3

1 Scope .............................................................................................................................. 5

2 Normative references ...................................................................................................... 5

3 Terms and definitions ...................................................................................................... 5

4 Test principle ................................................................................................................... 6

5 Measurement system ....................................................................................................... 7

5.1 General ................................................................................................................... 7

5.2 Equipment .............................................................................................................. 8

6 Preparation of test sample ............................................................................................... 8

6.1 Insertion method ..................................................................................................... 8

6.2 Reference method .................................................................................................. 8

7 Test procedure ................................................................................................................ 9

7.1 General ................................................................................................................... 9

7.2 Insertion method ..................................................................................................... 9

7.3 Reference method ................................................................................................ 10

7.4 Calculation of test data ......................................................................................... 11

8 Failure criterion ............................................................................................................. 11

9 Information to be given in the relevant specification ....................................................... 11

10 Test report ..................................................................................................................... 12

Figure 1 – The equivalent distribution parameter of the sample under test .............................. 6

Figure 2 – Test principle ......................................................................................................... 7

Figure 3 – Preparation of cable RF connector test sample (insertion method) ......................... 8

Figure 4 – Preparation of cable RF connector test sample (reference method) ........................ 9

Figure 5 – Insertion method .................................................................................................. 10

Figure 6 – Reference method ................................................................................................ 11

Table 1 – Measurement system rise time ................................................................................ 7

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IEC 61169-1-5:2022 © IEC 2022 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
RADIO FREQUENCY CONNECTORS –
Part 1-5: Electrical test methods – Rise time degradation
FOREWORD

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IEC 61169-1-5 has been prepared by subcommittee 46F: RF and microwave passive

components, of IEC technical committee 46: Cables, wires, waveguides, RF connectors, RF

and microwave passive components and accessories. It is an International Standard.

The text of this International Standard is based on the following documents:
Draft Report on voting
46F/592/FDIS 46F/608/RVD

Full information on the voting for its approval can be found in the report on voting indicated in

the above table.
The language used for the development of this International Standard is English.
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– 4 – IEC 61169-1-5:2022 © IEC 2022

This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in

accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available

at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are

described in greater detail at www.iec.ch/standardsdev/publications.

A list of all parts of the IEC 61169 series, under the general title Radio frequency connectors

can be found on the IEC website.

The committee has decided that the contents of this document will remain unchanged until the

stability date indicated on the IEC website under webstore.iec.ch in the data related to the

specific document. At this date, the document will be
• reconfirmed,
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contents. Users should therefore print this document using a colour printer.
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IEC 61169-1-5:2022 © IEC 2022 – 5 –
RADIO FREQUENCY CONNECTORS –
Part 1-5: Electrical test methods – Rise time degradation
1 Scope

This part of IEC 61169 provides test methods for the rise time degradation of radio frequency

(RF) connector.
This document is applicable to triaxial and other radio frequency connectors.
2 Normative references

The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies.

For undated references, the latest edition of the referenced document (including any

amendments) applies.

IEC 61169-1, Radio frequency connectors – Part 1: Generic specification – General

requirements and measuring methods
3 Terms and definitions

For the purposes of this document, the terms and definitions given in IEC 61169-1 and the

following apply.

ISO and IEC maintain terminological databases for use in standardization at the following

addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1
rise time degradation

increase in rise time to a theoretically perfect (zero rise time) voltage step when the sample is

inserted in the transmission path

Note 1 to entry: In general, the formula used to calculate rise time degradation from 20 % to 80 % levels is as

follows:
(1)
t (tt− )
3 21
where
t is the rise time degradation;

t is the measured rise time when the sample is inserted in the transmission path;

t is the measurement system rise time.
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– 6 – IEC 61169-1-5:2022 © IEC 2022
3.2
single-ended measurement

measurement method in which the rise time degradation is measured in a single channel formed

by a signal line and the ground line
3.3
differential measurement

measurement method in which the rise time degradation is measured in two channels formed

by two signal lines and the ground line(s) and the signals transmitted to the two signal lines are

differential signals
4 Test principle

When a pulse signal with a transient rise time is connected to the input end of the sample under

test and is transmitted to the output end, due to the nonlinear characteristic of the measured

sample, the rise time of the pulse signal measured at the output end is increased compared

with the rise time of the pulse signal at the input end. The cause of this phenomenon is the

delay caused by the distributed inductance and distributed capacitance of the sample under

test. See Figure 1.
Figure 1 – The equivalent distribution parameter of the sample under test

The test theory of rising time degradation generated by the pulse signal passing through the

sample under test is shown in Figure 2. Unless otherwise specified in the relevant specification,

rise time is measured from 20 % to 80 % levels. The rise time degradation is calculated

according to Formula (1).
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IEC 61169-1-5:2022 © IEC 2022 – 7 –
a) The input end rise time (measurement system rise time)
b) The output end rise time (measured rise time with sample)
Figure 2 – Test principle
5 Measurement system
5.1 General

Unless otherwise specified, the entire measurement system (including test equipment, test

fixture, etc.) shall meet the following requirements:

a) The rise time shall be as short as possible and shall be less than or equal to 70 % of the

rise time measured with the sample.
b) The rise time shall conform to the requirements of Table 1.
Table 1 – Measurement system rise time
Expected rise time degradation of the Measurement system rise time
connector pair under test
ps ps
≤100
100～250
≤250
250～500
≤500
500～1 000
>1 000 ≤1 000

c) The specimen environment impedance (this impedance is a result of transmission lines,

termination resistors, attached receivers and signal sources, and fixture parasitic) shall

match the impedance of the test equipment. When the specimen environment impedance

does not match the impedance of the test equipment, an impedance converter should be

used.
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– 8 – IEC 61169-1-5:2022 © IEC 2022
5.2 Equipment

Time domain reflectometer (TDR), signal generator and oscilloscope, or other suitable

equipment, with the rise time shall meet the requirements of Subclause 5.1.
6 Preparation of test sample
6.1 Insertion method
Test samples are prepared as follows:

a) First, select one cable with a length of L and a uniform characteristic impedance that can

be matched with the sample. Depending on the connector, the cable can be coaxial or

symmetrical, with suitable connector or fixture at both ends, and directly connect the test

equipment.

b) Then cut the cable assembly in the middle and connect to the tested connector pair

respectively; the connector pair under test shall be mated together to test, as shown in

Figure 3. When connecting to the test connector, the total length of the two pieces of the

cut cable shall not be shorter than length of the original cable.
Figure 3 – Preparation of cable RF connector test sample (insertion method)
6.2 Reference method
Test samples are prepared as follows:

Select one cable with a uniform characteristic impedance that can be matched with the sample,

cut into two cables with equal length L, and separately connect the two ends of the cable with

suitable connectors or fixtures that can be connected with the test equipment. Use one of them

as a reference cable assembly. Cut the other cable assembly out in the middle and attach the

tested connector pair, and make sure that the cable is not shorter (excluding the tested

connector pair), as shown in Figure 4.
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IEC 61169-1-5:2022 © IEC 2022 – 9 –
Figure 4 – Preparation of cable RF connector test sample (reference method)
7 Test procedure
7.1 General

The following two methods apply to both single-ended and differential measurements. It is

recommended to use the fastest output signal the equipment is capable of. Place the sample

at least 5 cm away from any object that could affect the measurement results.
7.2 Insertion method
Test procedure is as follows:

a) After the test equipment is fully preheated, the test ports shall be calibrated. For differential

measurements, any phase and/or amplitude errors between the channels shall be
determined and the necessary compensation for those errors shall be provided.

b) Set the test mode to measure the rise time and set the measurement range of rise time

levels.

c) Measure the measurement system rise time: Connect the cable assembly to the equipment

as shown in Figure 5a) and record the rise time t

d) Maintain the test equipment with no change and take the cable assembly off. Then cut the

cable assembly in the middle and connect respectively to the connector pair under test.

Mate connectors under test and reconnect them to the test equipment as shown in
Figure 5b) and record the rise time t .
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– 10 – IEC 61169-1-5:2022 © IEC 2022
a) Measure the measurement system rise time
b) Measure the rise time with sample
NOTE Only one output and receiving port is available for single-end testing.
Figure 5 – Insertion method
7.3 Reference method
Test procedure is as follows:

a) After the test equipment is fully preheated, the test ports shall be calibrated. For differential

measurements, any phase and/or amplitude errors between the channels shall be
determined and the necessary compensation for those errors shall be provided.

b) Set the test mode to measure the rise time and set the measurement range of rise time

levels.

c) Measure the measurement system rise time: Connect the reference cable assembly to the

test equipment as shown in Figure 6a) and record the rise time t .

d) Maintain the test equipment with no change and take the reference fixture off, then connect

the test cable assembly with the tested connector pair to the test equipment, as shown in

Figure 6b) and record the rise time t .
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IEC 61169-1-5:2022 © IEC 2022 – 11 –
a) Measure the measurement system rise time
b) Measure the rise time with sample
NOTE Only one output and receiving port is available for single-end testing.
Figure 6 – Reference method
7.4 Calculation of test data
The rise time degradation is calculated according to Formula (1).
8 Failure criterion
The results shall not exceed the values specified in the relevant specification.
9 Information to be given in the relevant specification
The following information shall be given in the relevant specification:
a) measurement range of rise time levels (if other than 20 % to 80 %);
b) test fixture requirement (if applicable);
c) difference from the test methods specified in this document.
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– 12 – IEC 61169-1-5:2022 © IEC 2022
10 Test report
Test report should at least include the following information:
• test procedure and method;
• environmental conditions;
• name of the test equipment used, validity of the measurement;
• test cable type to be used to test the connector pair;
• test fixture (if applicable);
• test results, including test curves, etc.
___________
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SOMMAIRE

AVANT-PROPOS .................................................................................................................. 15

1 Domaine d’application ................................................................................................... 17

2 Références normatives .................................................................................................. 17

3 Termes et définitions ..................................................................................................... 17

4 Principe d’essai ............................................................................................................. 18

5 Système de mesure ....................................................................................................... 19

5.1 Généralités ........................................................................................................... 19

5.2 Équipement........................................................................................................... 20

6 Préparation des échantillons d’essai .............................................................................. 20

6.1 Méthode par insertion ........................................................................................... 20

6.2 Méthode de référence ........................................................................................... 20

7 Procédure d’essai .......................................................................................................... 21

7.1 Généralités ........................................................................................................... 21

7.2 Méthode par insertion ........................................................................................... 21

7.3 Méthode de référence ........................................................................................... 22

7.4 Calcul des données d'essai ................................................................................... 23

8 Critère d’échec .............................................................................................................. 23

9 Informations devant figurer dans la spécification applicable ........................................... 23

10 Rapport d’essai ............................................................................................................. 24

Figure 1 – Paramètre de répartition équivalente de l’échantillon en essai ............................. 18

Figure 2 – Principe d’essai .................................................................................................... 19

Figure 3 – Préparation de l’échantillon d’essai de connecteur RF pour câble (méthode

par insertion) ........................................................................................................................ 20

Figure 4 – Préparation de l’échantillon d’essai de connecteur RF pour câble (méthode

de référence) ........................................................................................................................ 21

Figure 5 – Méthode par insertion .......................................................................................... 22

Figure 6 – Méthode de référence .......................................................................................... 23

Tableau 1 – Temps de montée du système de mesure .......................................................... 19

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IEC 61169-1-5:2022 © IEC 2022 – 15 –
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________
CONNECTEURS POUR FRÉQUENCES RADIOÉLECTRIQUES –
Partie 1-5: Méthodes d’essai électrique – Dégradation du temps de montée
AVANT-PROPOS

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...