Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric, dielectric and electrostatic oscillators

IEC TS 61994-3:2021(E) gives the terms and definitions for piezoelectric, dielectric and electrostatic oscillators representing the state of the art, which are intended for use in the standards and documents of IEC TC 49.
The main changes with respect to the previous edition are as listed below:
- some definitions have been updated;
- the terminology given in IEC 60679-1:2017 has been taken into account;
- new terminologies are added.

General Information

Status
Published
Publication Date
27-Jan-2021
Current Stage
PPUB - Publication issued
Completion Date
28-Jan-2021
Ref Project

Buy Standard

Technical specification
IEC TS 61994-3:2021 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric, dielectric and electrostatic oscillators
English language
19 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (sample)

IEC TS 61994-3
Edition 3.0 2021-01
TECHNICAL
SPECIFICATION
Piezoelectric, dielectric and electrostatic devices and associated materials for
frequency control, selection and detection – Glossary –
Part 3: Piezoelectric, dielectric and electrostatic oscillators
IEC TS 61994-3:2021-01(en)
---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2021 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from

either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC

copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or

your local IEC member National Committee for further information.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC

The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes

International Standards for all electrical, electronic and related technologies.
About IEC publications

The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the

latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform IEC online collection - oc.iec.ch

The advanced search enables to find IEC publications by a Discover our powerful search engine and read freely all the

variety of criteria (reference number, text, technical publications previews. With a subscription you will always

committee, …). It also gives information on projects, replaced have access to up to date content tailored to your needs.

and withdrawn publications.
Electropedia - www.electropedia.org
IEC Just Published - webstore.iec.ch/justpublished
The world's leading online dictionary on electrotechnology,
Stay up to date on all new IEC publications. Just Published
containing more than 22 000 terminological entries in English
details all new publications released. Available online and
and French, with equivalent terms in 18 additional languages.
once a month by email.
Also known as the International Electrotechnical Vocabulary
(IEV) online.
IEC Customer Service Centre - webstore.iec.ch/csc
If you wish to give us your feedback on this publication or
need further assistance, please contact the Customer Service
Centre: sales@iec.ch.
---------------------- Page: 2 ----------------------
IEC TS 61994-3
Edition 3.0 2021-01
TECHNICAL
SPECIFICATION
Piezoelectric, dielectric and electrostatic devices and associated materials for
frequency control, selection and detection – Glossary –
Part 3: Piezoelectric, dielectric and electrostatic oscillators
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.140; 01.040.31 ISBN 978-2-8322-9306-5

Warning! Make sure that you obtained this publication from an authorized distributor.

® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 3 ----------------------
– 2 – IEC TS 61994-3:2021 © IEC 2021
CONTENTS

FOREWORD ........................................................................................................................... 3

1 Scope .............................................................................................................................. 5

2 Normative references ...................................................................................................... 5

3 Terms and definitions ...................................................................................................... 5

Bibliography .......................................................................................................................... 19

Figure 1 – Characteristics of an output waveform .................................................................... 7

Figure 2 – Example of the use of frequency offset................................................................... 8

Figure 3 – Linearity of frequency modulation deviation .......................................................... 10

Figure 4 – Basic configuration of one-port SAW resonator with open-circuited metal strip

arrays ................................................................................................................................... 11

Figure 5 – Clock signal with period jitter................................................................................ 12

Figure 6 – Definition of start-up time ..................................................................................... 16

Figure 7 – Basic configurations of two-port SAW resonators with short-circuited metal

strip arrays ........................................................................................................................... 18

---------------------- Page: 4 ----------------------
IEC TS 61994-3:2021 © IEC 2021 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC DEVICES
AND ASSOCIATED MATERIALS FOR FREQUENCY CONTROL,
SELECTION AND DETECTION – GLOSSARY –
Part 3: Piezoelectric, dielectric and electrostatic oscillators
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international

co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in

addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,

Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their

preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with

may participate in this preparatory work. International, governmental and non-governmental organizations liaising

with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for

Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence between

any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.

5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any

services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses

arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent

rights. IEC shall not be held responsible for identifying any or all such patent rights.

The main task of IEC technical committees is to prepare International Standards. In exceptional

circumstances, a technical committee may propose the publication of a technical specification

when

• the required support cannot be obtained for the publication of an International Standard,

despite repeated efforts, or

• the subject is still under technical development or where, for any other reason, there is the

future but no immediate possibility of an agreement on an International Standard.

Technical specifications are subject to review within three years of publication to decide whether

they can be transformed into International Standards.

IEC TS 61994-3, which is a technical specification, has been prepared by IEC technical

committee 49: Piezoelectric, dielectric and electrostatic devices and associated materials for

frequency control, selection and detection.
---------------------- Page: 5 ----------------------
– 4 – IEC TS 61994-3:2021 © IEC 2021

This third edition of IEC 61994-3 cancels and replaces the second edition published in 2011.

This edition constitutes a technical revision.
The main changes with respect to the previous edition are as listed below:
– some definitions have been updated;
– the terminology given in IEC 60679-1:2017 has been taken into account;
– new terminologies are added.
The text of this Technical Specification is based on the following documents:
Enquiry draft Report on voting
49/1348/DTS 49/1355/RVC

Full information on the voting for the approval of this technical specification can be found in the

report on voting indicated in the above table.

This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts in the IEC 61994 series, published under the general title Piezoelectric,

dielectric and electrostatic devices and associated materials for frequency control, selection and

detection – Glossary, can be found on the IEC website.

Future standards in this series will carry the new general title as cited above. Titles of existing

standards in this series will be updated at the time of the next edition.

The committee has decided that the contents of this document will remain unchanged until the

stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to

the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
---------------------- Page: 6 ----------------------
IEC TS 61994-3:2021 © IEC 2021 – 5 –
PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC DEVICES
AND ASSOCIATED MATERIALS FOR FREQUENCY CONTROL,
SELECTION AND DETECTION – GLOSSARY –
Part 3: Piezoelectric, dielectric and electrostatic oscillators
1 Scope

This part of IEC 61994 gives the terms and definitions for piezoelectric, dielectric and

electrostatic oscillators representing the state of the art, which are intended for use in the

standards and documents of IEC TC 49.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.

ISO and IEC maintain terminological databases for use in standardization at the following

addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1
adjustment frequency

frequency to which an oscillator must be adjusted, under a particular combination of operating

conditions, in order to meet the requirement for the frequency tolerance specification over the

specified range of operating conditions

Note 1 to entry: Adjustment frequency corresponds to nominal frequency plus frequency offset.

[SOURCE: IEC 60679-1:2017, 3.2.22]
3.2
ADEV of fractional frequency fluctuation
Allan deviation of fractional frequency fluctuation

measure in the time domain of the short-term frequency stability of oscillator, based on the

statistical properties of a number of frequency measurements, each representing an average of

the frequency over the specified sampling interval τ
Note 1 to entry: The preferred measure of fractional frequency fluctuation is:
M −1 2
 
σ (τ ) ≅ (YY− )
 
y kk+1
21(M − )
 
 k =1 
where

Y are the average fractional frequency fluctuations obtained sequentially, with no systematic

dead time between measurements;
τ is the sample time over which measurements are averaged;
---------------------- Page: 7 ----------------------
– 6 – IEC TS 61994-3:2021 © IEC 2021
M is the number of measurements.
Note 2 to entry: The confidence of the estimate improves as M increases.

[SOURCE: IEC 60679-1:2017, 3.2.38, modified – ADEV of fractional frequency fluctuation has

been replaced as the first preferred term. The meaning of the symbols used in the

mathematical formula has been added, as well as Note 2 to entry.]
3.3
AVAR of fractional frequency fluctuation
Allan variance of fractional frequency fluctuation

unbiased estimate of the preferred definition in the time domain of the short-term stability

characteristic of the oscillator output frequency
Note 1 to entry: The preferred measure of fractional frequency fluctuation is:
M −1
2 2
σ (τ ) ≅ (Y −Y )
y k +1 k
(M )
2 −1
k =1
where

Y are the average fractional frequency fluctuations obtained sequentially, with no systematic

dead time between measurements;
τ is the sample time over which measurements are averaged;
M is the number of measurements.
Note 2 to entry: The confidence of the estimate improves as M increases.

[SOURCE: IEC 60679-1:2017, 3.2.37, modified – The term "Allan variance AVAR of fractional

frequency fluctuation" has been deleted. And AVAR of fractional frequency fluctuation has been

replaced as the preferred term.]
3.4
amplitude modulation distortion

non-linear distortion in which the relative magnitudes of the spectral components of the

modulating signal waveform are modified
Note 1 to entry: The test procedure is provided in 4.5.22.3 of IEC 62884-1:2017.
[SOURCE: IEC 60679-1:2017, 3.2.42, modified – Three entry terms except amplitude
modulation distortion have been deleted.]
3.5
crystal cut

orientation of the crystal element with respect to the crystallographic axes of the crystal

Note 1 to entry: It can be desirable to specify the cut (and hence the general form of the frequency/temperature

performance) of a crystal unit used in an oscillator application. The choice of the crystal cut will imply certain attributes

of the oscillator which may not otherwise appear in the detail specification.
[SOURCE: IEC 60679-1:2017, 3.2.3]
3.6
fall time
decay time

time interval required for the trailing edge of a waveform to change between two defined levels

Note 1 to entry: These levels may be two logic levels and or 90 % to 10 % of its maximum amplitude ( –

V V V
OH OL HI

), or any other ratio as defined in the detail specification as shown in Figure 1.

Note 2 to entry: The test procedure is provided in 4.5.16.2 of IEC 62884-1:2017.
---------------------- Page: 8 ----------------------
IEC TS 61994-3:2021 © IEC 2021 – 7 –

[SOURCE: IEC 60679-1:2017, 3.2.48, modified – The term "fall time" has been replaced as the

first preferred term.]
Figure 1 – Characteristics of an output waveform
3.7
DIXO
digital interfaced crystal oscillator

crystal oscillator, the frequency and the functions of which can be controlled, by application of an

external digital signal

Note 1 to entry: The prefix "DI" is applied to TCXO and OCXO as DI-TCXO and DI-OCXO, respectively.

[SOURCE: IEC 60679-1:2017, 3.2.17, modified – DIXO has been replaced as the most first

preferred term and the note has been reworded.]
3.8
MEMS oscillator
microelectromechanical system oscillator
oscillator that uses a MEMS device as the main frequency controlling element

[SOURCE: IEC 60679-1:2017, 3.2.15, modified – The term “electrostatic micro electro

mechanical system oscillator” has been deleted and MEMS oscillator has been replaced as the

first preferred term.]
3.9
frequency adjustment range

range over which oscillator frequency may be varied by means of some variable element

Note 1 to entry: The purpose is as follows:
a) setting the frequency to a particular value, or;

b) to correct oscillator frequency to a prescribed value after deviation due to ageing, or other changed conditions.

Note 2 to entry: The test procedure is provided in 4.5.11 of IEC 62884-1:2017.

[SOURCE: IEC 60679-1:2017, 3.2.23, modified – The end of definition has been replaced by

Note 1 to entry.]
---------------------- Page: 9 ----------------------
– 8 – IEC TS 61994-3:2021 © IEC 2021
3.10
frequency offset

frequency difference, positive or negative, which should be added to the specified nominal

frequency of the oscillator, when adjusting the oscillator frequency under a particular set of

operating conditions in order to minimize its deviation from the nominal frequency over the

specified range of operating conditions

Note 1 to entry: In order to minimize the frequency deviation from nominal frequency over the entire temperature

range, a frequency offset may be specified for adjustment at the reference temperature as shown in Figure 2.

Figure 2 – Example of the use of frequency offset
[SOURCE: IEC 60679-1:2017, 3.2.21]
3.11
frequency tolerance

maximum permissible deviation from the specified nominal frequency from the specified value

due to a specific cause, or a combination of causes

Note 1 to entry: Frequency tolerances are often assigned separately to specified ambient effects, namely electrical,

mechanical and environmental. When this approach is used, it is necessary to define the values of other operating

parameters as well as the range of the specified variable, that is to say:

– deviation from the frequency at the specified reference temperature due to operation over the specified

temperature range, other conditions remaining constant;

– deviation from the frequency at the specified supply voltage due to supply voltage changes over the specified

range, ot
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.