IEC TS 60871-2:2014
(Main)Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V - Part 2: Endurance testing
Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V - Part 2: Endurance testing
IEC/TS 60871-2:2014 which is a technical specification, applies to capacitors according to IEC 60871-1 and gives the requirements for ageing tests of these capacitors. This third edition cancels and replaces the second edition published in 1999. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: The overvoltage cycling test has been moved to IEC 60871-1:2014. Keywords: ageing tests of capacitors
Condensateurs shunt pour réseaux à courant alternatif de tension assignée supérieure à 1 000 V - Partie 2: Essais d'endurance
IEC/TS 60871-2:2014 qui est une spécification technique, s'applique aux condensateurs conformes à l'IEC 60871-1 et donne les exigences relatives aux essais de vieillissement de ces condensateurs. Cette troisième édition annule et remplace la deuxième édition parue en 1999. Cette édition constitue une révision technique. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: L'essai de tenue avec cycles de surtension à était déplacé a la norme IEC 608471-1:2014. Mots clés: essais de vieillissement de condensateurs
General Information
Relations
Overview
IEC TS 60871-2:2014 (consolidated as edition 3.1 with Amendment 1, 2022) is a Technical Specification from the IEC that defines endurance (ageing) testing for shunt capacitors for a.c. power systems having a rated voltage above 1 000 V. It complements IEC 60871-1 (general requirements) by specifying the purpose, test sequence and procedural requirements for ageing tests of capacitors and related fail‑safe checks for fuseless units.
Key topics and requirements
- Scope and purpose: The ageing test verifies that increased voltage stress at elevated temperature does not cause premature dielectric failure. It is intended to validate a dielectric system (not every individual rating).
- Test object: Applies to capacitors manufactured in accordance with IEC 60871-1; a defined test unit must be representative of production units (see Annex A for design limits).
- Test sequence and conditioning:
- Routine voltage test between terminals (frequency 50 Hz or 60 Hz; DC allowed for the routine test per IEC 60871-1 clause 9.3).
- Conditioning: subject test unit to at least 1.1 × rated voltage at ambient temperature not less than +10 °C for at least 16 hours to stabilize dielectric properties.
- Ageing (endurance) test:
- Initial and final capacitance and dielectric loss (tan δ) measurements are required; initial measurements at 0.9 to 1.1 times rated voltage.
- Ambient temperature during the ageing test shall be not less than 55 °C, with average dielectric temperatures typically exceeding 60 °C for covered designs.
- Acceptance criteria and validity rules are defined (see Clauses 4.3.3 and 4.4).
- Element fail‑safe testing: Specific procedures and circuits are included for fuseless capacitors, covering conditioning to provoke element failure, discharge tests, load current tests and voltage-withstand checks between terminals and container.
- Definitions: Terms such as test unit, comparable element design, and inter-element insulation are specified to ensure repeatable, comparable tests.
Applications and practical value
- Use this TS to:
- Validate dielectric systems and manufacturing processes for high‑voltage shunt capacitors.
- Produce manufacturer test certificates documenting endurance test results for purchasers.
- Design representative test units and select comparable element designs when qualifying new capacitor constructions.
- Practical users: capacitor manufacturers, R&D teams, quality engineers, test laboratories, and purchasers specifying endurance testing in procurement.
Who should use this standard?
- Manufacturers qualifying dielectric systems and production lines.
- Independent test laboratories performing endurance and fail‑safe testing.
- Utilities and OEMs specifying high‑voltage shunt capacitor performance and procurement acceptance tests.
Related standards
- IEC 60871-1:2014 - Shunt capacitors for a.c. power systems - Part 1: General (normative reference).
- IEC TR 60996 - Method for verifying accuracy of tan delta measurements applicable to capacitors.
- Note: the overvoltage cycling test was moved from this part to IEC 60871-1:2014 (significant change in this edition).
Keywords: IEC TS 60871-2:2014, ageing tests of capacitors, shunt capacitors, endurance testing, high‑voltage capacitors.
Standards Content (Sample)
IEC TS 60871-2 ®
Edition 3.1 2022-03
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
colour
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Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V –
Part 2: Endurance testing
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IEC TS 60871-2 ®
Edition 3.1 2022-03
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
colour
inside
Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V –
Part 2: Endurance testing
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 29.240.99; 31.060.70 ISBN 978-2-8322-4703-7
IEC TS 60871-2 ®
Edition 3.1 2022-03
CONSOLIDATED VERSION
REDLINE VERSION
colour
inside
Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V –
Part 2: Endurance testing
– 2 – IEC TS 60871-2:2014+AMD1:2022 CSV
© IEC 2022
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Quality requirements and tests . 7
4.1 Test requirements – General purpose . 7
4.2 Test procedure . 7
4.2.1 General . 7
4.2.2 Routine test . 7
4.2.3 Conditioning of the units before the test . 7
4.3 Ageing test . 7
4.3.1 Initial capacitance and dielectric loss measurements . 7
4.3.2 Final capacitance and dielectric loss measurements . 8
4.3.3 Acceptance criteria . 8
4.4 Validity of test . 8
5 Element fail safe test for fuseless capacitors . 8
5.1 General . 8
5.2 Test unit . 9
5.2.1 General . 9
5.2.2 Set-up of the test unit, first method . 9
5.2.3 Set-up of the test unit, second method . 9
5.2.4 Active element for the low energy test . 9
5.2.5 Active element for the high energy test . 10
5.3 Conditioning of the unit . 10
5.3.1 General . 10
5.3.2 Circuit for achieving a failed test unit, first method . 10
5.3.3 Circuit for achieving a failed test unit, second method . 11
5.3.4 Failure of the unit for the low energy test . 11
5.3.5 Failure of the unit for the high energy test . 12
5.4 Test procedure . 12
5.4.1 General . 12
5.4.2 Discharge test . 12
5.4.3 Load current test . 12
5.4.4 AC voltage test between terminals and container . 13
5.5 Success criteria . 13
Annex A (normative) Requirements regarding comparable element design and test
unit design . 14
A.1 Test element design criteria . 14
A.2 Test unit design . 14
Annex B (informative) Definition of element and capacitor container dimensions . 16
B.1 Flattened pressed element . 16
B.2 Capacitor container . 16
Figure 1 – Puncture location on the active element . 10
Figure 2 – Electric circuit for conditioning of the units . 11
© IEC 2022
Figure 3 – Electric circuit for the discharge test. 12
Figure 4 – Electric circuit for the load current test . 13
Figure B.1 – Flattened pressed element . 16
Figure B.2 – Capacitor container . 16
– 4 – IEC TS 60871-2:2014+AMD1:2022 CSV
© IEC 2022
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SHUNT CAPACITORS FOR AC POWER SYSTEMS
HAVING A RATED VOLTAGE ABOVE 1 000 V –
Part 2: Endurance testing
FOREWORD
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patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
This consolidated version of the official IEC Standard and its amendment has been
prepared for user convenience.
IEC TS 60871-2 edition 3.1 contains the third edition (2014-11) [documents 33/536/DTS
and 33/565/RVC] and its amendment 1 (2022-03) [documents 33/668/DTS and
33/671/RVDTS].
In this Redline version, a vertical line in the margin shows where the technical content
is modified by amendment 1. Additions are in green text, deletions are in strikethrough
red text. A separate Final version with all changes accepted is available in this
publication.
© IEC 2022
The main task of IEC technical committees is to prepare International Standards. In
exceptional circumstances, a technical committee may propose the publication of a technical
specification when
• the required support cannot be obtained for the publication of an International Standard,
despite repeated efforts, or
• the subject is still under technical development or where, for any other reason, there is the
future but no immediate possibility of an agreement on an International Standard.
Technical specifications are subject to review within three years of publication to decide
whether they can be transformed into International Standards.
IEC/TS 60871-2, which is a technical specification, has been prepared by IEC technical
committee 33: Power capacitors and their applications.
This third edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) The overvoltage cycling test has been moved to IEC 60871-1:2014.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60871 series, published under the general title Shunt capacitors
for a.c. power systems having a rated voltage above 1 000 V, can be found on the IEC
website.
The committee has decided that the contents of the base publication and its amendment will
remain unchanged until the stability date indicated on the IEC web site under webstore.iec.ch
in the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 6 – IEC TS 60871-2:2014+AMD1:2022 CSV
© IEC 2022
SHUNT CAPACITORS FOR AC POWER SYSTEMS
HAVING A RATED VOLTAGE ABOVE 1 000 V –
Part 2: Endurance testing
1 Scope
This part of IEC 60871, which is a technical specification, applies to capacitors according to
IEC 60871-1 and gives the requirements for ageing tests of these capacitors.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60871-1:2014, Shunt capacitors for a.c. power systems having a rated voltage above
1 000 V – Part 1: General
IEC TR 60996, Method for verifying accuracy of tan delta measurements applicable to
capacitors
3 Terms and definitions
For the purpose of this technical specification, the following terms and definitions apply in
addition to those given in IEC 60871-1:
3.1
test unit
one of the units to be manufactured or a special unit which, with respect to the properties to
be checked by the ageing test, is equivalent to the units to be manufactured
Note 1 to entry: The restrictions on test unit design are detailed in Annex A.
3.2
comparable element design
range of construction elements that will be comparable in performance, under the test
procedure, with elements of the units to be manufactured
Note 1 to entry: See Annex A for detailed design limits.
3.3
inter-element insulation
insulation between two series-connected elements, consisting of:
– the outer turns of the insulation layers around the electrodes in an element, or
– a separate insulation layer placed between the two elements
Note 1 to entry: This separate insulation layer may protrude outside the width and (or) length dimension(s) of the
flattened element (see Annex B).
© IEC 2022
4 Quality requirements and tests
4.1 Test requirements – General purpose
The ageing test is a special test carried out in order to ascertain that the progression of
deterioration resulting from increased voltage stress at elevated temperature does not cause
untimely failure of the dielectric. It is a mean to ensure that basic material selection is
properly made and that any rapid deterioration does not take place. The test should not be
seen as a tool for any exact assessment of life characteristics of a dielectric. For that purpose
various research and development activities are to be taken care of by the manufacturers.
The ageing test shall be carried out as special tests by the manufacturer for a particular
dielectric system, i.e. not for each particular capacitor rating. The test results are applicable to
a wide range of capacitor ratings within the limits defined in Annex A. The purchaser shall, on
request, be supplied with a certificate detailing the results of such tests.
4.2 Test procedure
4.2.1 General
The ageing test shall be carried out in the sequence given below. The applied test voltage
shall have a frequency of 50 Hz or 60 Hz, except for the test according to 4.2.2 where a d.c.
voltage can be used according to 9.3 of IEC 60871-1:2014.
4.2.2 Routine test
The test unit shall be subjected to the routine voltage test between the terminals (see
IEC 60871-1) with an amplitude such that the correct test voltage is obtained across each
element.
4.2.3 Conditioning of the units before the test
The test unit shall be subjected to a voltage of not less than 1,1 U at an ambient temperature
N
of not less than +10 °C for not less than 16 h.
NOTE The conditioning is carried out to stabilize the dielectric properties of the test units.
4.3 Ageing test
4.3.1 Initial capacitance and dielectric loss measurements
The capacitor unit shall be measured at 0,9 to 1,1 times the rated voltage. The choice of
temperature is left to the manufacturer.
4.3.1.1 Test method
The ambient temperature during the ageing test shall be not less than 55 °C.
It is anticipated, given the limits for the test object specified in Annex A, that more than 60 °C
average dielectric temperature is achieved. If requested by the purchaser further details about
the relation between external and internal (dielectric) temperatures should be given by the
manufacturer. The dielectric temperature may be measured with thermocouples on specially
prepared test units or estimated from previously established relationships between internal
and external temperatures such as by use of resistive dummy capacitors described in
IEC 60996.
The ambient temperature shall be held constant with a tolerance of –2 °C to +5 °C. Prior to
energization, the test units shall be stabilized in this ambient for 12 h. Due to the length of this
test, voltage interruptions are allowed. During these interruptions, the units shall remain in the
– 8 – IEC TS 60871-2:2014+AMD1:2022 CSV
© IEC 2022
controlled ambient. If power is lost to the chamber, the ambient temperature shall be
reattained for 12 h prior to re-energization of the units.
The testing time shall depend on the test voltage. Either one of the following test conditions
shall be used:
Test voltage Duration
h
1,25 U 3 000
N
1,40 U 1 000
N
4.3.2 Final capacitance and dielectric loss measurements
The measurement shall be repeated under the same conditions as for the initial
measurement, within a temperature tolerance of ±5°C. The measurements shall be made
within two days after completing the tests in 4.1.3.2.
4.3.3 Acceptance criteria
No breakdown shall occur when two units have been tested, or alternatively one breakdown is
accepted when three units have been tested.
To verify no breakdown the capacitance measurements performed in 4.3.1 and 4.3.2 shall
differ by less than an amount corresponding to breakdown of an element.
4.4 Validity of test
The ageing test is a test on the elements (their dielectric design and composition), and on
their processing (element winding, drying and impregnation) when assembled in a capacitor
unit. Each ageing test will also cover other capacitor designs, which are allowed to differ from
the tested design within the limits stated in Annex A.
A test performed at 50 Hz is also applicable for 60 Hz (and lower frequency) units and vice
versa.
5 Element fail safe test for fuseless capacitors
5.1 General
The proof of element fail safe is a design test applicable to fuseless power capacitors, as
defined in IEC 60871-1:2014, Clause E.4.
This proof is obtained by means of two separate tests, the low energy test and the high
energy test.
The low energy test is aimed to demonstrate that a failure of one capacitive element, caused
by a low voltage element failure event at the rated voltage, will result in reliable and secure
foil welding on the failed portion of the element without generation of hot spots and persistent
release of gas.
The high energy test is aimed to demonstrate that a failure of one or more capacitive
elements, caused by the occurrence of an overvoltage on the capacitor bank, will result in
reliable and safe behaviour without container rupture or explosion.
The physical location of the fault on the capacitor element is intended to represent the worst
possible location under the expected low or high energy level tested. A damage to the
© IEC 2022
insulation of the container is acceptable, provided that it maintains enough insulation in order
to remain in service until replacement.
5.2 Test unit
5.2.1 General
Two set-ups of the test unit are possible, as described in 5.2.2 and 5.2.3; the manufacturer
shall choose the set-up and manufacture the test unit accordingly.
5.2.2 Set-up of the test unit, first method
The test unit shall be a capacitor unit comparable to the units to be manufactured, as
described in Annex A, with the following features:
• The container shall be identical to that used for the units to be manufactured.
• The test unit shall contain a single active element, i.e. electrically connected to the
bushings for power supply; the other elements shall be passive, i.e. not electrically
connected neither to the active element nor to the bushings.
• The unit may be equipped with some means of shorting the capacitor terminals, such as
metallic wires between terminals, for safe handling.
• The position of the tested element shall be located at the top location nearest to the
bushing lid.
• The element shall be of the same size to that used for the units to be manufactured.
Each test shall be conducted on a separate test unit, differing for the intentional damage of
the active element (as described in 5.2.4 to 5.2.5) but otherwise identical.
5.2.3 Set-up of the test unit, second method
The test unit shall be a capacitor unit comparable to the units to be manufactured, as
described in Annex A, with the following features:
• The container shall be identical to that used for the units to be manufactured.
• The test unit shall have full-size active elements, with only one pre-damaged active
element identical to those included in the capacitor unit supplied.
• The unit may be equipped with some means of shorting the capacitor terminals, such as
metallic wires between terminals, for safe handling.
• The position of the tested element shall be located at the top location nearest to the
bushing lid.
• The capacitor units shall be constructed with appropriate resistor values capable to
withstand high voltage (see 5.3).
5.2.4 Active element for the low energy test
The insulating films between the two active electrodes of the element for the low energy test
shall be mechanically damaged before insertion in the test unit, in order facilitate the element
failure during the low energy test.
The mechanical damage shall be located at 5 ± 1 cm from the margin of the element and
roughly on the fringe of the element's length as shown in Figure 1. The damage shall be
located between five and ten plies from the outermost ply of the element. Two dielectric layers
between consecutive metallic foils shall be separately punctured; the punctures should be
sufficiently apart in order to avoid shorting the element just at the beginning of the test.
NOTE It is suggested to puncture the layers using a heated nail of about 2 mm in diameter.
– 10 – IEC TS 60871-2:2014+AMD1:2022 CSV
© IEC 2022
Figure 1 – Puncture location on the active element
5.2.5 Active element for the high energy test
One of the insulating films between the two active electrodes of the active element shall be
mechanically damaged during manufacturing in a manner to facilitate the element failure at
the time of the tests.
The mechanical damage shall be located at 5 ± 1 cm from the margin of the element and
roughly on the fringe of the element's length as shown in Figure 1. The damage shall be
located between five and ten plies from the outermost ply of the element. Only one dielectric
layer between consecutive metallic foils shall be punctured.
NOTE It is suggested to puncture the layer using a heated nail of about 2 mm in diameter.
5.3 Conditioning of the unit
5.3.1 General
Two methods to prepare the test circuit are possible, as described in 5.3.2 and 5.3.3; the
manufacturer shall choose the method and prepare the test circuit accordingly.
5.3.2 Circuit for achieving a failed test unit, first method
The electrical failure of each test unit shall be produced by the discharge of a pre-charged
loading capacitor unit in parallel to the test unit. The suggested electric circuit is shown in
Figure 2.
© IEC 2022
Figure 2 – Electric circuit for conditioning of the units
The discharge into the active element shall be performed by closing the switch in the branch
of the test unit, while disconnecting the power supply. Voltage and current shall be recorded
during this capacitive discharge to verify that the desired voltage level and the discharge are
achieved. Multiple discharges may be necessary for failure to occur. The test unit shall be
fully and safely discharged between attempts.
NOTE The use of a shorting stick is suggested, where applicable, in order to shorten the discharge time.
5.3.3 Circuit for achieving a failed test unit, second method
The unit shall be equipped with a modified discharge resistor in order to overheat it to failure.
A preheating of the unit at 80 °C for 12 hours with the regular resistor is also possible to
achieve a similar result.
NOTE The modified discharge resistor is preferably located near the tested element, in order to focalize the heat
to the targeted element and not to the other healthy elements.
The electrical failure of the test units shall be produced by applying and maintaining a DC
voltage corresponding to the required energy level for at least 30 minutes or until the element
fails.
The applied DC voltage, combined with the heating produced by the modified discharge
resistor, should create the proper condition to initiate the element failure. Voltage and current
shall be recorded during this attempt to verify that the desired energy level is achieved.
Multiple attempts may be necessary for failure to occur. The test units shall be fully
discharged between attempts.
For a high energy test unit, a short circuit of the test unit at nominal voltage may be performed
between attempts to weaken the tested element, if the attempt exceeds 30 minutes.
5.3.4 Failure of the unit for the low energy test
The failure of the unit for the low energy test is meant to represent the failure of a capacitor
element with a low level of stored energy. The loading capacitor shall be pre-charged to a
voltage level that does not result in a stored parallel energy higher than the one available to a
single element as part of a complete unit when the applied voltage is equal to 0,9 × √2 × U .
N
A tolerance in the range from 0 to +10 % on the test voltage is considered acceptable.
– 12 – IEC TS 60871-2:2014+AMD1:2022 CSV
© IEC 2022
5.3.5 Failure of the unit for the high energy test
The failure of the unit for the high energy test is meant to represent the failure of a capacitor
element with a high level of stored energy. The loading capacitor shall be pre-charged to a
voltage level that does not result in a stored parallel energy lower than the one available to a
single element as part of a complete unit when the applied voltage is equal to 3,0 × √2 × U .
N
A tolerance in the range from -10 % to 0 on the test voltage is considered acceptable.
NOTE The voltage level is chosen to represent a restrike on the circuit breaker during the opening of the
capacitor bank.
5.4 Test procedure
5.4.1 General
The following test procedure is applicable for both the low and high energy tests.
5.4.2 Discharge test
A discharge test in accordance with Clause 17 of IEC 60871-1:2014 shall be performed on
each of the previously failed test units. The desired discharge current shall be calculated
based on the ratio of the number of parallel elements in a complete unit and the total current
which would result from discharging that complete unit.
The test unit shall be connected in series with a healthy unit which was previously pre-
charged with the DC voltage necessary to obtain the desired discharge current. Figure 3
shows the suggested test setup.
Figure 3 – Electric circuit for the discharge test
5.4.3 Load current test
After subjecting the unit to the discharge test, it shall be placed into a cold chamber at the
lowest rated ambient temperature for a period of at least 12 hours. Within five minutes
following their removal from the cold chamber, units shall be energized with a current that
would circulate if the designed standard unit would have one element shorted at ambient
temperature (20 ± 5 °C) and subjected to 1,1 × U .
N
Four temperature sensors shall be placed on the capacitor container, one at the failure
location and three at different locations away from the failure.
© IEC 2022
NOTE It is suggested to place the three sensors near the bottom of the unit.
The test current shall be maintained for a period of 48 hours or until the temperature increase,
as measure by the average of the temperature sensors, stabilize to an increase less than
1 K/h for a period of at least five thermal time constants of the unit. Figure 4 shows the
suggested test setup.
Figure 4 – Electric circuit for the load current test
5.4.4 AC voltage test between terminals and container
The AC voltage test between terminals and container, as described in 15.1 and Clause 18 of
IEC 60871-1:2014, shall be performed at 80 % of the test voltage intended for this design, as
defined in IEC 60871-1. The duration of the test shall be 60 seconds.
5.5 Success criteria
The test of each unit shall be deemed successful if the following criteria are respected:
a) The discharge test, the load current test and AC voltage test between terminals and
container are passed.
b) The container remains sealed; deformations are allowed but no rupture is permitted.
c) The welding of the failed element presents a good electrical and mechanical connection at
a visual inspection; burned insulation layers near the location of the punctures are
allowed, provided that the units passed the AC voltage test.
d) The difference, recorded at the end of the load current test, between the temperature at
failure location and the average of the temperatures recorded at the three other locations
is equal or less than 10 K.
The proof of element fail safe is obtained if both the low energy and high energy test units
meet the success criteria.
– 14 – IEC TS 60871-2:2014+AMD1:2022 CSV
© IEC 2022
Annex A
(normative)
Requirements regarding comparable
element design and test unit design
A.1 Test element design criteria
A tested element design is considered to be comparable with respect to the elements in the
units to be manufactured if the following requirements are fulfilled:
a) the tested element shall have the same or an inferior number of layers of solid materials in
the dielectric and be impregnated with the same liquid.
the dielectric shall be within 70°% to 130°% of the thickness and be rated at equal or
higher electrical stress.
when a dielectric contains both film and paper, the stress value to be used in this
comparison is the stress across each of the solid materials, calculated using the thickness
of only the solid materials and their respective permittivity.
for the ageing test, using resistors and/or internal fuses is irrelevant for the test. It is up to
the manufacturer to choose.
b) the dielectric composition of the solid materials shall be the same, for example all-film or
all-paper or film-paper-film, etc.;
c) solid and liquid dielectric materials shall satisfy the same manufacturer’s specifications;
d) the aluminium-foil design shall be the same:
– same manufacturer’s specification;
– thickness within ±20 %;
– extended or non-extended foil edges;
– folded foil at the edges and (or) cut ends if it is a feature of the design;
– less or equal free margin;
e) element connections shall be of the same type, for example tabs, soldering, etc.;
f) the element width (active foil width) is allowed to vary within 50°% to 400°% and the
element length (active foil length) is allowed to vary within 30°% to 300°% (see Annex B).
A.2 Test unit design
A test unit is considered to be comparable to the units to be manufactured if the following
requirements are satisfied:
a) elements meeting the requirements of Clause A.1 shall be similarly assembled, have
equal or thinner inter-element insulation, be equally pressed within the manufacturing
tolerance, etc., as compared with the units to be manufactured;
b) a suitable number of elements shall be connected to give not less than 100 kvar output at
rated voltage (50 Hz). All connected elements shall be placed adjacent to each other.
NOTE The connected elements may be series and parallel-connected in any way to match the test
equipment.
c) the connections outside the tested elements may be enlarged in order to handle the
increased currents due, for example, to a number of elements in parallel;
d) the insulation to the container shall be of the same thickness or thicker;
NOTE This requirement is intended to ensure that the drying and impregnation conditions are equal to those
of the units to be produced. The electrical withstand requirements of the insulation to container are taken care
of by the tests according to Clauses 10 and 15 of IEC 60871-1:2014.
© IEC 2022
e) a container shall be used, the height of which is not less than 20% of the height of the unit
to be manufactured. The depth and width of the container shall not be less than 50%.
NOTE These ranges in container dimensions are necessary to allow for the variation in element sizes.
The container material shall be of equal type (metal, polymer etc.), but the painting can be
omitted or may be different.
The bushing design and number of bushings may be adjusted in order to match the test
voltage and/or test currents;
f) the drying and impregnation process shall be identical with the normal production process.
– 16 – IEC TS 60871-2:2014+AMD1:2022 CSV
© IEC 2022
Annex B
(informative)
Definition of element and capacitor container dimensions
B.1 Flattened pressed element
As shown in Figure B.1, the element has been pressed flat in the height direction.
Width
Height
(Flat-pressed) length
IEC
Figure B.1 – Flattened pressed element
Element or (active) foil length is obtained by unwinding the element in the length direction.
B.2 Capacitor container
Height
Depth
Width
IEC
Figure B.2 – Capacitor container
Height is always determined from the side on which the bushings are fitted to the opposite
side. Normally the length dimension of the flattened element corresponds to the container
depth dimension. Depending on the design, the element width direction may correspond to
either the container height or the container width dimension (see Figure B.2).
_____________
IEC TS 60871-2 ®
Edition 3.1 2022-03
CONSOLIDATED VERSION
FINAL VERSION
Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V –
Part 2: Endurance testing
– 2 – IEC TS 60871-2:2014+AMD1:2022 CSV
© IEC 2022
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Quality requirements and tests . 7
4.1 Test requirements – General purpose . 7
4.2 Test procedure . 7
4.2.1 General . 7
4.2.2 Routine test . 7
4.2.3 Conditioning of the units before the test . 7
4.3 Ageing test . 7
4.3.1 Initial capacitance and dielectric loss measurements . 7
4.3.2 Final capacitance and dielectric loss measurements . 8
4.3.3 Acceptance criteria . 8
4.4 Validity of test . 8
5 Element fail safe test for fuseless capacitors . 8
5.1 General . 8
5.2 Test unit . 9
5.2.1 General . 9
5.2.2 Set-up of the test unit, first method . 9
5.2.3 Set-up of the test unit, second method . 9
5.2.4 Active element for the low energy test . 9
5.2.5 Active element for the high energy test . 10
5.3 Conditioning of the unit . 10
5.3.1 General . 10
5.3.2 Circuit for achieving a failed test unit, first method . 10
5.3.3 Circuit for achieving a failed test unit, second method . 11
5.3.4 Failure of the unit for the low energy test . 11
5.3.5 Failure of the unit for the high energy test . 12
5.4 Test procedure . 12
5.4.1 General . 12
5.4.2 Discharge test . 12
5.4.3 Load current test . 12
5.4.4 AC voltage test between terminals and container . 13
5.5 Success criteria . 13
Annex A (normative) Requirements regarding comparable element design and test
unit design . 14
A.1 Test element design criteria . 14
A.2 Test unit design . 14
Annex B (informative) Definition of element and capacitor container dimensions . 16
B.1 Flattened pressed element . 16
B.2 Capacitor container . 16
Figure 1 – Puncture location on the active element . 10
Figure 2 – Electric circuit for conditioning of the units . 11
© IEC 2022
Figure 3 – Electric circuit for the discharge test. 12
Figure 4 – Electric circuit for the load current test . 13
Figure B.1 – Flattened pressed element . 16
Figure B.2 – Capacitor container . 16
...
IEC TS 60871-2 ®
Edition 3.0 2014-11
TECHNICAL
SPECIFICATION
SPECIFICATION
TECHNIQUE
Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V –
Part 2: Endurance testing
Condensateurs shunt pour réseaux à courant alternatif de tension assignée
supérieure à 1 000 V –
Partie 2: Essais d’endurance
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IEC TS 60871-2 ®
Edition 3.0 2014-11
TECHNICAL
SPECIFICATION
SPECIFICATION
TECHNIQUE
Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V –
Part 2: Endurance testing
Condensateurs shunt pour réseaux à courant alternatif de tension assignée
supérieure à 1 000 V –
Partie 2: Essais d’endurance
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX K
ICS 29.249.99; 31.060.70 ISBN 978-2-8322-1937-9
– 2 – IEC TS 60871-2:2014 © IEC 2014
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Quality requirements and tests . 6
4.1 Test requirements – General purpose . 6
4.2 Test procedure . 6
4.2.1 General . 6
4.2.2 Routine test . 6
4.2.3 Conditioning of the units before the test . 6
4.3 Ageing test . 6
4.3.1 Initial capacitance and dielectric loss measurements . 6
4.3.2 Final capacitance and dielectric loss measurements . 7
4.3.3 Acceptance criteria . 7
4.4 Validity of test . 7
Annex A (normative) Requirements regarding comparable element design and test
unit design . 8
A.1 Test element design criteria . 8
A.2 Test unit design . 8
Annex B (informative) Definition of element and capacitor container dimensions . 10
B.1 Flattened pressed element . 10
B.2 Capacitor container . 10
Figure B.1 – Flattened pressed element . 10
Figure B.2 – Capacitor container . 10
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SHUNT CAPACITORS FOR AC POWER SYSTEMS
HAVING A RATED VOLTAGE ABOVE 1 000 V –
Part 2: Endurance testing
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
The main task of IEC technical committees is to prepare International Standards. In
exceptional circumstances, a technical committee may propose the publication of a technical
specification when
• the required support cannot be obtained for the publication of an International Standard,
despite repeated efforts, or
• the subject is still under technical development or where, for any other reason, there is the
future but no immediate possibility of an agreement on an International Standard.
Technical specifications are subject to review within three years of publication to decide
whether they can be transformed into International Standards.
IEC/TS 60871-2, which is a technical specification, has been prepared by IEC technical
committee 33: Power capacitors and their applications.
– 4 – IEC TS 60871-2:2014 © IEC 2014
This third edition cancels and replaces the second edition published in 1999. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) The overvoltage cycling test has been moved to IEC 60871-1:2014.
The text of this technical specification is based on the following documents:
Enquiry draft Report on voting
33/536/DTS 33/565/RVC
Full information on the voting for the approval of this technical specification can be found in
the report on voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60871 series, published under the general title Shunt capacitors
for a.c. power systems having a rated voltage above 1 000 V, can be found on the IEC
website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• transformed into an International standard,
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
SHUNT CAPACITORS FOR AC POWER SYSTEMS
HAVING A RATED VOLTAGE ABOVE 1 000 V –
Part 2: Endurance testing
1 Scope
This part of IEC 60871, which is a technical specification, applies to capacitors according to
IEC 60871-1 and gives the requirements for ageing tests of these capacitors.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60871-1:2014, Shunt capacitors for a.c. power systems having a rated voltage above
1 000 V – Part 1: General
IEC TR 60996, Method for verifying accuracy of tan delta measurements applicable to
capacitors
3 Terms and definitions
For the purpose of this technical specification, the following terms and definitions apply in
addition to those given in IEC 60871-1:
3.1
test unit
one of the units to be manufactured or a special unit which, with respect to the properties to
be checked by the ageing test, is equivalent to the units to be manufactured
Note 1 to entry: The restrictions on test unit design are detailed in Annex A.
3.2
comparable element design
range of construction elements that will be comparable in performance, under the test
procedure, with elements of the units to be manufactured
Note 1 to entry: See Annex A for detailed design limits.
3.3
inter-element insulation
insulation between two series-connected elements, consisting of:
– the outer turns of the insulation layers around the electrodes in an element, or
– a separate insulation layer placed between the two elements
Note 1 to entry: This separate insulation layer may protrude outside the width and (or) length dimension(s) of the
flattened element (see Annex B).
– 6 – IEC TS 60871-2:2014 © IEC 2014
4 Quality requirements and tests
4.1 Test requirements – General purpose
The ageing test is a special test carried out in order to ascertain that the progression of
deterioration resulting from increased voltage stress at elevated temperature does not cause
untimely failure of the dielectric. It is a mean to ensure that basic material selection is
properly made and that any rapid deterioration does not take place. The test should not be
seen as a tool for any exact assessment of life characteristics of a dielectric. For that purpose
various research and development activities are to be taken care of by the manufacturers.
The ageing test shall be carried out as special tests by the manufacturer for a particular
dielectric system, i.e. not for each particular capacitor rating. The test results are applicable to
a wide range of capacitor ratings within the limits defined in Annex A. The purchaser shall, on
request, be supplied with a certificate detailing the results of such tests.
4.2 Test procedure
4.2.1 General
The ageing test shall be carried out in the sequence given below. The applied test voltage
shall have a frequency of 50 Hz or 60 Hz, except for the test according to 4.2.2 where a d.c.
voltage can be used according to 9.3 of IEC 60871-1:2014.
4.2.2 Routine test
The test unit shall be subjected to the routine voltage test between the terminals (see
IEC 60871-1) with an amplitude such that the correct test voltage is obtained across each
element.
4.2.3 Conditioning of the units before the test
The test unit shall be subjected to a voltage of not less than 1,1 U at an ambient temperature
N
of not less than +10 °C for not less than 16 h.
NOTE The conditioning is carried out to stabilize the dielectric properties of the test units.
4.3 Ageing test
4.3.1 Initial capacitance and dielectric loss measurements
The capacitor unit shall be measured at 0,9 to 1,1 times the rated voltage. The choice of
temperature is left to the manufacturer.
4.3.1.1 Test method
The ambient temperature during the ageing test shall be not less than 55 °C.
It is anticipated, given the limits for the test object specified in Annex A, that more than 60 °C
average dielectric temperature is achieved. If requested by the purchaser further details about
the relation between external and internal (dielectric) temperatures should be given by the
manufacturer. The dielectric temperature may be measured with thermocouples on specially
prepared test units or estimated from previously established relationships between internal
and external temperatures such as by use of resistive dummy capacitors described in
IEC 60996.
The ambient temperature shall be held constant with a tolerance of –2 °C to +5 °C. Prior to
energization, the test units shall be stabilized in this ambient for 12 h. Due to the length of this
test, voltage interruptions are allowed. During these interruptions, the units shall remain in the
controlled ambient. If power is lost to the chamber, the ambient temperature shall be
reattained for 12 h prior to re-energization of the units.
The testing time shall depend on the test voltage. Either one of the following test conditions
shall be used:
Test voltage Duration
h
1,25 U 3 000
N
1,40 U 1 000
N
4.3.2 Final capacitance and dielectric loss measurements
The measurement shall be repeated under the same conditions as for the initial
measurement, within a temperature tolerance of ±5°C. The measurements shall be made
within two days after completing the tests in 4.1.3.2.
4.3.3 Acceptance criteria
No breakdown shall occur when two units have been tested, or alternatively one breakdown is
accepted when three units have been tested.
To verify no breakdown the capacitance measurements performed in 4.3.1 and 4.3.2 shall
differ by less than an amount corresponding to breakdown of an element.
4.4 Validity of test
The ageing test is a test on the elements (their dielectric design and composition), and on
their processing (element winding, drying and impregnation) when assembled in a capacitor
unit. Each ageing test will also cover other capacitor designs, which are allowed to differ from
the tested design within the limits stated in Annex A.
A test performed at 50 Hz is also applicable for 60 Hz (and lower frequency) units and vice
versa.
– 8 – IEC TS 60871-2:2014 © IEC 2014
Annex A
(normative)
Requirements regarding comparable
element design and test unit design
A.1 Test element design criteria
A tested element design is considered to be comparable with respect to the elements in the
units to be manufactured if the following requirements are fulfilled:
a) the tested element shall have the same or an inferior number of layers of solid materials in
the dielectric and be impregnated with the same liquid.
the dielectric shall be within 70°% to 130°% of the thickness and be rated at equal or
higher electrical stress.
when a dielectric contains both film and paper, the stress value to be used in this
comparison is the stress across each of the solid materials, calculated using the thickness
of only the solid materials and their respective permittivity.
for the ageing test, using resistors and/or internal fuses is irrelevant for the test. It is up to
the manufacturer to choose.
b) the dielectric composition of the solid materials shall be the same, for example all-film or
all-paper or film-paper-film, etc.;
c) solid and liquid dielectric materials shall satisfy the same manufacturer’s specifications;
d) the aluminium-foil design shall be the same:
– same manufacturer’s specification;
– thickness within ±20 %;
– extended or non-extended foil edges;
– folded foil at the edges and (or) cut ends if it is a feature of the design;
– less or equal free margin;
e) element connections shall be of the same type, for example tabs, soldering, etc.;
f) the element width (active foil width) is allowed to vary within 50°% to 400°% and the
element length (active foil length) is allowed to vary within 30°% to 300°% (see Annex B).
A.2 Test unit design
A test unit is considered to be comparable to the units to be manufactured if the following
requirements are satisfied:
a) elements meeting the requirements of Clause A.1 shall be similarly assembled, have
equal or thinner inter-element insulation, be equally pressed within the manufacturing
tolerance, etc., as compared with the units to be manufactured;
b) a suitable number of elements shall be connected to give not less than 100 kvar output at
rated voltage (50 Hz). All connected elements shall be placed adjacent to each other.
NOTE The connected elements may be series and parallel-connected in any way to match the test
equipment.
c) the connections outside the tested elements may
...
Frequently Asked Questions
IEC TS 60871-2:2014 is a technical specification published by the International Electrotechnical Commission (IEC). Its full title is "Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V - Part 2: Endurance testing". This standard covers: IEC/TS 60871-2:2014 which is a technical specification, applies to capacitors according to IEC 60871-1 and gives the requirements for ageing tests of these capacitors. This third edition cancels and replaces the second edition published in 1999. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: The overvoltage cycling test has been moved to IEC 60871-1:2014. Keywords: ageing tests of capacitors
IEC/TS 60871-2:2014 which is a technical specification, applies to capacitors according to IEC 60871-1 and gives the requirements for ageing tests of these capacitors. This third edition cancels and replaces the second edition published in 1999. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: The overvoltage cycling test has been moved to IEC 60871-1:2014. Keywords: ageing tests of capacitors
IEC TS 60871-2:2014 is classified under the following ICS (International Classification for Standards) categories: 29.240.99 - Other equipment related to power transmission and distribution networks; 31.060.70 - Power capacitors. The ICS classification helps identify the subject area and facilitates finding related standards.
IEC TS 60871-2:2014 has the following relationships with other standards: It is inter standard links to IEC TS 60871-2:2014/AMD1:2022, IEC TS 60871-2:1999. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
You can purchase IEC TS 60871-2:2014 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of IEC standards.
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