IEC 62884-1:2017

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement

IEC 62884-1:2017 specifies the measurement techniques for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators using FBAR (hereinafter referred to as "Oscillator")

Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques - Partie 1: Méthodes fondamentales pour le mesurage

L'IEC 62884-1:2017 spécifie les techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques, y compris les oscillateurs à résonateur diélectrique (DRO – Dielectric Resonator Oscillators) et les oscillateurs utilisant des résonateurs et filtres à ondes de volume sur couches minces (FBAR) (ici appelé "Oscillateur").
NOTE: Les oscillateurs à résonateur diélectrique (DRO) et les oscillateurs utilisant FBAR sont à l'étude.

General Information

• Status: Published
• Publication Date: 07-Jun-2017
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 11.040.50 - Radiographic equipment
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
• Drafting Committee: WG 7 - TC 49/WG 7
• Current Stage: PPUB - Publication issued
• Start Date: 22-Jun-2017
• Completion Date: 08-Jun-2017

Standards Content (Sample)

IEC 62884-1 ®
Edition 1.0 2017-06
INTERNATIONAL
STANDARD
colour
inside
Measurement techniques of piezoelectric, dielectric and electrostatic
oscillators –
Part 1: Basic methods for the measurement
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
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IEC 62884-1 ®
Edition 1.0 2017-06
INTERNATIONAL
STANDARD
colour
inside
Measurement techniques of piezoelectric, dielectric and electrostatic

oscillators –
Part 1: Basic methods for the measurement

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.140 ISBN 978-2-8322-4395-4

– 2 – IEC 62884-1:2017  IEC 2017
CONTENTS
FOREWORD . 6
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 9
3.1 General . 9
3.2 Terms and definitions . 10
4 Test and measurement procedures . 10
4.1 General . 10
4.2 Test and measurement conditions . 10
4.2.1 Standard conditions for testing . 10
4.2.2 Equilibrium conditions . 10
4.2.3 Air flow conditions for temperature tests . 10
4.2.4 Power supplies . 11
4.2.5 Precision of measurement . 11
4.2.6 Precautions . 11
4.2.7 Alternative test methods . 11
4.3 Visual inspection . 11
4.3.1 General . 11
4.3.2 Visual test A . 11
4.3.3 Visual test B . 11
4.3.4 Visual test C . 12
4.4 Dimensions and gauging procedures . 12
4.4.1 Dimensions – Test A . 12
4.4.2 Dimensions – Test B . 12
4.5 Electrical test procedures . 12
4.5.1 Insulation resistance . 12
4.5.2 Voltage proof . 12
4.5.3 Input power . 13
4.5.4 Output frequency . 14
4.5.5 Frequency/temperature characteristics . 15
4.5.6 Frequency/load coefficient . 16
4.5.7 Frequency/voltage coefficient . 17
4.5.8 Frequency stability with thermal transient . 17
4.5.9 Oscillation start-up. 18
4.5.10 Stabilization time . 22
4.5.11 Frequency adjustment range. 22
4.5.12 Retrace characteristics . 22
4.5.13 Oscillator output voltage (sinusoidal) . 23
4.5.14 Oscillator output voltage (pulse waveform) . 24
4.5.15 Oscillator output waveform (sinusoidal) . 25
4.5.16 Oscillator output waveform (pulse) . 27
4.5.17 Oscillator output power (sinusoidal) . 27
4.5.18 Oscillator output impedance (sinusoidal) . 27
4.5.19 Re-entrant isolation . 28
4.5.20 Output suppression of gated oscillators . 28
4.5.21 3-state output characteristics . 29
4.5.22 Amplitude modulation characteristics . 30

4.5.23 Frequency modulation characteristics . 36
4.5.24 Spurious response . 40
4.5.25 Phase noise . 40
4.5.26 Phase noise – vibration . 41
4.5.27 Phase noise – acoustic . 41
4.5.28 Noise pedestal . 42
4.5.29 Spectral purity . 43
4.5.30 Incidental frequency modulation . 43
4.5.31 RMS fractional frequency fluctuations . 44
4.5.32 Electromagnetic interference (radiated) . 48
4.6 Mechanical and environmental test procedures . 52
4.6.1 Robustness of terminations (destructive) . 52
4.6.2 Sealing test (non-destructive) . 54
4.6.3 Soldering (solderability and resistance to soldering heat) (destructive) . 54
4.6.4 Rapid change of temperature: severe shock by liquid immersion (non-
destructive). 57
4.6.5 Rapid change of temperature: thermal shock in air (non-destructive) . 57
4.6.6 Bump (destructive) . 57
4.6.7 Vibration (destructive). 58
4.6.8 Shock (destructive) . 58
4.6.9 Free fall (destructive) . 59
4.6.10 Acceleration, steady-state (non-destructive) . 59
4.6.11 Acceleration – 2g tip over . 59
4.6.12 Acceleration noise . 59
4.6.13 Low air pressure (non-destructive) . 59
4.6.14 Dry heat (non-destructive) . 59
4.6.15 Damp heat, cyclic (destructive) . 59
4.6.16 Cold (non-destructive) . 60
4.6.17 Climatic sequence (destructive) . 60
4.6.18 Damp heat, steady-state (destructive) . 60
4.6.19 Salt mist, cyclic (destructive) . 60
4.6.20 Mould growth (non-destructive) . 60
4.6.21 Immersion in cleaning solvent (non-destructive) . 60
4.6.22 Radiation hardness . 60
Bibliography . 61

Figure 1 – Test circuits for insulation resistance measurements . 12
Figure 2 – Test circuit for voltage proof test . 13
Figure 3 – Test circuit for oscillator input power measurement . 13
Figure 4 – Test circuit for oven and oscillator input power measurement . 14
Figure 5 – Test circuit for measurement of output frequency, method1 . 15
Figure 6 – Test circuit for measurement of output frequency, method 2 . 15
Figure 7 – Test circuit for measurement of frequency/temperature characteristics . 16
Figure 8 – Thermal transient behaviour of typical oscillator . 18
Figure 9 – Generalized oscillator circuit . 19
Figure 10 – Test circuit for start-up behaviour and start-up time measurement. 20
Figure 11 – Typical start-up behaviour with slow supply voltage ramp . 20

– 4 – IEC 62884-1:2017  IEC 2017
Figure 12 – Definition of start-up time . 21
Figure 13 – Supply voltage waveform for periodical t measurement . 22
SU
Figure 14 – Typical oscillator stabilization char
...

IEC 62884-1 ®
Edition 1.0 2017-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Measurement techniques of piezoelectric, dielectric and electrostatic
oscillators –
Part 1: Basic methods for the measurement

Techniques de mesure des oscillateurs piézoélectriques, diélectriques et
électrostatiques –
Partie 1: Méthodes fondamentales pour le mesurage

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
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About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

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IEC 62884-1 ®
Edition 1.0 2017-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Measurement techniques of piezoelectric, dielectric and electrostatic

oscillators –
Part 1: Basic methods for the measurement

Techniques de mesure des oscillateurs piézoélectriques, diélectriques et

électrostatiques –
Partie 1: Méthodes fondamentales pour le mesurage

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-7263-3

– 2 – IEC 62884-1:2017  IEC 2017
CONTENTS
FOREWORD . 6
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 9
3.1 General . 9
3.2 Terms and definitions . 10
4 Test and measurement procedures . 10
4.1 General . 10
4.2 Test and measurement conditions . 10
4.2.1 Standard conditions for testing . 10
4.2.2 Equilibrium conditions . 10
4.2.3 Air flow conditions for temperature tests . 10
4.2.4 Power supplies . 11
4.2.5 Precision of measurement . 11
4.2.6 Precautions . 11
4.2.7 Alternative test methods . 11
4.3 Visual inspection . 11
4.3.1 General . 11
4.3.2 Visual test A . 11
4.3.3 Visual test B . 11
4.3.4 Visual test C . 11
4.4 Dimensions and gauging procedures . 12
4.4.1 Dimensions – Test A . 12
4.4.2 Dimensions – Test B . 12
4.5 Electrical test procedures . 12
4.5.1 Insulation resistance . 12
4.5.2 Voltage proof . 12
4.5.3 Input power . 13
4.5.4 Output frequency . 14
4.5.5 Frequency/temperature characteristics . 15
4.5.6 Frequency/load coefficient . 16
4.5.7 Frequency/voltage coefficient . 17
4.5.8 Frequency stability with thermal transient . 17
4.5.9 Oscillation start-up. 18
4.5.10 Stabilization time . 22
4.5.11 Frequency adjustment range. 22
4.5.12 Retrace characteristics . 23
4.5.13 Oscillator output voltage (sinusoidal) . 23
4.5.14 Oscillator output voltage (pulse waveform) . 24
4.5.15 Oscillator output waveform (sinusoidal) . 25
4.5.16 Oscillator output waveform (pulse) . 27
4.5.17 Oscillator output power (sinusoidal) . 27
4.5.18 Oscillator output impedance (sinusoidal) . 27
4.5.19 Re-entrant isolation . 28
4.5.20 Output suppression of gated oscillators . 28
4.5.21 3-state output characteristics . 29
4.5.22 Amplitude modulation characteristics . 30

4.5.23 Frequency modulation characteristics . 36
4.5.24 Spurious response . 40
4.5.25 Phase noise . 40
4.5.26 Phase noise – vibration . 41
4.5.27 Phase noise – acoustic . 41
4.5.28 Noise pedestal . 41
4.5.29 Spectral purity . 43
4.5.30 Incidental frequency modulation . 43
4.5.31 RMS fractional frequency fluctuations . 44
4.5.32 Electromagnetic interference (radiated) . 48
4.6 Mechanical and environmental test procedures . 52
4.6.1 Robustness of terminations (destructive) . 52
4.6.2 Sealing test (non-destructive) . 54
4.6.3 Soldering (solderability and resistance to soldering heat) (destructive) . 54
4.6.4 Rapid change of temperature: severe shock by liquid immersion (non-
destructive). 57
4.6.5 Rapid change of temperature: thermal shock in air (non-destructive) . 57
4.6.6 Bump (destructive) . 57
4.6.7 Vibration (destructive). 58
4.6.8 Shock (destructive) . 59
4.6.9 Free fall (destructive) . 59
4.6.10 Acceleration, steady-state (non-destructive) . 59
4.6.11 Acceleration – 2g tip over . 59
4.6.12 Acceleration noise . 59
4.6.13 Low air pressure (non-destructive) . 59
4.6.14 Dry heat (non-destructive) . 59
4.6.15 Damp heat, cyclic (destructive) .
...