IEC 62860-1:2013

Test methods for the characterization of organic transistor-based ring oscillators

IEC 62860-1:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators. Keywords: electrical characterization, high-impedance printing, organic transistor, printed electronics, ring oscillator

General Information

• Status: Published
• Publication Date: 04-Aug-2013
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 07.030 - Physics. Chemistry
• ICS: 07.120 - Nanotechnologies
• Technical Committee: TC 113 - Nanotechnology for electrotechnical products and systems
• Current Stage: PPUB - Publication issued
• Start Date: 15-Nov-2013
• Completion Date: 05-Aug-2013

Standards Content (Sample)

IEC 62860-1
Edition 1.0 2013-08
™
IEEE Std 1620.1
INTERNATIONAL

STANDARD



Test methods for the characterization of organic transistor-based ring
oscillators

IEC 62860-1:2013(E)  IEEE Std. 1620.1-2006

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IEC 62860-1


Edition 1.0 2013-08



IEEE Std 1620.1™

INTERNATIONAL



STANDARD



















Test methods for the characterization of organic transistor-based ring

oscillators



























INTERNATIONAL

ELECTROTECHNICAL

COMMISSION

PRICE CODE
R


ICS 07.030 ISBN 978-2-8322-1015-4



  Warning! Make sure that you obtained this publication from an authorized distributor.

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– ii – IEC 62860-1:2013(E)
 IEEE Std 1620.1-2006
Contents
1. Overview . 1
1.1 Scope . 1
1.2 Purpose . 1
1.3 Electrical characterization overview . 1
2. Definitions, abbreviations and acronyms . 4
2.1 Definitions . 4
2.2 Acronyms . 4
3. Standard ring oscillator characterization procedures . 5
3.1 Circuit layout . 5
3.2 Guidelines for the ring oscillator characterization process . 5
3.3 Other applicable standards .
...