IEC 62860-1:2013
(Main)Test methods for the characterization of organic transistor-based ring oscillators
Test methods for the characterization of organic transistor-based ring oscillators
IEC 62860-1:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators. Keywords: electrical characterization, high-impedance printing, organic transistor, printed electronics, ring oscillator
General Information
Standards Content (Sample)
IEC 62860-1
Edition 1.0 2013-08
™
IEEE Std 1620.1
INTERNATIONAL
STANDARD
Test methods for the characterization of organic transistor-based ring
oscillators
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IEC 62860-1
Edition 1.0 2013-08
IEEE Std 1620.1™
INTERNATIONAL
STANDARD
Test methods for the characterization of organic transistor-based ring
oscillators
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
R
ICS 07.030 ISBN 978-2-8322-1015-4
– ii – IEC 62860-1:2013(E)
IEEE Std 1620.1-2006
Contents
1. Overview . 1
1.1 Scope . 1
1.2 Purpose . 1
1.3 Electrical characterization overview . 1
2. Definitions, abbreviations and acronyms . 4
2.1 Definitions . 4
2.2 Acronyms . 4
3. Standard ring oscillator characterization procedures . 5
3.1 Circuit layout . 5
3.2 Guidelines for the ring oscillator characterization process . 5
3.3 Other applicable standards . 6
3.4 Reporting data. 6
3.5 Environmental control and standards .10
Annex A (informative) Bibliography .11
Annex B (informative) IEEE List of Participants . 12
Published by IEC under license from IEEE. © 2006 IEEE. All rights reserved.
IEEE Std 1620.1-2006
TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC
TRANSISTOR-BASED RING OSCILLATORS
FOREWORD
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Published by IEC under license from IEEE. © 2006 IEEE. All rights reserved.
– iv – IEC 62860-1:2013(E)
IEEE Std 1620.1-2006
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IEEE Std 1620.1™-2006 113/185/FDIS 113/195/RVD
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Published by IEC under license from IEEE. © 2006 IEEE. All rights reserved.
IEEE Std 1620.1-2006
IEEE Standard for Test Methods for
the Characterization of Organic
Transistor-Based Ring Oscillators
Sponsor
Microprocessor Standards Committee
of the
IEEE Computer Society
Approved 8 June 2006
IEEE-SA Standards Board
Published by IEC under license from IEEE. © 2006 IEEE. All rights reserved.
– vi – IEC 62860-1:2013(E)
IEEE Std 1620.1-2006
Abstract: Recommended methods and standardized reporting practices for electrical
characterization of printed and organic ring oscillators are covered. Due to the nature of printed
and organic circuits, significant measurement errors can be introduced if the electrical
characterization design-of-experiment is not properly addressed. This standard describes the
most common sources of measurement error, particularly for high-impedance electrical
measurements commonly required for printed and organic ring oscillators. This standard also
gives recommended practices in order to minimize and/or characterize the effect of measurement
artifacts and other sources of error encountered while measuring printed and organic ring
oscillators.
Keywords: electrical characterization, high-impedance printing, organic transistor, printed
electronics, ring oscillator
Published by IEC under license from IEEE. © 2006 IEEE. All rights reserved.
IEEE Std 1620.1-2006
IEEE Introduction
This introduction is not part of IEEE Std 1620.1-2006, IEEE Standard for Test Methods for the
Characterization of Organic Transistor-Based Ring Oscillators.
This standard covers recommended methods and standardized reporting practices for electrical
characterization of organic transistor-based ring oscillators. Due to the nature of organic transistors and
circuitry, significant measurement errors can be introduced if not properly addressed. This standard
describes the most common sources of measurement error and gives recommended practices in order to
minimize and/or characterize the effect of each.
Standard reporting practices are included in order to minimize confusion in analyzing reported data.
Disclosure of environmental conditions and design-of-experiment are included so that results can be
appropriately assessed by the research community. These reporting practices also support repeatability
...
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