Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification

Describes a high-performance backplane bus for use in microprocessor bases systems. This parallel bus supports single- and block-transfer cycles on a 32-bit non-multiplexed address and data highway. Transmission is governed by an asynchronous handshaken protocol. The bus allocation provides for multiprocessor architectures. This bus also supports inter-module interrupts for facilitating quick response to internal and external events. The mechanics of the boards and chassis are based on IEC 60297.[
]Note: -1.This bus is similar to the VME bus. 2.For the price of this publication, please consult the ISO/IEC price-code list.

Amendement 1 - Résonateurs à quartz sous assurance de la qualité - Partie 1: Spécification générique

Décrit un bus de fond de panier à haute performance utilisable dans les systèmes à microprocesseurs. Ce bus parallèle permet des cycles de transfert, soit uniques, soit par blocs, sur une voie d'adresses et de données de 32 bits non multiplexées. La transmission est gérée par un protocole de dialogue asynchrone. L'allocation du bus permet une architecture multiprocesseur. Ce bus permet également l'utilisation d'interruptions entre modules, facilitant une réponse rapide à des événements internes ou externes. La mécanique des cartes et des châssis est conçue à partir de la CEI 60297.[
]Notes: 1.  Ce bus est similaire au bus VME. 2.  Pour le prix de cette publication, veuillez consulter la liste du code-prix ISO/CEI.

General Information

Status
Published
Publication Date
07-Dec-2017
Current Stage
PPUB - Publication issued
Completion Date
08-Dec-2017
Ref Project

Buy Standard

Standard
IEC 60122-1:2002/AMD1:2017 - Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification
English and French language
17 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (sample)

IEC 60122-1
Edition 3.0 2017-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Quartz crystal units of assessed quality –
Part 1: Generic specification
Résonateurs à quartz sous assurance de la qualité –
Partie 1: Spécification générique
IEC 60122-1:2002-08/AMD1:2017-12 (en-fr)
---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2017 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from

either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC

copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or

your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite

ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie

et les microfilms, sans l'accord écrit de l'IEC ou du Comité national de l'IEC du pays du demandeur. Si vous avez des

questions sur le copyright de l'IEC ou si vous désirez obtenir des droits supplémentaires sur cette publication, utilisez

les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC

The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes

International Standards for all electrical, electronic and related technologies.
About IEC publications

The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the

latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org

The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,

variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English

committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.

and withdrawn publications. Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished

Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary

details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and

once a month by email. French extracted from the Terms and Definitions clause of

IEC publications issued since 2002. Some entries have been

IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and

If you wish to give us your feedback on this publication or CISPR.
need further assistance, please contact the Customer Service
Centre: sales@iec.ch.
A propos de l'IEC

La Commission Electrotechnique Internationale (IEC) est la première organisation mondiale qui élabore et publie des

Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications IEC

Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possédez l’édition la

plus récente, un corrigendum ou amendement peut avoir été publié.
Recherche de publications IEC - Electropedia - www.electropedia.org

webstore.iec.ch/advsearchform Le premier dictionnaire d'électrotechnologie en ligne au

La recherche avancée permet de trouver des publications IEC monde, avec plus de 22 000 articles terminologiques en

en utilisant différents critères (numéro de référence, texte, anglais et en français, ainsi que les termes équivalents dans

comité d’études,…). Elle donne aussi des informations sur les 16 langues additionnelles. Egalement appelé Vocabulaire

projets et les publications remplacées ou retirées. Electrotechnique International (IEV) en ligne.

IEC Just Published - webstore.iec.ch/justpublished Glossaire IEC - std.iec.ch/glossary

Restez informé sur les nouvelles publications IEC. Just 67 000 entrées terminologiques électrotechniques, en anglais

Published détaille les nouvelles publications parues. et en français, extraites des articles Termes et Définitions des

Disponible en ligne et une fois par mois par email. publications IEC parues depuis 2002. Plus certaines entrées

antérieures extraites des publications des CE 37, 77, 86 et
Service Clients - webstore.iec.ch/csc CISPR de l'IEC.
Si vous désirez nous donner des commentaires sur cette
publication ou si vous avez des questions contactez-nous:
sales@iec.ch.
---------------------- Page: 2 ----------------------
IEC 60122-1
Edition 3.0 2017-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Quartz crystal units of assessed quality –
Part 1: Generic specification
Résonateurs à quartz sous assurance de la qualité –
Partie 1: Spécification générique
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-7377-7

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 3 ----------------------
– 2 – IEC 60122-1:2002/AMD1:2017
© IEC 2017
FOREWORD

This amendment has been prepared by IEC technical committee 49: Piezoelectric, dielectric

and electrostatic devices and associated materials for frequency control, selection and

detection.

This bilingual version (2019-11) corresponds to the monolingual English version, published in

2017-12.
The text of this amendment is based on the following documents:
FDIS Report on voting
49/1254/FDIS 49/1259/RVD

Full information on the voting for the approval of this amendment can be found in the report

on voting indicated in the above table.
The French version of this amendment has not been voted upon.

The committee has decided that the contents of this amendment and the base publication will

remain unchanged until the stability date indicated on the IEC website under

"http://webstore.iec.ch" in the data related to the specific publication. At this date, the

publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
1.2 Normative references
Add the following reference to the existing list of normative references:
IEC 61760-1:2006, Surface mounting technology – Part 1: Standard method for the
specification of surface mounting components (SMDs)
4.9 Endurance test procedure
Replace Subclause 4.9 with the following new content:
4.9 Endurance test procedure
4.9.1 Standard aging test for production verification
4.9.1.1 Purpose

This test is usable for the statistical verification of aging performance in the production

process.
---------------------- Page: 4 ----------------------
IEC 60122-1:2002/AMD1:2017 – 3 –
© IEC 2017
4.9.1.2 Procedure
– Take sample from the production lot.
– Initial measurement of f and R at (25 ± 2) °C.
s 1
– Store in oven at T = (+85 ± 3) °C.
oven

– Take and record additional measurements after 1 day and at least three more times at

time intervals recommended in Annex A.

– For the measurement, remove the crystals from oven, and store at room temperature for

and R at (25 ± 2) °C in accordance
1 h, avoiding temperature shocks. Measurement of f
s 1
with IEC 60444-5 or equivalent.
– Final measurement of f and R at (25 ± 2) °C after 30 days.
s 1
4.9.1.3 Evaluation

The difference between the highest and lowest frequency measurement shall not exceed the

specified value. The resistance R shall never exceed the specified maximum values.

4.9.2 Accelerated aging
4.9.2.1 Purpose

For special applications, an accelerated aging procedure at higher temperatures is applied to

shorten the verification time and/or to gain performance data at higher operating temperatures.

4.9.2.2 Procedure

The procedure is as in 4.9.1, except that the preferred oven temperature is T = +105 °C,

oven

+125 °C or +150 °C. This temperature has to be lower or equal to the specified maximum

storage temperature.

The ratio between the storage time at 25 °C and the storage time at an elevated temperature

T to achieve the same amount of frequency aging is called "time acceleration factor"

oven

(TAF). This factor depends on the design of the crystal unit and on the production process. It

can be determined experimentally as described in Annex A, or taken from experience with

structurally similar crystals, or can be mutually agreed between the manufacturer and the user.

If the time acceleration factor TAF is not otherwise specified, the following approach is

recommended.

Applying Arrhenius’s law, the time acceleration factor TAF is related to the activation energy

E (in eV) by the following equation:
 1 1 
E ⋅ − 
 
T T
 ref oven
TAF= e
where

k is Boltzmann’s constant (k ≈ 8,617 × 10 eV/K), and the temperatures are given in K.

Published experimental results (see [6] and [7]) show that the activation energy E is

decreasing over time, i.e. the acceleration factor becomes lower with the aging time.

Furthermore, E varies between the different crystals and oscillators, depending on frequency,

package size, resonator design and production processes. The observed values of E were

between > 0,1 eV and < 1 eV.
---------------------- Page: 5 ----------------------
– 4 – IEC 60122-1:2002/AMD1:2017
© IEC 2017

A common assumption is TAF = 12 for T = +85 °C, i.e. 30 days (1 month) aging at 85 °C

oven

are considered to be equivalent to 365 days (12 months) aging at 25 °C, which corresponds to

an activation energy E of 0,38 eV.

With this value of E , the time acceleration factor for other aging temperatures can be

calculated. Table 5 below shows the time acceleration factor TAF and the number of days N

equivalent to 365 days at 25 °C.
Table 5 – Time acceleration factors for E = 0,38 eV
T TAF N
oven d
°C days
+25 1 365
+85 12 30
+105 23 16
+125 41 9
+150 79 5

Other time acceleration factors may be agreed between the manufacturer and the user based

on their own reliability calculations.
4.9.2.3 Evaluation
The evaluation is as in 4.9.1.
4.9.3 Reference aging test
4.9.3.1 Purpose

This procedure is used for higher confidence level. This method should be used for high-

precision crystals and as reference method in case of dispute.
4.9.3.2 Procedure
See Annex A.
4.9.3.3 Evaluation
is subjected to the data fitting procedure.
The test data of the series resonance frequency f

The frequency measurement data f (t) shall be fitted using the method of least squares of the

following function (logarithmic fit):
 
Δf (t)
= a +a ×ln(a ×t+1)
  0 1 2
 init 
where

∆f(t) is the frequency difference of the crystal t days after the start of the aging cycle and the

initial frequency f measured after the stabilization time t (the time origin for
init stab
measurements analysis shall be the beginning of the stabilization period).

The coefficients a , a and a are constants to be determined from the least squares fit.

0 1 2
---------------------- Page: 6 ----------------------
IEC 60122-1:2002/AMD1:2017 – 5 –
© IEC 2017

The default fitting algorithm is the logarithmic fit. In some cases, namely when the aging

response has a very small curvature, the logarithmic fit may not yield reasonable results. In

this case, the following polynomial fit is recommended to be calculated additionally:

1 1
 
∆f (t)
2 3
= a + a ×t+ a ×t + a ×t
 
0 1 2 3
init
 

This approach should only be used if the square root of the least square fit variance (SLQ) of

the measurements from the polynomial fit is at least five times smaller than that of the

logarithmic fit.

The total frequency change and the aging rate at the end of the specified aging period (t = T )

shall be determined from the fitting equation using the constants determined from the least

squares fit. The square root of the least squares fit variance of the measurements from the

curve-fit function shall not exceed 5 % of the total aging change allowed during the test period.

For the logarithmic fitting (default), the aging rate (in ppm or ppb per day) at t = T is:

 
 
Δf (t)
 
 
 
a ×a f (T +1)− f (T )
init
   a a
1 2
= ≈
 
dt a ×T +1 f
2 a init
 
 
 
t=T
If the polynomial fitting was used, the aging rate at t = T (T > 0) is:
a a
 
 
Δf (t)
 
 
 
1 2
a a
init − −
   2 3
= a + ×T + ×T
2 3
1 a a
 
dt 2 3
 
 
 
t=T

The projected total frequency change for a time period shall be calculated with the following

formulas:
f (T + 30)− f (T )
a a
Aging per month ≈
init
f (T + 365)− f (T )
a a
Aging per (1 ) year ≈
init
f (T + N× 365)− f (T )
a a
Aging over N years ≈
init
The resistance R shall never exceed the specified maximum values.
___________
ppm = parts per million; ppb = parts per billion.
---------------------- Page: 7 ----------------------
– 6 – IEC 60122-1:2002/AMD1:2017
© IEC 2017
4.9.4 Extended aging
4.9.4.1 Purpose
The purpose is to evaluate the reliability and long-term performance.
4.9.4.2 Procedure

This test shall be carried out in accordance with 4.9.1, except that the continuous periods

shall be 1 000 h, 2 000 h or 8 000 h, as prescribed in the detail specification and shall be used

for information purposes only.

The measurements shall be carried out at (25 ± 2) °C or any other specified reference

temperature in accordance with IEC 60444-5 or equivalent.

The measurement intervals can be extended to two weeks or longer. For the intermediate and

the final measurement, the crystals can be removed from the oven, and stored at room

temperature for 1 h. Thermal shocks should be avoided.
4.9.4.3 Evaluation

The difference between the highest and lowest frequency measurement shall not exceed the

specified value (if applicable). The resistance R shall never exceed the specified maximum

values.

This test shall be used for information only. The crystal units used for these tests should not

be supplied to any customer.
---------------------- Page: 8 ----------------------
IEC 60122-1:2002/AMD1:2017 – 7 –
© IEC 2017
Add the following new Annex A:
Annex A
(normative)
Procedure for the determination of the fitting parameters
for the frequency aging
A.1 Assumption
A general description of frequency aging is possible in the form of:
∆f/f (t,T) = g(t) × h(T)
where
g(t) = b + b × log(b × t + 1) (logarithmic fit);
0 1 2

g(t) = c + c × (t – ) + c × (t – t )^(1/2) + c × (t – t )^(1/3) (polynomial fit);

0 1 t0 2 0 3 0
and
h(T) = a × exp(E × (1/T – 1/T)/k)
1 a ref
where

k is Boltzmann’s constant (k ≈ 8,617 × 10 eV/K), and the temperatures are given in K;

T is 298 K.
ref

A.2 Determination of the fitting parameters b , b , b (and/or c , c , c , c ) and a ,

0 1 2 0 1 2 3 1
and E
The procedure of Table A.1 shall be applied.
---------------------- Page: 9 ----------------------
– 8 – IEC 60122-1:2002/AMD1:2017
© IEC 2017
Table A.1 – Procedure for the determination of the frequency aging parameters
Procedure Conditions
Aging test procedure Passive
Reflow solder test 2x ROHS-profile (IEC 61760-1:2006)

Initial pre-aging 48 h at >20 K above upper operating temperature, but T < upper

(time and temperature) storage temperature
Sample size per lot ≥ 30
(from one production lot) depending on needed confidence level
Number of aging temperatures 3
Recommended aging temperatures 85 °C, 105 °C, 125 °C, 150 °C
depending on application,
T < specified upper storage temperature

Recommend temperature for (25 ± 2) °C, measurement > 1 h after removal from the temperature

measurement chamber. Avoid thermal shocks.
Recommended aging time 500 h, 1 000 h, 2 000 h
depending on needed confidence level
Test intervals After 48 h stabilization:

(in "logarithmic" steps) 24 h, 72 h, 250 h, 500 h, 750 h, 1 000 h (1 500 h, 2 000 h)

Least square fitting
Algorithms to determine g(t) and h(T)
g(t): log fit and polynomial fit
Polynomial fit – only if sum of least squares
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.