Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

Modification of the validity date: now put at 2007.

Corrigendum 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 2: Basse pression atmosphérique

Modification de la date de validité : fixée maintenant à 2007.

General Information

Status
Published
Publication Date
11-Aug-2003
Technical Committee
Current Stage
PPUB - Publication issued
Start Date
31-Aug-2003
Completion Date
12-Aug-2003
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IEC 60749-2:2002/COR1:2003 - Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure Released:8/12/2003
English and French language
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Standards Content (Sample)


CEI 60749-2 IEC 60749-2
(Première édition – 2002) (First edition – 2002)
DISPOSITIFS À SEMICONDUCTEURS – SEMICONDUCTOR DEVICES –
MÉTHODES D'ESSAIS MÉCANIQUES MECHANICAL AND CLIMATIC TEST METHODS –
ET CLIMATIQUES –
Partie 2: Basse pression atmosphérique Part 2: Low air pressure
CORRIGENDUM 1
Page 2 Page 3
Au lieu de: Instead of:
Le comité a décidé que le contenu de The committee has decided th
...

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