IEC 61000-4-16:2015
(Main)Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz
Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz
IEC 61000-4-16:2015 relates to the immunity requirements and test methods for electrical and electronic equipment to conducted, common mode disturbances in the range d.c. to 150 kHz. The object of this standard is to establish a common and reproducible basis for testing electrical and electronic equipment with the application of common mode disturbances to power supply, control, signal and communication ports. It has the status of a basic EMC publication in accordance with IEC Guide 107. This second edition cancels and replaces the first edition published in 1998, Amendment 1:2001 and Amendment 2:2009. This edition constitutes a technical revision.
Compatibilité électromagnétique (CEM) - Partie 4-16: Techniques d'essai et de mesure - Essai d'immunité aux perturbations conduites en mode commun dans la plage de fréquences de 0 Hz à 150 kHz
IEC 61000-4-16:2015 relates to the immunity requirements and test methods for electrical and electronic equipment to conducted, common mode disturbances in the range d.c. to 150 kHz. The object of this standard is to establish a common and reproducible basis for testing electrical and electronic equipment with the application of common mode disturbances to power supply, control, signal and communication ports. It has the status of a basic EMC publication in accordance with IEC Guide 107. This second edition cancels and replaces the first edition published in 1998, Amendment 1:2001 and Amendment 2:2009. This edition constitutes a technical revision.
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IEC 61000-4-16 ®
Edition 2.0 2015-12
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-16: Testing and measurement techniques – Test for immunity to
conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz
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IEC 61000-4-16 ®
Edition 2.0 2015-12
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-16: Testing and measurement techniques – Test for immunity to
conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.100.20 ISBN 978-2-8322-3079-4
– 2 – IEC 61000-4-16:2015 RLV © IEC 2015
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 8
3 Terms and definitions . 8
4 General . 9
5 Test levels . 10
5.1 General . 10
5.2 Test levels at mains frequency . 10
5.3 Test levels in the frequency range 15 Hz-150 kHz . 10
6 Test equipment . 11
6.1 Test generators . 11
6.1.1 General . 11
6.1.2 Characteristics and performance of the generator for d.c. tests . 11
6.1.3 Characteristics and performance of the generator for tests at mains
2/3
frequency: 16 Hz, 50 Hz and 60 Hz . 12
6.1.4 Characteristics and performance of the generator for tests in the
frequency range 15 Hz to 150 kHz . 12
6.2 Verification of the characteristics of the test generators . 13
6.3 Coupling/decoupling networks . 13
6.3.1 General . 13
6.3.2 Coupling networks . 13
6.3.3 Decoupling devices . 14
7 Test set-up . 14
7.1 General . 14
7.2 Earthing connections . 15
7.3 Equipment under test . 15
7.4 Test generators . 15
7.5 Decoupling/isolation devices. 15
8 Test procedure . 16
8.1 General . 16
8.2 Laboratory reference conditions. 16
8.2.1 General . 16
8.2.2 Climatic conditions . 16
8.2.3 Electromagnetic conditions . 16
8.3 Execution of the test . 16
9 Evaluation of test results and test report. 18
10 Test report . 19
Annex A (informative) Sources of disturbances and coupling mechanisms . 25
A.1 Sources of disturbances . 25
A.2 Coupling mechanisms . 25
Annex B (informative) Selection of test levels . 27
Bibliography . 28
Figure 1 – Example of equipment ports and configuration . 20
Figure 2 – Profile of the test voltage . 21
Figure 3 – Example Schematic in principle of the generator for d.c. and frequency
voltage tests 15 Hz up to 150 kHz . 21
Figure 4 – Example Schematic in principle of the generator for tests at mains frequency
⅔
(16 Hz, 50 Hz and 60 Hz) . 22
Figure 5 – Schematic circuit of the coupling T network for communication ports and
other ports intended for connection to highly balanced pairs . 23
Figure 6 – Schematic circuit for type tests . 24
Table 1 – Levels for continuous disturbance . 10
Table 2 – Levels for short duration disturbance . 10
Table 3 – Test levels in the frequency range 15 Hz to 150 kHz. 11
– 4 – IEC 61000-4-16:2015 RLV © IEC 2015
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-16: Testing and measurement techniques –
Test for immunity to conducted, common mode disturbances
in the frequency range 0 Hz to 150 kHz
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
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2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
This redline version of the official IEC Standard allows the user to identify the changes
made to the previous edition. A vertical bar appears in the margin wherever a change
has been made. Additions are in green text, deletions are in strikethrough red text.
International Standard IEC 61000-4-16 has been prepared by subcommittee 77A: Low-
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms part 4-16 of IEC 61000. It has the status of a basic EMC publication in accordance with
IEC Guide 107.
This second edition cancels and replaces the first edition published in 1998,
Amendment 1:2001 and Amendment 2:2009. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) clarification and complement of test generators' specifications and performances.
The text of this standard is based on the following documents:
FDIS Report on voting
77A/905/FDIS 77A/917/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61000 series, published under the general title Electromagnetic
compatibility (EMC), can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The “colour inside” logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this publication using a colour printer.
– 6 – IEC 61000-4-16:2015 RLV © IEC 2015
INTRODUCTION
This standard is part of the IEC 61000 series, according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards or
as technical specifications or technical reports, some of which have already been published as
sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: IEC 61000-6-1).
This part is an international standard which gives immunity requirements and test procedures
related to conducted, common mode disturbances in the range d.c. to 150 kHz.
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-16: Testing and measurement techniques –
Test for immunity to conducted, common mode disturbances
in the frequency range 0 Hz to 150 kHz
1 Scope
This part of IEC 61000 relates to the immunity requirements and test methods for electrical and
electronic equipment to conducted, common mode disturbances in the range d.c. to 150 kHz.
The object of this standard is to establish a common and reproducible basis for testing
electrical and electronic equipment with the application of common mode disturbances to
power supply, control, signal and communication ports.
This standard defines
• test voltage and current waveform;
• range of test levels;
• test equipment;
• test set-up;
• test procedures.
For some types of ports, for example ports intended to be used with highly balanced lines,
additional test provisions may be established by product committee specifications.
The test is intended to demonstrate the immunity of electrical and electronic equipment when
subjected to conducted, common mode disturbances such as those originating from power line
currents and return leakage currents in the earthing/grounding system.
The disturbances produced by 400 Hz mains systems are not included in the scope of this
standard.
Actual interference due to these disturbance phenomena is relatively rare, except in industrial
plants. Product committees should therefore consider whether there is a justification for
applying this standard in their product/product family standards (see also Clause 4).
This test is not relevant for equipment ports intended to be connected to short cables, having a
length less than 20 m or less.
The immunity to harmonics and interharmonics, including mains signalling, on a.c. power ports
(in differential mode) is not included in the scope of this standard and is covered by
IEC 61000-4-13 and IEC 61000-4-19.
The immunity to conducted disturbances generated by intentional radio-frequency transmitters
is not included in the scope of this standard and is covered by IEC 61000-4-6.
Some ITU-T Recommendations, e.g. K17, K20 and K21, establish similar methods for testing
the resistibility of equipment; however, they are dedicated to telecommunication ports and deal
with power induction at frequency of the a.c. mains or electric railways.
– 8 – IEC 61000-4-16:2015 RLV © IEC 2015
Product Committees are advised to consider the Recommendations above, as far as
applicable, in preparing their product standards.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
IEC 60050(161): 1990, International Electrotechnical Vocabulary (IEV) – Chapter 161:
Electromagnetic compatibility
IEC 60068-1: 1988, Environmental testing – Part 1: General and guidance
Void.
3 Terms and definitions
For the purposes of this document, the following terms and definitions are used and apply to
the restricted field of conducted, common mode disturbances in the range d.c. to 150 kHz.
NOTE Not all of the definitions given in Clause 3 are included in IEC 60050-161.
3.1
EUT
equipment under test
equipment (devices, appliances and systems) subjected to tests
Note 1 to entry: This note applies to the French language only.
3.2
auxiliary equipment
AE
equipment that is necessary for setting up all functions and assessing the correct performance
(operation) of the EUT during the test
3.3
port
particular interface of the specified equipment with the external electromagnetic environment
SEE: Figure 1.
3.4
coupling
interaction between circuits, transferring energy from one circuit to another
3.5
coupling network
electrical circuit for the purpose of transferring energy from one circuit to another
3.6
decoupling network
electrical circuit for the purpose of preventing test voltage applied to the equipment under test
from affecting other devices, equipment or systems which are not under test
3.7
immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
[SOURCE: IEC 60050-161:1990, 161-01-20]
3.8
source impedance of the test generator
ratio between the open circuit voltage and the short circuit current, expressed as:
V open circuit voltage / I short circuit current
oc sc
4 General
The conducted, common mode disturbances in the frequency range d.c. to 150 kHz may
influence the reliable operation of equipment and systems installed in residential areas,
industrial areas and electrical plants.
Only those ports of an EUT which are likely to be subjected to the disturbances dealt with by
this standard shall be considered for the application of its requirements.
The disturbances are typically generated by
• the power distribution system, with its fundamental frequency, significant harmonics and
interharmonics;
• power electronic equipment (e.g. power convertors), which may inject disturbances into the
ground conductors and earthing system (through stray capacitance or filters), or generate
disturbances in signal and control lines by induction.
At the mains frequency and harmonics of the mains frequency, the disturbances are usually
generated by the power distribution system (fault and leakage currents in the ground and
earthing systems).
At frequencies above the range of harmonics of the mains frequency (up to 150 kHz) the
disturbances are usually generated by power electronic equipment, which is often found in
industrial and electrical plants.
The coupling of the source of disturbances with the power supply, signal, control and
communication cables, transfer these disturbances to the ports of the equipment under test.
Because the coupling mechanisms defined above cannot be completely eliminated, it is
necessary for equipment to have adequate immunity to the disturbances.
Depending on the type of installation, the disturbances may be classified as follows:
2/3
a) voltage/current at power frequency: d.c., 16 Hz, 50 Hz and 60 Hz;
b) voltage/current in the frequency range 15 Hz to 150 kHz (including the harmonics of the
mains frequency).
This standard defines the test procedures for both the categories of disturbance defined above.
The applicability of the tests should be defined in the product standard.
Annex A contains more information on the phenomena.
– 10 – IEC 61000-4-16:2015 RLV © IEC 2015
5 Test levels
5.1 General
The preferred range of test levels, applicable to equipment ports as a function of the different
types and sources of disturbances, is given in 5.2 and 5.3.
2/3
The levels are given for the tests at the mains frequency (d.c., 16 Hz, 50 Hz and 60 Hz) and
in the frequency range 15 Hz to 150 kHz.
The applicability of each test shall be defined in the product standard.
The test voltage shall be applied in common mode to power supply, control, signal and
communication ports (the differential mode voltage is dependent on the circuit unbalance).
A guide for the selection of the test levels is given in Annex B.
5.2 Test levels at mains frequency
Tables 1 and 2 define the preferred test levels.
2/3
Hz, 50 Hz and
The levels apply to test voltage at d.c. and at the mains frequencies of 16
60 Hz.
Table 1 – Levels for continuous Table 2 – Levels for short duration
disturbance disturbance
Level Open circuit test voltage Level Open circuit test voltage
V (r.m.s.) V (r.m.s.)
1 1 1 10
2 3 2 30
3 10 3 100
4 30 4 300
x Special x Special
NOTE x is an open level. This level may be defined in NOTE x is an open level. This level may be defined
the product standard. in the product standard.
For short duration disturbances, the normal duration for each applied disturbance is 1 s;
however, product standards may specify different durations for specific applications.
2/3
The test shall be carried out at one or more of the following frequencies: d.c., 16 Hz, 50 Hz or
60 Hz, according to the relevant mains frequency in the equipment location (see annex A); the
2/3
test at 16 Hz is therefore only applicable where the equipment is intended to be used in the
proximity of railway systems at this frequency.
The test level shall not exceed the test voltage defined in the product standard.
Information on the proposed test levels is given in Annex B.
5.3 Test levels in the frequency range 15 Hz-150 kHz
Table 3 defines the preferred test levels.
Table 3 – Test levels in the frequency range 15 Hz to 150 kHz
Level Profile of the test voltage (open circuit)
V (r.m.s.)
15 Hz – 150 Hz 150 Hz – 1,5 kHz 1,5 kHz – 15 kHz 15 kHz – 150 kHz
1 1 – 0,1 0,1 0,1 – 1 1
2 3 – 0,3 0,3 0,3 – 3 3
3 10 – 1 1 1 – 10 10
4 30 – 3 3 3 – 30 30
x x x x x
NOTE 1 x is an open level. This level can be given in the product specification.
NOTE 2 The profile of the test voltage in relation to frequency (see Annex B for information) is as follows:
• starting from the frequency 15 Hz, the level decreases up to 150 Hz at 20 dB/decade;
• the level is constant from 150 Hz to 1,5 kHz;
• the level increases from 1,5 kHz to 15 kHz at 20 dB/decade;
• the level is constant from 15 kHz to 150 kHz.
The profile of the test voltage is represented in Figure 2.
No test level is defined below 15 Hz, excluding d.c., as tests in this frequency range are not
considered to be relevant.
6 Test equipment
6.1 Test generators
6.1.1 General
The features of the test generators for each specific test are given in 6.1.2, 6.1.3 and 6.1.4.
The generators shall have provisions to prevent the emission of disturbances which, if injected
in the power supply network, may influence the test results.
Information on the impedance of the test generators is given in Annex A.
6.1.2 Characteristics and performance of the generator for d.c. tests
The test generator typically consists of a d.c. power supply unit with variable output voltage and
a time controlled switch for the short duration test.
Generator for continuous disturbance
– waveform: direct current, ripple less than 5 %;
– open circuit output voltage range
1 V, with a relative tolerance of −10 % to 30 V, with a
(r.m.s.):
relative tolerance of +10 %;
– source impedance: V /I = 50 Ω, with a relative tolerance of ±10 %.
oc sc
– 12 – IEC 61000-4-16:2015 RLV © IEC 2015
Generator for short duration disturbance
– waveform: direct current, ripple less than 5 %;
– open circuit output voltage 10 V, with a relative tolerance of −10 % to 300 V, with
range:
a relative tolerance of +10 %;
– source impedance:
V /I = 50 Ω, with a relative tolerance of ±10 %;
oc sc
– rise and fall time of the output
between 1 µs and 5 µs.
voltage at on/off switching:
The schematic in principle of the test generator is given in Figure 3.
6.1.3 Characteristics and performance of the generator for tests at mains frequency:
2/3
16 Hz, 50 Hz and 60 Hz
The test generator typically consists of a variable transformer (connected to the mains
distribution network), an isolation transformer and a time controlled switch for the short
duration test; the switch shall be synchronized at 0° of the mains voltage waveform.
Generator for continuous disturbance
– waveform: sinusoidal, total harmonic distortion less than 10 %;
– open circuit output voltage range
1 V, with a relative tolerance of −10 % to 30 V, with a
(r.m.s.):
relative tolerance of +10 %;
– source impedance: V /I = 50 Ω, with a relative tolerance of ±10 %;
oc sc
– frequency: selected mains frequency.
Generator for short duration disturbance
– waveform: sinusoidal, total harmonic distortion less than 10 %;
– open circuit output voltage range
10 V, with a relative tolerance of − 10 % to 300 V,
(r.m.s):
with a relative tolerance of + 10 %;
– source impedance: V /I = 50 Ω, with a relative tolerance of ±10 %;
oc sc
– frequency: selected mains frequency;
– on/off switching of the output
synchronized at zero crossing (0° ± 5 %).
voltage:
The schematic in principle of the test generator is given in Figure 4.
6.1.4 Characteristics and performance of the generator for tests in the frequency
range 15 Hz to 150 kHz
The test generator typically consists of a waveform generator capable of covering the
–2
frequency band of interest. It shall have an automated sweep capability of 1 × 10 decade/s or
slower or, in the case of a synthesizer, be capable of being programmed with frequency-
dependent step-sizes of 10 % of the preceding frequency value. It shall also be capable of
being set manually.
Specifications
– waveform: sinusoidal, total harmonic distortion less than 1 %;
– open circuit output voltage range
0,1 V, with a relative tolerance of − 10 % to 30 V, with
(r.m.s.):
a relative tolerance of +10 %;
– source impedance:
V /I = 50 Ω, with a relative tolerance of ±10 %;
oc sc
– frequency range: 15 Hz, with a relative tolerance of −10 % to 150 kHz,
with a relative tolerance of +10 %.
6.2 Verification of the characteristics of the test generators
In order to make it possible to compare the results dealing with different test generators, they
must shall be calibrated or verified for the most essential characteristics.
The following generator characteristics must shall be verified:
• output voltage waveform;
• generator source impedance (V open circuit voltage / I short circuit current). The source
oc sc
impedance has to be verified:
– at highest and lowest test level for all generators: d.c.; a.c.; sweep;
– additionally for sweep generator at frequencies: 15 Hz, 1,5 kHz, 15 kHz, 150 kHz.
For the verification of the source impedance of short duration disturbance generator, the
first 50 ms may be disregarded;
• frequency accuracy;
• open circuit output voltage accuracy;
• rise and fall time of the output voltage at on/off switching (where applicable).
The verifications shall be carried out with voltage and current probes and together with an
oscilloscope or other equivalent measurement instrumentation with 1 MHz minimum bandwidth.
The accuracy of the measuring equipment shall be better than ±5 %.
6.3 Coupling/decoupling networks
6.3.1 General
The coupling networks enable the test voltage to be applied, in common mode, to the power
supply, input/output (signal and control) and communication ports of the EUT. The decoupling
networks prevent the application of the test voltage to the auxiliary equipment needed to
perform the test.
6.3.2 Coupling networks
6.3.2.1 Coupling network for power supply and input/output ports
For power supply and input/output ports, the coupling network for each conductor is composed
of a resistor and a capacitor in series. The coupling networks of each conductor are connected
in parallel to form the coupling network of the port.
Figure 6 shows a schematic circuit for a coupling network, the value of the capacitor is
C = 1,0 μF and the resistor is R = 100 × n Ω where n is the number of the conductors (n is
greater than or equal to 2).
The capacitors and the resistors for each of the conductors in the coupling network for a port
shall be matched with a tolerance of 1 %.
For the d.c. voltage test the 1,0 μF capacitors shall be short-circuited.
NOTE When performing the d.c. voltage test on a signal port, the impedance of the coupling network may cause
the operating signal to be degraded.
For screened cables, the test signal is injected directly onto the cable shield, so no coupling
network is required (see Figure 6).
– 14 – IEC 61000-4-16:2015 RLV © IEC 2015
6.3.2.2 Coupling networks for communication ports
For communication ports and other ports intended for connection to balanced pairs (single or
multiple pairs), the coupling network is a T network.
Figure 5 shows a schematic circuit for a T network. The value of the capacitor is C = 4,7 µF,
the resistor is R = 200 Ω and the inductor is L = 2 × 38 mH (bifilar winding).
The components of the T network shall be matched with a tolerance such that the T network
does not significantly degrade the common mode rejection ratio of the EUT.
NOTE It may be possible to produce T networks suitable for use with common mode rejection
ratios greater than 80 dB, in which case the product standard should define an alternative
coupling method.
6.3.3 Decoupling devices
6.3.3.1 General characteristics
The function of the decoupling device is to isolate the AE and/or simulator from the EUT port
under test and thereby prevent the application of the test voltage to the AE and/or simulator.
The most important characteristic of a decoupling device is its common mode attenuation over
the frequency range 0 Hz to 150 kHz.
Both active and passive isolation devices are available; examples of active devices include
amplifiers and opto-isolators, while examples of passive devices include isolation transformers
and translators.
6.3.3.2 Specifications
The isolation and decoupling specifications, applicable to all the devices for all the types of
operating signals, are:
– input to output and input/output to ground
insulation withstand capability: 1 kV, 50/60 Hz, 1 min;
– common mode decoupling (attenuation)
in the range 15 Hz to 150 kHz: 60 dB.
Decoupling devices with reduced insulation withstand capability may be used when testing at
levels below level 4.
The common mode rejection of the decoupling device shall be as high as possible in order to
minimize the degradation of the common mode rejection ratio of the EUT port.
The requirements of 6.3.3.2 also apply to complex devices, such as a power supply unit
composed by an isolation transformer and an a.c. to d.c. converter.
For balanced lines the T network specified in 6.3.2.2 provides effective decoupling into the
frequency range 10 kHz to 150 kHz. A decoupling device is still required for frequencies below
10 kHz.
7 Test set-up
7.1 General
The test set-up specifications are given for
• earthing connections;
• equipment under test;
• test generator;
• coupling and decoupling network (decoupling/isolation devices).
7.2 Earthing connections
The safety earthing requirements of the EUT, of the auxiliary equipment (AE) and of the test
equipment shall be complied with at all times.
The EUT shall be connected to the earthing system in accordance with the manufacturer's
specifications. The test generator, the coupling networks and the decoupling devices shall be
connected to a ground reference plane (GRP) or to a common earth terminal. The earth
connection to the GRP or to the common earth terminal shall be less than 1 m in length.
7.3 Equipment under test
The equipment under test shall be arranged and connected according to the equipment
installation specifications.
The power supply, input/output and communication ports shall be connected to the sources of
power supply, control and signals via the decoupling/isolation devices (see 6.3.3).
The operating signals for exercising the EUT may be provided by the auxiliary equipment or
simulator.
The cables specified by the equipment manufacturer shall be used; in the absence of
specifications, unshielded cables shall be adopted, of the type suitable for the signals involved.
The cable length is not relevant for the test, unless except in the case of shielded cables (see
8.3). For shielded cables, where the manufacturer specifies a maximum cable length, this
length shall be used; in all other cases, the cable length shall be 20 m.
7.4 Test generators
The test generator shall be connected to the coupling network or coupling resistor, as specified
in Clause 8.
7.5 Decoupling/isolation devices
The decoupling/isolation devices shall be connected between all the EUT's ports to be tested
and the corresponding signal or power source.
Dedicated decoupling/isolation devices are not required if the AE or the power sources are
isolated.
NOTE The decoupling/isolation devices should be located on the side of the cables near to the
auxiliary equipment port, in order to use the normal terminations provided with the cables
without the need to cut them.
In the case of shielded lines (e.g. coaxial cables), the generator shall be directly connected to
the shields (no additional series resistor and capacitor are required).
– 16 – IEC 61000-4-16:2015 RLV © IEC 2015
8 Test procedure
8.1 General
The test procedure includes
• preliminary verification of the correct operation of the equipment;
• execution of the test.
8.2 Laboratory reference conditions
8.2.1 General
In order to minimize the impact of environmental parameters on test results, the tests shall be
carried out in climatic and electromagnetic reference conditions as specified in 8.2.2 and 8.2.3.
8.2.2 Climatic conditions
The tests shall be carried out in standard climatic conditions in accordance with IEC 60068-1:
– ambient temperature: 15 °C to 35 °C;
– relative humidity: 25 % to 75 %;
– atmospheric pressure: 86 kPa (860 mbar) to 106 kPa (1 060 mbar).
NOTE – Any other values are specified in the product specification.
The EUT shall be operated within its intended climatic conditions.
Unless otherwise specified by the committee responsible for the generic or product standard,
the climatic conditions in the laboratory shall be within any limits specified for the operation of
the EUT and the test equipment by their respective manufacturers.
Tests shall not be performed if the relative humidity is so high as to cause condensation on the
EUT or the test equipment.
Where it is considered that there is sufficient evidence to demonstrate that the effects of the
phenomenon covered by this standard are influenced by climatic conditions, this should be
brought to the attention of the committee responsible for this standard.
8.2.3 Electromagnetic conditions
The electromagnetic conditions of the laboratory shall not influence the test results.
8.3 Execution of the test
The EUT shall be configured for its normal operating conditions.
The tests shall be performed according to a test plan that shall specify
• the type of test;
• the test level;
• the test duration;
• the EUT's ports to be tested;
• the representative operating conditions of the EUT;
• the auxiliary equipment.
The power supply, signal and other functional electrical quantities shall be applied within their
rated range. If the actual operating signal sources are not available, they may be simulated.
The main steps of the test procedure are as follows:
• preliminary verification of equipment performances;
• connection of the coupling networks and decoupling devices to the EUT's ports to be
tested;
• verification of the operating performances of input signals, if necessary;
• application of the test voltage.
The test configuration can affect the operating conditions of the I/O ports of the EUT. These
new conditions shall be considered as references in the evaluation of the test voltage
influence.
The test voltage shall be applied for a period of time sufficient to allow a complete verification
of the EUT's operating performance. For short duration tests (of typically 1 s duration), the test
voltage shall be applied repeatedly until this criterion has been met.
The test in the frequency range 15 Hz to 150 kHz starts from 15 Hz; the rate of sweep shall not
–2
exceed 1 × 10 decade/s. Where the frequency is swept incrementally, the step size shall not
exceed 10 % of the start and thereafter 10 % of the preceding frequency value.
The performance of the EUT shall be continuously monitored, and any degradation shall be
recorded in the test report.
The test generator shall be connected to each port in turn. Ports not under test shall have the
input terminals of their respective coupling network connected to ground (see Figure 6).
If the apparatus has a large number of similar ports, then a sufficient number shall be selected
so that all different types of termination are covered.
NOTE – A preliminary investigation should be carried out applying the test voltage to the earth port of the EUT in
the complete set-up described for type tests. Susceptibility conditions, if any, will be investigated on a port-by-port
basis.
The ports provided by unshielded cables shall be tested by applying the test voltage directly to
the port's terminals.
In the case of shielded lines (e.g. coaxial cables), the generator output shall be directly
connected to the screen (no additional series resistor and capacitor are required).
To test ports with more than two terminals (e.g. grouping), the test voltage shall be applied
simultaneously between all the terminals of the port and ground (common mode).
For ports intended to be connected to balanced lines, the test voltage shall be applied using
the T network specified in 6.3.2.2.
During the test with application of d.c. voltage, the polarity of the test voltage shall be reversed.
A general schematic for the application of the test voltage is given in figure 6.
The test voltage shall be applied in common mode to the following ports:
• power supply;
• input and output;
– 18 – IEC 61000-4-16:2015 RLV © IEC 2015
• communication.
No specific test is required for the earth port.
The performances of the EUT shall be verified against the requirements of the plan.
The test can produce unsafe situations due to the test voltage involved or the leakage current
to earth: adequate safety precautions are essential to avoid risks to operators.
9 Evaluation of test results and test report
This clause provides guidance for the evaluation of test results and for the test report related to
this part of IEC 61000.
The variety and diversity of equipment and systems to be tested make the task of establishing
the effects of this test on equipment and systems difficult.
The test results shall be classified on the basis of the operating conditions and the functional
specifications of the equipment under test, as follows, unless different specifications are given
by product committees or product specifications in terms of the loss of function or degradation
of performance of the equi
...
IEC 61000-4-16 ®
Edition 2.0 2015-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-16: Testing and measurement techniques – Test for immunity to
conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz
Compatibilité électromagnétique (CEM) –
Partie 4-16: Techniques d’essai et de mesure – Essai d’immunité aux
perturbations conduites en mode commun dans la plage de fréquences de 0 Hz
à 150 kHz
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IEC 61000-4-16 ®
Edition 2.0 2015-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-16: Testing and measurement techniques – Test for immunity to
conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz
Compatibilité électromagnétique (CEM) –
Partie 4-16: Techniques d’essai et de mesure – Essai d’immunité aux
perturbations conduites en mode commun dans la plage de fréquences de 0 Hz
à 150 kHz
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.20 ISBN 978-2-8322-3036-7
– 2 – IEC 61000-4-16:2015 © IEC 2015
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 8
3 Terms and definitions. 8
4 General . 9
5 Test levels . 9
5.1 General . 9
5.2 Test levels at mains frequency . 10
5.3 Test levels in the frequency range 15 Hz-150 kHz . 10
6 Test equipment . 11
6.1 Test generators . 11
6.1.1 General . 11
6.1.2 Characteristics and performance of the generator for d.c. tests . 11
6.1.3 Characteristics and performance of the generator for tests at mains
2/3
frequency: 16 Hz, 50 Hz and 60 Hz . 12
6.1.4 Characteristics and performance of the generator for tests in the
frequency range 15 Hz to 150 kHz . 12
6.2 Verification of the characteristics of the test generators . 13
6.3 Coupling/decoupling networks . 13
6.3.1 General . 13
6.3.2 Coupling networks . 13
6.3.3 Decoupling devices . 14
7 Test set-up . 14
7.1 General . 14
7.2 Earthing connections . 15
7.3 Equipment under test . 15
7.4 Test generators . 15
7.5 Decoupling/isolation devices. 15
8 Test procedure . 15
8.1 General . 15
8.2 Laboratory reference conditions. 16
8.2.1 General . 16
8.2.2 Climatic conditions . 16
8.2.3 Electromagnetic conditions . 16
8.3 Execution of the test . 16
9 Evaluation of test results . 17
10 Test report . 18
Annex A (informative) Sources of disturbances and coupling mechanisms . 23
A.1 Sources of disturbances . 23
A.2 Coupling mechanisms . 23
Annex B (informative) Selection of test levels . 25
Bibliography . 26
Figure 1 – Example of equipment ports and configuration . 19
Figure 2 – Profile of the test voltage . 19
Figure 3 – Example of the generator for d.c. and frequency voltage tests 15 Hz up to
150 kHz . 20
⅔
Figure 4 – Example of the generator for tests at mains frequency (16 Hz, 50 Hz and
60 Hz) . 20
Figure 5 – Schematic circuit of the coupling T network for communication ports and
other ports intended for connection to highly balanced pairs . 21
Figure 6 – Schematic circuit for type tests . 22
Table 1 – Levels for continuous disturbance . 10
Table 2 – Levels for short duration disturbance . 10
Table 3 – Test levels in the frequency range 15 Hz to 150 kHz. 11
– 4 – IEC 61000-4-16:2015 © IEC 2015
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-16: Testing and measurement techniques –
Test for immunity to conducted, common mode disturbances
in the frequency range 0 Hz to 150 kHz
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-16 has been prepared by subcommittee 77A: Low-
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms part 4-16 of IEC 61000. It has the status of a basic EMC publication in accordance with
IEC Guide 107.
This second edition cancels and replaces the first edition published in 1998,
Amendment 1:2001 and Amendment 2:2009. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) clarification and complement of test generators' specifications and performances.
The text of this standard is based on the following documents:
FDIS Report on voting
77A/905/FDIS 77A/917/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61000 series, published under the general title Electromagnetic
compatibility (EMC), can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The “colour inside” logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this publication using a colour printer.
– 6 – IEC 61000-4-16:2015 © IEC 2015
INTRODUCTION
This standard is part of the IEC 61000 series, according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards or
as technical specifications or technical reports, some of which have already been published as
sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: IEC 61000-6-1).
This part is an international standard which gives immunity requirements and test procedures
related to conducted, common mode disturbances in the range d.c. to 150 kHz.
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-16: Testing and measurement techniques –
Test for immunity to conducted, common mode disturbances
in the frequency range 0 Hz to 150 kHz
1 Scope
This part of IEC 61000 relates to the immunity requirements and test methods for electrical and
electronic equipment to conducted, common mode disturbances in the range d.c. to 150 kHz.
The object of this standard is to establish a common and reproducible basis for testing
electrical and electronic equipment with the application of common mode disturbances to
power supply, control, signal and communication ports.
This standard defines
• test voltage and current waveform;
• range of test levels;
• test equipment;
• test set-up;
• test procedures.
For some types of ports, for example ports intended to be used with highly balanced lines,
additional test provisions may be established by product committee specifications.
The test is intended to demonstrate the immunity of electrical and electronic equipment when
subjected to conducted, common mode disturbances such as those originating from power line
currents and return leakage currents in the earthing/grounding system.
The disturbances produced by 400 Hz mains systems are not included in the scope of this
standard.
Actual interference due to these disturbance phenomena is relatively rare, except in industrial
plants. Product committees should therefore consider whether there is a justification for
applying this standard in their product/product family standards (see also Clause 4).
This test is not relevant for equipment ports intended to be connected to short cables, having a
length less than 20 m or less.
The immunity to harmonics and interharmonics, including mains signalling, on a.c. power ports
(in differential mode) is not included in the scope of this standard and is covered by
IEC 61000-4-13 and IEC 61000-4-19.
The immunity to conducted disturbances generated by intentional radio-frequency transmitters
is not included in the scope of this standard and is covered by IEC 61000-4-6.
– 8 – IEC 61000-4-16:2015 © IEC 2015
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
Void.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
NOTE Not all of the definitions given in Clause 3 are included in IEC 60050-161.
3.1
EUT
equipment under test
equipment (devices, appliances and systems) subjected to tests
Note 1 to entry: This note applies to the French language only.
3.2
auxiliary equipment
AE
equipment that is necessary for setting up all functions and assessing the correct performance
(operation) of the EUT during the test
3.3
port
particular interface of the specified equipment with the external electromagnetic environment
SEE: Figure 1.
3.4
coupling
interaction between circuits, transferring energy from one circuit to another
3.5
coupling network
electrical circuit for the purpose of transferring energy from one circuit to another
3.6
decoupling network
electrical circuit for the purpose of preventing test voltage applied to the equipment under test
from affecting other devices, equipment or systems which are not under test
3.7
immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
[SOURCE: IEC 60050-161:1990, 161-01-20]
3.8
source impedance of the test generator
ratio between the open circuit voltage and the short circuit current, expressed as:
V open circuit voltage / I short circuit current
oc sc
4 General
The conducted, common mode disturbances in the frequency range d.c. to 150 kHz may
influence the reliable operation of equipment and systems installed in residential areas,
industrial areas and electrical plants.
Only those ports of an EUT which are likely to be subjected to the disturbances dealt with by
this standard shall be considered for the application of its requirements.
The disturbances are typically generated by
• the power distribution system, with its fundamental frequency, significant harmonics and
interharmonics;
• power electronic equipment (e.g. power convertors), which may inject disturbances into the
ground conductors and earthing system (through stray capacitance or filters), or generate
disturbances in signal and control lines by induction.
At the mains frequency and harmonics of the mains frequency, the disturbances are usually
generated by the power distribution system (fault and leakage currents in the ground and
earthing systems).
At frequencies above the range of harmonics of the mains frequency (up to 150 kHz) the
disturbances are usually generated by power electronic equipment, which is often found in
industrial and electrical plants.
The coupling of the source of disturbances with the power supply, signal, control and
communication cables, transfer these disturbances to the ports of the equipment under test.
Because the coupling mechanisms defined above cannot be completely eliminated, it is
necessary for equipment to have adequate immunity to the disturbances.
Depending on the type of installation, the disturbances may be classified as follows:
2/3
a) voltage/current at power frequency: d.c., 16 Hz, 50 Hz and 60 Hz;
b) voltage/current in the frequency range 15 Hz to 150 kHz (including the harmonics of the
mains frequency).
This standard defines the test procedures for both the categories of disturbance defined above.
The applicability of the tests should be defined in the product standard.
Annex A contains more information on the phenomena.
5 Test levels
5.1 General
The preferred range of test levels, applicable to equipment ports as a function of the different
types and sources of disturbances, is given in 5.2 and 5.3.
2/3
The levels are given for the tests at the mains frequency (d.c., 16 Hz, 50 Hz and 60 Hz) and
in the frequency range 15 Hz to 150 kHz.
The applicability of each test shall be defined in the product standard.
– 10 – IEC 61000-4-16:2015 © IEC 2015
The test voltage shall be applied in common mode to power supply, control, signal and
communication ports (the differential mode voltage is dependent on the circuit unbalance).
A guide for the selection of the test levels is given in Annex B.
5.2 Test levels at mains frequency
Tables 1 and 2 define the preferred test levels.
2/3
The levels apply to test voltage at d.c. and at the mains frequencies of 16 Hz, 50 Hz and
60 Hz.
Table 2 – Levels for short duration
Table 1 – Levels for continuous
disturbance disturbance
Level Open circuit test voltage Level Open circuit test voltage
V (r.m.s.) V (r.m.s.)
1 1 1 10
2 3 2 30
3 10 3 100
4 30 4 300
x Special x Special
NOTE x is an open level. This level may be defined in NOTE x is an open level. This level may be defined
the product standard. in the product standard.
For short duration disturbances, the normal duration for each applied disturbance is 1 s;
however, product standards may specify different durations for specific applications.
2/3
Hz, 50 Hz or
The test shall be carried out at one or more of the following frequencies: d.c., 16
60 Hz, according to the relevant mains frequency in the equipment location (see annex A); the
2/3
test at 16 Hz is therefore only applicable where the equipment is intended to be used in the
proximity of railway systems at this frequency.
The test level shall not exceed the test voltage defined in the product standard.
Information on the proposed test levels is given in Annex B.
5.3 Test levels in the frequency range 15 Hz-150 kHz
Table 3 defines the preferred test levels.
Table 3 – Test levels in the frequency range 15 Hz to 150 kHz
Level Profile of the test voltage (open circuit)
V (r.m.s.)
15 Hz – 150 Hz 150 Hz – 1,5 kHz 1,5 kHz – 15 kHz 15 kHz – 150 kHz
1 1 – 0,1 0,1 0,1 – 1 1
2 3 – 0,3 0,3 0,3 – 3 3
3 10 – 1 1 1 – 10 10
4 30 – 3 3 3 – 30 30
x x x x x
NOTE 1 x is an open level. This level can be given in the product specification.
NOTE 2 The profile of the test voltage in relation to frequency (see Annex B for information) is as follows:
• starting from the frequency 15 Hz, the level decreases up to 150 Hz at 20 dB/decade;
• the level is constant from 150 Hz to 1,5 kHz;
• the level increases from 1,5 kHz to 15 kHz at 20 dB/decade;
• the level is constant from 15 kHz to 150 kHz.
The profile of the test voltage is represented in Figure 2.
No test level is defined below 15 Hz, excluding d.c., as tests in this frequency range are not
considered to be relevant.
6 Test equipment
6.1 Test generators
6.1.1 General
The features of the test generators for each specific test are given in 6.1.2, 6.1.3 and 6.1.4.
The generators shall have provisions to prevent the emission of disturbances which, if injected
in the power supply network, may influence the test results.
Information on the impedance of the test generators is given in Annex A.
6.1.2 Characteristics and performance of the generator for d.c. tests
The test generator typically consists of a d.c. power supply unit with variable output voltage and
a time controlled switch for the short duration test.
Generator for continuous disturbance
– waveform: direct current, ripple less than 5 %;
– open circuit output voltage range
1 V, with a relative tolerance of −10 % to 30 V, with a
(r.m.s.):
relative tolerance of +10 %;
– source impedance:
V /I = 50 Ω, with a relative tolerance of ±10 %.
oc sc
– 12 – IEC 61000-4-16:2015 © IEC 2015
Generator for short duration disturbance
– waveform: direct current, ripple less than 5 %;
– open circuit output voltage 10 V, with a relative tolerance of −10 % to 300 V, with
range:
a relative tolerance of +10 %;
– source impedance:
V /I = 50 Ω, with a relative tolerance of ±10 %;
oc sc
– rise and fall time of the output
between 1 µs and 5 µs.
voltage at on/off switching:
The schematic in principle of the test generator is given in Figure 3.
6.1.3 Characteristics and performance of the generator for tests at mains frequency:
2/3
16 Hz, 50 Hz and 60 Hz
The test generator typically consists of a variable transformer (connected to the mains
distribution network), an isolation transformer and a time controlled switch for the short
duration test; the switch shall be synchronized at 0° of the mains voltage waveform.
Generator for continuous disturbance
– waveform: sinusoidal, total harmonic distortion less than 10 %;
– open circuit output voltage range
1 V, with a relative tolerance of −10 % to 30 V, with a
(r.m.s.):
relative tolerance of +10 %;
– source impedance: V /I = 50 Ω, with a relative tolerance of ±10 %;
oc sc
– frequency: selected mains frequency.
Generator for short duration disturbance
– waveform: sinusoidal, total harmonic distortion less than 10 %;
– open circuit output voltage
10 V, with a relative tolerance of − 10 % to 300 V,
range:
with a relative tolerance of + 10 %;
– source impedance: V /I = 50 Ω, with a relative tolerance of ±10 %;
oc sc
– frequency: selected mains frequency;
– on/off switching of the output
synchronized at zero crossing (0° ± 5 %).
voltage:
The schematic in principle of the test generator is given in Figure 4.
6.1.4 Characteristics and performance of the generator for tests in the frequency
range 15 Hz to 150 kHz
The test generator typically consists of a waveform generator capable of covering the
–2
frequency band of interest. It shall have an automated sweep capability of 1 × 10 decade/s or
slower or, in the case of a synthesizer, be capable of being programmed with frequency-
dependent step-sizes of 10 % of the preceding frequency value. It shall also be capable of
being set manually.
Specifications
– waveform: sinusoidal, total harmonic distortion less than 1 %;
– open circuit output voltage range
0,1 V, with a relative tolerance of − 10 % to 30 V, with
(r.m.s.):
a relative tolerance of +10 %;
– source impedance:
V /I = 50 Ω, with a relative tolerance of ±10 %;
oc sc
– frequency range: 15 Hz, with a relative tolerance of −10 % to 150 kHz,
with a relative tolerance of +10 %.
6.2 Verification of the characteristics of the test generators
In order to make it possible to compare the results dealing with different test generators, they
shall be calibrated or verified for the most essential characteristics.
The following generator characteristics shall be verified:
• output voltage waveform;
• source impedance (V open circuit voltage / I short circuit current). The source
oc sc
impedance has to be verified:
– at highest and lowest test level for all generators: d.c.; a.c.; sweep;
– additionally for sweep generator at frequencies: 15 Hz, 1,5 kHz, 15 kHz, 150 kHz.
For the verification of the source impedance of short duration disturbance generator, the
first 50 ms may be disregarded;
• frequency accuracy;
• open circuit output voltage accuracy;
• rise and fall time of the output voltage at on/off switching (where applicable).
The verifications shall be carried out with voltage and current probes together with an
oscilloscope or other equivalent measurement instrumentation with 1 MHz minimum bandwidth.
The accuracy of the measuring equipment shall be better than ±5 %.
6.3 Coupling/decoupling networks
6.3.1 General
The coupling networks enable the test voltage to be applied, in common mode, to the power
supply, input/output (signal and control) and communication ports of the EUT. The decoupling
networks prevent the application of the test voltage to the auxiliary equipment needed to
perform the test.
6.3.2 Coupling networks
6.3.2.1 Coupling network for power supply and input/output ports
For power supply and input/output ports, the coupling network for each conductor is composed
of a resistor and a capacitor in series. The coupling networks of each conductor are connected
in parallel to form the coupling network of the port.
Figure 6 shows a schematic circuit for a coupling network, the value of the capacitor is
C = 1,0 µF and the resistor is R = 100 × n Ω where n is the number of the conductors (n is
greater than or equal to 2).
The capacitors and the resistors for each of the conductors in the coupling network for a port
shall be matched with a tolerance of 1 %.
For the d.c. voltage test the 1,0 µF capacitors shall be short-circuited.
NOTE When performing the d.c. voltage test on a signal port, the impedance of the coupling network may cause
the operating signal to be degraded.
For screened cables, the test signal is injected directly onto the cable shield, so no coupling
network is required (see Figure 6).
– 14 – IEC 61000-4-16:2015 © IEC 2015
6.3.2.2 Coupling networks for communication ports
For communication ports and other ports intended for connection to balanced pairs (single or
multiple pairs), the coupling network is a T network.
Figure 5 shows a schematic circuit for a T network. The value of the capacitor is C = 4,7 µF,
the resistor is R = 200 Ω and the inductor is L = 2 × 38 mH (bifilar winding).
The components of the T network shall be matched with a tolerance such that the T network
does not significantly degrade the common mode rejection ratio of the EUT.
It may be possible to produce T networks suitable for use with common mode rejection ratios
greater than 80 dB, in which case the product standard should define an alternative coupling
method.
6.3.3 Decoupling devices
6.3.3.1 General characteristics
The function of the decoupling device is to isolate the AE and/or simulator from the EUT port
under test and thereby prevent the application of the test voltage to the AE and/or simulator.
The most important characteristic of a decoupling device is its common mode attenuation over
the frequency range 0 Hz to 150 kHz.
Both active and passive isolation devices are available; examples of active devices include
amplifiers and opto-isolators, while examples of passive devices include isolation transformers.
6.3.3.2 Specifications
The isolation and decoupling specifications, applicable to all the devices for all the types of
operating signals, are:
– input to output and input/output to ground
insulation withstand capability: 1 kV, 50/60 Hz, 1 min;
– common mode decoupling (attenuation)
in the range 15 Hz to 150 kHz: 60 dB.
Decoupling devices with reduced insulation withstand capability may be used when testing at
levels below level 4.
The common mode rejection of the decoupling device shall be as high as possible in order to
minimize the degradation of the common mode rejection ratio of the EUT port.
The requirements of 6.3.3.2 also apply to complex devices, such as a power supply unit
composed by an isolation transformer and an a.c. to d.c. converter.
For balanced lines the T network specified in 6.3.2.2 provides effective decoupling into the
frequency range 10 kHz to 150 kHz. A decoupling device is still required for frequencies below
10 kHz.
7 Test set-up
7.1 General
The test set-up specifications are given for
• earthing connections;
• equipment under test;
• test generator;
• coupling and decoupling network (decoupling/isolation devices).
7.2 Earthing connections
The safety earthing requirements of the EUT, of the auxiliary equipment (AE) and of the test
equipment shall be complied with at all times.
The EUT shall be connected to the earthing system in accordance with the manufacturer's
specifications. The test generator, the coupling networks and the decoupling devices shall be
connected to a ground reference plane (GRP) or to a common earth terminal. The earth
connection to the GRP or to the common earth terminal shall be less than 1 m in length.
7.3 Equipment under test
The equipment under test shall be arranged and connected according to the equipment
installation specifications.
The power supply, input/output and communication ports shall be connected to the sources of
power supply, control and signals via the decoupling/isolation devices (see 6.3.3).
The operating signals for exercising the EUT may be provided by the auxiliary equipment or
simulator.
The cables specified by the equipment manufacturer shall be used; in the absence of
specifications, unshielded cables shall be adopted, of the type suitable for the signals involved.
The cable length is not relevant for the test, except in the case of shielded cables (see 8.3).
For shielded cables, where the manufacturer specifies a maximum cable length, this length
shall be used; in all other cases, the cable length shall be 20 m.
7.4 Test generators
The test generator shall be connected to the coupling network or coupling resistor, as specified
in Clause 8.
7.5 Decoupling/isolation devices
The decoupling/isolation devices shall be connected between all the EUT's ports to be tested
and the corresponding signal or power source.
Dedicated decoupling/isolation devices are not required if the AE or the power sources are
isolated.
The decoupling/isolation devices should be located on the side of the cables near to the
auxiliary equipment port, in order to use the normal terminations provided with the cables
without the need to cut them.
In the case of shielded lines (e.g. coaxial cables), the generator shall be directly connected to
the shields (no additional series resistor and capacitor are required).
8 Test procedure
8.1 General
The test procedure includes
– 16 – IEC 61000-4-16:2015 © IEC 2015
• preliminary verification of the correct operation of the equipment;
• execution of the test.
8.2 Laboratory reference conditions
8.2.1 General
In order to minimize the impact of environmental parameters on test results, the tests shall be
carried out in climatic and electromagnetic reference conditions as specified in 8.2.2 and 8.2.3.
8.2.2 Climatic conditions
Unless otherwise specified by the committee responsible for the generic or product standard,
the climatic conditions in the laboratory shall be within any limits specified for the operation of
the EUT and the test equipment by their respective manufacturers.
Tests shall not be performed if the relative humidity is so high as to cause condensation on the
EUT or the test equipment.
Where it is considered that there is sufficient evidence to demonstrate that the effects of the
phenomenon covered by this standard are influenced by climatic conditions, this should be
brought to the attention of the committee responsible for this standard.
8.2.3 Electromagnetic conditions
The electromagnetic conditions of the laboratory shall not influence the test results.
8.3 Execution of the test
The EUT shall be configured for its normal operating conditions.
The tests shall be performed according to a test plan that shall specify
• the type of test;
• the test level;
• the test duration;
• the EUT's ports to be tested;
• the representative operating conditions of the EUT;
• the auxiliary equipment.
The power supply, signal and other functional electrical quantities shall be applied within their
rated range. If the actual operating signal sources are not available, they may be simulated.
The main steps of the test procedure are as follows:
• preliminary verification of equipment performances;
• connection of the coupling networks and decoupling devices to the EUT's ports to be
tested;
• verification of the operating performances of input signals, if necessary;
• application of the test voltage.
The test configuration can affect the operating conditions of the I/O ports of the EUT. These
new conditions shall be considered as references in the evaluation of the test voltage
influence.
The test voltage shall be applied for a period of time sufficient to allow a complete verification
of the EUT's operating performance. For short duration tests (of typically 1 s duration), the test
voltage shall be applied repeatedly until this criterion has been met.
The test in the frequency range 15 Hz to 150 kHz starts from 15 Hz; the rate of sweep shall not
–2
exceed 1 × 10 decade/s. Where the frequency is swept incrementally, the step size shall not
exceed 10 % of the start and thereafter 10 % of the preceding frequency value.
The performance of the EUT shall be continuously monitored, and any degradation shall be
recorded in the test report.
The test generator shall be connected to each port in turn. Ports not under test shall have the
input terminals of their respective coupling network connected to ground (see Figure 6).
If the apparatus has a large number of similar ports, then a sufficient number shall be selected
so that all different types of termination are covered.
The ports provided by unshielded cables shall be tested by applying the test voltage directly to
the port's terminals.
In the case of shielded lines (e.g. coaxial cables), the generator output shall be directly
connected to the screen (no additional series resistor and capacitor are required).
To test ports with more than two terminals (e.g. grouping)
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