IEC 61000-4-6:2008

Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

IEC 61000-4-6:2008 relates to the conducted immunity requirements of electrical and electronic equipment to electromagnetic disturbances coming from intended radio-frequency (RF) transmitters in the frequency range 9 kHz up to 80 MHz. Equipment not having at least one conducting cable (such as mains supply, signal line or earth connection) which can couple the equipment to the disturbing RF fields is excluded. The object of IEC 61000-4-6:2008 is to establish a common reference for evaluating the functional immunity of electrical and electronic equipment when subjected to conducted disturbances induced by radio-frequency fields. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. IEC 61000-4-6:2008 has the status of a basic EMC publication in accordance with IEC Guide 107. This third edition of IEC 61000-4-6:2008 cancels and replaces the second edition published in 2003, Amendment 1 (2004) and Amendment 2 (2006). This edition cons titutes a technical revision.

Compatibilité électromagnétique (CEM) - Partie 4-6: Techniques d'essai et de mesure - Immunité aux perturbations conduites, induites par les champs radioélectriques

IEC 61000-4-6:2008 se rapporte aux exigences relatives à l'immunité en conduction des équipements électriques et électroniques aux perturbations électromagnétiques provoquées par des émetteurs destinés à des radiofréquences (RF), dans la plage de fréquences de 9 kHz à 80 MHz. Les matériels n'ayant pas au moins un câble conducteur (tel que cordons d'alimentation, lignes de transmission de signaux ou connexions de mise à la terre) pouvant coupler les matériels aux champs RF perturbateurs ne sont pas concernés par cette norme. L'objet de la CEI 61000-4-6:2008 est d'établir une référence commune dans le but d'évaluer l'immunité fonctionnelle des matériels électriques et électroniques, quand ils sont soumis aux perturbations conduites induites par les champs radiofréquence. La méthode d'essai documentée dans cette partie de la CEI 61000, décrit une méthode cohérente dans le but d'évaluer l'immunité d'un matériel ou d'un système vis-à-vis d'un phénomène défini. La CEI 61000-4-6:2008 a le statut de publication fondamentale en CEM en accord avec le Guide 107 de la CEI. Cette troisième édition de la CEI 61000-4-6 annule et remplace la deuxième édition parue en 2003, l'Amendement 1 (2004) et l'Amendement 2 (2006). Cette édition constitue une révision technique.

General Information

• Status: Published
• Publication Date: 30-Sep-2008
• ICS: 33.100.20 - Immunity
• Technical Committee: SC 77B - High frequency phenomena
• Drafting Committee: WG 10 - TC 77/SC 77B/WG 10
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 23-Oct-2013

Relations

• Revises: IEC 61000-4-6:2003/AMD2:2006 - Amendment 2 - Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
• Effective Date: 05-Sep-2023
• Revises: IEC 61000-4-6:2003/AMD1:2004 - Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
• Effective Date: 05-Sep-2023
• Revised: IEC 61000-4-6:2013 - Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
• Effective Date: 05-Sep-2023
• Revises: IEC 61000-4-6:2003 - Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 61000-4-6
Edition 3.0 2008-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields

Compatibilité électromagnétique (CEM) –
Partie 4-6: Techniques d'essai et de mesure – Immunité aux perturbations
conduites, induites par les champs radioélectriques

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

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About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

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IEC 61000-4-6
Edition 3.0 2008-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields

Compatibilité électromagnétique (CEM) –
Partie 4-6: Techniques d'essai et de mesure – Immunité aux perturbations
conduites, induites par les champs radioélectriques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
XA
CODE PRIX
ICS 33.100.20 ISBN 978-2-88910-376-8
– 2 – 61000-4-6 © IEC:2008
CONTENTS
FOREWORD.5
INTRODUCTION.7
1 Scope and object .8
2 Normative references.8
3 Terms and definitions .8
4 General .10
5 Test levels .10
6 Test equipment.11
6.1 Test generator .11
6.2 Coupling and decoupling devices .12
6.2.1 Coupling/decoupling networks (CDNs) .12
6.2.2 Clamp injection devices .13
6.2.3 Direct injection devices .14
6.2.4 Decoupling networks.14
6.3 Verification of the common mode impedance at the EUT port of coupling and
decoupling devices .14
6.3.1 Insertion loss of the 150 Ω to 50 Ω adapters.15
6.4 Setting of the test generator.15
6.4.1 Setting of the output level at the EUT port of the coupling device.15
7 Test set-up for table-top and floor-standing equipment .16
7.1 Rules for selecting injection methods and test points.16
7.1.1 Injection method .16
7.1.2 Ports to be tested .17
7.2 Procedure for CDN injection application .18
7.3 Procedure for clamp injection when the common-mode impedance
requirements can be met .18
7.4 Procedure for clamp injection when the common-mode impedance

requirements cannot be met .19
7.5 Procedure for direct injection .19
7.6 EUT comprising a single unit .19
7.7 EUT comprising several units.20
8 Test procedure .20
9 Evaluation of the test results .21
10 Test report.21
Annex A (normative) Additional information regarding clamp injection.33
Annex B (informative) Selection criteria for the frequency range of application .38
Annex C (informative) Guide for selecting test levels .40
Annex D (informative) Information on coupling and decoupling networks.41
Annex E (informative) Information for the test generator specification .45
Annex F (informative) Test set-up for large EUTs .46
Annex G (informative) Measurement uncertainty of test instrumentation.49
Bibliography .56

Figure 1 – Rules for selecting the injection method .17

61000-4-6 © IEC:2008 – 3 –
Figure 2 – Immunity test to RF conducted disturbances .23
Figure 3 – Test generator set-up .24
Figure 4 – Open circuit waveforms at the EUT port of a coupling device for test level 1.24
Figure 5 – Principle of coupling and decoupling .27
Figure 6 – Principle of coupling and decoupling according to the clamp injection method .27
Figure 7 – Details of set-ups and components to verify the essential characteristics of
coupling and decoupling devices and the 150 Ω to 50 Ω adapters .29
Figure 8 – Set-up for level setting (see 6.4.1) .30
Figure 9 – Example of test set-up with a single unit EUT.31
Figure 10 – Example of a test set-up with a multi-unit EUT .32
Figure A.1 – Circuit for level setting set-up in a 50 Ω test Jig .34
Figure A.2 – The 50 Ω test jig construction .34
Figure A.3 – Construction details of the EM clamp.35
Figure A.4 – Concept of the EM clamp (electromagnetic clamp).36
Figure A.5 – Coupling factor of the EM clamp .36
Figure A.6 – General principle of a test set-up using injection clamps .37
Figure A.7 – Example of the test unit locations on the ground plane when using
injection clamps (top view) .37
Figure B.1 – Start frequency as function of cable length and equipment size.39
Figure D.1 – Example of a simplified diagram for the circuit of CDN-S1 used with
screened cables (see 6.2.1) .42
Figure D.2 – Example of simplified diagram for the circuit of CDN-M1/-M2/-M3 used

with unscreened supply (mains) lines (see 6.2.1.1) .42
Figure D.3 – Example of a simplified diagram for the circuit of CDN-AF2 used with
unscreened non-balanced lines (see 6.2.1.3).43
Figure D.4 – Example of a simplified diagram for the circuit of a CDN-T2, used with an
unscreened balanced pair (see 6.2.1.2) .43
Figure D.5 – Example of a simplified diagram of the circuit of a CDN-T4 used with
unscreened balanced pairs (see 6.2.1.2) .44
Figure D.6 – Example of a simplified diagram of the circuit of a CDN-T8 used with
unscreened balanced pairs (see 6.2.1.2) .44
Figure F.1 – Example of large EUT test set-up with elevated horizontal ground reference
plane .47
Figure F.2 – Example of large EUT test set-up with vertical ground reference plane.48
Figure G.1 – Example of influences upon the test method using CDN .49
Figure G.2 – Example of influences upon the test method using EM clamp .50
Figure G.3 – Example of influences upon the test method using current clamp.50
Figure G.4 – Exa
...

IEC 61000-4-6
Edition 3.0 2008-10
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by

any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or

IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.

Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette

publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: [e-mail]
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
 Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
 IEC Just Published: www.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
 Electropedia: www.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
 Customer Service Centre: www.iec.ch/webstore/custserv
If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service
Centre FAQ or contact us:
Email: [e-mail]
Tel.: [phone]
Fax: [phone]
A propos de la CEI
La Commission Electrotechnique Internationale (CEI) est la première organisation mondiale qui élabore et publie des
normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications CEI
Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possédez
l’édition la plus récente, un corrigendum ou amendement peut avoir été publié.
 Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm
Le Catalogue en-ligne de la CEI vous permet d’effectuer des recherches en utilisant différents critères (numéro de référence,
texte, comité d’études,…). Il donne aussi des informations sur les projets et les publications retirées ou remplacées.
 Just Published CEI: www.iec.ch/online_news/justpub
Restez informé sur les nouvelles publications de la CEI. Just Published détaille deux fois par mois les nouvelles
publications parues. Disponible en-ligne et aussi par email.
 Electropedia: www.electropedia.org
Le premier dictionnaire en ligne au monde de termes électroniques et électriques. Il contient plus de 20 000 termes et
définitions en anglais et en français, ainsi que les termes équivalents dans les langues additionnelles. Egalement appelé
Vocabulaire Electrotechnique International en ligne.
 Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm
Si vous désirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du
Service clients ou contactez-nous:
Email: [e-mail]
Tél.: [phone]
Fax: [phone]
IEC 61000-4-6
Edition 3.0 2008-10
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.100.20 ISBN 978-2-8891-0376-8
IEC 61000-4-6
Edition 3.0 2008-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields

Compatibilité électromagnétique (CEM) –
Partie 4-6: Techniques d'essai et de mesure – Immunité aux perturbations
conduites, induites par les champs radioélectriques

– 2 – 61000-4-6 © IEC:2008
CONTENTS
FOREWORD.5
INTRODUCTION.7
1 Scope and object .8
2 Normative references.8
3 Terms and definitions .8
4 General .10
5 Test levels .10
6 Test equipment.11
6.1 Test generator .11
6.2 Coupling and decoupling devices .12
6.2.1 Coupling/decoupling networks (CDNs) .12
6.2.2 Clamp injection devices .13
6.2.3 Direct injection devices .14
6.2.4 Decoupling networks.14
6.3 Verification of the common mode impedance at the EUT port of coupling and
decoupling devices .14
6.3.1 Insertion loss of the 150 Ω to 50 Ω adapters.15
6.4 Setting of the test generator.15
6.4.1 Setting of the output level at the EUT port of the coupling device.15
7 Test set-up for table-top and floor-standing equipment .16
7.1 Rules for selecting injection methods and test points.16
7.1.1 Injection method .16
7.1.2 Ports to be tested .17
7.2 Procedure for CDN injection application .18
7.3 Procedure for clamp injection when the common-mode impedance
requirements can be met .18
7.4 Procedure for clamp injection when the common-mode impedance

requirements cannot be met .19
7.5 Procedure for direct injection .19
7.6 EUT comprising a single unit .19
7.7 EUT comprising several units.20
8 Test procedure .20
9 Evaluation of the test results .21
10 Test report.21
Annex A (normative) Additional information regarding clamp injection.33
Annex B (informative) Selection criteria for the frequency range of application .38
Annex C (informative) Guide for selecting test levels .40
Annex D (informative) Information on coupling and decoupling networks.41
Annex E (informative) Information for the test generator specification .45
Annex F (informative) Test set-up for large EUTs .46
Annex G (informative) Measurement uncertainty of test instrumentation.49
Bibliography .56

Figure 1 – Rules for selecting the injection method .17

61000-4-6 © IEC:2008 – 3 –
Figure 2 – Immunity test to RF conducted disturbances .23
Figure 3 – Test generator set-up .24
Figure 4 – Open circuit waveforms at the EUT port of a coupling device for test level 1.24
Figure 5 – Principle of coupling and decoupling .27
Figure 6 – Principle of coupling and decoupling according to the clamp injection method .27
Figure 7 – Details of set-ups and components to verify the essential characteristics of
coupling and decoupling devices and the 150 Ω to 50 Ω adapters .29
Figure 8 – Set-up for level setting (see 6.4.1) .30
Figure 9 – Example of test set-up with a single unit EUT.31
Figure 10 – Example of a test set-up with a multi-unit EUT .32
Figure A.1 – Circuit for level setting set-up in a 50 Ω test Jig .34
Figure A.2 – The 50 Ω test jig construction .34
Figure A.3 – Construction details of the EM clamp.35
Figure A.4 – Concept of the EM clamp (electromagnetic clamp).36
Figure A.5 – Coupling factor of the EM clamp .36
Figure A.6 – General principle of a test set-up using injection clamps .37
Figure A.7 – Example of the test unit locations on the ground plane when using
injection clamps (top view) .37
Figure B.1 – Start frequency as function of cable length and equipment size.39
Figure D.1 – Example of a simplified diagram for the circuit of CDN-S1 used with
screened cables (see 6.2.1) .42
Figure D.2 – Example of simplified diagram for the circuit of CDN-M1/-M2/-M3 used

with unscreened supply (mains) lines (see 6.2.1.1) .42
Figure D.3 – Example of a simplified diagram for the circuit of CDN-AF2 used with
unscreened non-balanced lines (see 6.2.1.3).43
Figure D.4 – Example of a simplified diagram for the circuit of a CDN-T2, used with an
unscreened balanced pair (see 6.2.1.2) .43
Figure D.5 – Example of a simplified diagram of the circuit of a CDN-T4 used with
unscreened balanced pairs (see 6.2.1.2) .44
Figure D.6 – Example of a simplified diagram of the circuit of a CDN-T8 used with
unscreened balanced pairs (see 6.2.1.2) .44
Figure F.1 – Example of large EUT test set-up with elevated horizontal ground reference
plane .47
Figure F.2 – Example of large EUT test set-up with vertical ground reference plane.48
Figure G.1 – Example of influences upon the test method using CDN .
...