IEC 60862-1:2015
(Main)Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60862-1:2015 specifies the methods of test and general requirements for SAW filters of assessed quality using either capability approval or qualification approval procedures. This edition includes the following significant technical changes with respect to the previous edition:
- the terms and definitions from IEC 60862-2:2002 are included;
- the measurement method for the balanced type filter is described;
- the electrostatic discharge (ESD) sensitivity test procedure is considered.
Filtres à ondes acoustiques de surface (OAS) sous assurance de la qualité - Partie 1: Spécification générique
L'IEC 60862-1:2015 spécifie les méthodes d'essai et les exigences générales pour les filtres OAS dont la qualité est garantie par les procédures d'agrément de savoir-faire ou par les procédures d'homologation. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
- les "Termes et définitions" de l'IEC 60862-2:2002 sont inclus;
- la méthode de mesure du filtre de type équilibré est décrite;
- la procédure d'essai de la sensibilité aux décharges électrostatiques (DES) est abordée.
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Standards Content (Sample)
IEC 60862-1 ®
Edition 3.0 2015-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Surface acoustic wave (SAW) filters of assessed quality –
Part 1: Generic specification
Filtres à ondes acoustiques de surface (OAS) sous assurance de la qualité –
Partie 1: Spécification générique
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IEC 60862-1 ®
Edition 3.0 2015-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Surface acoustic wave (SAW) filters of assessed quality –
Part 1: Generic specification
Filtres à ondes acoustiques de surface (OAS) sous assurance de la qualité –
Partie 1: Spécification générique
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-2863-0
– 22 – IEC 60862-1:2015 © IEC 2015
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms, definitions, units and symbols . 9
3.1 Terms and definitions . 9
3.1.1 General terms . 9
3.1.2 Response characteristics related terms . 12
3.1.3 SAW filter related terms . 16
3.2 Units and symbols. 18
4 Order of precedence of documents . 18
5 Preferred values for ratings and characteristics . 19
5.1 General . 19
5.2 Nominal frequencies . 19
5.2.1 Nominal frequency bands for use in RF applications . 19
5.2.2 Nominal frequency bands for use in IF applications . 19
5.2.3 Nominal frequency values for use in broadcasting IF applications . 19
5.3 Relative attenuation values specifying pass bandwidth for IF applications . 20
5.4 TTE signal suppression . 20
5.5 Operating temperature ranges, in degrees Celsius (°C) . 20
5.6 Climatic category . 20
5.7 Bump severity . 20
5.8 Vibration severity . 21
5.9 Shock severity . 21
5.10 Fine leak rate . 21
6 Marking . 22
6.1 Filter marking . 22
6.2 Package marking . 22
7 Quality assessment procedures . 22
7.1 General . 22
7.2 Primary stage of manufacture . 22
7.3 Structurally similar components . 22
7.4 Subcontracting . 22
7.5 Incorporated components . 23
7.6 Manufacturer’s approval . 23
7.7 Approval procedures . 23
7.7.1 General . 23
7.7.2 Capability approval . 23
7.7.3 Qualification approval . 23
7.8 Procedures for capability approval . 23
7.8.1 General . 23
7.8.2 Eligibility for capability approval . 24
7.8.3 Application for capability approval . 24
7.8.4 Granting of capability approval . 24
7.8.5 Capability manual . 24
7.9 Procedures for qualification approval . 24
7.9.1 General . 24
7.9.2 Eligibility for qualification approval . 24
7.9.3 Application for qualification approval . 24
7.9.4 Granting of qualification approval . 24
7.9.5 Quality conformance inspection . 24
7.10 Test procedures . 24
7.11 Screening requirements . 24
7.12 Rework and repair work . 25
7.12.1 Rework . 25
7.12.2 Repair work . 25
7.13 Certified records of released lots . 25
7.14 Validity of release . 25
7.15 Release for delivery . 25
7.16 Unchecked parameters . 25
8 Test and measurement procedures . 25
8.1 General . 25
8.2 Test and measurement conditions . 25
8.2.1 Standard conditions for testing . 25
8.2.2 Precision of measurement . 26
8.2.3 Precautions . 26
8.2.4 Alternative test methods . 26
8.3 Visual inspection . 26
8.3.1 General . 26
8.3.2 Visual test A . 26
8.3.3 Visual test B . 26
8.3.4 Visual test C . 27
8.4 Dimensions and gauging procedures . 27
8.4.1 Dimensions test A . 27
8.4.2 Dimensions test B . 27
8.5 Electrical test procedures . 27
8.5.1 General . 27
8.5.2 Insertion attenuation measurement . 27
8.5.3 Phase measurement . 29
8.5.4 Group delay measurement . 29
8.5.5 Return attenuation measurement . 30
8.5.6 Unwanted signal measurement . 32
8.5.7 Intermodulation distortion measurement . 34
8.5.8 Measurement of insertion attenuation, phase, and group delay
characteristics at specified terminating impedances and at standard
atmospheric conditions . 35
8.5.9 Measurement of insertion attenuation, phase, and group delay
characteristics as a function of temperature . 35
8.5.10 Measurement of return attenuation at specified terminating impedance
and at the standard atmospheric conditions . 35
8.5.11 Measurement of unwanted signals at standard atmospheric conditions . 35
8.5.12 Measurement of intermodulation distortion at standard atmospheric
conditions . 36
8.5.13 Measurement method for the balanced type filter . 36
8.5.14 Insulation resistance . 38
– 44 – IEC 60862-1:2015 © IEC 2015
8.5.15 Voltage proof . 38
8.6 Mechanical and environmental test procedures . 38
8.6.1 Robustness of terminations (destructive) . 38
8.6.2 Sealing tests (non-destructive) . 38
8.6.3 Soldering (solderability and resistance to soldering heat) (destructive) . 39
8.6.4 Rapid change of temperature: severe shock by liquid immersion (non-
destructive). 40
8.6.5 Rapid change of temperature with prescribed time of transition (non-
destructive). 40
8.6.6 Bump (destructive) . 40
8.6.7 Vibration (destructive). 40
8.6.8 Shock (destructive) . 41
8.6.9 Free fall (destructive) . 41
8.6.10 Acceleration, steady state (non-destructive) . 41
8.6.11 Low air pressure (non-destructive) . 42
8.6.12 Dry heat (non-destructive) . 42
8.6.13 Damp heat, cyclic (destructive) . 42
8.6.14 Cold (non-destructive) . 42
8.6.15 Climatic sequence (destructive) . 42
8.6.16 Damp heat, steady state (destructive) . 42
8.6.17 Salt mist cyclic (destructive) . 42
8.6.18 Immersion in cleaning solvents (non-destructive) . 43
8.6.19 Flammability test (destructive) . 43
8.6.20 Electrostatic discharge (ESD) sensitivity test (destructive) . 43
8.7 Endurance test procedure . 43
Bibliography . 44
Figure 1 – Frequency response of a SAW filter . 18
Figure 2 – Insertion attenuation, phase, and group delay measurement . 28
Figure 3 – Return attenuation measurement . 31
Figure 4 – Unwanted signal measurement . 33
Figure 5 – Unwanted signals measured on time domain . 34
Figure 6 – Intermodulation distortion measurement . 35
Figure 7 – Four-port network analyzer measurement for balanced-balanced connection
filter . 37
Figure 8 – Three-port network analyzer measurement for balanced-unbalanced
connection filter . 37
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SURFACE ACOUSTIC WAVE (SAW) FILTERS
OF ASSESSED QUALITY –
Part 1: Generic specification
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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6) All users should ensure that they have the latest edition of this publication.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60862-1 has been prepared by IEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
This third edition cancels and replaces the second edition published in 2003. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
• the terms and definitions from IEC 60862-2:2002 are included;
• the measurement method for the balanced type filter is described;
• the electrostatic discharge (ESD) sensitivity test procedure is considered.
– 66 – IEC 60862-1:2015 © IEC 2015
The text of this standard is based on the following documents:
FDIS Report on voting
49/1151/FDIS 49/1164/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60862 series, published under the general title Surface acoustic
wave (SAW) filters of assessed quality, can be found on the IEC web site.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
SURFACE ACOUSTIC WAVE (SAW) FILTERS
OF ASSESSED QUALITY –
Part 1: Generic specification
1 Scope
This part of IEC 60862 specifies the methods of test and general requirements for SAW filters
of assessed quality using either capability approval or qualification approval procedures.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology
IEC 60050 (all parts), International Electrotechnical Vocabulary (available at
www.electropedia.org)
IEC 60068-1:2013, Environmental testing – Part 1: General and guidance
IEC 60068-2-1, Environmental testing – Part 2-1: Tests – Test A: Cold
IEC 60068-2-2, Environmental testing – Part 2-2: Tests – Test B: Dry heat
IEC 60068-2-6, Environmental testing – Part 2-6: Tests – Test Fc: Vibration (sinusoidal)
IEC 60068-2-7, Basic environmental testing procedures – Part 2-7: Tests – Test Ga and
guidance: Acceleration, steady state
IEC 60068-2-13, Basic environmental testing procedures – Part 2-13: Tests – Test M: Low air
pressure
IEC 60068-2-14, Environmental testing – Part 2-14: Tests – Test N: Change of temperature
IEC 60068-2-17:1994, Basic environmental testing procedures– Part 2-17: Tests – Test Q:
Sealing
IEC 60068-2-20, Environmental testing – Part 2-20: Tests – Test T: Test methods for
solderability and resistance to soldering heat of devices with leads
IEC 60068-2-21, Environmental testing – Part 2-21: Tests – Test U: Robustness of
terminations and integral mounting devices
IEC 60068-2-27, Environmental testing – Part 2-27: Tests – Test Ea and guidance: Shock
IEC 60068-2-30, Environmental testing – Part 2-30: Tests – Test Db and guidance: Damp
+ 12 h cycle)
heat, cyclic (12 h
– 88 – IEC 60862-1:2015 © IEC 2015
IEC 60068-2-31, Environmental testing – Part 2-31: Tests – Test Ec: Rough handling shocks,
primarily for equipment-type specimens
IEC 60068-2-45, Basic environmental testing procedures – Part 2-45: Tests – Test XA and
guidance: Immersion in cleaning solvents
IEC 60068-2-52, Environmental testing – Part 2-52: Tests – Test Kb: Salt mist, cyclic (sodium
chloride solution)
IEC 60068-2-58, Environmental testing – Part 2-58: Tests – Test Td: Test methods for
solderabilitly, resistance to dissolution of metallization and to soldering heat of surface
mounting devices (SMD)
IEC 60068-2-64, Environmental testing – Part 2-64: Tests – Test Fh: Vibration, broad-band
random and guidance
IEC 60068-2-78, Environmental testing – Part 2-78: Tests – Test Cab: Damp heat, steady
state
IEC 60122-1, Quartz crystal units of assessed quality – Part 1: Generic specification
IEC 60617, Graphical symbols for diagrams (available at http://std.iec.ch/iec60617)
IEC 60642, Piezoelectric ceramic resonators and resonator units for frequency control and
selection – Chapter I: Standard values and conditions – Chapter II: Measuring and test
conditions
IEC 60695-11-5, Fire hazard testing – Part 11-5: Test flames – Needle-flame test method –
Apparatus, confirmatory test arrangement and guidance
IEC 60749-28 , Semiconductor devices – Mechanical and climatic test methods – Part 28:
Electrostatic discharge (ESD) sensitivity testing direct contact charged device model (DC-
CDM)
IEC 61000-4-2, Electromagnetic compatibility (EMC) – Part 4-2: Testing and measurement
techniques – Electrostatic discharge immunity test
IEC 61340-3-1, Electrostatics – Part 3-1: Methods for simulation of electrostatic effects –
Human body model (HBM) electrostatic discharge test waveforms
IEC 61340-3-2, Electrostatics – Part 3-2: Methods for simulation of electrostatic effects –
Machine model (MM) electrostatic discharge test waveforms
IEC 80000 (all parts), Quantities and units
ISO 80000 (all parts), Quantities and units
_____________
To be published.
3 Terms, definitions, units and symbols
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1.1 General terms
3.1.1.1
surface acoustic wave
SAW
acoustic wave, propagating along a surface of an elastic material, whose amplitude decays
exponentially with the depth
3.1.1.2
surface acoustic wave filter
SAW filter
filter characterized by one or more surface acoustic wave transmission line or resonant
elements, where the surface acoustic wave is usually generated by an interdigital transducer
and propagates along a material surface
3.1.1.3
power flow vector
vector, analogous to a Poynting vector, characterizing energy propagation caused by a
surface acoustic wave
3.1.1.4
propagation vector
vector characterizing the phase progression of a wave
3.1.1.5
power flow angle
angle between the direction of the power flow vector and the direction of the propagation
vector
3.1.1.6
SAW beam steering
SAW propagation phenomenon in anisotropic materials described by an angle of powerflow
which is not zero
3.1.1.7
SAW diffraction
phenomenon, analogous to diffraction of light from a source of finite aperture, which causes
SAW beam spreading and wave-front distortion
3.1.1.8
SAW coupling coefficient
k
s
electromechanical coupling coefficient defined as follows:
∆ν
2 s
k = 2
s
ν
s
where
v is the SAW propagation velocity on the free surface;
s
∆v is the change of SAW velocity due to short-circuiting the surface potential;
s
– 1010 – IEC 60862-1:2015 © IEC 2015
∆v /v is the relative velocity change produced by short-circuiting the surface potential from
s s
the open-circuit condition
3.1.1.9
interdigital transducer
IDT
SAW transducer made of two comb-like conductive structures deposited on a piezoelectric
substrate transforming electrical energy into acoustic energy or vice versa
3.1.1.10
unidirectional interdigital transducer
UDT
transducer capable of radiating and receiving surface acoustic waves in or from a single
direction
3.1.1.11
multiphase transducer
interdigital transducer having more than two inputs which are driven in different phases
Note 1 to entry: Usually used as a unidirectional transducer.
3.1.1.12
finger
element of the IDT comb electrode
3.1.1.13
solid finger
finger formed of one element with a period of a half wavelength along the propagation
direction
3.1.1.14
split finger
finger formed of more than one element, so as to produce antireflection properties in a
surface acoustic wave filter
3.1.1.15
dummy finger
passive finger which may be included in order to suppress wave-front distortion
3.1.1.16
bus bar
common electrode which connects individual fingers together and also connects the filter to
an external circuit
3.1.1.17
weighted-response transducer
transducer intended to produce a specified impulse response by design of the structure
Note 1 to entry: See 3.1.1.18 to 3.1.1.23.
3.1.1.18
finger overlap or source strength
length of a finger pair between which only electromechanical interaction is generated
3.1.1.19
apodization
weighting produced by the change of finger overlap over the length of the IDT
3.1.1.20
withdrawal weighting
weighting by removal of fingers or sources
3.1.1.21
capacitive weighting
weighting by change of capacitance between electrodes
3.1.1.22
series weighting
weighting by separation of a finger into individual elements having capacitive coupling
between them
Note 1 to entry: The elements may be separated from the bus bar.
3.1.1.23
phase weighting
weighting by change in period of finger arrangement inside the IDT
3.1.1.24
aperture
normalized beamwidth of the SAW generated at the centre frequency and normalized to the
corresponding wavelength
3.1.1.25
multistrip coupler
MSC
array of additional metal strips deposited on a piezoelectric substrate in a direction transverse
to the propagation direction, which transfers acoustic power from one acoustic track to an
adjacent track
3.1.1.26
reflector
SAW reflecting component which normally makes use of the periodic discontinuity provided by
a metal strip array or a grooved array
3.1.1.27
spurious reflection
unwanted signal caused by reflection of SAW or bulk waves from substrate edges or
electrodes
3.1.1.28
triple transit echo
TTE
unwanted signals in a SAW filter which have traversed three times the propagation path
between input and output IDTs caused by reflections from output and input transducers
3.1.1.29
bulk wave signal
unwanted signal caused by bulk wave excitation and detected at the filter output
3.1.1.30
feed through signal
signal of electromagnetic interference
unwanted signal from the input appearing at the filter output due to stray capacitances and
other electromagnetic couplings
– 1212 – IEC 60862-1:2015 © IEC 2015
3.1.1.31
suppression corrugation
grooves in the non-active side of a substrate for suppressing bulk wave signals
3.1.1.32
acoustic absorber
material with high acoustic loss placed on any part of the substrate for acoustic absorption
purposes
3.1.1.33
shielding electrode
electrode intended for the reduction of electromagnetic interference signals
3.1.1.34
interdigitated interdigital transducer
IIDT
SAW transducer made of a combination of three or more interdigital transducers
Note 1 to entry: Same as a muti-IDT in the IEC 60862 series , IIDT(or multi-IDT) resonator filter is used to refer to
SAW resonator filters composed of a number of IDTs for input and output in a line alternately with grating reflectors
at both ends.
3.1.2 Response characteristics related terms
3.1.2.1
nominal frequency
frequency given by the manufacturer or the specification to identify the filter
3.1.2.2
centre frequency
arithmetic mean of the cut-off frequencies
SEE: Figure 1.
3.1.2.3
reference frequency
frequency defined by the specification to which other frequencies may be referred
SEE: Figure 1.
3.1.2.4
cut-off frequency
frequency of the pass band at which the relative attenuation reaches a specified value
SEE: Figure 1.
3.1.2.5
total power loss
logarithmic ratio of the available power at the given source to the power that the SAW filter
delivers to a load impedance under specified operating conditions
3.1.2.6
insertion attenuation
logarithmic ratio of the power delivered directly to the load impedance before insertion of the
filter to the power delivered to the load impedance after insertion of the filter
3.1.2.7
nominal insertion attenuation
insertion attenuation at a specified reference frequency
SEE: Figure 1.
3.1.2.8
relative attenuation
difference between the attenuation at a given frequency and the attenuation at the reference
frequency
SEE: Figure 1.
3.1.2.9
pass band
band of frequencies in which the relative attenuation is equal to or less than a specified value
3.1.2.10
pass bandwidth
separation of frequencies between which the relative attenuation is equal to or less than a
specified value
3.1.2.11
pass band ripple
maximum variation in attenuation characteristics within a specified pass band
SEE: Figure 1.
3.1.2.12
TTE ripple
maximum variation in attenuation characteristics caused by TTE within a specified pass band
SEE: Figure 1.
3.1.2.13
minimum insertion attenuation
minimum value of insertion attenuation in the pass band
SEE: Figure 1.
3.1.2.14
maximum insertion attenuation
maximum value of insertion attenuation in the pass band
SEE: Figure 1.
3.1.2.15
stop band
band of frequencies in which the relative attenuation is equal to or greater than a specified
value
3.1.2.16
stop bandwidth
separation of frequencies between which the relative attenuation is equal to or greater than a
specified value
3.1.2.17
stop band rejection
minimum relative attenuation at a specified stop band
– 1414 – IEC 60862-1:2015 © IEC 2015
3.1.2.18
shape factor
ratio of the two bandwidths at specified values of relative attenuation
3.1.2.19
group delay
time equal to the first derivative of the phase shift, in radians, with respect to the angular
frequency
3.1.2.20
nominal group delay
group delay at a specified reference frequency
SEE: Figure 1.
3.1.2.21
group delay distortion
difference between the lowest value and highest value of group delay in a specified frequency
band
SEE: Figure 1.
3.1.2.22
trap frequency
specified frequency at which the relative attenuation is equal to or greater than a specified
value
3.1.2.23
trap attenuation
relative attenuation at a specified trap frequency
3.1.2.24
transition band
band of frequencies between the cut-off frequency and the nearest point of the adjacent stop
band
3.1.2.25
reflectivity
dimensionless measure of the degree of mismatch between two impedances Z and Z :
a b
Z − Z
a b
,
Z + Z
a b
where Z and Z represent, respectively, the input and source impedance or the output and
a b
load impedance
Note 1 to entry: The absolute value of reflectivity is called the reflection coefficient.
3.1.2.26
return attenuation
value of the reflection coefficient given by the sign changed expression in decibels:
Z − Z
a b
– 20 log dB
Z + Z
a b
3.1.2.27
reflected wave signal suppression
relative attenuation of unwanted signals caused by reflection of SAW or bulk waves from
substrate edges or electrodes within a specified time window
3.1.2.28
feedthrough signal suppression
relative attenuation which implies the suppression of directly coupled signals by the
electromagnetic and electrostatic coupling between the input and output electrodes
3.1.2.29
unwanted response
response other than that associated with the mode of vibration intended for the application
3.1.2.30
input level
power, voltage or current value applied to the input terminal of a filter
3.1.2.31
output level
power, voltage or current value delivered to the load circuit
3.1.2.32
nominal level
power, voltage or current value at which the performance measurement is specified
3.1.2.33
input impedance
impedance presented by the filter to the signal source when the output is terminated by a
specified load impedance
3.1.2.34
output impedance
impedance presented by the filter to the load when the input is terminated by a specified
source impedance
3.1.2.35
terminating impedance
impedance presented to the filter by the source or by the load
3.1.2.36
balanced input/output
filter input/output between two terminals having equal amplitudes and 180 degree different
phases
3.1.2.37
available power
maximum power obtainable from a given source by suitable adjustment of the load impedance
3.1.2.38
operating temperature range
range of temperatures, over which the SAW filter will function while maintaining its specified
characteristics within specified tolerances
– 1616 – IEC 60862-1:2015 © IEC 2015
3.1.2.39
operable temperature range
range of temperatures over which the SAW filter continues to provide its specified response
characteristics, though not necessarily within the specified tolerances
3.1.2.40
storage temperature range
minimum and maximum temperatures as measured on the enclosure, at which the SAW filter
may be stored without deterioration or damage to its performance
3.1.2.41
roll-off rate
index describing the rise-up characteristics for digital communication SAW roll-off filters
Note 1 to entry: It is a ratio of the transition band to the ideal cut-off frequency, which is equal to a half of the
sampling frequency in the case of cosine roll-off frequency characteristics.
3.1.2.42
intermodulation distortion
IMD
non-linear distortion of a device response characterized by the appearance of frequencies at
the output which is equal to the differences (or sums) of integral multiples of the two or more
component frequencies present at the input
Note 1 to entry: This note applies to the French language only.
3.1.3 SAW filter related terms
3.1.3.1
transversal filter
filter consisting of input and output interdigital transducers on a piezoelectric substrate
Note 1 to entry: The impulse response of a transversal filter is given by the convolution of the impulse response
of the input IDT and the impulse response of the output IDT. The frequency response is given by the Fourier
transform of the impulse response.
3.1.3.2
frequency symmetrical filter
filter having a symmetrical frequency characteristic in relation to the reference frequency
3.1.3.3
frequency asymmetrical filter
filter having a specified asymmetrical pass-band or stop-band characteristic in relation to the
reference frequency
3.1.3.4
dispersive filter
filter designed so as to have group delay which is a function of frequency, usually by varying
the finger periodicity
3.1.3.5
comb filter
filter having two or more pass bands between three or more stop bands
3.1.3.6
tapered IDT filter
broad-band SAW filter using a fan-shaped IDT called “tapered IDT” or “slanted finger IDT”, in
which electrode pitch is varied perpendicular to the propagation direct
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