IEC 60512-27-200:2022

Connectors for electrical and electronic equipment - Tests and measurements - Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on IEC 60603-7 series connectors - Tests 27a to 27g

L'IEC 60512-27-200:2022 est avant tout destiné à être utilisé pour les essais d’intégrité des signaux et de qualité de la transmission jusqu’à 2 000 MHz des types de connecteurs à 8 voies couverts par la série IEC 60603-7 (IEC 60603‑7‑81), conformément à la méthode d’essai des connecteurs de l’IEC 60512‑28‑100. Le présent document couvre les connecteurs d’essai ainsi que les dispositifs d’essai à référence indirecte utilisés pour mesurer l’intégrité des signaux et la qualité de la transmission selon les exigences de la série IEC 60603-7 concernant les types de connecteurs à 8 voies définis dans les normes publiées suivantes: - IEC 60603‑7‑2 - IEC 60603‑7‑3 - IEC 60603‑7‑4 - IEC 60603‑7‑5 - IEC 60603‑7‑41 - IEC 60603‑7‑51 - IEC 60603‑7‑81 Le présent document fournit des informations supplémentaires sur les connecteurs d’essai ainsi que sur les dispositifs d’essai utilisés pour les mesures de performance des connecteurs conformément aux normes de méthode d’essai qui concernent ces connecteurs: - IEC 60512‑26‑100 - IEC 60512‑27‑100 - IEC 60512‑28‑100 Cette première édition annule et la CEI/PAS 60512-27-200, parue en 2018.

Connecteurs pour équipements électriques et électroniques - Essais et mesures - Partie 27-200: Spécifications supplémentaires pour les essais d’intégrité des signaux jusqu’à 2 000 MHz sur les connecteurs de la série IEC 60603-7 - Essais 27a à 27g

L'IEC 60512-27-200:2022 est avant tout destiné à être utilisé pour les essais d’intégrité des signaux et de qualité de la transmission jusqu’à 2 000 MHz des types de connecteurs à 8 voies couverts par la série IEC 60603-7 (IEC 60603‑7‑81), conformément à la méthode d’essai des connecteurs de l’IEC 60512‑28‑100. Le présent document couvre les connecteurs d’essai ainsi que les dispositifs d’essai à référence indirecte utilisés pour mesurer l’intégrité des signaux et la qualité de la transmission selon les exigences de la série IEC 60603-7 concernant les types de connecteurs à 8 voies définis dans les normes publiées suivantes: - IEC 60603‑7‑2 - IEC 60603‑7‑3 - IEC 60603‑7‑4 - IEC 60603‑7‑5 - IEC 60603‑7‑41 - IEC 60603‑7‑51 - IEC 60603‑7‑81 Le présent document fournit des informations supplémentaires sur les connecteurs d’essai ainsi que sur les dispositifs d’essai utilisés pour les mesures de performance des connecteurs conformément aux normes de méthode d’essai qui concernent ces connecteurs: - IEC 60512‑26‑100 - IEC 60512‑27‑100 - IEC 60512‑28‑100 Cette première édition annule et la CEI/PAS 60512-27-200, parue en 2018.

General Information

• Status: Published
• Publication Date: 14-Sep-2022
• ICS: 31.220.10 - Plug-and-socket devices. Connectors
• Technical Committee: SC 48B - Electrical connectors
• Current Stage: PPUB - Publication issued
• Start Date: 15-Sep-2022
• Completion Date: 14-Oct-2022

Relations

• Replaces: IEC PAS 60512-27-200:2018 - Connectors for electrical and electronic equipment - Tests and measurements - Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on IEC 60603-7 series connectors - Tests 27a to 27g
• Effective Date: 05-Sep-2023

Overview

IEC 60512-27-200:2022 is an international standard published by the International Electrotechnical Commission (IEC) that specifies additional test requirements for evaluating the signal integrity of electrical connectors. This standard focuses on connectors of the IEC 60603-7 series designed for 8-way connections and defines tests and measurement methods for signal frequencies up to 2,000 MHz. It is intended to be applied in assessing the performance and transmission quality of these connectors in high-frequency applications.

This standard replaces the previous IEC/PAS 60512-27-200:2018 and complementarily works alongside other IEC test standards such as IEC 60512-26-100, IEC 60512-27-100, and IEC 60512-28-100. It includes detailed specifications for test plugs, test cords, and fixtures employed for indirect-reference and direct-probe measurements involved in signal integrity assessment.

Key Topics

• Scope of Testing
  The standard concentrates on signal integrity tests including near-end crosstalk (NEXT), return loss, insertion loss, and similar measures up to 2 GHz on various IEC 60603-7 connector types (e.g., IEC 60603-7-2, -3, -4, -5, -41, -51, -81).

• Test Connector Specifications
  Detailed descriptions and requirements for test plugs (Category 8.1) and cord test heads are included to ensure consistent and repeatable measurements, particularly concerning NEXT loss and return loss parameters.

• Measurement Setups and Methods
  The document defines both indirect-reference and direct-probe test fixtures, including calibration planes and phase reference considerations, essential for accurate signal integrity testing of connectors.

• Balun and Balunless Measurement Procedures
  It provides informative annexes describing how to conduct balun (balanced to unbalanced) and balunless measurements on connectors and associated cabling to evaluate insertion loss and overall signal quality.

• Test Limits and Loss Specifications
  Comprehensive tables delineate acceptable NEXT, return loss, and insertion loss limits for test plugs, mated connectors, and test cords, supporting manufacturers and testers in quality assurance and compliance verification.

Applications

IEC 60512-27-200:2022 plays a critical role in ensuring the performance and reliability of electrical connectors used in high-frequency data transmission systems. Common application areas include:

• Telecommunications Equipment
  Verification of connectors carrying high-speed digital signals up to 2000 MHz ensures signal integrity in telecom infrastructure.

• Data Centers and Networking
  Standard-compliant connectors assure robust links in data centers, enabling reliable high-bandwidth network communication.

• Industrial and Electronic Equipment
  Devices requiring multi-channel 8-way connectors benefit from this standard’s guidance to maintain consistent transmission quality.

• Manufacturing and Quality Control
  Test labs and connector manufacturers use the standard to design test procedures and validate connector performance during production and R&D.

By following the test methods and specifications defined in IEC 60512-27-200, industries can reduce signal degradation and crosstalk, leading to better overall system performance and interoperability.

Related Standards

• IEC 60603-7 Series
  Defines the construction and performance requirements for 8-way connectors, including various sub-parts such as 60603-7-2/-3/-4/-5/-41/-51/-81 which IEC 60512-27-200 references specifically for test scope.

• IEC 60512-26-100
  Covers additional test methods related to electrical connectors, complementing the signal integrity tests of Part 27-200.

• IEC 60512-27-100 and IEC 60512-28-100
  Provide foundational test methodologies and guidelines for conducting connector tests, on which the additional specifications up to 2000 MHz are based.

• IEC/PAS 60512-27-200 (2018)
  The previous Publicly Available Specification replaced by this 2022 edition with updated tests and enhanced accuracy.

Adhering to IEC 60512-27-200 along with these related standards enables a rigorous and comprehensive framework for connector evaluation, promoting global standardization and interoperability.

---

Keywords: IEC 60512-27-200, IEC 60603-7 connectors, signal integrity tests, electrical connectors, test plugs, near-end crosstalk, return loss, insertion loss, Category 8.1 connectors, electrical connector testing, IEC standards, high-frequency connectors, signal transmission quality

Standards Content (Sample)

IEC 60512-27-200 ®
Edition 1.0 2022-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Connectors for electrical and electronic equipment – Tests and measurements –
Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz
on IEC 60603-7 series connectors – Tests 27a to 27g
Connecteurs pour équipements électriques et électroniques – Essais et
mesures –
Partie 27-200: Spécifications supplémentaires pour les essais d’intégrité des
signaux jusqu’à 2 000 MHz sur les connecteurs de la série IEC 60603-7 –
Essais 27a à 27g
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IEC 60512-27-200 ®
Edition 1.0 2022-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Connectors for electrical and electronic equipment – Tests and measurements –
Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz
on IEC 60603-7 series connectors – Tests 27a to 27g
Connecteurs pour équipements électriques et électroniques – Essais et
mesures –
Partie 27-200: Spécifications supplémentaires pour les essais d’intégrité des
signaux jusqu’à 2 000 MHz sur les connecteurs de la série IEC 60603-7 –
Essais 27a à 27g
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.220.10 ISBN 978-2-8322-5666-4
– 2 – IEC 60512-27-200:2022 © IEC 2022
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 8
3 Terms and definitions . 9
4 Test connector specifications. 9
4.1 General . 9
4.2 Indirect-reference test fixtures . 10
4.3 Category 8.1 test plug requirements . 11
4.3.1 General . 11
4.3.2 Category 8.1 test plug NEXT loss requirements . 11
4.3.3 Category 8.1 test plug return loss requirements . 11
4.4 Category 8.1 cord test head requirements . 12
4.4.1 General . 12
4.4.2 Category 8.1 cord test head return loss . 12
Annex A (informative) Test connectors specifications. 13
A.1 General . 13
A.2 Test plug specifications. 13
A.2.1 General . 13
A.2.2 Test plug NEXT loss limit vectors . 13
A.2.3 Mated connector NEXT loss specifications . 14
A.2.4 Test plug NEXT loss specifications . 14
A.2.5 Test plug phase reference plane and calibration planes . 16
A.2.6 Device delay measurements . 17
A.3 Cord test head specifications . 19
A.3.1 General . 19
A.3.2 Cord test head NEXT loss, centred . 19
A.3.3 Cord test head FEXT loss . 19
A.3.4 Cord test head return loss . 19
Annex B (informative) Balun measurement procedures use of test plugs and test
heads . 21
B.1 General . 21
B.2 Example balun measurement test configuration for permanent link insertion
loss . 21
B.3 Example balun measurement test configuration for direct attach cord
insertion loss . 21
Annex C (informative) Balunless measurement procedures use of test plugs and test
heads . 23
C.1 General . 23
C.2 Example balunless measurement test configuration for permanent link
insertion loss . 23
C.3 Example balunless measurement test configuration for direct attach cord
insertion loss . 23
Annex D (informative) Connector test fixtures . 25
D.1 General . 25
D.2 Overall test setup . 25
D.3 Indirect-reference test fixtures . 26

D.3.1 Indirect-reference test fixtures basic specifications . 26
D.3.2 Indirect-reference test fixtures additional specifications . 26
D.4 Direct-probe test fixtures . 26
D.4.1 Direct-probe test fixtures basic specifications . 26
D.4.2 Direct-probe test fixtures additional specifications . 26
D.4.3 Direct-probe test fixtures for test plug measurements . 27
Bibliography . 28

Figure A.1 – Calibration planes, test plug phase reference plane, and port extensions . 17
Figure B.1 – Example balun measurement test configuration for permanent link
insertion loss . 21
Figure B.2 – Example balun measurement test configuration for direct attach cord
insertion loss . 22
Figure C.1 – Example balunless measurement test configuration for permanent link
insertion loss . 23
Figure C.2 – Example balunless measurement test configuration for direct attach cord
insertion loss . 24

Table 1 – IEC 60603-7 series, 8-way connector types standards and respective
connector test method standards . 10
Table 2 – Category 8.1 test plug NEXT loss ranges . 11
Table 3 – Category 8.1 test plug return loss requirements . 12
Table 4 – Category 8.1 cord test head return loss . 12
Table A.1 – Category 6, 6A and 8.1 test plug NEXT loss limit vectors . 13
Table A.2 – Category 5e test plug NEXT loss limit vectors . 14
Table A.3 – Category 6, 6A and 8.1 mated connector NEXT loss specifications for
case 1 and case 4 . 14
Table A.4 – Category 5e, 6, and 6A test plug NEXT loss ranges . 15
Table A.5 – Category 8.1 test plug NEXT loss ranges. 16
Table A.6 – Category 5e, 6, and 6A cord test head return loss . 19
Table A.7 – Category 8.1 cord test head return loss . 20
Table D.1 – Overall test setup specifications . 25
Table D.2 – Direct-probe test fixture general specifications . 27
Table D.3 – Direct probe fixture for test plugs measurements – specifications . 27

– 4 – IEC 60512-27-200:2022 © IEC 2022
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CONNECTORS FOR ELECTRICAL AND ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 27-200: Additional specifications for signal integrity tests
up to 2 000 MHz on IEC 60603-7 series connectors –
Tests 27a to 27g
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
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preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
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Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 60512-27-200 has been prepared by subcommittee 48B: Electrical connectors, of IEC
technical committee 48: Electrical connectors and mechanical structures for electrical and
electronic equipment. It is an International Standard.
This first edition cancels and replaces IEC/PAS 60512-27-200 published in 2018.
The text of this International Standard is based on the following documents:
Draft Report on voting
48B/2976/FDIS 48B/2988/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/standardsdev/publications.
A list of all parts of IEC 60512 series, under the general title Connectors for electrical and
electronic equipment – Tests and measurements, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
 reconfirmed,
 withdrawn,
 replaced by a revised edition, or
 amended.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.

.
– 6 – IEC 60512-27-200:2022 © IEC 2022
INTRODUCTION
This document is primarily intended for use in signal integrity and transmission performance
testing up to 2 000 MHz of IEC 60603-7 series 8-way connector type IEC 60603-7-81, according
to connector test method IEC 60512-28-100.
This document covers test connectors and associated indirect-reference test fixtures used for
connector signal integrity and transmission performance measurements of connector
requirements specified in IEC 60603-7 series 8-way connector types defined in these published
standards:
IEC 60603-7-2
IEC 60603-7-3
IEC 60603-7-4
IEC 60603-7-5
IEC 60603-7-41
IEC 60603-7-51
IEC 60603-7-81.
This document provides supplementary information on test connectors and test fixtures used in
connector performance measurements according to those connectors’ respective test methods
standards:
IEC 60512-26-100
IEC 60512-27-100
IEC 60512-28-100.
The test fixtures and reference connectors, e.g., test plugs, specified in this document are
referenced by test method IEC 60512-28-100.
The test fixtures and reference connectors, e.g., cord test heads, specified in this document are
referenced by test method IEC 61935-2.

CONNECTORS FOR ELECTRICAL AND ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –
Part 27-200: Additional specifications for signal integrity tests
up to 2 000 MHz on IEC 60603-7 series connectors –
Tests 27a to 27g
1 Scope
This part of IEC 60512 covers additional, supplemental test method specifications to extend the
upper frequency for the test connectors and associated indirect-reference test fixtures used in
the signal integrity and transmission performance tests specified in IEC 60512-27-100. In
support of de-embedded crosstalk and related transmission requirements specified in
IEC 60603-7-81, for frequencies up to 2 000 MHz, these supplemental specifications extend
the upper test frequency from IEC 60512-27-100 up to 500 MHz to the upper test frequency of
IEC 60512-28-100 up to 2 000 MHz.
This document covers measurements of connector signal integrity and transmission
performance of 8-way connector types defined in these published connector series standards:
IEC 60603-7-2
IEC 60603-7-3
IEC 60603-7-4
IEC 60603-7-5
IEC 60603-7-41
IEC 60603-7-51
IEC 60603-7-81.
This document covers respective performance test procedures of connector signal integrity and
transmission performance defined in these published connector test method series standards:
IEC 60512-26-100
IEC 60512-27-100
IEC 60512-28-100.
These additional specifications are also suitable for testing the series related lower frequency
backward compatible connectors. However, the actual measurement or test procedure specified
in the detail specification for any particular connector remains the reference conformance test
for that connector category; see Table 1.
The test procedures of IEC 60512-27-100 affected by these supplemental specifications are:
– insertion loss, test 27a;
– return loss, test 27b;
– near-end crosstalk (NEXT) test 27c;
– far-end crosstalk (FEXT), test 27d;
– transverse conversion loss (TCL), test 27f;
– transverse conversion transfer loss (TCTL), test 27g.
– transfer impedance (Z ), see IEC 60512-26-100, test 26e.
T
– 8 – IEC 60512-27-200:2022 © IEC 2022
– coupling attenuation (a ), see IEC 62153-4-12.
C
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60050‑581, International Electrotechnical Vocabulary (IEV) – Part 581: Electromechanical
components for electronic equipment
IEC 60512-1, Connectors for electrical and electronic equipment – Tests and measurements –
Part 1: Generic specification
IEC 60512‑26‑100, Connectors for electronic equipment – Tests and measurements –
Part 26‑100: Measurement setup, test and reference arrangements and measurements for
connectors according to IEC 60603‑7 – Tests 26a to 26g
IEC 60512‑27‑100, Connectors for electronic equipment – Tests and measurements –
Part 27‑100: Signal integrity tests up to 500 MHz on 60603‑7 series connectors – Tests 27a to
27g
IEC 60512‑28‑100, Connectors for electronic equipment – Tests and measurements –
Part 28‑100:Signal integrity tests up to 200 MHz– Tests 28a to 28g
IEC 60603‑7, Connectors for electronic equipment – Part 7: Detail specification for 8‑way,
unshielded, free and fixed connectors
IEC 60603‑7‑1, Connectors for electronic equipment – Part 7‑1: Detail specification for 8‑way,
shielded, free and fixed connectors
IEC 60603‑7‑2, Connectors for electronic equipment – Part 7‑2: Detail specification for 8‑way,
unshielded, free and fixed connectors, for data transmissions with frequencies up to 100 MHz
IEC 60603‑7‑3, Connectors for electronic equipment – Part 7‑3: Detail specification for 8‑way,
shielded, free and fixed connectors, for data transmission with frequencies up to 100 MHz
IEC 60603‑7‑4, Connectors for electronic equipment – Part 7‑4: Detail specification for 8‑way,
unshielded, free and fixed connectors, for data transmissions with frequencies up to 250 MHz
IEC 60603‑7‑5, Connectors for electronic equipment – Part 7‑5: Detail specification for 8‑way,
shielded, free and fixed connectors, for data transmissions with frequencies up to 250 MHz
IEC 60603‑7‑41, Connectors for electronic equipment – Part 7‑41: Detail specification for
8‑way, unshielded, free and fixed connectors, for data transmissions with frequencies up to
500 MHz
IEC 60603‑7‑51, Connectors for electronic equipment – Part 7‑51: Detail specification for
8‑way, shielded, free and fixed connectors, for data transmissions with frequencies up to
500 MHz
IEC 60603‑7‑81, Connectors for electronic equipment – Part 7‑81: Detail specification for
8‑way, shielded, free and fixed connectors, for data transmissions with frequencies up to
2 000 MHz
IEC 61156‑1, Multicore and symmetrical pair/quad cables for digital communications – Part 1:
Generic specification
IEC 61156‑9, Multicore and symmetrical pair/quad cables for digital communications – Part 9:
Cables for channels with transmission characteristics up to 2 GHz – Sectional specification
IEC 61156‑10, Multicore and symmetrical pair/quad cables for digital communications –
Part 10: Cables for cords with transmission characteristics up to 2 GHz – Sectional specification
IEC 61935‑2, Specification for the testing of balanced and coaxial information technology
cabling – Part 2: Cords as specified in ISO/IEC 11801-1 and related standards
IEC 62153-4-12, Metallic communication cable test methods – Part 4-12: Electromagnetic
compatibility (EMC) – Coupling attenuation or screening attenuation of connecting hardware –
Absorbing clamp method
3 Terms and definitions
For the purposes of this document, the terms and definitions of IEC 60050-581, IEC 60512-1,
and IEC 60603-7 apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
4 Test connector specifications
4.1 General
This document specifies test connectors, including test plugs, cord test heads, and related test
fixtures used in signal integrity and transmission performance measurements and test
procedures for connectors.
The test fixtures and reference connectors, e.g., test plugs, specified in this document are
referenced by IEC 60512-28-100.
The test fixtures and reference connectors, e.g., cord test heads, specified in this document are
referenced by IEC 61935-2.
The test methods and procedures for signal integrity and transmission performance – specified
in IEC 60512-28-100 to cover the frequency range up to 2 000 MHz – are referenced by
connectors specified up to 3 MHz in IEC 60603-7 (unshielded) and IEC 60603-7-1 (shielded),
and up to 2 000 MHz only in IEC 60603-7-81.
The test method specified in IEC 60512-27-100 has a frequency range up to 500 MHz; this
document covers test connectors and related test fixtures specifications for extending the
frequency range up to 2 000 MHz.
The test connectors specified herein, used for signal integrity and transmission performance
measurements, are for connectors using de-embedded crosstalk and related specifications and
for measurements up to 2 000 MHz; i.e., IEC 60603-7-81.

– 10 – IEC 60512-27-200:2022 © IEC 2022
The indirect-reference test fixtures and associated test procedures used for measuring
IEC 60603-7 series 8-way connector types’ transmission parameters shall conform to their
respective detail specification test procedures requirements and to the requirements in this
document. In the case that a conflict arises between the requirements in the respective detail
specification test procedures and this document, the respective detail specification test
procedures shall take precedence.
The test methods and procedures specified herein are referenced by connector standards
normally used with twisted-pair cables having 100 Ω nominal differential characteristic
impedance, which are specified up to 2 000 MHz, in accordance with IEC 61156-1 cable
standard and its sectional specifications; e.g., IEC 61156-9 and IEC 61156-10.
4.2 Indirect-reference test fixtures
Indirect-reference test fixtures are for connector types utilizing indirect reference to de-
embedded crosstalk vectors for measurement of transmission parameters, e.g., IEC 60603-7
series (8-way types): IEC 60603-7-2, IEC 60603-7-3, IEC 60603-7-4, IEC 60603-7-5,
IEC 60603-7-41, IEC 60603-7-51, and IEC 60603-7-81.
The detail tests and measurement specifications for the measurement of the respective
transmission parameters, required by the detail product specifications of the IEC 60603-7 series
8-way connector types, are given in Table 1.
The indirect-reference test fixtures and associated test procedures used for measuring
IEC 60603-7 series 8-way connector types transmission parameters, up to 2 000 MHz, shall
conform to their respective detail tests and measurements specifications requirements, given
in IEC 60512-28-100.
Indirect-reference test fixtures up to 2 000 MHz shall also meet the overall test fixtures minimum
signal integrity requirements up to 2 000 MHz according to IEC 60512-28-100, listed in
Annex D.
Additional specifications in this document, given in Annex A, Annex B, Annex C, Annex D, are
for information.
The IEC 60603-7 series, 8-way connector types detail specifications and respective detail test
procedures standards for connector transmission parameters measurements are given in
Table 1.
Table 1 – IEC 60603-7 series, 8-way connector types standards and respective
connector test method standards
Connector Connector Shield Frequency Test methods
standard category type MHz standard
IEC 60603-7-2 Category 5e Unshielded 100 IEC 60512-26-100
IEC 60603-7-3 Category 5e Shielded
IEC 60603-7-4 Category 6 Unshielded 250 IEC 60512-26-100
IEC 60603-7-5 Category 6 Shielded
IEC 60603-7-41 Category 6 Unshielded 500 IEC 60512-27-100
A
IEC 60603-7-51 Category 6 Shielded
A
IEC 60603-7-81 Category Shielded 2 000 IEC 60512-28-100
8.1
4.3 Category 8.1 test plug requirements
4.3.1 General
The difference between IEC 60603-7-51 and IEC 60603-7-81 test plug requirements is in the
NEXT loss specifications from 300 MHz to 2 000 MHz and in the return loss specifications from
10 MHz to 2 000 MHz.
4.3.2 Category 8.1 test plug NEXT loss requirements
The corrected NEXT loss vectors (magnitude and phase) of the test plug in the forward direction
shall be within the test plug NEXT loss ranges of Table 2. Test plug NEXT loss requirements
apply in the forward direction only. Test plug NEXT loss in the reverse direction shall also be
measured so that the data can be used in the reverse direction for mated connector NEXT loss
qualification procedure.
NOTE Phase limits are only specified up to 500 MHz, which assure backward compatibility with category 6 500 MHz
A
connectors; phase requirements from 500 MHz to 2 000 MHZ are for further study (ffs).
Table 2 – Category 8.1 test plug NEXT loss ranges
1 2
Pair
NEXT loss magnitude range NEXT loss phase range
combination
degrees
dB
3,6-4,5 10 MHz ≤ f < 300 MHz: 50 MHz – 100 MHz:
38,1-20log(f /100) ≤ NEXT loss ≤ 39,5-20log(f /100)
(-90 + 1,5⋅× f /100) ± 1
300MHz ≤ f ≤ 2 000 MHz:
100 MHz – 500 MHz:
38,1-20log(f /100) ≤ NEXT loss ≤ 39,5-20log(f /100) +
(-90 + 1,5⋅× f /100) ± f /100
0,5(f-300)/200
500 MHz – 2 000 MHz:
not specified
1,2-3,6 10 MHz ≤ f < 300 MHz:
(-90 +1,5 × f /100) ± 3⋅× f /100
46,5-20log(f /100) ≤ NEXT loss ≤ 49,5-20log(f /100)
300 MHz ≤ f ≤ 2 000 MHz:
46,5-20log(f /100) ≤ NEXT loss ≤ 49,5-20log(f /100) +
0,5(f-300)/200
3,6-7,8 10 MHz ≤ f < 300 MHz: (-90 +1,5⋅× f /100) ± 3⋅× f /100
46,5-20log(f /100) ≤ NEXT loss ≤ 49,5-20log(f /100)
300 MHz ≤ f ≤ 2 000 MHz:
46,5-20log(f /100) ≤ NEXT loss ≤ 49,5-20log(f /100) +
0,5(f-300)/200
4 3
1,2-4,5
NEXT loss ≥ 57-20log(f /100) 90 ± (30⋅× f /100)
4 3
4,5-7,8
NEXT loss ≥ 57-20log(f /100) 90 ± (30⋅× f /100)
1,2-7,8 Any phase
NEXT loss ≥ 66-20log(f /100)
Magnitude limits apply over the frequency range from 10 MHz to 2 000 MHz.
Phase limits apply over the frequency range from 50 MHz to 2 000 MHz.
NEXT loss phase range requirements from 500 MHz to 2 000 MHz are for further study (ffs).
When the NEXT loss magnitude limit calculation results in a value greater than 70 dB, the limit reverts to
70 dB.
When the measured test plug NEXT loss magnitude is greater than 70-20log(f /100) or 70 dB, the NEXT loss
phase limit does not apply.
4.3.3 Category 8.1 test plug return loss requirements
The return loss requirements of the test plug are given in Table 3.

– 12 – IEC 60512-27-200:2022 © IEC 2022
Table 3 – Category 8.1 test plug return loss requirements
Pair Frequency Return loss
range magnitude
MHz
dB
1,2
3,6
10 to 2 000 ≥ 35-20log(f /100) min 14
4,5
7,8
Calculations that result in return loss limit value greater than 40 dB revert to a
limit of 40 dB.
4.4 Category 8.1 cord test head requirements
4.4.1 General
The difference between IEC 60603-7-51 and IEC 60603-7-81 cord test head requirements is
return loss specifications from 10 MHz to 2 000 MHz.
4.4.2 Category 8.1 cord test head return loss
The return loss requirements of the cord test head are given in Table 4.
Table 4 – Category 8.1 cord test head return loss
Frequency Return loss
MHz dB
10 ≤ f < 70 ≥ 35
70 ≤ f < 1 000 ≥ 32 – 20log(f /100)
1 000 ≤ f ≤ 2 000 ≥ 12
Annex A
(informative)
Test connectors specifications
A.1 General
For information and the purpose of comparison, the complete test connector specifications are
given in this Annex, including specifications for categories 5e, 6, 6 , and 8.1 up to the respective
A
upper frequencies of those categories. In some cases, there are specifications for specific
categories, and those are so noted.
A.2 Test plug specifications
A.2.1 General
Test plugs used in de-embedded crosstalk and related connector signal integrity and
transmission performance test procedures are specified in IEC 60512-26-100,
IEC 60512-27-100, and IEC 60512-28-100,
A.2.2 Test plug NEXT loss limit vectors
The plug NEXT loss limit vectors for each case are determined by combining the magnitude
values and phase values as shown in Table A.1 for categories 6, 6 , and 8.1, and Table A.2 for
A
category 5e.
Table A.1 – Category 6, 6 and 8.1 test plug NEXT loss limit vectors
A
Case # Pair combination Limit Plug NEXT loss limit magnitude Plug NEXT loss limit phase
1, 2
dB
degrees
Case 1 3,6-4,5 Low 38,1-20log(f /100) Test plug NEXT loss phase
Case 2 3,6-4,5 Central 38,6-20log(f /100) Test plug NEXT loss phase
Case 3 3,6-4,5 Central 39,0-20log(f /100) Test plug NEXT loss phase
Case 4 3,6-4,5 High 39,5-20log(f /100) Test plug NEXT loss phase
Case 5 1,2-3,6 Low 46,5-20log(f /100) Test plug NEXT loss phase
Case 6 1,2-3,6 High 49,5-20log(f /100) Test plug NEXT loss phase
Case 7 3,6-7,8 Low 46,5-20log(f /100) Test plug NEXT loss phase
Case 8 3,6-7,8 High 49,5-20log(f /100) Test plug NEXT loss phase
Case 9 1,2-4,5 Low 57-20log(f /100) +90
Case 10 1,2-4,5 High 70-20log(f /100) -90
Case 11 4,5-7,8 Low 57-20log(f /100) +90
Case 12 4,5-7,8 High 70-20log(f /100) -90
Case 13 1,2-7,8 Low 66-20log(f /100) Test plug NEXT loss phase
Case 14 1,2-7,8 High 66-20log(f /100) Test plug NEXT loss phase
minus 180°
Test plug NEXT loss phase is determined by following the procedure in A.2.6.
The reference plane for measuring test plug NEXT loss phase and mated connector NEXT loss is the test plug
phase reference plane as described in A.2.5.

– 14 – IEC 60512-27-200:2022 © IEC 2022
Table A.2 – Category 5e test plug NEXT loss limit vectors
Case # Pair combination Limit Plug NEXT loss limit magnitude Plug NEXT loss limit phase
1, 2
dB
degrees
Case 1 3,6-4,5 Low 35,8-20log(f /100) Test plug NEXT loss phase
Case 2 3,6-4,5 Central n/a n/a
Case 3 3,6-4,5 Central n/a n/a
Case 4 3,6-4,5 High 39,5-20log(f /100) Test plug NEXT loss phase
Case 5 1,2-3,6 Low 42-20log(f /100) Test plug NEXT loss phase
Case 6 1,2-3,6 High 50-20log(f /100) Test plug NEXT loss phase
Case 7 3,6-7,8 Low 42-20log(f /100) Test plug NEXT loss phase
Case 8 3,6-7,8 High 50-20log(f /100) Test plug NEXT loss phase
Case 9 1,2-4,5 Low 50-20log(f /100) 90° or -90°
Case 10 1,2-4,5 High n/a n/a
Case 11 4,5-7,8 Low 50-20log(f /100) 90° or -90°
Case 12 4,5-7,8 High n/a n/a
Case 13 1,2-7,8 Low 60-20log(f /100) 90° or -90°
Case 14 1.2-7,8 High n/a n/a
Test plug NEXT loss phase is determined by following the procedure in A.2.6.
The reference plane for measuring test plug NEXT loss phase and mated connector NEXT loss is the test plug
phase reference plane as described in A.2.5.

A.2.3 Mated connector NEXT loss specifications
The re-embedded response for case 2, case 3, and cases 5 – 14, as specified in
IEC 60512-27-100, are given in the respective mated connector NEXT loss specifications. For
categories 6, 6 , and 8.1, the re-embedded response for pair combination 3,6 – 4,5 case 1 and
A
case 4, as specified in IEC 60603-7-51 and IEC 60603-7-81, are given in Table A.3.
Table A.3 – Category 6, 6 and 8.1 mated connector NEXT loss specifications
A
for case 1 and case 4
Frequency NEXT loss
MHz dB
1 ≤ f ≤ 250 52,5 – 20log(f /100)
Category 6 and 6
A
250 < f ≤ 500 44,54 – 40log(f /250)
1 ≤ f ≤ 250 52,5 – 20log(f /100)
Category 8.1 250 < f ≤ 500 44,54 – 30log(f /250)
500 < f ≤ 2 000 35,51 – 40log(f /500)

A.2.4 Test plug NEXT loss specifications
The corrected NEXT loss vectors (magnitude and phase) of the test plug in the forward direction
should be within the test plug NEXT loss ranges of Table A.4 or Table A.5. Test plug NEXT loss
specifications apply in the forward direction only. Test plug NEXT loss in the reverse direction
should also be measured so that the data can be used in the reverse direction for mated
connector NEXT loss qualification procedure as described in IEC 60512-27-100.

Table A.4 – Category 5e, 6, and 6 test plug NEXT loss ranges
A
Pair NEXT loss magnitude range NEXT loss phase range
combination
degrees
dB
3,6-4,5 10 MHz ≤ f < 300 MHz: 50 MHz – 100 MHz:
(-90 + 1,5⋅× f /100) ± 1
38,1-20log(f /100) ≤ NEXT loss ≤ 3,5-20log(f /100)
300 MHz ≤ f ≤ 500 MHz: 100 MHz – 500 MHz:
38,1-20log(f /100) ≤ NEXT loss ≤ 39,5-20log(f /100) + (-90 + 1,5⋅× f /100) ± f /100
0,5(f-300)/200
1,2-3,6 46,5-20log(f /100) ≤ NEXT loss ≤ 49,5-20log(f /100)
(-90 +1,5 × f /100) ± 3⋅× f /100
3,6-7,8 46,5-20log(f /100) ≤ NEXT loss ≤ 49,5-20log(f /100) (-90 +1,5⋅× f /100) ± 3⋅× f /100
4 3
1,2-4,5
NEXT loss ≥ 57-20log(f /100) 90 ± (30⋅× f /100)
4 3
4,5-7,8
NEXT loss ≥ 57-20log(f /100) 90 ± (30⋅× f /100)
1,2-7,8 Any phase
NEXT loss ≥ 66-20log(f /100)
Magnitude limits apply over the frequency range from 10 MHz to 500 MHz.
Phase limits apply over the frequency range from 50 MHz to 500 MHz.
When the measured test plug NEXT loss magnitude is greater than 70-20log(f /100) or 70 dB, the phase limit
does not apply.
When the NEXT loss magnitude limit calculation results in a value greater than 70 dB, the limit reverts to
70 dB.
When the fixture described in IEC 60512-27-100 or an equivalent is used, the magnitude high limit for pair
combination 36-45, 39,5-20log(f /100), should be 39,5-20log(f /100) + 0,5(f-300)/200 for the frequency range
from 300 MHz to 500 MHz.
An alternative procedure for qualification of test plug NEXT loss may be used if equivalent
results and equivalent or better accuracy can be demonstrated.

– 16 – IEC 60512-27-200:2022 © IEC 2022
Table A.5 – Category 8.1 test plug NEXT loss ranges
Pair NEXT loss magnitude range NEXT loss phase range
combination
degrees
dB
3,6-4,5 10 MHz ≤ f < 300 MHz: 50 MHz – 100 MHz:
38,1-20log(f /100) ≤ NEXT loss ≤ 39,5-20log(f /100) (-90 + 1,5⋅× f /100) ± 1
300 MHz ≤ f ≤ 2 000 MHz:
100 MHz – 500 MHz:
38,1-20log(f /100) ≤ NEXT loss ≤ 39,5-20log(f /100) +
(-90 + 1,5⋅× f /100) ± f /100
0,5(f-300)/200
1,2-3,6 10 MHz ≤ f < 300 MHz:
(-90 +1,5 × f /100) ± 3⋅× f
/100
46,5-20log(f /100) ≤ NEXT loss ≤ 49,5-20log(f /100)
300 MHz ≤ f ≤ 2 000 MHz:
46,5-20log(f /100) ≤ NEXT loss ≤ 49,5-20log(f /100) +
0,5(f-300)/200
3,6-7,8 10 MHz ≤ f < 300 MHz: (-90 +1,5⋅× f /100) ± 3⋅× f
/100
46,5-20log(f /100) ≤ NEXT loss ≤ 49,5-20log(f /100)
300 MHz ≤ f ≤ 2 000 MHz:
46,5-20log(f /100) ≤ NEXT loss ≤ 49,5-20log(f /100) +
0,5(f-300)/200
4 3
1,2-4,5
NEXT loss ≥ 57-20log(f /100) 90 ± (30⋅× f /100)
4 3
4,5-7,8
NEXT loss ≥ 57-20log(f /100) 90 ± (30⋅× f /100)
1,2-7,8 Any phase
NEXT loss ≥ 66-20log(f /100)
Magnitude limits apply over the frequency range from 10 MHz to 2 000 MHz.
Phase limits apply over the frequency range from 50 MHz to 2 000 MHz.
When the measured test plug NEXT loss magnitude is greater than 70-20log(f /100) or 70 dB, the phase limit
does not apply.
When the NEXT loss magnitude limit calculation results in a value greater than 70 dB, the limit reverts to
70 dB.
A.2.5 Test plug phase reference plane and calibration planes
For categories 5e, 6, 6A and 8.1 mated connector measurements of return loss, insertion loss,
NEXT loss, and FEXT loss are conducted by using mated connector with a test plug that
complies with IEC 60512-27-100. Certain plug parameters include phase specifications, and
certain mated connector specifications are based on calculations that involve both test plug and
mated connector phase data. There are no test plug specifications for category 3 mated
connector. To maintain a consistent phase reference, a “test
...