IEC 61000-4-3:2006/AMD1:2007
(Amendment)Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
Amendement 1 - Compatibilité électromagnétique (CEM) - Partie 4-3: Techniques d'essai et de mesure - Essai d'immunité aux champs électromagnétiques rayonnés aux fréquences radioélectriques
General Information
Relations
Standards Content (Sample)
IEC 61000-4-3
Edition 3.0 2007-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Electromagnetic compatibility (EMC) –
Part 4-3: Testing and measurement techniques – Radiated, radio-frequency,
electromagnetic field immunity test
Compatibilité électromagnétique (CEM) –
Partie 4-3: Techniques d’essai et de mesure – Essai d’immunité aux champs
électromagnétiques rayonnés aux fréquences radioélectriques
IEC 61000-4-3 A1:2007
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.
Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.
IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: inmail@iec.ch
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
ƒ Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
ƒ IEC Just Published: www.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
ƒ Electropedia: www.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
ƒ Customer Service Centre: www.iec.ch/webstore/custserv
If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service
Centre FAQ or contact us:
Email: csc@iec.ch
Tel.: +41 22 919 02 11
Fax: +41 22 919 03 00
A propos de la CEI
La Commission Electrotechnique Internationale (CEI) est la première organisation mondiale qui élabore et publie des
normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.
A propos des publications CEI
Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possédez
l’édition la plus récente, un corrigendum ou amendement peut avoir été publié.
ƒ Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm
Le Catalogue en-ligne de la CEI vous permet d’effectuer des recherches en utilisant différents critères (numéro de référence,
texte, comité d’études,…). Il donne aussi des informations sur les projets et les publications retirées ou remplacées.
ƒ Just Published CEI: www.iec.ch/online_news/justpub
Restez informé sur les nouvelles publications de la CEI. Just Published détaille deux fois par mois les nouvelles
publications parues. Disponible en-ligne et aussi par email.
ƒ Electropedia: www.electropedia.org
Le premier dictionnaire en ligne au monde de termes électroniques et électriques. Il contient plus de 20 000 termes et
définitions en anglais et en français, ainsi que les termes équivalents dans les langues additionnelles. Egalement appelé
Vocabulaire Electrotechnique International en ligne.
ƒ Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm
Si vous désirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du
Service clients ou contactez-nous:
Email: csc@iec.ch
Tél.: +41 22 919 02 11
Fax: +41 22 919 03 00
IEC 61000-4-3
Edition 3.0 2007-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Electromagnetic compatibility (EMC) –
Part 4-3: Testing and measurement techniques – Radiated, radio-frequency,
electromagnetic field immunity test
Compatibilité électromagnétique (CEM) –
Partie 4-3: Techniques d’essai et de mesure – Essai d’immunité aux champs
électromagnétiques rayonnés aux fréquences radioélectriques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
R
CODE PRIX
ICS 33.100.20 ISBN 2-8318-9354-2
– 2 – 61000-4-3 Amend.1 © IEC:2007
FOREWORD
This amendment has been prepared by subcommittee 77B: High frequency phenomena of IEC
technical committee 77: Electromagnetic compatibility.
The text of this amendment is based on the following documents:
FDIS Report on voting
77B/546/FDIS 77B/556/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the maintenance result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
Page 3
CONTENTS
Add, to the existing list of annexes, the following new title:
Annex I (informative) Calibration method for E-field probes
Page 25
Add, at the end of the sixth dashed item (beginning with “– An isotropic field sensor”), the
following new sentence:
Annex I provides a calibration method for E-field probes.
Page 111
Add the following new annex:
61000-4-3 Amend.1 © IEC:2007 – 3 –
Annex I
(informative)
Calibration method for E-field probes
I.1 Overview
E-field probes with broad frequency range and large dynamic response are extensively used
in the field uniformity calibration procedures in accordance with IEC 61000-4-3. Among other
aspects, the quality of the field probe calibration directly impacts the uncertainty budget of a
radiated immunity test.
Generally, probes are subject to relatively low field strengths, e.g. 1 V/m – 30 V/m, during the
field uniformity calibration in accordance with IEC 61000-4-3. Therefore a calibration of the E-
field probes used within IEC 61000-4-3 shall take the intended frequency and dynamic ranges
into consideration.
Currently probe calibration results may show differences when the probe is calibrated in
different calibration laboratories. Therefore the environment and method for a field probe
calibration are to be specified. This annex provides relevant information on calibration of
probes to be used in IEC 61000-4-3.
For frequencies above the several hundred megahertz to gigahertz range, using standard gain
horn antennas to establish a standard field inside an anechoic chamber is one of the most
widely used methods for calibrating probes for IEC 61000-4-3 applications. However, there is
a lack of an established method for validating the test environment for field probe calibrations.
In using this method, differences have been observed between calibration laboratories,
beyond their reported measurement uncertainties.
Field probe calibrations in the 80 MHz to a few hundred megahertz range that are usually
carried out in TEM waveguides are generally found to be more reproducible.
This informative annex therefore concentrates on improving the probe calibration procedures
with horn antennas in anechoic chambers to which a comprehensive calibration procedure is
depicted.
I.2 Probe calibration requirements
I.2.1 General
The calibration of E-Field probes intended to be used for UFA calibration procedure as
defined in IEC 61000-4-3 shall satisfy the following requirements.
I.2.2 Calibration frequency range
The frequency range shall normally cover 80 MHz to 6 GHz but it may be limited to the
frequency range required by the tests.
I.2.3 Frequency steps
To be able to compare test results between different calibration laboratories, it is necessary to
use fixed frequencies for the calibration.
– 4 – 61000-4-3 Amend.1 © IEC:2007
80 MHz to 1 GHz:
Use the following frequencies for the calibration of E-field probes (typically 50 MHz step
width)
80, 100, 150, 200,…, 950, 1 000 MHz
1 GHz to 6 GHz:
Use the following frequencies for the calibration of E-field probes (200 MHz step width)
1 000, 1 200, 1 400,…, 5 800, 6 000 MHz
NOTE It is not intended to measure a probe at 1 GHz twice, but in case it is used up to or from 1 GHz, the probe
needs to be measured at that frequency.
I.2.4 Field strength
The field strength at which a probe is calibrated should be based on the field strength
required for the immunity test. As the preferred method for uniformity field calibration is
carried out at field strength of at least 1,8 times the field strength to be applied to the EUT, it
is recommended that the probe calibration be carried out at twice the intended test field
strength (see Table I.1). If a probe is to be used at different field levels, it has to be calibrated
at multiple levels according to its linearity, at least the minimum and maximum levels. See
also I.3.2.
NOTE 1 This also covers the 1 dB compression requirement of the power amplifier.
NOTE 2 The calibration is performed using CW signals without modulation.
Table I.1 – Calibration field strength level
Calibration level Calibration field strength
1 2 V/m
2 6 V/m
3 20 V/m
4 60 V/m
X Y V/m
NOTE X,Y is an open calibration level which can be higher
or lower than one of the other levels 1-4. This level may be
given in the product specification or test laboratory.
I.3 Requirements for calibration instrumentation
I.3.1 Harmonics and spurious signals
Any harmonics or spurious signals from the power amplifiers shall be at least 20 dB below the
level at the carrier frequency. This is required for all field strength levels used during
calibration and linearity check. Since the harmonic content of power amplifiers is usually
worse at higher power levels, the harmonic measurement may be performed only at the
highest calibration field strength. The harmonic measurement can be performed using a
calibrated spectrum analyzer which is connected to the amplifier output through an attenuator,
or through a directional coupler.
NOTE 1 The antenna may have additional influence on harmonic content and may need to be checked separately.
Calibration laboratories shall perform a measurement to validate that the harmonic and/or
spurious signals from the amplifier satisfy the requirements for all measurement setups. This
61000-4-3 Amend.1 © IEC:2007 – 5 –
may be done by connecting a spectrum analyzer to Port 3 of the directional coupler (replacing
the power meter sensor with the spectrum analyzer input – see Figure I.2).
NOTE 2 It should be assured that the power level does not exceed the maximum allowable input power of the
spectrum analyzer. An attenuator may be used.
The frequency span shall cover at least the third harmonic of the intended frequency. The
validation measurement shall be performed at the power level that will generate the highest
intended field strength.
Harmonic suppression filters may be used to improve the spectrum purity of the power
amplifier(s) (see Annex D).
I.3.2 Linearity check for probe
The linearity of the probe which is used for the chamber validation according to I.4.2.5 shall
be within ±0,5 dB from an ideal linear response in the required dynamic range (see Figure I.1).
Linearity shall be confirmed for all intended range settings if the probe has multiple ranges or
gain settings.
In general probe linearity does not change significantly with frequency. Linearity checking can
be performed at a spot frequency that is close to the central region of the intended use of
frequency range, and where the probe response versus frequency is relatively flat. The
selected spot frequency is to be documented in the calibration certificate.
The field strength for which the linearity of the probe is measured should be within –6 dB to
+6 dB of the field strength which is used during the validation of the chamber, with a
sufficiently small step size, e.g. 1 dB. Table I.2 shows an example of the field strength levels
to be checked for a 20 V/m application.
Table I.2 – Example for the probe linearity check
Calibration field
Signal level
strength
dB V/m
-6,0 13,2
-5,0 14,4
-4,0 14,8
-3,0 15,2
-2,0 16,3
-1,0 18,0
0 20,0
1,0 22,2
2,0 24,7
3,0 27,4
4,0 30,5
5,0 34,0
6,0 38,0
– 6 – 61000-4-3 Amend.1 © IEC:2007
100,0
Nonlinear curve
10,0
1,0
–6,0 –4,0 –2,0 0,0 2,0 4,0 6,0
Signal level dB
IEC 2043/07
Figure I.1 – Example of linearity for probe
I.3.3 Determination of the gain of the standard horn antennas
Far field gain of the standard pyramidal horn antennas can be determined fairly accurately
(less than 0,1 dB of uncertainties have been reported in [1] ). The far-field gain is typically
valid for distances greater than 8D / λ (where D is the largest dimension of the horn aperture,
and λ is the wavelength). Calibrations of field probes at such distances may not be practical
due to the large anechoic chamber and high power amplifiers required. Field probes are
typically calibrated in the near field region of the transmitting antennas. The near-field gain of
standard gain horn antennas have been determined by using equations such as those
described in [2]. The gain is computed based o
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.